Three Ni/NiO samples (G1-G3) were obtained by calcining the precursor NiC
2O
4·2H
2O at different temperatures. The phase purity and crystal structure of the samples was determined by X-ray diffraction (XRD). As shown in Fig. S1 (Supporting informatoin), the precursor was NiC
2O
4·2H
2O, and its crystal structure was consistent with PDF #21-0297. The thermogravimetric (TG) curve in Fig. S2 (Supporting informatoin) was used to optimize the annealing temperature of the precursor. Fig. S3 (Supporting informatoin) shows the XRD patterns of the three samples, demonstrating that they have similar compositions, all of which were Ni/NiO composites. From the peaks of Ni and NiO, the higher the calcination temperature, the more obvious the peak of NiO, while the peak of Ni becomes smaller. Morphological characteristics of sample G2 are determined by scanning electron microscopy (SEM), transmission electron microscopy (TEM), and energy-dispersive X-ray (EDX) spectroscopy, as shown in
Fig. 1. The SEM image (
Fig. 1a) and TEM image (
Fig. 1b) showed a porous cuboid morphology. Fig. S4 (Supporting informatoin) shows that the surface of the precursor is smooth, and the morphology of samples G1 and G3 are similar to the porous structure of sample G2. Because the morphology of sample G1 is not uniform enough, and the morphology of G3 grows and collapses a bit, sample G2 is selected. HRTEM and EDX (
Fig. 1c) were used to further analyze the distribution of Ni and O in the composites, demonstrating uniform distribution of these elements. High resolution transmission electron microscope (HRTEM) image in
Fig. 1d shows that the interplanar spacings of the sample of N-340 are ≈ 0.203, 0.241 nm which represent the (111), (101) lattice planes of Ni and NiO, respectively [
19]. X-ray photoelectron spectroscopy was used to further study the electronic states of the elements on the sample surface. As shown in Fig. S5 (Supporting informatoin), Ni and O are found in the three samples, and it was also confirmed that the elements were in the same oxidation states in the three samples, confirming their similar composition. In addition, the atomic ratio results of Ni and O are shown in Table S1 (Supporting informatoin), and the XPS peak values of the percentages of Ni(0) and Ni(Ⅱ) are calculated by Ni 2p, as shown in Table S2 (Supporting informatoin). It can be speculated that the different phases may be one of the reasons for the good catalytic performance. The peaks at 855.1 eV, 851.8 eV are caused by Ni 2p
3/2, and the peak at 872.3 eV is caused by Ni 2p
1/2. Hence, Ni
2+, Ni
0 exist in the three samples which are from NiO and Ni, consistent with the result of XRD (Fig. S6 in Supporting informatoin). As shown in Fig. S7 (Supporting informatoin), the peak at 530.7 eV is caused by O 1s.