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The Reliability Optimization Design of Vehicle Chip Based on Advanced Techonology
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Hongyu Liang1, Xiaoyu Yang1, 2, Zhihua Feng1, Yan Wang1, 3
Automobile Technology | 2026, (2) : 7 - 12
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Automobile Technology | 2026, (2): 7-12
• Special Topic on Academic Papers at the 28th CAST Annual Meeting: Key Technologies for Automotive-Grade Chip Architecture Improvement and Reliability Optimization •
The Reliability Optimization Design of Vehicle Chip Based on Advanced Techonology
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Hongyu Liang1, Xiaoyu Yang1, 2, Zhihua Feng1, Yan Wang1, 3
Affiliations
  • 1.National key Laboratory of Integrated Circuit and Microsystems, Chongqing 400060
  • 2.Chongqing University, Chongqing 400060
  • 3.University of Electronic Science and Technology of China, Chengdu 611700
Published: 2026-02-24 doi: 10.19620/j.cnki.1000-3703.20250310
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Based on the SMIC 12 nm Fin Field-Effect Transistor (FinFET) process, this paper analyzes the harmonic distortion and bandwidth performance indicators of the track/hold circuit at the front end of the Analog-to-Digital (A/D) converter. By reasonably selecting the type and size of the track/hold switch, the harmonic distortion caused by the temperature variation of the track/hold switch is reduced, and a new type of switch output buffer is proposed to improve the linearity of the track/hold circuit and the driving capability of the A/D converter. Test results show that: using the gate and parasitic capacitances of N-type Metal-Oxide-Semiconductor (NMOS) and P-type Metal-Oxide-Semiconductor (PMOS) transistors as sampling capacitances, the overall front-end circuit bandwidth is increased to 34 GHz through simulation verification with Cadence Virtuoso; when the sampling frequency fs=10 GHz and the input signal fin=9.8 GHz, the Spurious-Free Dynamic Range (SFDR) and Total Harmonic Distortion (THD) reach 67 dB and -59.5 dB, respectively. The proposed design scheme can be applied to the built-in self-test and self-check safety system of autonomous driving, reducing the failure rate of the autonomous driving system and improving the reliability of the embedded vehicle chip safety mechanism.

Tracking/holding circuit  /  Switching output buffer  /  Vehicle chip of the embedded system  /  Reliability
梁宏玉, 杨潇雨, 冯治华, 王妍. 基于先进工艺的车载芯片可靠性优化设计. 汽车技术, 2026 , (2) : 7 -12 . DOI: 10.19620/j.cnki.1000-3703.20250310
Hongyu Liang, Xiaoyu Yang, Zhihua Feng, Yan Wang. The Reliability Optimization Design of Vehicle Chip Based on Advanced Techonology[J]. Automobile Technology, 2026 , (2) : 7 -12 . DOI: 10.19620/j.cnki.1000-3703.20250310
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Year 2026 volume Issue 2
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doi: 10.19620/j.cnki.1000-3703.20250310
  • Online Date：2026-09-23
  • Published：2026-02-24
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  • Revised：2025-06-10
Affiliations
    1.National key Laboratory of Integrated Circuit and Microsystems, Chongqing 400060
    2.Chongqing University, Chongqing 400060
    3.University of Electronic Science and Technology of China, Chengdu 611700
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https://castjournals.cast.org.cn/joweb/qcjs/EN/10.19620/j.cnki.1000-3703.20250310
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红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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