To examine the effect of perovskite/FCQDs GHJ on dynamics of charge carrier transfer and recombination, the PSC devices were further characterized with transient photocurrent/photovoltage decay (TPC/TPV) measurements at various bias light intensities (Figure S8). The working principles for measurements of the TPC/TPV have been described in our previous reports [
53–
55]. By varying the bias light intensity, the corresponding recombination lifetime (
) at a different open-circuit voltage (or quasi-Fermi level) can be obtained in the model of TPV. Similarly, the apparent transport lifetime (
) is collected at short circuit conditions in TPC measurements. The transport/recombination kinetics in PSCs are frequently modeled with biphasic decay (Figure S8), corresponding to the dynamics of electron and hole, respectively. Figure
4(d) exhibits the carrier transport lifetime as a function of
(determined by the incident light intensity) for the devices by fitting the TPC curves. Notably, both electron and hole transport lifetimes of device B are significantly shorter than that of device A. At an identical voltage of ~0.9 V, the transport lifetime of electron (
) of device B is approximately 6
μs, being shorter than that of device A (~8
μs). Similarly, the transport lifetime of hole (
) of device B is approximately 1.5
μs, being shorter than that of device A (~2.6
μs). This result can be attributed to the CsPbI
2.5Br
0.5/FCQDs GHJ, which introduces additional driving force for hole transfer, therefore an enhanced charge carrier transport. This result also indicates an imbalanced charge transport in both devices. A similar behavior has been found in the TPV measurements (Figure
4(e)), showing that device B exhibited a longer carrier recombination lifetime (
) of electron and hole compared to device A. At an identical voltage of ~0.9 V, the recombination lifetime of electron (
) of device B is approximately 31.5
μs, being longer than that of device A (~23
μs). Similarly, the recombination lifetime of the hole (
) of device B is approximately 7
μs, being longer than that of device A (~2.9
μs). A long interfacial recombination lifetime guarantees efficient charge collection and thus enhancing the device output photovoltage. The diffusion length (
) of charge carriers in CsPbI
2.5Br
0.5 PSCs was further evaluated by the ratio of recombination lifetime and transport lifetime, as given by the expression
, where
is the charge carrier diffusion coefficient obtained from charge transport time
. As shown in Figure
4(f), device B has a longer charge diffusion length (
). At an identical voltage of ~0.9 V, the diffusion length of electron (
) of device B is approximately 1.46
μm, being longer than that of device A (~1.06
μm). The diffusion length of the hole (
) of device B is approximately 617 nm, being longer than that of device A (~303 nm). In comparison with previous report on CsPbI
2Br-based inorganic PSC showing diffusion length of 463 nm for electrons and 202 nm for holes, in this study, the CsPbI
2.5Br
0.5/FCQDs GHJ device exhibited much longer diffusion length for both electrons and holes [
55]. Especially, such a greatly increased hole diffusion length indicates effective hole collection efficiency, which principally delivers higher output photocurrent. This result also well explains the increased EQE value observed for device B in long wavelength region (Figure
3(d)), which can be ascribed to the better charge carrier collection efficiency. The negative slope of the EQE curve for both devices towards longer wavelengths could be due to the loss of carriers by recombination in the bulk of the perovskite layer. Clearly, we should concern to increase the hole diffusion length along with a reduced interfacial charge recombination with the aim to a balanced charge transport and further improvement in device performace.