Full
Outline
As core components of automotive electronic systems, the reliability of automotive-grade chips directly determines vehicle safety and service life. Traditional accelerated aging models are primarily designed for conventional industrial and consumer electronics testing scenarios and do not fully account for the complex and variable operating conditions found in automotive applications. Consequently, reliability verification of automotive-grade chips suffers from issues such as low accuracy in life prediction, poor alignment with failure mechanisms, and significant deviations in test results. Based on the AEC-Q100 automotive standard, this paper systematically reviews the typical failure mechanisms of automotive-grade chips, classic accelerated aging models, and automotive application scenarios. It analyzes future trends in aging model development to provide theoretical support and engineering references for the reliability assessment, test plan design, and product optimization of automotive-grade chips.
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| 科 Family | 属数 Number of genus | 种数 Number of species | 占总种数比例 Percentage of total species (%) | 属 Genus | 种数 Number of species | 占总种数比例 Percentage of total species (%) |
|---|---|---|---|---|---|---|
| 鹅膏菌科Amanitaceae | 2 | 11 | 5.26 | 鹅膏菌属 Amanita | 10 | 4.78 |
| 小菇科 Mycenaceae | 2 | 12 | 5.74 | 丝盖伞属 Inocybe | 5 | 2.39 |
| 多孔菌科 Polyporaceae | 8 | 14 | 6.70 | 蜡蘑属 Laccaria | 5 | 2.39 |
| 红菇科 Russulaceae | 3 | 23 | 11.00 | 小皮伞属 Marasmius | 6 | 2.87 |
| 小菇属 Mycena | 11 | 5.26 | ||||
| 光柄菇属 Pluteus | 5 | 2.39 | ||||
| 红菇属 Russula | 17 | 8.13 | ||||
| 栓菌属 Trametes | 5 | 2.39 |
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