Fig. 1a illustrates the preparation process of hierarchical NiS@ZIS heterostructure. First, a nickel silicate (Ni
3Si
2O
5(OH)
4) coating was grown on the surface of SiO
2 nanospheres in a hydrothermal reaction system containing SiO
2, urea and nickel nitrate (Step I). Next, the Ni
3Si
2O
5(OH)
4 nanospheres were vulcanized by hydrothermal process, producing NiS hollow spheres (Step II). Finally, the hollow NiS@ZIS heterostructure was obtained by growing a layer of ZIS nanosheets on the surface of NiS under 80 ℃ of oil bath (Step III). In the experiment, SiO
2 nanospheres were synthesized according to the reported method [
32,
33]. The Powder X-ray diffraction (XRD) pattern is shown in Fig. S1a (Supporting information). The diffraction peak at 22.02° is consistent with the standard PDF card of SiO
2 (JCPDS No. 29-0085). The field-emission scanning electron microscopy (FESEM) image in Fig. S1b (Supporting information) shows the smooth surface of SiO
2 spheres with average diameter of 400 nm. Nickel silicate (Ni
3Si
2O
5(OH)
4) nanospheres were synthesized
via a hydrothermal reaction [
34], and XRD analysis indicates their successful formation (Fig. S2a in Supporting information). FESEM image shows that the morphology of Ni
3Si
2O
5(OH)
4 is uniform nanospheres coating with nickel silicate thin layer (Fig. S2b in Supporting information). The original spherical shape and size of the SiO
2 templates are retained. To remove the SiO
2 templates and vulcanize the nickel silicate, Ni
3Si
2O
5(OH)
4 nanospheres were dispersed in Na
2S·9H
2O solution, followed by a hydrothermal treatment at 160 ℃ [
34]. After the sulfuration, the coating layer of nickel silicate was translated to NiS while the hollow structure was still retained. As shown in
Fig. 1b, NiS nanospheres have an average diameter of 420 nm. The surfaces are composed of ultra-thin nanosheets. From the broken spheres, one can conclude that the obtained NiS possesses a hollow structure. The corresponding N
2 sorption measurement confirms the presence of mesopores in NiS, with a specific surface area of 19.76 m
2/g (Fig. S3 in Supporting information). XRD pattern in Fig. S4a identifies the formation of NiS mixed phase. All the diffraction peaks belong to the NiS rhomboid phase (
β-NiS, JCPDS No. 12-0041) and NiS hexagonal phase (
α-NiS, JCPDS No. 02-1280), consisting with the previous reports [
35,
36]. Transmission electron microscopy (TEM) image further proves the hollow structure of NiS (
Fig. 1c). The high-resolution TEM (HRTEM) image (Fig. S4b in Supporting information) exhibits clear crystal lattice fringe with an interlayer distance of 0.29 nm, corresponding to (101) crystal plane of NiS.