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A high⁃speed subpixel localization approach for small⁃scale spots in industrial vision applications
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Yixuan HAN1, 2, Doudou GAO1, 2, Dengfeng DONG1, 2, 1, Bo WANG1, Qifan QIU1, 3
Metrology & Measurement Technology | 2025, 45(6) : 29 - 40
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Metrology & Measurement Technology | 2025, 45(6): 29-40
• New Techniques for Precision Measurement •
A high⁃speed subpixel localization approach for small⁃scale spots in industrial vision applications
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Yixuan HAN1, 2, Doudou GAO1, 2, Dengfeng DONG1, 2, 1, Bo WANG1, Qifan QIU1, 3
Affiliations
  • 1Institute of Microelectronics Chinese Academy of Sciences, Beijing100029, China
  • 2University of Chinese Academy of Sciences, Beijing100049, China
  • 3College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing211106, China
Published: 2025-12-28 doi: 10.11823/j.issn.1674-5795.2025.06.02
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To address the issues of accuracy degradation and computational delay in extracting small spot centers in the field of industrial high⁃speed visual measurement, a high⁃speed real⁃time spot localization method for small⁃sized spots is proposed. A Region of Interest (ROI) extraction algorithm based on sliding window brightness consistency is designed and implemented in a Field Programmable Gate Array (FPGA) to improve detection speed. A small spot center extraction algorithm combining distance⁃weighted least⁃square fitting and a Signal⁃to⁃Noise Ratio (SNR)⁃based adaptive weight adjustment mechanism is introduced to enhance the localization robustness of small spots under varying lighting and noise conditions. Experimental results show that the proposed method has achieved a spot center localization error of not more than 0.05 pixels, with a frame rate of 160 frames per second, significantly outperforming traditional methods in processing speed. This method to a great extent meets the high⁃precision real⁃time localization requirements of small spot centers in industrial high⁃speed visual measurement.

image recognition  /  high⁃speed visual measurement  /  small spot centers  /  FPGA  /  center extraction algorithm  /  Gaussian fitting  /  Kalman filtering  /  on⁃line measurement
Yixuan HAN, Doudou GAO, Dengfeng DONG, Bo WANG, Qifan QIU. A high⁃speed subpixel localization approach for small⁃scale spots in industrial vision applications[J]. Metrology & Measurement Technology, 2025 , 45 (6) : 29 -40 . DOI: 10.11823/j.issn.1674-5795.2025.06.02
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doi: 10.11823/j.issn.1674-5795.2025.06.02
  • Receive Date：2025-09-08
  • Online Date：2026-04-09
  • Published：2025-12-28
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  • Received：2025-09-08
  • Revised：2025-09-24
Affiliations
    1Institute of Microelectronics Chinese Academy of Sciences, Beijing100029, China
    2University of Chinese Academy of Sciences, Beijing100049, China
    3College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing211106, China
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https://castjournals.cast.org.cn/joweb/jcjs/EN/10.11823/j.issn.1674-5795.2025.06.02
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