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Integrated circuit nanotechnology is gradually approaching the physical limit. Therefore, relying on heterogeneous integration technology to continue and expand Moore Law is becoming increasingly important. The vertical interconnection of signals from various integrated chips is achieved through technologies such as through silicon via (TSV) or through glass via (TGV), while high-density interconnection in the horizontal direction can be achieved through rewiring layer (RDL) technology. The article summarizes the comparison between TGV technology and adapter boards, elaborates on the current application status in the field of passive systems and RF 3D integration, analyzes the TGV process capability and the current technical progress of domestic and foreign manufacturers, and explores the existing technical difficulties and future development trends of the TGV.
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集成电路纳米工艺技术正在逐渐逼近其物理极限,因此依靠异质集成技术来延续以及拓展摩尔定律正变得越来越重要。来自不同种类集成芯片的信号垂直互连网络是通过硅通孔(TSV)或者玻璃通孔(TGV)等技术实现,而高密度的水平网络互连可以凭借再布线层(RDL)技术来实现。本文通过综述TGV技术及转接板的对比,阐述了TGV技术在无源系统领域以及射频三维集成领域的应用现状,剖析了TGV工艺能力及目前海内外厂商的技术进度,最后分析了TGV存在的技术瓶颈和未来的发展趋势。
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傅显惠 1995年生,硕士,工程师。
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傅显惠 1995年生,硕士,工程师。
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景翠 1985年生,硕士,研究员。
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景翠 1985年生,硕士,研究员。
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电子与封装,
2021,
21(9): 32-42., articleTitle=射频系统2.5D/3D封装结构的研究进展, refAbstract=null), Reference(id=1239263357681849323, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2021, volume=21, issue=9, pageStart=32, pageEnd=42, url=null, language=null, rfNumber=[1], rfOrder=1, authorNames=WANG Haojie, CUI Bifeng, WANG Qidong, journalName=Electronics and Packaging, refType=null, unstructuredReference=
WANG Haojie,
CUI Bifeng,
WANG Qidong, et al. Research progress of RF system 2.5D/3D package structure[J].
Electronics and Packaging,
2021,
21(9): 32-42., articleTitle=Research progress of RF system 2.5D/3D package structure, refAbstract=null), Reference(id=1239263357782512623, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[2], rfOrder=2, authorNames=蔡旭东, journalName=null, refType=null, unstructuredReference=蔡旭东. 基于TGV技术的基片集成波导毫米波封装滤波天线研究[D]. 成都: 电子科技大学,
2024., articleTitle=基于TGV技术的基片集成波导毫米波封装滤波天线研究, refAbstract=null), Reference(id=1239263357866398709, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2016, volume=null, issue=null, pageStart=1, pageEnd=6, url=null, language=null, rfNumber=[3], rfOrder=3, authorNames=SHOREY A B, LU R, journalName=null, refType=null, unstructuredReference=
SHOREY A B,
LU R. Progress and application of through glass via (TGV) technology[C]//2016 Pan Pacific Microelectronics Symposium (Pan Pacific). New York:IEEE,
2016: 1-6., articleTitle=Progress and application of through glass via (TGV) technology, refAbstract=null), Reference(id=1239263357946090492, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=null, issue=null, pageStart=1, pageEnd=5, url=null, language=null, rfNumber=[4], rfOrder=4, authorNames=XU C, LI S, HU Z, journalName=null, refType=null, unstructuredReference=
XU C,
LI S,
HU Z, et al. A New method of TGVs for fast filling of metal paste[C]//2024 25th International Conference on Electronic Packaging Technology (ICEPT). New York: IEEE,
2024: 1-5., articleTitle=A New method of TGVs for fast filling of metal paste, refAbstract=null), Reference(id=1239263358017393662, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2017, volume=null, issue=null, pageStart=1, pageEnd=6, url=null, language=null, rfNumber=[5], rfOrder=5, authorNames=KURAMOCHI S, YUN H, journalName=null, refType=null, unstructuredReference=
KURAMOCHI S,
YUN H. 3D IPD on thru glass via substrate using panel manufacturing technology for RF applications[C]//2017 Pan Pacific Microelectronics Symposium (Pan Pacific). New York: IEEE,
2017: 1-6., articleTitle=3D IPD on thru glass via substrate using panel manufacturing technology for RF applications, refAbstract=null), Reference(id=1239263358118055942, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=15, issue=3, pageStart=356, pageEnd=null, url=null, language=null, rfNumber=[6], rfOrder=6, authorNames=GAO Yahao, PENG Simin, LIU Xiangming, journalName=Micromachines, refType=null, unstructuredReference=
GAO Yahao,
PENG Simin,
LIU Xiangming, et al. A sensitivity-enhanced vertical-resonant MEMS electric field sensor based on TGV technology[J].
Micromachines,
2024,
15(3): 356., articleTitle=A sensitivity-enhanced vertical-resonant MEMS electric field sensor based on TGV technology, refAbstract=null), Reference(id=1239263358285828111, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[7], rfOrder=7, authorNames=王凌岳, journalName=null, refType=null, unstructuredReference=王凌岳. 基于TGV技术的SIW滤波器的小型化研究[D]. 成都: 电子科技大学,
2024., articleTitle=基于TGV技术的SIW滤波器的小型化研究, refAbstract=null), Reference(id=1239263358386491412, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2012, volume=null, issue=null, pageStart=808, pageEnd=810, url=null, language=null, rfNumber=[8], rfOrder=8, authorNames=SUN X, SUN Y, ZHANG J, journalName=null, refType=null, unstructuredReference=
SUN X,
SUN Y,
ZHANG J, et al. Design of RF MEMS phase shifter packaging based on through glass via(TGV) interposer[C]//2012 13th International Conference on Electronic Packaging Technology & High Density Packaging. New York: IEEE,
2012: 808-810., articleTitle=Design of RF MEMS phase shifter packaging based on through glass via(TGV) interposer, refAbstract=null), Reference(id=1239263358482960410, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2023, volume=44, issue=9, pageStart=1535, pageEnd=1538, url=null, language=null, rfNumber=[9], rfOrder=9, authorNames=HU Z, ZHOU Q, MA H, journalName=IEEE Electron Device Letters, refType=null, unstructuredReference=
HU Z,
ZHOU Q,
MA H, et al. Development of low cost glass based deep trench capacitor for 3D packaging[J].
IEEE Electron Device Letters,
2023,
44(9): 1535-1538., articleTitle=Development of low cost glass based deep trench capacitor for 3D packaging, refAbstract=null), Reference(id=1239263358592012317, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2022, volume=65, issue=9, pageStart=2031, pageEnd=2050, url=null, language=null, rfNumber=[10], rfOrder=10, authorNames=ZHAO H, CHEN M, PENG Y, journalName=Science China-Technological Sciences, refType=null, unstructuredReference=
ZHAO H,
CHEN M,
PENG Y, et al. TXV Technology:The cornerstone of 3D system-inpackaging[J].
Science China-Technological Sciences,
2022,
65(9): 2031-2050., articleTitle=TXV Technology:The cornerstone of 3D system-inpackaging, refAbstract=null), Reference(id=1239263358713647139, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=24, issue=3, pageStart=101, pageEnd=102, url=null, language=null, rfNumber=[11], rfOrder=11, authorNames=吉力小兵, 张继华, journalName=电子与封装, refType=null, unstructuredReference=吉力小兵, 张继华. 玻璃基三维集成技术领域系列研究新进展[J].
电子与封装,
2024,
24(3): 101-102., articleTitle=玻璃基三维集成技术领域系列研究新进展, refAbstract=null), Reference(id=1239263358814310442, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=54, issue=2, pageStart=298, pageEnd=303, url=null, language=null, rfNumber=[12], rfOrder=12, authorNames=黄根信, 黄春跃, 李鹏, journalName=微电子学, refType=null, unstructuredReference=黄根信, 黄春跃, 李鹏, 等. 3D封装玻璃通孔高频特性分析与优化[J].
微电子学,
2024,
54(2): 298-303., articleTitle=3D封装玻璃通孔高频特性分析与优化, refAbstract=null), Reference(id=1239263358898196528, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=54, issue=2, pageStart=298, pageEnd=303, url=null, language=null, rfNumber=[12], rfOrder=13, authorNames=HUANG Genxin, HUANG Chunyue, LI Peng, journalName=Microelectronics, refType=null, unstructuredReference=
HUANG Genxin,
HUANG Chunyue,
LI Peng, et al. High-frequency characteristic analysis and optimization of 3D-packaging through glass via[J].
Microelectronics,
2024,
54(2): 298-303., articleTitle=High-frequency characteristic analysis and optimization of 3D-packaging through glass via, refAbstract=null), Reference(id=1239263359007248439, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2023, volume=23, issue=3, pageStart=14, pageEnd=24, url=null, language=null, rfNumber=[13], rfOrder=14, authorNames=钟毅, 江小帆, 喻甜, journalName=电子与封装, refType=null, unstructuredReference=钟毅, 江小帆, 喻甜, 等. 芯片三维互连技术及异质集成研究进展[J].
电子与封装,
2023,
23(3): 14-24., articleTitle=芯片三维互连技术及异质集成研究进展, refAbstract=null), Reference(id=1239263359149854781, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2023, volume=23, issue=3, pageStart=14, pageEnd=24, url=null, language=null, rfNumber=[13], rfOrder=15, authorNames=ZHONG Yi, JIANG Xiaofan, YU Tian, journalName=null, refType=null, unstructuredReference=
ZHONG Yi,
JIANG Xiaofan,
YU Tian, et al. Electronics and Packaging,
2023,
23(3): 14-24., articleTitle=Electronics and Packaging, refAbstract=null), Reference(id=1239263359254712387, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2022, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[14], rfOrder=16, authorNames=赵瑾, journalName=null, refType=null, unstructuredReference=赵瑾. 玻璃转接板2.5D封装技术工艺及可靠性研究[D]. 北京: 北京工业大学,
2022., articleTitle=玻璃转接板2.5D封装技术工艺及可靠性研究, refAbstract=null), Reference(id=1239263359338598472, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2022, volume=28, issue=6, pageStart=46, pageEnd=65, url=null, language=null, rfNumber=[15], rfOrder=17, authorNames=纪执敬, 凌惠琴, 吴培林, journalName=电化学, refType=null, unstructuredReference=纪执敬, 凌惠琴, 吴培林, 等. 玻璃通孔三维互连镀铜填充技术发展现状[J].
电化学,
2022,
28(6): 46-65., articleTitle=玻璃通孔三维互连镀铜填充技术发展现状, refAbstract=null), Reference(id=1239263359426678860, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2022, volume=28, issue=6, pageStart=46, pageEnd=65, url=null, language=null, rfNumber=[15], rfOrder=18, authorNames=JI Zhijing, LING Huiqin, WU Peilin, journalName=Electrochem, refType=null, unstructuredReference=
JI Zhijing,
LING Huiqin,
WU Peilin, et al. Development status of copper electroplating filling technology in through glass via for 3D interconnections[J].
Electrochem,
2022,
28(6):46-65., articleTitle=Development status of copper electroplating filling technology in through glass via for 3D interconnections, refAbstract=null), Reference(id=1239263359544119380, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2018, volume=null, issue=null, pageStart=19, pageEnd=22, url=null, language=null, rfNumber=[16], rfOrder=19, authorNames=JUN O, FUSAO T, TAKASHI K, journalName=null, refType=null, unstructuredReference=
JUN O,
FUSAO T,
TAKASHI K. Development of the integrated passive device using through-glass-via substrate [C]//ICEP-IAAC2018. The Japan Institute of Electronics Packaging. New York: IEEE,
2018: 19-22., articleTitle=Development of the integrated passive device using through-glass-via substrate, refAbstract=null), Reference(id=1239263359648976990, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=null, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[17], rfOrder=20, authorNames=中国电子科技集团公司第十四研究所, journalName=null, refType=null, unstructuredReference=中国电子科技集团公司第十四研究所. 一种三维堆叠玻璃TGV基板开关滤波器组: 202311038276.4[P].2024-04-23., articleTitle=一种三维堆叠玻璃TGV基板开关滤波器组, refAbstract=null), Reference(id=1239263359728668768, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2013, volume=null, issue=null, pageStart=348, pageEnd=352, url=null, language=null, rfNumber=[18], rfOrder=21, authorNames=TAKAHASHI S, HORIUCHI K, TATSUKOSHI K, journalName=null, refType=null, unstructuredReference=
TAKAHASHI S,
HORIUCHI K,
TATSUKOSHI K, et al. Development of through glass via (TGV) formation technology using electrical discharging for 2.5/3D integrated packaging[C]//2013 IEEE 63rd Electronic Components and Technology Conference. New York:IEEE,
2013: 348-352., articleTitle=Development of through glass via (TGV) formation technology using electrical discharging for 2.5/3D integrated packaging, refAbstract=null), Reference(id=1239263359829332071, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2014, volume=null, issue=null, pageStart=601, pageEnd=605, url=null, language=null, rfNumber=[19], rfOrder=22, authorNames=WEI T, WANG Q, CAI J, journalName=null, refType=null, unstructuredReference=
WEI T,
WANG Q,
CAI J,et a1. Performance and reliability study of TGV interposer in 3D integration[C] //Electronics Packaging Technology Conference(EPTC), IEEE 16th. New York: IEEE.
2014: 601-605., articleTitle=Performance and reliability study of TGV interposer in 3D integration, refAbstract=null), Reference(id=1239263359963549806, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2012, volume=11, issue=2, pageStart=143, pageEnd=152, url=null, language=null, rfNumber=[20], rfOrder=23, authorNames=SENTHILKUMAR T, AJIBOYE T K, journalName=Journal of Minerals & Materials Characterization & Engineering, refType=null, unstructuredReference=
SENTHILKUMAR T,
AJIBOYE T K. Effect of heat treatment processes on the mechanical properties of medium carbon steel[J].
Journal of Minerals & Materials Characterization & Engineering,
2012,
11(2): 143-152., articleTitle=Effect of heat treatment processes on the mechanical properties of medium carbon steel, refAbstract=null), Reference(id=1239263360055824497, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2022, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[21], rfOrder=24, authorNames=周静, journalName=null, refType=null, unstructuredReference=周静. 基于TGV技术的带通滤波器研究[D]. 成都: 电子科技大学,
2022., articleTitle=基于TGV技术的带通滤波器研究, refAbstract=null), Reference(id=1239263360164876412, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2022, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[22], rfOrder=25, authorNames=陈雨哲, journalName=null, refType=null, unstructuredReference=陈雨哲. 基于TGV技术的芯片电感研究[D]. 成都: 电子科技大学,
2022., articleTitle=基于TGV技术的芯片电感研究, refAbstract=null), Reference(id=1239263360315871369, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2021, volume=21, issue=7, pageStart=20, pageEnd=25, url=null, language=null, rfNumber=[23], rfOrder=26, authorNames=谢迪, 李浩, 王从香, journalName=电子与封装, refType=null, unstructuredReference=谢迪, 李浩, 王从香, 等. 基于TGV工艺的三维集成封装技术研究[J].
电子与封装,
2021,
21(7): 20-25., articleTitle=基于TGV工艺的三维集成封装技术研究, refAbstract=null), Reference(id=1239263360378785933, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2021, volume=21, issue=7, pageStart=20, pageEnd=25, url=null, language=null, rfNumber=[23], rfOrder=27, authorNames=XIE Di, LI Hao, WANG Congxiang, journalName=Electronics and Packaging, refType=null, unstructuredReference=
XIE Di,
LI Hao,
WANG Congxiang, et al. Study on technology of through glass via for 3D integration package[J].
Electronics and Packaging,
2021,
21(7): 20-25., articleTitle=Study on technology of through glass via for 3D integration package, refAbstract=null), Reference(id=1239263360458477714, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2023, volume=23, issue=10, pageStart=96, pageEnd=null, url=null, language=null, rfNumber=[24], rfOrder=28, authorNames=胡芝慧, 钟毅, 窦宇航, journalName=电子与封装, refType=null, unstructuredReference=胡芝慧, 钟毅, 窦宇航, 等. 面向芯片三维封装的低成本玻璃基深沟电容技术[J].
电子与封装,
2023,
23(10): 96., articleTitle=面向芯片三维封装的低成本玻璃基深沟电容技术, refAbstract=null), Reference(id=1239263360559141015, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2021, volume=16, issue=5, pageStart=434, pageEnd=437, url=null, language=null, rfNumber=[25], rfOrder=29, authorNames=卢茜, 张 剑, 王文博, journalName=中国电子科学研究报, refType=null, unstructuredReference=卢茜,张 剑,王文博,等. 玻璃基三维集成技术在宽带射频领域的应用[J].
中国电子科学研究报,
2021,
16(5):434-437., articleTitle=玻璃基三维集成技术在宽带射频领域的应用, refAbstract=null), Reference(id=1239263360676581529, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2021, volume=16, issue=5, pageStart=434, pageEnd=437, url=null, language=null, rfNumber=[25], rfOrder=30, authorNames=LU Qian, ZHANG Jian, WANG Wen-bo, journalName=Journal of CAEIT, refType=null, unstructuredReference=
LU Qian,
ZHANG Jian,
WANG Wen-bo,et al. Application of the glass based 3D Iintegration technology in broadband RF field[J].
Journal of CAEIT,
2021,
16(5):434-437., articleTitle=Application of the glass based 3D Iintegration technology in broadband RF field, refAbstract=null), Reference(id=1239263360781439137, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2023, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[26], rfOrder=31, authorNames=陈亚东, journalName=null, refType=null, unstructuredReference=陈亚东. 基于玻璃基工艺的射频滤波器的设计[D]. 南京: 南京邮电大学,
2023., articleTitle=基于玻璃基工艺的射频滤波器的设计, refAbstract=null), Reference(id=1239263360882102440, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2016, volume=null, issue=null, pageStart=62, pageEnd=67, url=null, language=null, rfNumber=[27], rfOrder=32, authorNames=LIU Z, FU H, HUNEGNAW S, journalName=null, refType=null, unstructuredReference=
LIU Z,
FU H,
HUNEGNAW S, et al. Electroless and electrolytic copper plating of glass interposer combined with metal oxide adhesion layer for manufacturing 3D RF devices[C]//2016 IEEE 66th Electronic Components and Technology Conference (ECTC). New York: IEEE,
2016: 62-67., articleTitle=Electroless and electrolytic copper plating of glass interposer combined with metal oxide adhesion layer for manufacturing 3D RF devices, refAbstract=null), Reference(id=1239263360970182827, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2019, volume=null, issue=null, pageStart=1952, pageEnd=1957, url=null, language=null, rfNumber=[28], rfOrder=33, authorNames=IWAI T, SAKAI T, FUJISAKI H, journalName=null, refType=null, unstructuredReference=
IWAI T,
SAKAI T,
FUJISAKI H,et a1. Multilayer glass substrate with high density via structure for all inorganic multi-chip module[C]//Proceedings of 69th Electronic Components and Technology Conference(ECTC). New York: IEEE,
2019: 1952-1957., articleTitle=Multilayer glass substrate with high density via structure for all inorganic multi-chip module, refAbstract=null), Reference(id=1239263361125372081, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=null, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[29], rfOrder=34, authorNames=中国电子科技集团公司第五十八研究所, journalName=null, refType=null, unstructuredReference=中国电子科技集团公司第五十八研究所. 基于射频信号传输的扇出型封装结构及制造方法: 201710758205.X[P]. 2019-09-03., articleTitle=基于射频信号传输的扇出型封装结构及制造方法, refAbstract=null), Reference(id=1239263361209258168, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2021, volume=21, issue=4, pageStart=5, pageEnd=17, url=null, language=null, rfNumber=[30], rfOrder=35, authorNames=陈力, 杨晓锋, 于大全, journalName=电子与封装, refType=null, unstructuredReference=陈力, 杨晓锋, 于大全. 玻璃通孔技术研究进展[J].
电子与封装,
2021,
21(4): 5-17., articleTitle=玻璃通孔技术研究进展, refAbstract=null), Reference(id=1239263361280561340, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2021, volume=21, issue=4, pageStart=5, pageEnd=17, url=null, language=null, rfNumber=[30], rfOrder=36, authorNames=CHEN Li, YANG Xiaofeng, YU Daquan, journalName=Electronics and Packaging, refType=null, unstructuredReference=
CHEN Li,
YANG Xiaofeng,
YU Daquan. Development of through glass via technology[J].
Electronics and Packaging,
2021,
21(4): 5-17., articleTitle=Development of through glass via technology, refAbstract=null), Reference(id=1239263361356058818, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2019, volume=27, issue=18, pageStart=97, pageEnd=101, url=null, language=null, rfNumber=[31], rfOrder=37, authorNames=郭燕慧, 张国华, 王剑峰, journalName=电子设计工程, refType=null, unstructuredReference=郭燕慧, 张国华, 王剑峰. 基于TGV的射频无源器件的三维集成[J].
电子设计工程,
2019,
27(18): 97-101., articleTitle=基于TGV的射频无源器件的三维集成, refAbstract=null), Reference(id=1239263361431556295, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2019, volume=27, issue=18, pageStart=97, pageEnd=101, url=null, language=null, rfNumber=[31], rfOrder=38, authorNames=GUO Yanhui, ZHANG Guohua, WANG Jianfen, journalName=Electronic Design Engineering, refType=null, unstructuredReference=
GUO Yanhui,
ZHANG Guohua,
WANG Jianfen. 3D integration of RF passive components based on TGV[J].
Electronic Design Engineering,
2019,
27(18): 97-101., articleTitle=3D integration of RF passive components based on TGV, refAbstract=null), Reference(id=1239263361511248076, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=152, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[32], rfOrder=39, authorNames=HUANG Y, TAO Z, CAI X, journalName=Microelectronics Journal, refType=null, unstructuredReference=
HUANG Y,
TAO Z,
CAI X, et al. Electroless silver plating on through-glass via (TGV) as an adhesive and conducting layer[J].
Microelectronics Journal,
2024,
152:106371., articleTitle=Electroless silver plating on through-glass via (TGV) as an adhesive and conducting layer, refAbstract=null), Reference(id=1239263361586745554, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[33], rfOrder=40, authorNames=李世中, journalName=null, refType=null, unstructuredReference=李世中. 基于TGV工艺和SiP技术的射频T/R组件设计与仿真[D]. 成都: 电子科技大学,
2024., articleTitle=基于TGV工艺和SiP技术的射频T/R组件设计与仿真, refAbstract=null), Reference(id=1239263361683214549, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2019, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[34], rfOrder=41, authorNames=桑吉飞, journalName=null, refType=null, unstructuredReference=桑吉飞. 基于TGV技术的集成无源器件及其应用[D].宁波: 宁波大学,
2019., articleTitle=基于TGV技术的集成无源器件及其应用, refAbstract=null), Reference(id=1239263361859375323, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2019, volume=271, issue=null, pageStart=542, pageEnd=553, url=null, language=null, rfNumber=[35], rfOrder=42, authorNames=ARAB J, MISHRA D K, KANNOJIA H K, journalName=Journal of Materials Processing Technology, refType=null, unstructuredReference=
ARAB J,
MISHRA D K,
KANNOJIA H K, et al. Fabrication of multiple through-holes in non-conductive materials by electrochemical discharge machining for RF MEMS packaging[J].
Journal of Materials Processing Technology,
2019,
271: 542-553., articleTitle=Fabrication of multiple through-holes in non-conductive materials by electrochemical discharge machining for RF MEMS packaging, refAbstract=null), Reference(id=1239263361972621538, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=null, issue=10, pageStart=6, pageEnd=9, url=null, language=null, rfNumber=[36], rfOrder=43, authorNames=«股市动态分析»研究部, journalName=股市动态分析, refType=null, unstructuredReference=«股市动态分析»研究部. 玻璃通孔(TGV)技术的前景及机遇[J].
股市动态分析,
2024(10): 6-9., articleTitle=玻璃通孔(TGV)技术的前景及机遇, refAbstract=null), Reference(id=1239263362106839271, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2022, volume=584, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[37], rfOrder=44, authorNames=BAJPAI V K, MISHRA D K, DIXIT P, journalName=Applied Surface Science, refType=null, unstructuredReference=
BAJPAI V K,
MISHRA D K,
DIXIT P. Fabrication of Through-glass Vias (TGV) based 3D microstructures in glass substrate by a lithography-free process for MEMS applications[J].
Applied Surface Science,
2022,
584:152494., articleTitle=Fabrication of Through-glass Vias (TGV) based 3D microstructures in glass substrate by a lithography-free process for MEMS applications, refAbstract=null), Reference(id=1239263362228474095, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=291, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[38], rfOrder=45, authorNames=WU L, WANG L, WANG J, journalName=Microelectronic Engineering, refType=null, unstructuredReference=
WU L,
WANG L,
WANG J. Fractures of low-k materials in a RF package with integrated passive device based on TGV[J].
Microelectronic Engineering,
2024,
291:112195., articleTitle=Fractures of low-k materials in a RF package with integrated passive device based on TGV, refAbstract=null), Reference(id=1239263362303971571, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2016, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[39], rfOrder=46, authorNames=林来存, journalName=null, refType=null, unstructuredReference=林来存. 三维玻璃通孔(TGV)关键工艺及无源器件集成研究[D]. 北京: 中国科学院大学,
2016., articleTitle=三维玻璃通孔(TGV)关键工艺及无源器件集成研究, refAbstract=null), Reference(id=1239263362387857652, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2018, volume=null, issue=1, pageStart=000680, pageEnd=000684, url=null, language=null, rfNumber=[40], rfOrder=47, authorNames=PARMAR R, ZHANG J, KEIMEL C, journalName=null, refType=null, unstructuredReference=
PARMAR R,
ZHANG J,
KEIMEL C. Glass packaging for RF MEMS[C]//International Symposium on Microelectronics. Pittsburgh: International Microelectronics Assembly and Packaging Society,
2018(1): 000680-000684., articleTitle=Glass packaging for RF MEMS, refAbstract=null), Reference(id=1239263362492715255, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2023, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[41], rfOrder=48, authorNames=周冠宇, journalName=null, refType=null, unstructuredReference=周冠宇. 玻璃基三维电感研究[D]. 成都: 电子科技大学,
2023., articleTitle=玻璃基三维电感研究, refAbstract=null), Reference(id=1239263362568212731, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2013, volume=null, issue=null, pageStart=1385, pageEnd=1391, url=null, language=null, rfNumber=[42], rfOrder=49, authorNames=KIM C, YOON Y K, journalName=null, refType=null, unstructuredReference=
KIM C,
YOON Y K. High frequency characterization and analytical modeling of through glass via (TGV) for 3D thin-film interposer and MEMS packaging[C]//2013 IEEE 63rd Electronic Components and Technology Conference. New York: IEEE,
2013: 1385-1391., articleTitle=High frequency characterization and analytical modeling of through glass via (TGV) for 3D thin-film interposer and MEMS packaging, refAbstract=null), Reference(id=1239263362664681726, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2016, volume=26, issue=3/4, pageStart=1157, pageEnd=1171, url=null, language=null, rfNumber=[43], rfOrder=50, authorNames=CHO S, SUNDARAM V, RAO T, journalName=International Joumal of Numerical Methods for Heat & Fluid Flow, refType=null, unstructuredReference=
CHO S,
SUNDARAM V,
RAO T, et al. Multi-scale thermal modeling of glass interposer for mobile electronics application[J].
International Joumal of Numerical Methods for Heat & Fluid Flow,
2016,
26(3/4): 1157-1171., articleTitle=Multi-scale thermal modeling of glass interposer for mobile electronics application, refAbstract=null), Reference(id=1239263362756956419, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2019, volume=null, issue=null, pageStart=1, pageEnd=4, url=null, language=null, rfNumber=[44], rfOrder=51, authorNames=ZHANG Z Y, DING Y T, CHEN Z M, journalName=null, refType=null, unstructuredReference=
ZHANG Z Y,
DING Y T,
CHEN Z M, et al. Design and evaluation of a novel and ultra-compact fully-TGV-based-self-shielding bandpass filter for 5G applications[C]//International 3D Systems Integration Conference(3DIC), 2019. New York: IEEE,
2019: 1-4., articleTitle=Design and evaluation of a novel and ultra-compact fully-TGV-based-self-shielding bandpass filter for 5G applications, refAbstract=null), Reference(id=1239263362845036810, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2023, volume=null, issue=null, pageStart=1, pageEnd=5, url=null, language=null, rfNumber=[45], rfOrder=52, authorNames=XIANG J, CHEN H, WANG H, journalName=null, refType=null, unstructuredReference=
XIANG J,
CHEN H,
WANG H, et al. Reliability study of through glass vias under high current density[C]//2023 24th International Conference on Electronic Packaging Technology (ICEPT). New York: IEEE,
2023: 1-5., articleTitle=Reliability study of through glass vias under high current density, refAbstract=null), Reference(id=1239263362941505805, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2023, volume=null, issue=null, pageStart=01, pageEnd=03, url=null, language=null, rfNumber=[46], rfOrder=53, authorNames=LI W, WANG L, ZHANG J, journalName=null, refType=null, unstructuredReference=
LI W,
WANG L,
ZHANG J, et al. SIW bandpass filter based on tgv technology for millimeter-wave wideband communications[C]//2023 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP). New York: IEEE,
2023: 01-03., articleTitle=SIW bandpass filter based on tgv technology for millimeter-wave wideband communications, refAbstract=null), Reference(id=1239263363021197585, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2013, volume=null, issue=null, pageStart=348, pageEnd=352, url=null, language=null, rfNumber=[47], rfOrder=54, authorNames=TAKAHASHI S, HORIUCHI K, TATSUKOSHI K, journalName=null, refType=null, unstructuredReference=
TAKAHASHI S,
HORIUCHI K,
TATSUKOSHI K, et al. Development of through glass via (TGV) formation technology using electrical discharging for 2.5/3D integrated packaging[C]// Proceedings - Electronic Components and Technology Conference. New York: IEEE,
2013: 348–352., articleTitle=Development of through glass via (TGV) formation technology using electrical discharging for 2.5/3D integrated packaging, refAbstract=null), Reference(id=1239263363096695061, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2021, volume=120, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[48], rfOrder=55, authorNames=OKORO C, JAYARAMAN S, POLLARD S, journalName=Microelectronics Reliability, refType=null, unstructuredReference=
OKORO C,
JAYARAMAN S,
POLLARD S. Understanding and eliminating thermomechanically induced radial cracks in fully metallized through-glass via(TGV) substrates[J].
Microelectronics Reliability,
2021,
120: 114092., articleTitle=Understanding and eliminating thermomechanically induced radial cracks in fully metallized through-glass via(TGV) substrates, refAbstract=null), Reference(id=1239263363172192538, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=161, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[49], rfOrder=56, authorNames=LAI Y, PAN K, PARK S, journalName=Microelectronics Reliability, refType=null, unstructuredReference=
LAI Y,
PAN K,
PARK S. Thermo-mechanical reliability of glass substrate and Through Glass Vias (TGV): A comprehensive review[J].
Microelectronics Reliability,
2024,
161: 115477., articleTitle=Thermo-mechanical reliability of glass substrate and Through Glass Vias (TGV): A comprehensive review, refAbstract=null), Reference(id=1239263363247690014, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=42, issue=2, pageStart=156, pageEnd=null, url=null, language=null, rfNumber=[50], rfOrder=57, authorNames=SEOK B C, JUNG J P, journalName=Journal of Welding and Joining, refType=null, unstructuredReference=
SEOK B C,
JUNG J P. Recent progress of TGV technology for high performance semiconductor packaging[J].
Journal of Welding and Joining,
2024,
42(2): 156., articleTitle=Recent progress of TGV technology for high performance semiconductor packaging, refAbstract=null), Reference(id=1239263363339964708, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2025, volume=192, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[51], rfOrder=58, authorNames=WANG M, LIU L, HU Y, journalName=Materials Science in Semiconductor Processing, refType=null, unstructuredReference=
WANG M,
LIU L,
HU Y, et al. Research on high inductance and quality factor embedded 3D inductors using ultra-high aspect ratio TGV technology[J].
Materials Science in Semiconductor Processing,
2025,
192: 109388., articleTitle=Research on high inductance and quality factor embedded 3D inductors using ultra-high aspect ratio TGV technology, refAbstract=null), Reference(id=1239263363415462185, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=34, issue=3, pageStart=271, pageEnd=274, url=null, language=null, rfNumber=[52], rfOrder=59, authorNames=WANG L, CHEN H, LI W, journalName=IEEE Microwave and Wireless Technology Letters, refType=null, unstructuredReference=
WANG L,
CHEN H,
LI W, et al. A low-loss slow wave SIW bandpass filter with blind via-holes using TGVtechnology[J].
IEEE Microwave and Wireless Technology Letters,
2024,
34(3): 271-274., articleTitle=A low-loss slow wave SIW bandpass filter with blind via-holes using TGVtechnology, refAbstract=null), Reference(id=1239263363495153965, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=45, issue=4, pageStart=681, pageEnd=684, url=null, language=null, rfNumber=[53], rfOrder=60, authorNames=WANG L, CHEN H, LI W, journalName=IEEE Electron Device Letters, refType=null, unstructuredReference=
WANG L,
CHEN H,
LI W, et al. Slow-wave substrate integrated waveguide with low loss and miniaturized dimensions using TGV technology[J].
IEEE Electron Device Letters,
2024,
45(4): 681-684., articleTitle=Slow-wave substrate integrated waveguide with low loss and miniaturized dimensions using TGV technology, refAbstract=null), Reference(id=1239263363600011570, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=31, issue=4, pageStart=37, pageEnd=46, url=null, language=null, rfNumber=[54], rfOrder=61, authorNames=SEON S H, CHEON S G, JUNG J P, journalName=Journal of the Microelectronics and Packaging Society, refType=null, unstructuredReference=
SEON S H,
CHEON S G,
JUNG J P. Recent research trends in TGV and Cu-filling for AI semiconductor packaging[J].
Journal of the Microelectronics and Packaging Society,
2024,
31(4): 37-46., articleTitle=Recent research trends in TGV and Cu-filling for AI semiconductor packaging, refAbstract=null), Reference(id=1239263363679703352, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2025, volume=34, issue=3, pageStart=252, pageEnd=259, url=null, language=null, rfNumber=[55], rfOrder=62, authorNames=HU Z R, WANG H, LI S, journalName=Journal of Microelectromechanical Systems, refType=null, unstructuredReference=
HU Z R,
WANG H,
LI S, et al. Wafer-level fabrication of FAIMS chips based on TGV technology[J].
Journal of Microelectromechanical Systems,
2025,
34(3): 252-259., articleTitle=Wafer-level fabrication of FAIMS chips based on TGV technology, refAbstract=null), Reference(id=1239263363759395127, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, doi=null, pmid=null, pmcid=null, year=2024, volume=33, issue=5, pageStart=610, pageEnd=619, url=null, language=null, rfNumber=[56], rfOrder=63, authorNames=QIAN H L, CHEN L L, DAI H T, journalName=Journal of Microelectromechanical Systems, refType=null, unstructuredReference=
QIAN H L,
CHEN L L,
DAI H T, et al. Glass-based micro-hotplate with low power consumption and TGVstructure through anodic bonding and glass thermal reflow[J].
Journal of Microelectromechanical Systems,
2024,
33(5): 610-619., articleTitle=Glass-based micro-hotplate with low power consumption and TGVstructure through anodic bonding and glass thermal reflow, refAbstract=null)], funds=null, companyList=[AuthorCompany(id=1239263352183116562, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, xref=null, ext=[AuthorCompanyExt(id=1239263352195699475, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, companyId=1239263352183116562, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=Beijing Research Institute of Telemetry, Beijing 100094, China), AuthorCompanyExt(id=1239263352204088084, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, companyId=1239263352183116562, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=北京遥测技术研究所 北京 100094)])], figs=[ArticleFig(id=1239263354150245172, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 1, caption=
Three dimensional heterogeneous integration and interconnect structure, figureFileSmall=jswIv8gv+I1B1Ko22PqusQ==, figureFileBig=vkfEhjJtLbWjcQxaCzTPRA==, tableContent=null), ArticleFig(id=1239263354229936951, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图1, caption=
三维异质集成及互连结构, figureFileSmall=jswIv8gv+I1B1Ko22PqusQ==, figureFileBig=vkfEhjJtLbWjcQxaCzTPRA==, tableContent=null), ArticleFig(id=1239263354326405946, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 2, caption=
The application of TXV technology in 3D packaging systems, figureFileSmall=MNhOcqf6u8qC8aAwCn70Iw==, figureFileBig=vk+9GqtYT3X6C98xd3ti5g==, tableContent=null), ArticleFig(id=1239263354393514812, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图2, caption=
TXV技术在3D封装系统中的应用, figureFileSmall=MNhOcqf6u8qC8aAwCn70Iw==, figureFileBig=vk+9GqtYT3X6C98xd3ti5g==, tableContent=null), ArticleFig(id=1239263354456429374, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 3, caption=
System level packaging using glass interlayer, figureFileSmall=1Vd01bdr7azi/sAWUmKdfg==, figureFileBig=Cwn6DePFOZ3shJReoP1JIA==, tableContent=null), ArticleFig(id=1239263354548704065, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图3, caption=
采用玻璃中介层的系统级封装, figureFileSmall=1Vd01bdr7azi/sAWUmKdfg==, figureFileBig=Cwn6DePFOZ3shJReoP1JIA==, tableContent=null), ArticleFig(id=1239263354624201540, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 4, caption=
TGV adapter plate process fiow, figureFileSmall=dQJ8zIwr3kg5QOeU+N9N2g==, figureFileBig=yvnm+Na8SVtYM5p0zbO5aA==, tableContent=null), ArticleFig(id=1239263354716476232, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图4, caption=
TGV转接板工艺流程, figureFileSmall=dQJ8zIwr3kg5QOeU+N9N2g==, figureFileBig=yvnm+Na8SVtYM5p0zbO5aA==, tableContent=null), ArticleFig(id=1239263354808750922, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 5, caption=
The influence of copper structure and steam chamber heat dissipation plate on heat dissipation performance, figureFileSmall=LADnZpw97+BiUbiD3obq1Q==, figureFileBig=aaq6Qfh+UmrTe0qL1fGzCA==, tableContent=null), ArticleFig(id=1239263354917802828, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图5, caption=
铜结构以及蒸汽腔均热板对散热性能的影响, figureFileSmall=LADnZpw97+BiUbiD3obq1Q==, figureFileBig=aaq6Qfh+UmrTe0qL1fGzCA==, tableContent=null), ArticleFig(id=1239263354980717390, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 6, caption=
TGV packaging substrate and transmission line sample, figureFileSmall=k+Gb3+JnBQev29YPFpt3Yw==, figureFileBig=B9h8hH+IDeZa2pmeh7Iw/g==, tableContent=null), ArticleFig(id=1239263355072992080, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图6, caption=
TGV封装基板和传输线, figureFileSmall=k+Gb3+JnBQev29YPFpt3Yw==, figureFileBig=B9h8hH+IDeZa2pmeh7Iw/g==, tableContent=null), ArticleFig(id=1239263355173655380, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 7, caption=
Expansion and compensation structure of elliptical filter, figureFileSmall=bkqLLDTQWTar/2FyzWMkcQ==, figureFileBig=3ZHZ1mVuQp70UaJvfZ4xww==, tableContent=null), ArticleFig(id=1239263355253347159, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图7, caption=
玻璃沟槽电容器的射频特性, figureFileSmall=bkqLLDTQWTar/2FyzWMkcQ==, figureFileBig=3ZHZ1mVuQp70UaJvfZ4xww==, tableContent=null), ArticleFig(id=1239263355366593371, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 8, caption=
Three dimensional bandpass filter with TGV shielding ring, figureFileSmall=KQrctz5vbgoABogkpTjLyg==, figureFileBig=4HkZ474lV47aOk8zjVzZcA==, tableContent=null), ArticleFig(id=1239263355442090847, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图8, caption=
带有 TGV 屏蔽环的三维带通滤波器, figureFileSmall=KQrctz5vbgoABogkpTjLyg==, figureFileBig=4HkZ474lV47aOk8zjVzZcA==, tableContent=null), ArticleFig(id=1239263355555337061, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 9, caption=
Topology and simulation results of elliptical filter, figureFileSmall=9+ApfTtxOtR8NYw9PQDj7g==, figureFileBig=3XmBPo/ElUJQjufwvdWCwQ==, tableContent=null), ArticleFig(id=1239263355660194664, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图9, caption=
椭圆滤波器拓扑结构及仿真结果, figureFileSmall=9+ApfTtxOtR8NYw9PQDj7g==, figureFileBig=3XmBPo/ElUJQjufwvdWCwQ==, tableContent=null), ArticleFig(id=1239263355781829484, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 10, caption=
Schematic process flow of the devices on glass and appearance of 320 mm×400 mm glass panel, figureFileSmall=ssr8B3seCxWhuX5HPlE5Dg==, figureFileBig=4LgKTYYEQ+LX1qAn31ynHA==, tableContent=null), ArticleFig(id=1239263355861521265, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图10, caption=
玻璃上器件的工艺流程示意与320 mm×400 mm的玻璃面板外观, figureFileSmall=ssr8B3seCxWhuX5HPlE5Dg==, figureFileBig=4LgKTYYEQ+LX1qAn31ynHA==, tableContent=null), ArticleFig(id=1239263355949601655, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 11, caption=
Package structure, figureFileSmall=Io+6llI08M7NiO+RwTMBTg==, figureFileBig=LqKobUxteflz+47pEQIr7g==, tableContent=null), ArticleFig(id=1239263356033487740, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图11, caption=
封装结构, figureFileSmall=Io+6llI08M7NiO+RwTMBTg==, figureFileBig=LqKobUxteflz+47pEQIr7g==, tableContent=null), ArticleFig(id=1239263356117373824, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 12, caption=
Technological process and multi-chip module based on glass substrate, figureFileSmall=l0bW6s9MIkBv6anLpqVh9Q==, figureFileBig=yHXFqbnpI6MXxFYxk5/fiA==, tableContent=null), ArticleFig(id=1239263356239008645, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图12, caption=
工艺流程以及基于玻璃基板的多芯片组件, figureFileSmall=l0bW6s9MIkBv6anLpqVh9Q==, figureFileBig=yHXFqbnpI6MXxFYxk5/fiA==, tableContent=null), ArticleFig(id=1239263356343866248, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 13, caption=
Process flow and packaging chip, figureFileSmall=P/6snqiaiEMmlvn5omPSfA==, figureFileBig=gXrhShOp0JdIHjUqqwRTjA==, tableContent=null), ArticleFig(id=1239263356452918159, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图13, caption=
工艺流程与封装芯片, figureFileSmall=P/6snqiaiEMmlvn5omPSfA==, figureFileBig=gXrhShOp0JdIHjUqqwRTjA==, tableContent=null), ArticleFig(id=1239263356553581458, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 14, caption=
3D stacking procress and physical of glass based broadband variable frenquency micro-module, figureFileSmall=/g13BVDVnstDzSl0PiDnHA==, figureFileBig=ReTl7WvVcAtcQePFE8p8kA==, tableContent=null), ArticleFig(id=1239263356729742238, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图14, caption=
三维堆叠流程与玻璃基宽带变频微模组实物, figureFileSmall=/g13BVDVnstDzSl0PiDnHA==, figureFileBig=ReTl7WvVcAtcQePFE8p8kA==, tableContent=null), ArticleFig(id=1239263356796851107, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Fig. 15, caption=
Schematic of TR component cross-section, figureFileSmall=OlsZHl27qyLszYuJp1NqMA==, figureFileBig=v2dxsIqiETosYyqwRzldAQ==, tableContent=null), ArticleFig(id=1239263356884931495, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=图15, caption=
T/R 组件截面示意, figureFileSmall=OlsZHl27qyLszYuJp1NqMA==, figureFileBig=v2dxsIqiETosYyqwRzldAQ==, tableContent=null), ArticleFig(id=1239263356989789103, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Table 1, caption=
Performance comparison of commonly used packaging materials[25]
, figureFileSmall=null, figureFileBig=null, tableContent=
| 参数 | 硅 | 多层有机板材 | 环氧塑封料 | 玻璃 |
|---|
| 相对介电常数 | 11.9 | 2.8~3.2 | 2.8~3.2 | 2~5 |
| 表面粗糙度/mm | <1 | 40~600 | >1 000 | <10 |
| 热膨胀系数/(10-6·K-1) | 2.9~4 | 17 | 16~30 | 3~9 |
| 杨氏模量/GPa | 165 | 10~40 | 22 | 50~90 |
| 热导率/(W•m-1•K-1) | 148 | 0.9 | 0.5~0.75 | 1.1 |
), ArticleFig(id=1239263357056897978, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=表1, caption=
常用封装材料性能对比[25]
, figureFileSmall=null, figureFileBig=null, tableContent=
| 参数 | 硅 | 多层有机板材 | 环氧塑封料 | 玻璃 |
|---|
| 相对介电常数 | 11.9 | 2.8~3.2 | 2.8~3.2 | 2~5 |
| 表面粗糙度/mm | <1 | 40~600 | >1 000 | <10 |
| 热膨胀系数/(10-6·K-1) | 2.9~4 | 17 | 16~30 | 3~9 |
| 杨氏模量/GPa | 165 | 10~40 | 22 | 50~90 |
| 热导率/(W•m-1•K-1) | 148 | 0.9 | 0.5~0.75 | 1.1 |
), ArticleFig(id=1239263357149172671, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Table 2, caption=
Key indicators of TXV technology
, figureFileSmall=null, figureFileBig=null, tableContent=
| 种类 | 材料 | 工业规模 | 直径(μm) | 深度(μm) | 特点和优势 |
|---|
| TSV | 硅 | 晶圆,中阶层 | 1~10 | 10~150 | 尺寸小,高热导率 |
| TGV | 玻璃 | 晶圆,中阶层 | 5~200 | 100~300 | 良好的电气性能,低成本 |
| TCV | 陶瓷 | 基片,封装 | 60~200 | 100~500 | 高可靠性,高热导性 |
| TMV | 模塑 | 封装 | 25~150 | 100~1 000 | 薄型化,工艺兼容性 |
), ArticleFig(id=1239263357233058756, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=表2, caption=
TXV 技术的关键指标[10]
, figureFileSmall=null, figureFileBig=null, tableContent=
| 种类 | 材料 | 工业规模 | 直径(μm) | 深度(μm) | 特点和优势 |
|---|
| TSV | 硅 | 晶圆,中阶层 | 1~10 | 10~150 | 尺寸小,高热导率 |
| TGV | 玻璃 | 晶圆,中阶层 | 5~200 | 100~300 | 良好的电气性能,低成本 |
| TCV | 陶瓷 | 基片,封装 | 60~200 | 100~500 | 高可靠性,高热导性 |
| TMV | 模塑 | 封装 | 25~150 | 100~1 000 | 薄型化,工艺兼容性 |
), ArticleFig(id=1239263357325333455, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Table 3, caption=
Progress of TGV technology from mainstream manufacturers at home and abroad
, figureFileSmall=null, figureFileBig=null, tableContent=
| 公司 | 技术进度 |
|---|
| 康宁 | 熔融制程为康宁的专利创新技术核心。公司能为3D IC基板生产出表面极为纯净、光滑、平坦且尺寸稳定的玻璃基板,做到TGV 孔径 20 ~ 100 μm,纵横比10:1 |
| Samtec | 公司拥有超高密度TGV 金属化和气密密封工艺,其TGV技术支持通孔直径最小为40 μm,通过位置精度为±5μm,总厚度变化为15 μm |
| 肖特 | 公司面向半导体应用的玻璃品类厚度在0.5-30 μm,拥有高透光率,卓越的机械性能、耐热性、耐化学性,高射频性能,适用于半导体行业的晶圆级封装;与国内水晶光电合作研发RealView光学玻璃晶圆 |
| 云天半导体 | 公司成功开发先进的 TGV 激光刻蚀技术,可以在 50~500 μm厚的玻璃上形成孔径 7 μm的玻璃通孔/盲孔;通孔可以做到深宽比70:1,锥度可达90°,具有较好的表面和孔内粗糙度、孔型圆度 |
| 沃格光电 | 公司具备行业领先的玻璃薄化、TGV、溅射铜(镀铜铜厚可达7 μm)以及微电路图形化、玻璃基巨量微米级通孔(最小孔径可至10 μm,厚度最薄50 μm,线宽线距小至8 μm);子公司湖北通格微投资建设年产100万平方米芯片板级封装载板产业园项目。 |
| 成都迈科 | 公司核心技术 TGV3.0率先突破超高深径比通孔技术难题(最小通孔<7 μm,纵横比>50:1),并开发了适用于深孔填充的电镀液和无空洞的深孔实心金属化技术;公司在东莞松山湖建立 TGV 基板与三维集成封装中试线,预计年产能约7万片,年产值可达2~3亿元;已形成TGV工艺服务、3D 玻璃和 TGV 特色工艺装备体系,主要应用在先进三维系统封装、高 Q 微波/THz 器件、光学/射频 MEMS、微流控芯片等领域,已经为中国电科、肖特玻璃、华为、康佳光电、京东方等企业供货 |
| 五方光电 | 已具备TGV产品批量交付能力,其玻璃晶圆成孔圆度、正反面同心度、通孔锥度、通孔间距、深宽比、通孔尺寸公差、通孔内微裂纹、微孔一致性等方面具有显著优势 |
| 赛微电子 | 公司旗下代工厂掌握国际领先的玻璃通孔,可以在先进的3D封装系统中实现多芯片间的信号传输,在3D方向增加堆叠度,使得外形尺寸小型化,提高芯片速度以及低功耗特性 |
| 蓝特光学 | 率先对TGV项目产业化,面向半导体三维封装的通孔晶圆(TGV)可实现通孔间距50~150 μm,最小孔径20 μm,最大深宽比10:1 |
), ArticleFig(id=1239263357421802455, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=表3, caption=
海内外主流厂商TGV技术进度
, figureFileSmall=null, figureFileBig=null, tableContent=
| 公司 | 技术进度 |
|---|
| 康宁 | 熔融制程为康宁的专利创新技术核心。公司能为3D IC基板生产出表面极为纯净、光滑、平坦且尺寸稳定的玻璃基板,做到TGV 孔径 20 ~ 100 μm,纵横比10:1 |
| Samtec | 公司拥有超高密度TGV 金属化和气密密封工艺,其TGV技术支持通孔直径最小为40 μm,通过位置精度为±5μm,总厚度变化为15 μm |
| 肖特 | 公司面向半导体应用的玻璃品类厚度在0.5-30 μm,拥有高透光率,卓越的机械性能、耐热性、耐化学性,高射频性能,适用于半导体行业的晶圆级封装;与国内水晶光电合作研发RealView光学玻璃晶圆 |
| 云天半导体 | 公司成功开发先进的 TGV 激光刻蚀技术,可以在 50~500 μm厚的玻璃上形成孔径 7 μm的玻璃通孔/盲孔;通孔可以做到深宽比70:1,锥度可达90°,具有较好的表面和孔内粗糙度、孔型圆度 |
| 沃格光电 | 公司具备行业领先的玻璃薄化、TGV、溅射铜(镀铜铜厚可达7 μm)以及微电路图形化、玻璃基巨量微米级通孔(最小孔径可至10 μm,厚度最薄50 μm,线宽线距小至8 μm);子公司湖北通格微投资建设年产100万平方米芯片板级封装载板产业园项目。 |
| 成都迈科 | 公司核心技术 TGV3.0率先突破超高深径比通孔技术难题(最小通孔<7 μm,纵横比>50:1),并开发了适用于深孔填充的电镀液和无空洞的深孔实心金属化技术;公司在东莞松山湖建立 TGV 基板与三维集成封装中试线,预计年产能约7万片,年产值可达2~3亿元;已形成TGV工艺服务、3D 玻璃和 TGV 特色工艺装备体系,主要应用在先进三维系统封装、高 Q 微波/THz 器件、光学/射频 MEMS、微流控芯片等领域,已经为中国电科、肖特玻璃、华为、康佳光电、京东方等企业供货 |
| 五方光电 | 已具备TGV产品批量交付能力,其玻璃晶圆成孔圆度、正反面同心度、通孔锥度、通孔间距、深宽比、通孔尺寸公差、通孔内微裂纹、微孔一致性等方面具有显著优势 |
| 赛微电子 | 公司旗下代工厂掌握国际领先的玻璃通孔,可以在先进的3D封装系统中实现多芯片间的信号传输,在3D方向增加堆叠度,使得外形尺寸小型化,提高芯片速度以及低功耗特性 |
| 蓝特光学 | 率先对TGV项目产业化,面向半导体三维封装的通孔晶圆(TGV)可实现通孔间距50~150 μm,最小孔径20 μm,最大深宽比10:1 |
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