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Development of nano and atomic scale real-space imaging techniques under extreme conditions
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Qiyuan FENG1, Wenjie MENG1, Jihao WANG1, Yubin HOU1, Jing ZHANG1, Qingyou LU1, 2, 3, *
Science & Technology Review | 2025, 43(7) : 100 - 115
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Science & Technology Review | 2025, 43(7): 100-115
• Papers •
Development of nano and atomic scale real-space imaging techniques under extreme conditions
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Qiyuan FENG1, Wenjie MENG1, Jihao WANG1, Yubin HOU1, Jing ZHANG1, Qingyou LU1, 2, 3, *
Affiliations
  • 1. High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China
  • 2. Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei 230026, China
  • 3. Anhui Provincial Laboratory of Advanced Photon Science and Technology, University of Science and Technology of China, Hefei 230026, China
Published: 2025-04-13 doi: 10.3981/j.issn.1000-7857.2024.09.01367
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Scanning Probe Microscopy (SPM), owing to its ultra-high spatial resolution, has become an indispensable tool for advancing nanotechnology and probing quantum phenomena. It has a wide range of applications across various fields, including materials science, physics, chemistry, and biology. The significance of SPM lies in its atomic-scale resolution and multifunctionality. This review summarizes recent progress, development trends, and existing challenges in integrating SPM with extreme conditions. SPM can perform various fundamental measurements, such as mechanical, magnetic, and electrical characterization, making it a versatile platform for exploring the microscopic world. At present, as material performance continues to improve yet seems to encounter a bottleneck in disruptive breakthroughs, leveraging extreme environments to discover new materials and new physics has become a promising direction. Therefore, the integration of SPM with extreme external physical fields—such as ultra-high magnetic fields, ultra-low temperatures, and high vacuum—has emerged as an important development trend.

scanning probe microscopy  /  ultra-high magnetic fields  /  cryogenics  /  scanning tunneling microscopy(STM)  /  atomic force microscopy(AFM)
Qiyuan FENG, Wenjie MENG, Jihao WANG, Yubin HOU, Jing ZHANG, Qingyou LU. Development of nano and atomic scale real-space imaging techniques under extreme conditions[J]. Science & Technology Review, 2025 , 43 (7) : 100 -115 . DOI: 10.3981/j.issn.1000-7857.2024.09.01367
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doi: 10.3981/j.issn.1000-7857.2024.09.01367
  • Receive Date：2024-07-15
  • Online Date：2025-06-29
  • Published：2025-04-13
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  • Received：2024-07-15
  • Revised：2024-12-19
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Affiliations
    1. High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China
    2. Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei 230026, China
    3. Anhui Provincial Laboratory of Advanced Photon Science and Technology, University of Science and Technology of China, Hefei 230026, China
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红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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