Home Journals Articles Updates About
CN
image
收藏切换
Research on a repair method of high-voltage cable buffer layer based on graphite injection
收藏切换
PDF
Pengxian SONG1, Hua ZHANG2, Xiaohui ZHU1, Shengchen FANG1, Zhanpeng WEI2, Boxue DU3, Qi LI3, Hao LIU3
Insulating Materials | 2023, 56(10) : 84 - 90
Less
收藏切换
Insulating Materials | 2023, 56(10): 84-90
• Insulation Technology •
Research on a repair method of high-voltage cable buffer layer based on graphite injection
Full
Pengxian SONG1, Hua ZHANG2, Xiaohui ZHU1, Shengchen FANG1, Zhanpeng WEI2, Boxue DU3, Qi LI3, Hao LIU3
Affiliations
  • 1Tianjin Electric Power Research Institute of State Grid Tianjin Electric Power Company, Tianjin 300384, China
  • 2State Grid Tianjin Cable Company, Tianjin 300171, China
  • 3School of Electrical and Information Engineering, Tianjin University, Tianjin 300072, China
Published: 2023-10-20 doi: 10.16790/j.cnki.1009-9239.im.2023.10.011
Outline
收藏切换

In recent years, ablation failure of high-voltage cable buffer layer occurs frequently. In order to solve the problem, this paper established a simulation model for XLPE cables and studied the electric field distribution characteristics of buffer layers under different resistivity. Based on the fault mechanism, a buffer layer repair scheme and a full set of on-site repair process were proposed. Repair tests were conducted on 220 kV high-voltage cross-linked polyethylene fault cables with a length of 1.2 m and 6 m, respectively. The repair effect was evaluated from the perspectives of contact resistance and capacitance current. The results show that with the increase of volume resistivity of the buffer layer, the electric field distortion between the buffer layer and the aluminum sheath is serious, which is easy to cause partial discharge and lead to cable failure. With the decrease of volume resistivity of the buffer layer, the electrical connection between the buffer layer and the aluminum sheath gradually recovers, and the electric field distribution tends to be uniform. After the injection of conductive repair medium, the resistance between the buffer layer and the aluminum sheath decreases by 41.67%, indicating that the electrical connection performance between the buffer layer and the aluminum sheath has been restored.

buffer layer  /  electric field distortion  /  conductive repair medium  /  outcome evaluation
Pengxian SONG, Hua ZHANG, Xiaohui ZHU, Shengchen FANG, Zhanpeng WEI, Boxue DU, Qi LI, Hao LIU. Research on a repair method of high-voltage cable buffer layer based on graphite injection[J]. Insulating Materials, 2023 , 56 (10) : 84 -90 . DOI: 10.16790/j.cnki.1009-9239.im.2023.10.011
Appendix
Less
Year 2023 volume 56 Issue 10
PDF
160
75
Cite this Article
BibTeX
Article Info
doi: 10.16790/j.cnki.1009-9239.im.2023.10.011
  • Receive Date：2022-08-30
  • Online Date：2025-11-24
  • Published：2023-10-20
Article Data
Affiliations
History
  • Received：2022-08-30
  • Revised：2022-10-23
Funding
Affiliations
    1Tianjin Electric Power Research Institute of State Grid Tianjin Electric Power Company, Tianjin 300384, China
    2State Grid Tianjin Cable Company, Tianjin 300171, China
    3School of Electrical and Information Engineering, Tianjin University, Tianjin 300072, China
References
Share
https://castjournals.cast.org.cn/joweb/jycl/EN/10.16790/j.cnki.1009-9239.im.2023.10.011
Share to
QR

Scan QR to access full text

Cite this article
BibTeX
Citations
表12种不同金属材料的力学参数
科
Family		 属数
Number of
genus		 种数
Number of
species		 占总种数比例
Percentage of
total species (%)		 属
Genus		 种数
Number of
species		 占总种数比例
Percentage of total
species (%)
鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
关闭全屏
  • BibTeX
  • EndNote
  • RefWorks
  • TxT
Links
Articles
Latest Articles
Most Read
Collections
Updates
Events
News
Multimedia
About
About Us
Contact
No. 86 Xueyuan South Road, Haidian District, Beijing
100081
010-62199257
qkjq@cast.org.cn

Copyright © 2025 China Association for Science and Technology. All rights reserved. For all open access content, the relevant licensing terms apply.
Sponsored by the Office of the Leading Group for Cybersecurity and Informatization of CAST, and supported by Science and Technology Review Publishing House