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Specific Emitter Identification for Mode 5 Signal Based on Synchronous Pulse
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Shaojun XIA1, Zebin HU1, Qin NIU1, Xiangmingyue KONG1, Zhongling YANG2
Radar Science and Technology | 2025, 23(5) : 523 - 528
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Radar Science and Technology | 2025, 23(5): 523-528
Specific Emitter Identification for Mode 5 Signal Based on Synchronous Pulse
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Shaojun XIA1, Zebin HU1, Qin NIU1, Xiangmingyue KONG1, Zhongling YANG2
Affiliations
  • 1.The 38th Research Institute of China Electronics Technology Group Corporation, Hefei 230088, China
  • 2.Unit 93145 of PLA, Nanjing 210000, China
doi: 10.3969/j.issn.1672-2337.2025.05.006
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Mode 5 signal used in the identification friend or foe (IFF) system adopts technologies such as Walsh soft spread spectrum and MSK modulation to improve the information capacity and security, while making specific emitter identification (SEI) of the Mode 5 signal difficult. To address this issue, two SEI methods for Mode 5 signal are proposed by using the fixed characteristics of synchronous pulse: SEI method based on the instantaneous phase features of synchronous pulses and SEI method based on the cross-correlation features of synchronous pulses. The simulation results show that under the condition of signal-to-noise ratio of 12dB, the accuracy of the method based on the instantaneous phase feature is 90.4%, and the accuracy of the method based on the cross-correlation feature is 94.8%. The performance of both SEI methods proposed in this paper is better than the traditional ones.

IFF mode 5  /  specific emitter identification  /  synchronous pulse  /  instantaneous phase  /  cross-correlation
Shaojun XIA, Zebin HU, Qin NIU, Xiangmingyue KONG, Zhongling YANG. Specific Emitter Identification for Mode 5 Signal Based on Synchronous Pulse[J]. Radar Science and Technology, 2025 , 23 (5) : 523 -528 . DOI: 10.3969/j.issn.1672-2337.2025.05.006
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Year 2025 volume 23 Issue 5
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doi: 10.3969/j.issn.1672-2337.2025.05.006
  • Receive Date：2024-10-30
  • Online Date：2026-04-23
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  • Received：2024-10-30
  • Revised：2025-03-03
Affiliations
    1.The 38th Research Institute of China Electronics Technology Group Corporation, Hefei 230088, China
    2.Unit 93145 of PLA, Nanjing 210000, China
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