After characterizing the structure of samples, we explored the phase composition of the three samples.
Fig. 3b compares the X-ray diffraction results of SiO
2, SiO
2@rGO and SiO
2@rGO–Co. As shown in the figure, they all have an obvious roomy peak around 22°, indicating the existence of amorphous SiO
2 [
27]. SiO
2@rGO and SiO
2@rGO–Co both show a diffraction peak matched to the (002) crystal plane of graphene at about 26° [
28]. In addition, there are three diffraction peaks at 44.3°, 51.3° and 76.1° in the XRD pattern of SiO
2@rGO–Co. It has been verified that they are corresponding to the (111), (200) and (220) crystal planes of the Co face-centered cubic structure (JCPDS 15–0806, FCC phase). The diffraction peaks are broad, illustrating that the Co particles are nano-sized [
29]. The XRD pattern again proves the existence of Co nanoparticles, and no other obvious impurity peaks are found. Besides, we used XPS to further characterize the valence states of each element in SiO
2@rGO–Co. As shown in
Fig. 3c, a characteristic peak of Si 2p
3/2 is observed at 102.8 eV, demonstrating that the Si is in the form of Si
4+ [
30]. The Co 2p high-resolution spectrum is displayed in
Fig. 3d. There are two characteristic peaks with a weak intensity that appeared at 780.1 eV and 796.5 eV, corresponding to the 2p
3/2 and 2p
1/2 peaks of Co
2+, respectively [
31-
33]. The partial oxidation of the surface for Co particles exposed to the air environment cause the presence of Co
2+ in the sample. However, the XRD spectrum of SiO
2@rGO–Co shows Co is a simple substance. Therefore, most Co nanoparticles are still in the form of crystalline metal. Raman spectroscopy was performed on the SiO
2@rGO–Co (
Fig. 3e) to analyze the degree of disorder for graphene. The D peak at 1350 cm
−1 and the G peak at 1586 cm
−1 were observed in Raman spectroscopy. Compared with the G peak, the intensity of D peak is greater, which manifests that the rGO becomes more disordered after loading the Co nanoparticles, and the conductivity is better [
12,
34]. This is also consistent with the phenomenon that graphene in the XRD spectrum shows a bun peak with a high background signal intensity. Next, we conducted an ICP-AES test to analyze the content of each component quantitatively in the SiO
2@rGO–Co sample. We list the element mass fractions of Si and Co in Table S1 (Supporting information). According to the data in the table, the content of SiO
2, rGO, and Co in the sample is calculated to be 41.72 wt%, 51.29 wt%, and 6.99 wt%, respectively. Furthermore, we carried out thermogravimetric tests on SiO
2@rGO and SiO
2@rGO–Co in the air to determine the rGO content in the system. The blue curve in
Fig. 3f represents the test result of SiO
2@rGO, in which the content of rGO is 47.21 wt% and the content of SiO
2 is 52.79 wt%. The SiO
2@rGO–Co represented by the red curve has a mass loss of 45.26 wt%. It is slightly different from the rGO content calculated through the ICP test results. This is because the final product of SiO
2@rGO–Co after the thermogravimetric test is SiO
2/Co
3O
4. The weight gain of the oxidation for the Co element offsets the weight loss of carbon decomposition, so that the weight loss reflected by the sample is less than its actual carbon content. We can also observe that the initial weight loss of SiO
2@rGO–Co is slower than that of SiO
2@rGO obviously from
Fig. 3f. This phenomenon also corresponds to the quality compensation effect of the formation of Co
3O
4 on the system.