电源学报

Journal of Power Supply ›› 2024, Vol. 22 ›› Issue (6) : 288 - 294. DOI: 10.13234/j.issn.2095-2805.2024.6.288

Power Semiconductor Devices

Study on Influence of High-temperature Gate Bias and Electron Irradiation on Threshold Voltage of SiC MOSFET

Ziyang ZHANG ¹^,² ,
Lin LIANG ¹^,² ,
Hai SHANG ¹^,² ,
Keyan SHENG ¹ ,
Jiang HUANG ¹

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Received	Accepted	Published
2021-12-27	2022-05-19
Issue Date
2025-07-19

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The hierarchy quorum sensing network in Pseudomonas aeruginosa

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