Evaluation Method for Maximum Current Conduction Capability of SIC MOSFET Device at High Temperature
| Just accepted | Online first | Issue | Totals | |
|---|---|---|---|---|
| HTML pages views | 0 | 0 | 287 | 287 |
| PDF downloads | 0 | 0 | 62 | 62 |
Citation counts are provided from Web of Science and CrossRef. The counts may vary by service, and are reliant on the availability of their data. Counts will update daily once available.
|
No. 86 Xueyuan South Road, Haidian District, Beijing
010-62199257
qkjq@cast.org.cn
Copyright © 2025 China Association for Science and Technology. All rights reserved. For all open access content, the relevant licensing terms apply.
Sponsored by the Office of the Leading Group for Cybersecurity and Informatization of CAST, and supported by Science and Technology Review Publishing House
PDF