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Investigation of Failure Mechanisms in SiC MOSFETs under Temperature Shock Testing
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Shuaishuai Zhu1, 2, 3, Xin Zhou1, 2, 3, Jie Chen1, 2, 3, Song Han1, 2, 3
Automobile Technology | 2026, (2) : 13 - 17
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Automobile Technology | 2026, (2): 13-17
• Special Topic on Academic Papers at the 28th CAST Annual Meeting: Key Technologies for Automotive-Grade Chip Architecture Improvement and Reliability Optimization •
Investigation of Failure Mechanisms in SiC MOSFETs under Temperature Shock Testing
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Shuaishuai Zhu1, 2, 3, Xin Zhou1, 2, 3, Jie Chen1, 2, 3, Song Han1, 2, 3
Affiliations
  • 1.State Key Laboratory of Intelligent Vehicle Safety Technology, Chongqing 401122
  • 2.China Automotive Engineering Research Institute Co., Ltd., Chongqing 401122
  • 3.China Automobile Research Institute (Jiangsu) Automotive Engineering Research Institute Company Limited, Suzhou 215129
Published: 2026-02-24 doi: 10.19620/j.cnki.1000-3703.20250372
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Regarding failure cases of Silicon Carbide Metal-Oxide-Semiconductor Field-Effect Transistors (SiC MOSFETs) during thermal shock testing, failure defects and causes are analyzed through electrical testing, ultrasonic scanning microscopy, super-depth three-dimensional microscopy, scanning electron microscopy, and other methods. Corresponding solutions are provided, which hold value for enhancing the reliability of SiC MOSFETs and ensuring stable operation of the full vehicle.

SiC MOSFETs  /  Temperature shock  /  Failure analysis  /  Delamination
朱帅帅, 周昕, 陈杰, 韩松. SiC MOSFETs在温度冲击试验中的失效原因研究. 汽车技术, 2026 , (2) : 13 -17 . DOI: 10.19620/j.cnki.1000-3703.20250372
Shuaishuai Zhu, Xin Zhou, Jie Chen, Song Han. Investigation of Failure Mechanisms in SiC MOSFETs under Temperature Shock Testing[J]. Automobile Technology, 2026 , (2) : 13 -17 . DOI: 10.19620/j.cnki.1000-3703.20250372
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Year 2026 volume Issue 2
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Article Info
doi: 10.19620/j.cnki.1000-3703.20250372
  • Online Date：2026-09-23
  • Published：2026-02-24
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  • Revised：2025-09-22
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Affiliations
    1.State Key Laboratory of Intelligent Vehicle Safety Technology, Chongqing 401122
    2.China Automotive Engineering Research Institute Co., Ltd., Chongqing 401122
    3.China Automobile Research Institute (Jiangsu) Automotive Engineering Research Institute Company Limited, Suzhou 215129
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https://castjournals.cast.org.cn/joweb/qcjs/EN/10.19620/j.cnki.1000-3703.20250372
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