PDF
Full
Outline
The phenomenon of dynamic avalanche occurring during the IGBT turn-off process is one of the important reasons for its failure. To study the dynamic avalanche failure mechanism of IGBT, the Silvaco software was used to simulate and analyze this mechanism. Through the simulation and analysis of the breakdown mechanism, current density distribution and temperature distribution of dynamic avalanche, it is concluded that dynamic avalanche can generate moving current filaments and dead filaments which are either moving slowly or fixed. However, the failure of the device is caused by the dead filaments formed by dynamic avalanche. The dead filaments will lead to a sharp increase of local temperature in the IGBT, and the IGBT will eventually fail because the local temperature is too high to burn the device. On this basis, the causes of dead filaments are analyzed, and specific measures to prevent the dynamic avalanche failure of IGBT are also put forward.
PDF
384
153
| 科 Family | 属数 Number of genus | 种数 Number of species | 占总种数比例 Percentage of total species (%) | 属 Genus | 种数 Number of species | 占总种数比例 Percentage of total species (%) |
|---|---|---|---|---|---|---|
| 鹅膏菌科Amanitaceae | 2 | 11 | 5.26 | 鹅膏菌属 Amanita | 10 | 4.78 |
| 小菇科 Mycenaceae | 2 | 12 | 5.74 | 丝盖伞属 Inocybe | 5 | 2.39 |
| 多孔菌科 Polyporaceae | 8 | 14 | 6.70 | 蜡蘑属 Laccaria | 5 | 2.39 |
| 红菇科 Russulaceae | 3 | 23 | 11.00 | 小皮伞属 Marasmius | 6 | 2.87 |
| 小菇属 Mycena | 11 | 5.26 | ||||
| 光柄菇属 Pluteus | 5 | 2.39 | ||||
| 红菇属 Russula | 17 | 8.13 | ||||
| 栓菌属 Trametes | 5 | 2.39 |
关闭全屏
No. 86 Xueyuan South Road, Haidian District, Beijing
010-62199257
qkjq@cast.org.cn
Copyright © 2025 China Association for Science and Technology. All rights reserved. For all open access content, the relevant licensing terms apply.
Sponsored by the Office of the Leading Group for Cybersecurity and Informatization of CAST, and supported by Science and Technology Review Publishing House
