The health monitoring of the IGBT is crucial for the normal operation of the system, and current research mainly focuses on single aging. The combination of multiple aging states can lead to low applicability and misoperation of some monitoring methods. There are still many shortcomings in the research on the determination and differentiation of multiple aging states. Due to the rich information contained in the U_CE spectrum, different aging will have different effects on it. Therefore, a method for determining and distinguishing bond wire aging and gate aging based on U_CE spectrum is proposed. Firstly, the impact of bonding wire and gate aging on the voltage switch waveform is analyzed. Then, fast Fourier transform (FFT) the switch voltage waveform and perform spectral analysis to explore the impact of different aging on the spectrum, and thus make aging judgments and distinctions. Finally, the circuit is constructed for experimental verification and the impact of different operating conditions on the method is analyzed. The experimental results show that both bond wire aging and gate aging can increase the amplitude of the high-frequency band, and the proposed method can effectively distinguish different aging forms.