Effect of Trace-Oxide on H-Se Impurity in Se-Based Chalcogenide Glasses
1.Laboratory of Infrared Materials and Devices, Research Institute of Advanced Technology, College of Information, Ningbo University, Ningbo 315211, Zhejiang, China
2.College of Data Science, Jiaxing University, Jiaxing 314001, Zhejiang, China
3.Key Laboratory of Photoelectric Detection Materials and Devices of Zhejiang Province, Ningbo 315211, Zhejiang, China
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WANG Yuze (1997—), male, Master candidate. E-mail: 1692437099@qq.com
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