Acta Energiae Solaris Sinica
|
2026, 47(6): 792-798
STABILITY STUDY OF AGTA INFRARED REFLECTIVE FILM
Full
Yang Deng1, Cao Hongtao2, Gao Junhua3
Affiliations
1. Collega of Materials Science and Engineering, Zhejiang University of Technology, Hangzhou 310014, China;
2. Ningbo Institute of Materials Technology&Engineering, Chinese Academy of Sciences, Ningbo 315201, China;
3. Westlake Institute for Optoelectronics, Hangzhou 311421, China
doi: 10.19912/j.0254-0096.tynxb.2025-0112
Outline
Conventional infrared reflective layers often struggle with thermal instability at high temperatures or insufficient infrared reflectivity, limiting their practical applications. In this study, we employed a microalloying approach to enhance film performance by incorporating tantalum (Ta) into silver (Ag) films via magnetron sputtering. The reflective spectra, crystal structure, and surface morphology of the films were systematically analyzed. The results indicate that Ta doping effectively inhibites the preferred growth of the Ag(111) crystal plane. Furthermore, high-vacuum thermal stability tests at 600 ℃ confirm that the AgTa infrared reflective coatings retain excellent optical and structural stability, even under elevated temperatures.
microalloying
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Ag
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thermal stability
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IR reflective layer
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reflectance
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magnetron sputtering
Yang Deng, Cao Hongtao, Gao Junhua.
STABILITY STUDY OF AGTA INFRARED REFLECTIVE FILM[J].
Acta Energiae Solaris Sinica,
2026
, 47
(6)
: 792
-798
.
DOI: 10.19912/j.0254-0096.tynxb.2025-0112
Year 2026 volume 47 Issue 6
PDF
209
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Cite this Article
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Article Info
doi: 10.19912/j.0254-0096.tynxb.2025-0112
- Receive Date:2025-01-16
- Online Date:2026-07-17