To explore the limitations of the low air pressure test methods for electronic and electrical products, and to propose ways to optimize and improve the test methods. To analyze the influence of low air pressure environment on the performance, reliability and life of electronic products, and to summarize the important role of low air pressure test in the reliability assessment of electronic products. From the four aspects of test equipment, test conditions, test point arrangement and data processing methods, suggestions are made to improve the low air pressure test methods. For the test equipment, it is proposed to adopt new vacuum pumps, high vacuum chamber materials, optimize the sealing structure, and introduce precise temperature control algorithms; for the test conditions, it is proposed to reasonably select the air pressure value and rate of change according to the product environment, match the temperature conditions, and take into account the test efficiency and failure incentives; for the test point layout, it is proposed to focus on the key devices and weak structures, and adopt suitable wiring materials and direction design; for the data processing method, it is proposed to improve the low air pressure test method. For the data processing method, it is suggested to introduce new methods such as machine learning and signal processing to explore the failure law and performance trend, and focus on the visualization of the analysis results. Strengthening the research on low air pressure test methods is of great significance to enhance the reliability of electronic products and promote their application in rail transportation, aerospace and other fields, which requires the joint efforts of industry, academia and research institutes.

hypobaric test  /  reliability  /  test optimization  /  adaptation