Article(id=1239136718583034222, tenantId=1146029695717560320, journalId=1238841944844054536, issueId=1239136718008414574, articleNumber=null, orderNo=null, doi=10.12347/j.ycyk.20250507001, pmid=null, cstr=32406.14.ycyk.20250507001, oa=null, hot=1, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=null, receivedDate=1746547200000, receivedDateStr=2025-05-07, revisedDate=1750089600000, revisedDateStr=2025-06-17, acceptedDate=null, acceptedDateStr=null, onlineDate=1773362815757, onlineDateStr=2026-03-13, pubDate=1752508800000, pubDateStr=2025-07-15, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1773362815757, onlineIssueDateStr=2026-03-13, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1773362815757, creator=13701087609, updateTime=1773896908002, updator=13701087609, issue=Issue{id=1239136718008414574, tenantId=1146029695717560320, journalId=1238841944844054536, year='2025', volume='46', issue='4', pageStart='1', pageEnd='148', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1773362815620, creator=13701087609, updateTime=1773393299751, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1239264577775522632, tenantId=1146029695717560320, journalId=1238841944844054536, issueId=1239136718008414574, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1239264577775522633, tenantId=1146029695717560320, journalId=1238841944844054536, issueId=1239136718008414574, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=1, endPage=13, ext={EN=ArticleExt(id=1239136720306893172, articleId=1239136718583034222, tenantId=1146029695717560320, journalId=1238841944844054536, language=EN, title=The Application and Challenges of Through Glass Via Technology in The Microwave Field, columnId=1239136720231395698, journalTitle=Journal of Telemetry, Tracking and Command, columnName=Microwave and Millimeter Wave Technology, runingTitle=null, highlight=null, articleAbstract=

Integrated circuit nanotechnology is gradually approaching the physical limit. Therefore, relying on heterogeneous integration technology to continue and expand Moore Law is becoming increasingly important. The vertical interconnection of signals from various integrated chips is achieved through technologies such as through silicon via (TSV) or through glass via (TGV), while high-density interconnection in the horizontal direction can be achieved through rewiring layer (RDL) technology. The article summarizes the comparison between TGV technology and adapter boards, elaborates on the current application status in the field of passive systems and RF 3D integration, analyzes the TGV process capability and the current technical progress of domestic and foreign manufacturers, and explores the existing technical difficulties and future development trends of the TGV.

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集成电路纳米工艺技术正在逐渐逼近其物理极限,因此依靠异质集成技术来延续以及拓展摩尔定律正变得越来越重要。来自不同种类集成芯片的信号垂直互连网络是通过硅通孔(TSV)或者玻璃通孔(TGV)等技术实现,而高密度的水平网络互连可以凭借再布线层(RDL)技术来实现。本文通过综述TGV技术及转接板的对比,阐述了TGV技术在无源系统领域以及射频三维集成领域的应用现状,剖析了TGV工艺能力及目前海内外厂商的技术进度,最后分析了TGV存在的技术瓶颈和未来的发展趋势。

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刘德喜 1973年生,硕士,研究员。

傅显惠 1995年生,硕士,工程师。

景翠 1985年生,硕士,研究员。

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景翠 1985年生,硕士,研究员。

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景翠 1985年生,硕士,研究员。

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Performance comparison of commonly used packaging materials[25]

, figureFileSmall=null, figureFileBig=null, tableContent=
参数多层有机板材环氧塑封料玻璃
相对介电常数11.92.8~3.22.8~3.22~5
表面粗糙度/mm<140~600>1 000<10
热膨胀系数/(10-6·K-1)2.9~41716~303~9
杨氏模量/GPa16510~402250~90
热导率/(W•m-1•K-1)1480.90.5~0.751.1
), ArticleFig(id=1239263357056897978, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=表1, caption=

常用封装材料性能对比[25]

, figureFileSmall=null, figureFileBig=null, tableContent=
参数多层有机板材环氧塑封料玻璃
相对介电常数11.92.8~3.22.8~3.22~5
表面粗糙度/mm<140~600>1 000<10
热膨胀系数/(10-6·K-1)2.9~41716~303~9
杨氏模量/GPa16510~402250~90
热导率/(W•m-1•K-1)1480.90.5~0.751.1
), ArticleFig(id=1239263357149172671, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Table 2, caption=

Key indicators of TXV technology

, figureFileSmall=null, figureFileBig=null, tableContent=
种类材料工业规模直径(μm)深度(μm)特点和优势
TSV晶圆,中阶层1~1010~150尺寸小,高热导率
TGV玻璃晶圆,中阶层5~200100~300良好的电气性能,低成本
TCV陶瓷基片,封装60~200100~500高可靠性,高热导性
TMV模塑封装25~150100~1 000薄型化,工艺兼容性
), ArticleFig(id=1239263357233058756, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=表2, caption=

TXV 技术的关键指标[10]

, figureFileSmall=null, figureFileBig=null, tableContent=
种类材料工业规模直径(μm)深度(μm)特点和优势
TSV晶圆,中阶层1~1010~150尺寸小,高热导率
TGV玻璃晶圆,中阶层5~200100~300良好的电气性能,低成本
TCV陶瓷基片,封装60~200100~500高可靠性,高热导性
TMV模塑封装25~150100~1 000薄型化,工艺兼容性
), ArticleFig(id=1239263357325333455, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=EN, label=Table 3, caption=

Progress of TGV technology from mainstream manufacturers at home and abroad

, figureFileSmall=null, figureFileBig=null, tableContent=
公司技术进度
康宁熔融制程为康宁的专利创新技术核心。公司能为3D IC基板生产出表面极为纯净、光滑、平坦且尺寸稳定的玻璃基板,做到TGV 孔径 20 ~ 100 μm,纵横比10:1
Samtec公司拥有超高密度TGV 金属化和气密密封工艺,其TGV技术支持通孔直径最小为40 μm,通过位置精度为±5μm,总厚度变化为15 μm
肖特公司面向半导体应用的玻璃品类厚度在0.5-30 μm,拥有高透光率,卓越的机械性能、耐热性、耐化学性,高射频性能,适用于半导体行业的晶圆级封装;与国内水晶光电合作研发RealView光学玻璃晶圆
云天半导体公司成功开发先进的 TGV 激光刻蚀技术,可以在 50~500 μm厚的玻璃上形成孔径 7 μm的玻璃通孔/盲孔;通孔可以做到深宽比70:1,锥度可达90°,具有较好的表面和孔内粗糙度、孔型圆度
沃格光电公司具备行业领先的玻璃薄化、TGV、溅射铜(镀铜铜厚可达7 μm)以及微电路图形化、玻璃基巨量微米级通孔(最小孔径可至10 μm,厚度最薄50 μm,线宽线距小至8 μm);子公司湖北通格微投资建设年产100万平方米芯片板级封装载板产业园项目。
成都迈科公司核心技术 TGV3.0率先突破超高深径比通孔技术难题(最小通孔<7 μm,纵横比>50:1),并开发了适用于深孔填充的电镀液和无空洞的深孔实心金属化技术;公司在东莞松山湖建立 TGV 基板与三维集成封装中试线,预计年产能约7万片,年产值可达2~3亿元;已形成TGV工艺服务、3D 玻璃和 TGV 特色工艺装备体系,主要应用在先进三维系统封装、高 Q 微波/THz 器件、光学/射频 MEMS、微流控芯片等领域,已经为中国电科、肖特玻璃、华为、康佳光电、京东方等企业供货
五方光电已具备TGV产品批量交付能力,其玻璃晶圆成孔圆度、正反面同心度、通孔锥度、通孔间距、深宽比、通孔尺寸公差、通孔内微裂纹、微孔一致性等方面具有显著优势
赛微电子公司旗下代工厂掌握国际领先的玻璃通孔,可以在先进的3D封装系统中实现多芯片间的信号传输,在3D方向增加堆叠度,使得外形尺寸小型化,提高芯片速度以及低功耗特性
蓝特光学率先对TGV项目产业化,面向半导体三维封装的通孔晶圆(TGV)可实现通孔间距50~150 μm,最小孔径20 μm,最大深宽比10:1
), ArticleFig(id=1239263357421802455, tenantId=1146029695717560320, journalId=1238841944844054536, articleId=1239136718583034222, language=CN, label=表3, caption=

海内外主流厂商TGV技术进度

, figureFileSmall=null, figureFileBig=null, tableContent=
公司技术进度
康宁熔融制程为康宁的专利创新技术核心。公司能为3D IC基板生产出表面极为纯净、光滑、平坦且尺寸稳定的玻璃基板,做到TGV 孔径 20 ~ 100 μm,纵横比10:1
Samtec公司拥有超高密度TGV 金属化和气密密封工艺,其TGV技术支持通孔直径最小为40 μm,通过位置精度为±5μm,总厚度变化为15 μm
肖特公司面向半导体应用的玻璃品类厚度在0.5-30 μm,拥有高透光率,卓越的机械性能、耐热性、耐化学性,高射频性能,适用于半导体行业的晶圆级封装;与国内水晶光电合作研发RealView光学玻璃晶圆
云天半导体公司成功开发先进的 TGV 激光刻蚀技术,可以在 50~500 μm厚的玻璃上形成孔径 7 μm的玻璃通孔/盲孔;通孔可以做到深宽比70:1,锥度可达90°,具有较好的表面和孔内粗糙度、孔型圆度
沃格光电公司具备行业领先的玻璃薄化、TGV、溅射铜(镀铜铜厚可达7 μm)以及微电路图形化、玻璃基巨量微米级通孔(最小孔径可至10 μm,厚度最薄50 μm,线宽线距小至8 μm);子公司湖北通格微投资建设年产100万平方米芯片板级封装载板产业园项目。
成都迈科公司核心技术 TGV3.0率先突破超高深径比通孔技术难题(最小通孔<7 μm,纵横比>50:1),并开发了适用于深孔填充的电镀液和无空洞的深孔实心金属化技术;公司在东莞松山湖建立 TGV 基板与三维集成封装中试线,预计年产能约7万片,年产值可达2~3亿元;已形成TGV工艺服务、3D 玻璃和 TGV 特色工艺装备体系,主要应用在先进三维系统封装、高 Q 微波/THz 器件、光学/射频 MEMS、微流控芯片等领域,已经为中国电科、肖特玻璃、华为、康佳光电、京东方等企业供货
五方光电已具备TGV产品批量交付能力,其玻璃晶圆成孔圆度、正反面同心度、通孔锥度、通孔间距、深宽比、通孔尺寸公差、通孔内微裂纹、微孔一致性等方面具有显著优势
赛微电子公司旗下代工厂掌握国际领先的玻璃通孔,可以在先进的3D封装系统中实现多芯片间的信号传输,在3D方向增加堆叠度,使得外形尺寸小型化,提高芯片速度以及低功耗特性
蓝特光学率先对TGV项目产业化,面向半导体三维封装的通孔晶圆(TGV)可实现通孔间距50~150 μm,最小孔径20 μm,最大深宽比10:1
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TGV技术在微波领域的应用与挑战
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刘德喜 , 傅显惠 , 景翠
遥测遥控 | 微波毫米波技术 2025,46(4): 1-13
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遥测遥控 | 微波毫米波技术 2025, 46(4): 1-13
TGV技术在微波领域的应用与挑战
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刘德喜, 傅显惠, 景翠
作者信息
  • 北京遥测技术研究所 北京 100094
  • 刘德喜 1973年生,硕士,研究员。

    傅显惠 1995年生,硕士,工程师。

    景翠 1985年生,硕士,研究员。

The Application and Challenges of Through Glass Via Technology in The Microwave Field
Dexi LIU, Xianhui FU, Cui JING
Affiliations
  • Beijing Research Institute of Telemetry, Beijing 100094, China
出版时间: 2025-07-15 doi: 10.12347/j.ycyk.20250507001
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集成电路纳米工艺技术正在逐渐逼近其物理极限,因此依靠异质集成技术来延续以及拓展摩尔定律正变得越来越重要。来自不同种类集成芯片的信号垂直互连网络是通过硅通孔(TSV)或者玻璃通孔(TGV)等技术实现,而高密度的水平网络互连可以凭借再布线层(RDL)技术来实现。本文通过综述TGV技术及转接板的对比,阐述了TGV技术在无源系统领域以及射频三维集成领域的应用现状,剖析了TGV工艺能力及目前海内外厂商的技术进度,最后分析了TGV存在的技术瓶颈和未来的发展趋势。

玻璃通孔  /  三维集成  /  中介层  /  先进封装

Integrated circuit nanotechnology is gradually approaching the physical limit. Therefore, relying on heterogeneous integration technology to continue and expand Moore Law is becoming increasingly important. The vertical interconnection of signals from various integrated chips is achieved through technologies such as through silicon via (TSV) or through glass via (TGV), while high-density interconnection in the horizontal direction can be achieved through rewiring layer (RDL) technology. The article summarizes the comparison between TGV technology and adapter boards, elaborates on the current application status in the field of passive systems and RF 3D integration, analyzes the TGV process capability and the current technical progress of domestic and foreign manufacturers, and explores the existing technical difficulties and future development trends of the TGV.

Through glass via  /  3D Integration  /  Interposer  /  Advanced packaging
刘德喜, 傅显惠, 景翠. TGV技术在微波领域的应用与挑战. 遥测遥控, 2025 , 46 (4) : 1 -13 . DOI: 10.12347/j.ycyk.20250507001
Dexi LIU, Xianhui FU, Cui JING. The Application and Challenges of Through Glass Via Technology in The Microwave Field[J]. Journal of Telemetry, Tracking and Command, 2025 , 46 (4) : 1 -13 . DOI: 10.12347/j.ycyk.20250507001
伴随着5G通信、智能手机、人工智能的蓬勃发展,电子产品不断朝着多功能集成、小型化、低成本的方向发展。这需要增加电路密度并减小集成电路的间距,以提升集成度,提高信号传输速度[1]。在摩尔定律放缓的时代,先进封装通过改变连接距离和连接方式,不断提升芯片的性能[2]。高密度封装技术的发展使介质基板间的距离不断减小,然而,在亚微米级芯片的互连之间仍然存在显著不足。2D系统级封装走线具有局限性,因此会使设计的产品的带宽有限以及体积较大。与此同时,3D硅封装技术具有低功耗和带宽宽的特点,但由于成本高,在工艺研发、可靠性设计、散热设计方面具有挑战性。为了克服上述困难、应对挑战,出现了2D和3D之间的2.5D转接板封装技术。2.5D 封装是指将多种芯片与器件装配在中介层(Interposer)上,通过走线连接,实现多种芯片间的水平信号与垂直信号相互连接的过程。研究学者们把中介层技术作为2.5D封装以及3D封装的核心技术,因此受到广泛关注。根据材料的种类,中介层可以分为有机中介层、玻璃中介层、陶瓷中介层、硅中介层。现在,硅中介层技术相对成熟与稳定,大量应用于生产实践中[3-5]。但是,在高频的条件下,通过硅材料传递信号的串扰和插损显著,使得可靠性降低。同时硅中介层的价格相对较高,约束了其使用。面对这些困难,产生了玻璃中介层[6-7]。玻璃通孔(Through Glass Via,TGV)实现玻璃基板的垂直电气互连,与硅通孔(Through Silicon Via,TSV)相对应,作为一种可以替代硅基板的材料,它被视为下一代3D集成的核心技术[8]
先进封装包括2.5D或3D封装、晶圆级封装和系统级封装,在提高芯片集成度、缩短芯片距离、加快芯片间电气连接速度、性能优化的过程中扮演重要角色[9]。其中,2.5D封装是将芯片放于中介层的上面,并通过对芯片的微凸点与信号走线将它们连接起来。3D封装则将多个半导体芯片堆叠在一起创建三维结构,将集成提升至新高度,如图1所示为三维异质集成及互连结构。
在三维堆叠中,中介层所用材料分为四种:硅基材料,玻璃基材料,陶瓷基材料,以及有机材料。通孔以及再分布层(Re-Distribution Layer,RDL)共同构成了中介层结构。通孔是中介层的重要部分,其工艺的发展对中介层结构的电性能有着重要的作用[10-12]。凭借其高精度走线技术、微机电系统(Micro Electro Mechanical System,MEMS)集成技术、无源器件(Integrated Passive Device,IPD)集成技术以及优异的微波性能,中介层结构逐渐成为研究先进封装结构的热门对象之一[13-14]
有机转接板的基材主要以通过层压技术大规模制造的有机树脂和玻璃纤维为主。与其它材料相比,这种转接板的制造价格低,工艺流程相对容易。但是,有机转接板散热性相对差,翘曲随着层数的增加而增加,这在一定程度上限制了其在高性能产品领域的发展与应用[15]
陶瓷转接板的连接和导电使用陶瓷通孔技术。AlN和Al2O3等陶瓷材料具备优良的绝缘和机械性能。AlN陶瓷还有低热膨胀系数(Coefficient of Thermal Expansion,CTE)、高电阻和高导热性的特点,在封装方面具有很大优势。然而,加工这些材料需要静压粉末压制,既昂贵又低效,无法进行大规模生产[16]
通过TSV技术,硅转接板实现芯片和基板之间的垂直传输,它是目前最成熟的转接板技术。与传统的多层连接孔相比,它的通孔尺寸会更小。硅作为一种半导体材料,具有导电性,在高频信号传输的过程中容易引起信号串扰以及信号耦合。在实际制造过程中,需要沉积绝缘介质层以防止电信号泄漏到通孔中。在选择绝缘层时,建议选择介电常数低、寄生电容效应小的绝缘材料,以满足高速、高频信号传输的要求[17-20]。与此同时,互连孔中硅和铜之间的CTE失配导致工艺中的残余应力,影响后续的可靠性。这是目前硅转移板在使用与发展过程中所面临的困难与挑战[21,22]
玻璃转接板是近年来的研究热点,可在射频元件、光电集成、MEMS器件等3D封装领域使用。玻璃材料具有以下特性[23-24]:首先,玻璃是一种在加工过程中易于内部检查结构和光学连接的透明材料,具有良好的热稳定性,在高温下不易变形;玻璃表面平整度高,可以形成高密度的通孔和信号走线,具备可调节热膨胀系数,根据特定产品要求可选择不同种性能的玻璃材料;其次,它具有优良的高频性能、良好的绝缘性能,不需要沉积绝缘层,与TSV相比其容性效应更能改善电性能,其在高频信号传输中更具优势,使工艺过程更容易,使用成本更低。常用封装材料性能对比如表1所示。
TXV是一种在晶圆、中介层和基板衬底等介质材料中钻孔并填充导电填料的技术。通过在电介质的顶面和底面之间实现垂直电连接,它显著促进了封装的集成和小型化[26-28]。TXV技术起源于THs(贯导通孔)PCB(印制电路板)的制造技术,逐渐在硅、玻璃、陶瓷和聚合物等各种材料的封装工艺中发展起来。根据衬底的材料和工艺,TXV具体包括TGV、TSV、TCV(陶瓷通孔)和TMV(模塑通孔)。图2(a)中展示了三维封装系统的全景,并说明了TXV技术在其中的作用。中介层采用TXV技术实现垂直连接,包括各种材料的转接板,其中有硅转接板、玻璃转接板以及陶瓷转接板。伴随柔性电子技术的发展,封装转接板采用聚合物作为衬底,TXV技术在芯片垂直方向的连接中也起着重要作用。如图2所示有两种堆叠策略:一种方法是直接实现堆叠芯片,而不是采用封装,如图2(b)所示;另一种是采用封装的3D堆叠,如图2(c)所示,芯片被封装在模组中,TMV从上至下贯穿,堆叠多个模组并垂直连接多个芯片。上述的四种不同的TXV技术(TSV、TGV、TCV、TMV)均具有它独特的概念和特点,TXV技术的关键性能指标,如表2所示。
TGV是一种穿过玻璃中介层或芯片的垂直电气互连技术,对TSV 起到一定的替代作用。TGV使用高质量的硼硅玻璃和石英玻璃作为基板材料,通过种子层溅射技术、电镀技术、填充技术、化学机械平坦化技术、RDL 再布线技术和微凸点技术等工艺实现3D连接。与TSV相比,TGV技术具有成本低、高频电性能优异、工艺流程简单、机械稳定性强等优点。相比于硅中介层,玻璃中介层具有更好的绝缘性能,可以大大减少信号间的干扰和插损,在传输高频信号方面极具优势。其与硅的热膨胀系数相似,具有良好的热稳定性;较强的机械稳定性,表面光滑平整,适用于高密度布线和通孔连接;不需要沉积介质层,大大减少技术难度;最重要的是玻璃的原材料价格低,生产成本仅为硅中介层的八分之一左右。替代硅中介层的市场潜力巨大,因此引起了科学家的关注[29]图3是采用玻璃中介层的系统级封装。
TGV转接板工艺如图4所示。首先,需要在形成 TGV盲孔的同时采用物理气相沉积(PVD)技术在其中沉积种子层;其次,使用从下到上的电镀技术填充TGV,保证其没有缝隙;最终,TGV金属填充转接板凭借临时键合工艺、背面研磨工艺和化学机械抛光(CMP)工艺形成[19]。使用超声波钻孔、超声波高速钻孔 (USHD)、喷砂、机械钻孔、化学放电和激光钻孔制成的玻璃钻孔形成TGV。在这些方法中,激光钻孔是最常用的技术,包括CO2 激光器、紫外激光器以及准分子激光器。通孔制作后,钛或者铜材料的种子层凭借物理气相沉积(PVD)沉积在晶片表面,其中钛的厚度为300 nm,铜的厚度为500 nm,确保通过中心进行连续覆盖。随后的电镀辅以退火步骤,促进了铜晶粒在炉内生长并减轻了应力。然后,采用化学机械抛光(CMP)技术去除冗余的铜。退火过程可能达到 400 ℃ 的温度,使材料承受大于热循环过程中经历的热负荷。玻璃的脆性以及各种 TGV 设计涉及钻孔、蚀刻、种子和电镀的限制,目前该行业正在不断优化制造过程。
目前,全球 TGV 晶圆市场份额高度集中,仅康宁一家就占据全球 TGV 晶圆产值市场份额的26%。海内外厂商在 TGV 技术方面特别是深孔形成工艺相继取得突破,以云天半导体、沃格光电、成都迈科等为代表的国内厂商有望打破海外厂商高度垄断的TGV市场竞争格局[27-36]表3为海内外主流厂商TGV技术进度。
综上所述,在国外的厂商中,康宁在市场中占据主导地位,目前它不断对TGV技术进行创新,与英特尔等多家公司合作,来扩大TGV的应用范围。国内的公司也不断持续创新,推动行业的不断发展。这些厂商聚焦高密度转接板与 IPD 无源器件,不断开发 TGV 的技术能力,实现技术突破。
目前,制约 TGV技术运用的核心难点在于深孔形成工艺。由于没有与硅相似的Bosch(博世公司)深刻蚀工艺技术,因此采用 TGV 技术很难迅速形成高深宽比的玻璃深孔或者沟槽[37-41]。目前,TGV技术发展的主要困难为高质量、高效的TGV制作方案以及填充方法。和TSV相比,大部分TGV盲孔的形状是不规则的,表面的粗糙度和加工的工艺有着密切的关系,TGV的填充技术不可以直接应用TSV的技术。目前,TGV填充技术的讨论方向有两个:一个是如何迅速填充孔径更大的TGV通孔以缩减电镀的时间以及成本;另一种是如何实现高深宽比TGV盲孔的无缺陷填充。面对以上难题,今后可以进一步开发与完善电镀技术,达到提升TGV电镀效率的目的。同时添加剂的研究也很重要,可以研制新材料的添加剂来填充高深宽比的TGV。但是,到目前为止,关于新添加剂作用原理的研究很少,因此沉积期间添加剂作用原理也是一个重要的研究方向。
然而,目前玻璃材料的主要问题是其低导热性导致的散热性差。CHO等专家[42-43]察觉玻璃转接板采用的通孔结构和接地铜等结构能够提供有效的导热性。通过在通孔结构、走线结构和其他结构中大规模地引进铜材料,可以大大提升玻璃转接板的散热性能,同时可以达到逻辑设备与存储设备间的优异的隔热效果,这是硅材料难以实现的。将蒸汽腔均热板引入PCB中可以进一步提升其散热性,能够解决玻璃的低热导率的难题,实现与硅转接板相似的散热性能[13],如图5所示。总之,虽然玻璃基板和 TGV 在彻底改变电子封装方面具有广阔前景,但要充分发挥其潜力,需要业内共同克服它们带来的热机械挑战。随着学术界和工业界的持续创新和合作,玻璃基板可以在未来实现紧凑、高性能的电子设备方面发挥关键作用。
目前,TGV技术广泛应用于三维集成无源射频器件领域、集成天线与扇出型封装领域、MEMS器件领域、多层玻璃基板及微流道等领域,具体有以下几个方面[20]
①基于玻璃基的无源器件集成;
②基于玻璃通孔的微机电系统封装;
③嵌入式玻璃基扇出与天线的集成封装系统。
玻璃介电损耗低,热膨胀系数可调,集成度高,绝缘性能优异,具有巨大的晶圆级气密性封装潜能。因此基于玻璃转接板的2.5D封装技术,广泛应用于高频、高性能等领域,渐渐成为推进2.5D封装技术的支撑力量。
2021年,南京电子研究所设计了采用TGV技术的 3D封装基板,孔径大小为50 μm、孔径深度为300 μm,RDL包括两层BCB介质层和三层金属线层,传输线的最小线宽为20 μm。该研究所设计了一段石英基的微波传输线,结果表明:S11与S12的测试结果与仿真结果基本一致,二者保持在误差范围内,因此,使用TGV技术在石英玻璃基板上设计了3D封装基板,并证明了2~18 GHz下的电气性能与模拟结果一致。通过在石英基板上设计传输线,并使用矢量网络分析仪测试。结果显示:在10 MHz ~ 40 GHz的频率,每单位长度1 mm的微波传输线插入损耗小于-0.05 dB。如图6所示[23],在24 GHz的频率下,每1 mm传输线长度的损耗为-0.02 dB,表明采用石英衬底的TGV封装技术更加适宜高频和高速应用,基于石英衬底的TGV技术在高频和高速应用中具有显著优势。
2023年,厦门大学于大全教授的团队阐述了基于玻璃通孔(TGV)技术的玻璃基深沟电容器工艺,并设计制造了一种三维的金属-绝缘-金属(MIM)电容器[24]。玻璃基板上阵列的盲槽结构采用激光诱导湿法刻蚀技术制造,MIM电容器叠层采用原子层沉积和化学气相沉积技术制造。开发的玻璃沟槽电容器尺寸仅有360 μm×360 μm,在小尺寸下实现了8.85 nF的电容值、10 pH的等效串联电感值以及315 mΩ的等效串联电阻值,如图7所示为其射频特性。
2019年,张子跃等[44]人采用TGV技术制作了一种超小型BPF(带通滤波器)。这种BPF基于TGV的3D阵列电容器和3D螺旋电感器以及相应的再分配层组成,采用了有TGV的屏蔽环,增强了BPF的抗干扰性能,并提高了其散热能力。滤波器整体版图如图8所示。BPF的中心频率接近5 GHz,插入损耗为2.25 dB,回波损耗为15.8 dB。此外,包括屏蔽环在内的器件总面积仅有0.91 mm×0.58 mm。
2024年,南京邮电大学提出了一种改进的椭圆滤波器拓扑结构[26]。该滤波器不仅在低频和高频阻带处抑制得到了提升,还减小了插入插损,仿真结果显示:滤波器通带频率为3.3~4.2 GHz;插损小于1.70 dB,芯片尺寸为1 000 μm×500 μm。椭圆滤波器拓扑结构如图9所示。
2018年,日本学者在玻璃面板上使用传统的FC-BGA(倒装芯片球栅格阵列封装)技术集成无源器件(IPD)。这种玻璃基板IPD适合在薄型封装中使用,用于高频移动应用[16]。这种玻璃IPD基板采用螺线管线圈制造,使用玻璃通孔 (TGV),通过半加成方法在 TGV 玻璃面板(尺寸为320 mm×400 mm,厚度为 0.3 mm)上形成铜线。玻璃芯螺线管线圈被制造为无源电路元件。使用这种玻璃IPD基板的三维螺线管电感器,在1 GHz 时Q(品质因数)值高于70。同时制造了原型TGV双工器,使用在同一衬底中制造的玻璃芯螺线管电感器和电容器。图10为玻璃上器件的工艺流程,第一步是将种子层沉积在玻璃上,然后进行镀铜(13 μm)。介电层 (SiN) 采用 CVD (化学气相沉积)方法沉积。种子层上的布线层采用半添加剂工艺(SAP)制成。此外,树脂膜作为绝缘层层压而成。在该流程中,ABF(芳香族苯并环丁烷薄膜) GX-T31R 在真空中层压作为绝缘层,并用UV-YAG(基于掺钕钇铝石榴石(Nd: YAG)晶体的紫外激光器)形成φ50 μm的通孔进行层间连接。通孔通过电解镀铜填充。阻焊剂形成后,在铜导电层上提供 OSP 表面处理。图10为玻璃上器件的工艺流程示意以及玻璃面板外观,玻璃之间的布线层和树脂层在整个过程中保持稳定,没有任何分层。基板的构建层是使用凸版印刷久经考验的FC-BGA技术制造的。在整个研究中未发现与过程相关的缺陷或模式异常。这验证了采用玻璃IPD衬底是高频器件的有效手段。
综上所述,TGV在石英基微波传输线、玻璃基深沟电容器、滤波器以及玻璃面板上的无源器件集成等方面发挥着重要的作用,在无线射频架构中,基于TGV技术的无源器件,通过无源三维集成设计技术以及其高频特性,正在逐渐朝着前沿方向发展。
2017年,中国电子科技集团公司第五十八研究所,研制了一种扇出型的封装结构用来传输射频信号,该结构通过TGV转接板集成射频电路,解决了由于集成度高导致射频信号传输损耗的难题[29]。封装结构如图11(a)所示,其中1为TGV转接板,21为第一再布线层,22为第二再布线层,23为第三再布线层,3为半导体芯片,4为TSV转接板,5为填充材料,61为第一组焊球,62为第二组焊球。具体装配流程见图11(b)所示。通过此设计形式,第三再布线层实现了TSV转接板与焊球的过渡连接。由于不存在自由移动的电荷,TGV转接板具有优异的介电性能和低膨胀系数,大幅度降低了传输损耗。
2019年,IWAI等专家制作了一种采用多层玻璃基板技术的多芯片封装系统[28],如图12所示,具体制作的工艺步骤如下:首先,在玻璃基上制作玻璃通孔TGV,通过激光诱导玻璃变性技术以及湿法刻蚀技术,形成种子层;其次,采用半加成法工艺设计走线方案;再次,凭借激光在树脂层压膜上创建通孔,同时执行丝网印刷;然后,使得单层基板堆叠,并采用真空热压机熔化导电浆料以及干膜;最后,对准位置并装配多种芯片以形成多芯片组件。
2020年,厦门云天半导体科技公司开发了77 GHz汽车雷达芯片组件,利用嵌入式玻璃扇出技术,阐述并提出了一种具有高性能的天线组件封装(AiP)的设计方法[30]。在180 μm厚的玻璃晶圆中,首先使用激光诱导玻璃变性技术以及化学腐蚀技术制作形成玻璃腔,然后将175 μm高的芯片放置在玻璃腔中,采用新型结构材料填补芯片和玻璃之间的空白,使得其不会产生缝隙,同时可以保护芯片的底部。剥离晶圆的上表面,以形成铜RDL,最后进行后续线路制作、BGA制造以及晶圆切片,得到封装芯片。如图13所示。
2021年,中国电子科技集团公司第二十九研究所研究了玻璃转移板的加工工艺以及基于玻璃的3D堆叠技术,以应对宽带射频领域对3D封装的需求。使用尺寸为200 μm、500 μm 、200 μm的三层玻璃转移板与转移框架结合,实现双层射频芯片的3D堆叠方案,并测试了三维结构的射频性能[25]。以此为基础,在玻璃转接板和转接框架形成的空隙中使射频芯片嵌入,实现了双层射频芯片的垂直传输与堆叠,形成了工作频率为2 GHz ~18 GHz的基于玻璃的宽带变频微系统,它可以实现两种功能:宽带组件的接收与发射的直接采集功能以及频率转换功能。首先制作玻璃通孔,接着设计双面走线方案,以实现转接板和框架的加工过程。然后在连接点处设计微凸点结构,并采用热压键合技术实现双层基板的堆叠装配,同时装配芯片。最后,完成顶层基板以及顶层芯片的装配。内部集成了8个MMIC(单层微波集或电路)和半导体器件,整体尺寸是10 mm×10 mm×0.9 mm,通过共面波导的射频传输形式对外连接,如图14所示。其测试性能与设计模拟相符,表明其设计的基于玻璃的3D堆叠方案的工艺方法是可行的。
2024年,中国电子科技大学成功开发出一种采用系统级封装(System In a Package,SiP)技术和TGV工艺的超宽带双频段的射频T/R微系统[33]。电路的多层结构是通过堆叠六层无碱玻璃AF32来实现的,其中AF32的介电常数为5.1。根据设计结构,基板从下至上分为Sub1~ Sub6,其中Sub1的厚度为500 μm,Sub2~Sub6的每层厚度为400 μm。两个底层是微流道热沉,在底层Sub1上有微流道,在Sub2上具有金属散热孔,实现芯片的液冷散热技术。外部接口是组件的下面和上面的BGA焊球,其中下面的BGA焊球与天线基板结构连接,上面BGA焊球与后续的处理基板连接,具体结构如图15所示。
Sub1和Sub2的设计为微流道以及金属散热孔,不适合穿过太多的射频信号线,更适宜铺设大面积或者穿过少部分的电信号。芯片装配在Sub3上面,大多数芯片需要在腹部接地,其中一些芯片的背面需要连接到后面的电源部分。为保证金丝键合的高度差,使得射频插损最小,在芯片底部增加载体,缩短高度差。Sub4为空腔,保证了芯片装配,预留了安装芯片的空间,芯片的顶部被大面积的地覆盖,以确保电磁性能不会受到外部干扰的影响,保证电磁屏蔽。因此Sub5没有空腔,其相对完整,上面有一些控制信号线和一些电源信号线。Sub6的顶层需要将射频信号和控制信号引至相应的BGA焊球。
该设计的射频T/R微系统的尺寸为73.5 mm×73.5 mm×3.5 mm,T/R模块里面包括从天线至混频器的一部分链路结构,其中有开关、放大、滤波、衰减等链路。该组件实现了双频段工作,其中低频覆盖L频率~S频率,而高频覆盖从S频率~C频率,然后至X频率的超宽频段。该组件集成性高、可靠性高,同时满足了小型化,可以高效完成收发超宽带射频信号的任务。
综上所述,TGV 在嵌入式玻璃基扇出封装系统以及射频三维集成组件系统中发挥着不可替代的作用,通过TGV技术以及射频异质异构集成等技术,实现三维集成互连系统,为小型化高密度电子封装系统提供了一个高性能、低成本的新型方案。
文章通过综述 TGV技术及转接板的对比,阐述了在无源系统领域以及射频三维集成领域的应用现状,分析了TGV技术工艺能力及目前海内外厂商的技术进度,并探讨存在的技术难点及未来发展趋势。玻璃基板的独特特性,例如其可调模量和热膨胀系数与硅非常相似,在大尺寸应用中发挥着关键作用,能够最大限度地减少 CTE 失配引起的应力,这种兼容性增强了设备可靠性和延长了使用寿命。TGV技术能够支持更高密度(可能是有机衬底的十倍)的通孔,通过改进布线和信号传输来形成复杂的电路设计。此外,它的低电损耗增强了高速信号传输,这对于高频应用至关重要[45-51]。面对目前存在的挑战,可以通过引入铜结构,提升玻璃转接板的散热性能;通过进一步创造和改进所采用的电镀技术,来提升TGV电镀效率;同时可以研制新材料的添加剂来填充高深宽比的TGV。但是,到目前为止,关于新添加剂作用原理的研究很少,因此沉积期间添加剂作用原理也是未来一个重要的研究方向[52-56]。综上所述,TGV在无源系统与三维射频领域拥有很大的影响,为未来先进封装的发展奠定了一定基础,对于TGV更深入的研究需要进一步开发与探索。
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doi: 10.12347/j.ycyk.20250507001
  • 接收时间:2025-05-07
  • 首发时间:2026-03-13
  • 出版时间:2025-07-15
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  • 收稿日期:2025-05-07
  • 修回日期:2025-06-17
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2种不同金属材料的力学参数

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Percentage of
total species (%)

Genus
种数
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鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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