Article(id=1241718780519306157, tenantId=1146029695717560320, journalId=1146032081894723586, issueId=1241718213453607496, articleNumber=null, orderNo=null, doi=10.3981/j.issn.2097-0781.2022.03.003, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1659974400000, receivedDateStr=2022-08-09, revisedDate=1661702400000, revisedDateStr=2022-08-29, acceptedDate=null, acceptedDateStr=null, onlineDate=1667491200000, onlineDateStr=2022-11-04, pubDate=1663603200000, pubDateStr=2022-09-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1667491200000, onlineIssueDateStr=2022-11-04, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1773978427292, creator=sys-migrate, updateTime=1773978427292, updator=sys-migrate, issue=Issue{id=1241718213453607496, tenantId=1146029695717560320, journalId=1146032081894723586, year='2022', volume='1', issue='3', pageStart='10', pageEnd='148', issueExtLink='null', onlineDate='null', pubDate='1663603200000', pubDateStr='2022-09-20', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=1, createTime=1773978292094, creator='sys-migrate', updateTime=1776075247554, updator='13041195026', preIssue=null, nextIssue=null, articleTotal=null, ext={EN=IssueExt(id=1250513482186179119, tenantId=1146029695717560320, journalId=1146032081894723586, issueId=1241718213453607496, language=EN, specialIssueTitle=Science and Technology Foresight, coverIllustrator=null, specialIssueEditor=null, specialIssueAbout=null), CN=IssueExt(id=1250513482186179120, tenantId=1146029695717560320, journalId=1146032081894723586, issueId=1241718213453607496, language=CN, specialIssueTitle=集成电路科学与工程专刊, coverIllustrator=null, specialIssueEditor=null, specialIssueAbout=null)}, issueFiles=null, downloadFileDto=null}, startPage=42, endPage=51, ext={EN=ArticleExt(id=1241718789809697237, articleId=1241718780519306157, tenantId=1146029695717560320, journalId=1146032081894723586, language=EN, title=Prospects of Advanced Integrated Circuit Technologies in Post-Moore Era, columnId=1149656489310208610, journalTitle=Science and Technology Foresight, columnName=Review and Commentary, runingTitle=null, highlight=null, articleAbstract=

As the cornerstone of the modern information society, integrated circuit (IC) has promoted the development of various industries and profoundly affected people’s living habits, work styles, and thinking patterns. So far, Moore’s law-oriented IC has been developed for over 60 years. As process nodes continuously evolve, manufacturing and design costs of IC rise significantly, and the yield and production efficiency of IC begin to decrease. In recent years, new processes, materials, and technologies have been introduced in the IC field, and novel application methods, application scenarios, and development paths have emerged, which boost the development of IC. IC has entered the post-Moore era quietly. Therefore, it is of great research significance and application value to sort out the main technological paths and characteristics of advanced IC in the post-Moore era. This paper firstly analyzes the technological challenges of Moore’s law-oriented IC during development as well as the basic characteristics of IC in the post-Moore era. Then, it reviews recent research progress and achievements of IC both in China and abroad, discusses the advantages and disadvantages of related technological paths in China, and puts forward strategies and measures for promoting the development of IC. Finally, the paper draws conclusions and predicts the future trend of advanced IC technologies in the post-Moore era.

, authors=null, authorsList=Junchen DONG, Xing ZHANG, authorCompany=null, correspAuthors=Junchen DONG, Xing ZHANG, authorNote=null, correspAuthorsNote=
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集成电路被誉为现代信息社会的基石,推动了各个产业的发展和进步,深刻影响着人们的生活习惯、工作方式、思维模式。集成电路以摩尔定律为导向发展了60多年,随着工艺节点的不断演进,电路制造和设计成本大幅攀升,产品良率和生产效率开始出现下降的苗头。近年来,一系列新工艺、新材料、新技术被引入集成电路领域,形成了新的应用方式、使用场景、发展路径,为集成电路发展注入强心剂,集成电路后摩尔时代悄然而至。因此,对后摩尔时代先进集成电路主要技术路径及其特点进行梳理具有重要的研究意义和应用价值。文章总结了集成电路沿摩尔定律发展面临的技术困境以及后摩尔时代集成电路的基本特征,归纳了集成电路领域的国内外新近学术进展和研究成果,分析了中国在相关技术路径上的潜力与不足,并提出相应发展对策和可行措施。最后,总结和展望了后摩尔时代先进集成电路技术的未来发展趋势。

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董俊辰,副教授。主要研究方向为新型电子器件。电子信箱:

张兴,教授,博士研究生导师。国家杰出青年科学基金获得者。主要致力于小尺寸MOS器件物理与结构、CMOS集成电路工艺与设计技术、新型纳米半导体器件和集成电路等方面的研究。获国家技术发明奖二等奖、北京市科学技术奖一等奖、教育部科学技术进步奖一等奖等。发表论文200余篇。申请发明专利100余项,获授权发明专利40余项。电子信箱:

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张兴,教授,博士研究生导师。国家杰出青年科学基金获得者。主要致力于小尺寸MOS器件物理与结构、CMOS集成电路工艺与设计技术、新型纳米半导体器件和集成电路等方面的研究。获国家技术发明奖二等奖、北京市科学技术奖一等奖、教育部科学技术进步奖一等奖等。发表论文200余篇。申请发明专利100余项,获授权发明专利40余项。电子信箱:

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后摩尔时代先进集成电路技术展望
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董俊辰 1, , 张兴 2,
前瞻科技 | 综述与述评 2022,1(3): 42-51
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前瞻科技 | 综述与述评 2022, 1(3): 42-51
后摩尔时代先进集成电路技术展望
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董俊辰1, , 张兴2,
作者信息
  • 1.北京信息科技大学信息与通信工程学院,北京 100101
  • 2.北京大学集成电路学院,北京 100871
  • 董俊辰,副教授。主要研究方向为新型电子器件。电子信箱:

    张兴,教授,博士研究生导师。国家杰出青年科学基金获得者。主要致力于小尺寸MOS器件物理与结构、CMOS集成电路工艺与设计技术、新型纳米半导体器件和集成电路等方面的研究。获国家技术发明奖二等奖、北京市科学技术奖一等奖、教育部科学技术进步奖一等奖等。发表论文200余篇。申请发明专利100余项,获授权发明专利40余项。电子信箱:

通信作者:

Prospects of Advanced Integrated Circuit Technologies in Post-Moore Era
Junchen DONG1, , Xing ZHANG2,
Affiliations
  • 1. School of Information and Communication Engineering, Beijing Information Science & Technology University, Beijing 100101, China
  • 2. School of Integrated Circuits, Peking University, Beijing 100871, China
出版时间: 2022-09-20 doi: 10.3981/j.issn.2097-0781.2022.03.003
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集成电路被誉为现代信息社会的基石,推动了各个产业的发展和进步,深刻影响着人们的生活习惯、工作方式、思维模式。集成电路以摩尔定律为导向发展了60多年,随着工艺节点的不断演进,电路制造和设计成本大幅攀升,产品良率和生产效率开始出现下降的苗头。近年来,一系列新工艺、新材料、新技术被引入集成电路领域,形成了新的应用方式、使用场景、发展路径,为集成电路发展注入强心剂,集成电路后摩尔时代悄然而至。因此,对后摩尔时代先进集成电路主要技术路径及其特点进行梳理具有重要的研究意义和应用价值。文章总结了集成电路沿摩尔定律发展面临的技术困境以及后摩尔时代集成电路的基本特征,归纳了集成电路领域的国内外新近学术进展和研究成果,分析了中国在相关技术路径上的潜力与不足,并提出相应发展对策和可行措施。最后,总结和展望了后摩尔时代先进集成电路技术的未来发展趋势。

后摩尔时代  /  集成电路  /  摩尔定律  /  芯片

As the cornerstone of the modern information society, integrated circuit (IC) has promoted the development of various industries and profoundly affected people’s living habits, work styles, and thinking patterns. So far, Moore’s law-oriented IC has been developed for over 60 years. As process nodes continuously evolve, manufacturing and design costs of IC rise significantly, and the yield and production efficiency of IC begin to decrease. In recent years, new processes, materials, and technologies have been introduced in the IC field, and novel application methods, application scenarios, and development paths have emerged, which boost the development of IC. IC has entered the post-Moore era quietly. Therefore, it is of great research significance and application value to sort out the main technological paths and characteristics of advanced IC in the post-Moore era. This paper firstly analyzes the technological challenges of Moore’s law-oriented IC during development as well as the basic characteristics of IC in the post-Moore era. Then, it reviews recent research progress and achievements of IC both in China and abroad, discusses the advantages and disadvantages of related technological paths in China, and puts forward strategies and measures for promoting the development of IC. Finally, the paper draws conclusions and predicts the future trend of advanced IC technologies in the post-Moore era.

post-Moore era  /  integrated circuit  /  Moore’s law  /  chip
董俊辰, 张兴. 后摩尔时代先进集成电路技术展望. 前瞻科技, 2022 , 1 (3) : 42 -51 . DOI: 10.3981/j.issn.2097-0781.2022.03.003
Junchen DONG, Xing ZHANG. Prospects of Advanced Integrated Circuit Technologies in Post-Moore Era[J]. Science and Technology Foresight, 2022 , 1 (3) : 42 -51 . DOI: 10.3981/j.issn.2097-0781.2022.03.003
作为信息社会的基石,集成电路正越来越深刻地影响着人们的生活。在消费电子、汽车、医疗、航天、军事、人工智能、物联网、通信等领域,集成电路都扮演着举足轻重的角色。集成电路发展遵循着一定的规律,其中最著名的是摩尔定律。摩尔定律是美国英特尔公司创始人之一戈登·摩尔先生于1965年提出的经验式总结。该定律描述了集成电路的发展趋势:从性价比的角度,集成电路芯片上可容纳元器件的数目,约每隔2年翻一番,电路性能也将提升一倍,而价格下降一半[1]。简而言之,即通过缩小集成电路元器件的面积,在相同尺寸的晶圆上制造出更多的电路和芯片,从而达到降低成本和提升性能的目的。在高κ金属栅、应变硅、鳍式场效应晶体管(Fin Field-Effect Transistor, FinFET)等新材料和新器件结构技术的支撑下,摩尔定律延续了近60年,集成电路也进入到5 nm技术节点,并向着3 nm节点迈进[2,3]
集成电路沿摩尔定律发展终将面临器件尺寸无法持续缩小的问题[4]。特别是在引入FinFET技术之后,更为复杂的器件结构使得集成电路的制造难度大幅提高、良率明显下降,导致制造和设计成本大幅攀升,给产品研发带来风险。这也成为限制集成电路发展的重要因素之一[5]。此外,集成电路制造涉及的设备、材料等方面正在逼近物理极限,电路性能逐渐触及瓶颈。因此,探索引领集成电路走出尺寸缩小困境的技术路径在实际生产和学术研究等方面都具有非常深远的意义。近年来,一系列新工艺、新材料、新技术的引入为集成电路的发展注入了活力,例如三维集成、芯粒(Chiplet)、类脑芯片等技术[6-8],使集成电路在更多维度上取得了令人耳目一新的进展,形成了新的发展路径、应用方式、使用场景,进入了“后摩尔时代”[9]
中国是集成电路需求和生产大国,2021年集成电路进口量为6354.8亿块,其中净进口量(进口量–出口量)超3240亿块[10,11]。集成电路产业已成为国民经济和社会发展的战略性、基础性和先导性产业,在国家政策的大力支持下,近些年中国大陆集成电路企业在设计、制造、封装、测试、材料、设备等环节都取得了长足进步,与国外及中国台湾地区先进水平的差距正在逐步缩小。此外,中国经济发展平稳向上、集成电路消费市场发展前景乐观、政策持续性强、工科人才储备量大,这些都为集成电路产业的良性发展提供了坚实的物质基础。然而,我们也应清楚地认识到,后摩尔时代是机遇与挑战共存的时代,集成电路的发展也面临着极大的技术挑战,例如先进工艺的研发、材料及设备的获取、跨领域技术的整合、设计软件的国产化等。因此,非常有必要对后摩尔时代集成电路技术研究进展进行总结并对其发展趋势进行研判。
实际生产制造中,集成电路按技术节点分为2类:成熟工艺和先进工艺。28 nm及以上节点的集成电路研发时间久、产品良率高、技术积累丰富,称为“成熟工艺”;22 nm及以下节点的集成电路研发较晚,技术仍在不断完善,称为“先进工艺”。其中,先进工艺包括FinFET技术和三维集成技术。此外,基础性研究也是集成电路技术的重要组成部分,包括技术创新和技术融合等内容。
在28 nm节点以前,集成电路制造以平面型工艺为主[12],最基本的器件是金属氧化物半导体场效应晶体管(Metal-Oxide-Semiconductor Field-Effect Transistor, MOSFET),其结构如图1所示。通过缩小MOSFET特征尺寸,包括沟道长度和宽度,可提升电路集成度。MOSFET有开启和关断2种工作状态,对应于数字逻辑1和0。该器件比较理想的工作状态是:在开启状态,流经器件的电流尽量大;在关断状态,流经器件的电流尽量小。美国加利福尼亚大学伯克利分校胡正明(Chenming Hu)教授曾做过一个经典比喻,将沟道看成一根扁平水管,通过按压水管的方式控制水管的流通和截止,在MOSFET栅电极施加的电压就相当于按压水管的力量[13]。因此,将沟道长度做得越短,则单位时间内流经器件的电流越大;器件对导电沟道的控制能力越强,则截止状态的关断电流越小。平面型MOSFET即是按照这个思路演变,等比例缩小、应变硅、高κ金属栅等技术的引入,保证了器件在特征尺寸缩小的情况下,维持良好的开启和关断状态,使集成电路不断优化升级[2,3,14]
近年来,智慧城市、智慧医疗、物联网等新兴技术的兴起为集成电路产业提供了巨大的潜在市场。这些应用领域具有碎片化的特点,使用场景范围广、硬件需求量大,并且对集成电路计算能力不做过高要求,所以对先进工艺的需求并不强烈,适合于成本和风险可控、安全性较高的成熟工艺。因此,成熟工艺仍是未来集成电路产业非常重要的组成部分。在2020年晶圆代工市场中,28 nm及以上节点的成熟工艺占集成电路市场份额为66%,未来5年成熟工艺市场份额仍将不低于50%,占据市场的半壁江山[15]。成熟工艺是中国大陆晶圆代工企业的主要营收项目之一,中芯国际、华虹半导体、晶合集成等多家公司都具备成熟工艺的代工能力。2021年中国大陆晶圆代工企业营收额继续高速增长,占全球总体份额的8.5%,并且中芯国际和华虹半导体成功跻身全球晶圆代工企业十强[15]
1999年美国加利福尼亚大学伯克利分校在国际电子器件会议(IEDM)首次报道了FinFET技术,论证了实现20 nm以下节点硅基集成电路的可行性[16]。2012年,美国英特尔发布了采用FinFET技术的22 nm节点芯片产品,此后中国台湾积体电路制造股份有限公司(简称台积电)、韩国三星公司等代工企业均将FinFET技术作为各自主流的先进工艺。FinFET器件结构如图2所示,其特征是将扁平的导电沟道沿垂直方向竖立起来,使得MOSFET由平面结构转变为立体结构[17]。该结构主要有以下2个优势:①可以更灵活地调整沟道特征尺寸,包括沟道长度、宽度和高度,以便在提升电路集成度的情况下维持开启电流,保证器件的驱动能力;②显著增加器件栅电压的控制面积,提高器件的栅控能力,从而减小器件的泄漏电流,更好地控制MOSFET关断状态,这是FinFET技术的核心作用。结合应变硅和高κ栅介质等工艺,FinFET技术已经发展出Enhanced FinFET、SuperFin等先进结构和制造工艺(图3[18]。在台积电、三星、英特尔等晶圆代工企业的共同推动下,FinFET技术已从22 nm节点发展到5 nm节点。台积电日前宣布,未来3 nm节点芯片产品继续使用FinFET技术。因此,FinFET技术仍是未来集成电路先进工艺的主流技术之一。
随着FinFET技术的成熟度不断提升,其生产成本将持续降低,先进工艺占集成电路市场的比例也将不断提高。从技术更迭角度,先进工艺的持续性研发投入对中国集成电路企业保持市场竞争力起着至关重要的作用。值得一提的是,与成熟工艺相比,先进工艺具有高利润率的优势。例如,以成熟工艺为主要营收项目的中芯国际,2020年营收额为274.7亿元,净利润为43.32亿元,利润率为16%;与之对比的是以先进工艺为主要营收项目的台积电,2020年营收额为3100亿元,净利润为1200亿元,利润率为39%[19]。由此可知,攻克先进工艺是中国集成电路产业通往技术高地和利润高地的必由之路,晚攻克不如早攻克。目前,台积电、三星、英特尔是最主要的先进工艺晶圆代工企业,都具备5 nm节点先进工艺的生产能力;中国大陆企业具备14 nm节点先进工艺的代工能力,但在10 nm及以下节点先进工艺的生产能力上,与国外及中国台湾地区企业相比还有一定的技术差距。
自FinFET技术开始,集成电路在物理上的第三个维度成为研究人员重点开拓的领域,已发展出器件级三维集成、电路级三维集成、芯片级三维集成等方向。
FinFET技术已经发展接近10年,推动集成电路进入5 nm先进工艺节点。然而该技术对维持MOSFET器件的正常工作却越发“力不从心”,尤其是难以较好地控制泄漏电流。为了进一步提升栅电压对沟道电流的控制能力,一个必然的趋势是将MOSFET扁平的沟道“悬空”,再次提升栅电压的控制面积(图4(a)),并彻底切断来自硅衬底区域的泄漏电流。这种结构的MOSFET称之为“纳米片晶体管”[20]。纳米片晶体管延伸出的另一种结构是“纳米线晶体管”[21],该结构将扁平的沟道制成圆柱形(图4(b))。通常,纳米片晶体管和纳米线晶体管统称为环栅场效应晶体管(Gate-All-Around Field-Effect Transistor, GAAFET)。
MOSFET包含N型(NMOS)和P型(PMOS)晶体管2种类型,N型和P型晶体管构成反向器单元,在此基础上通过反相器和晶体管的复杂组合最终形成集成电路。GAAFET技术为集成电路布局提供了另一种方式:将N型和P型晶体管沿垂直方向堆叠,以器件级三维集成的方式形成反向器,或堆叠多层,形成更为复杂的结构单元(图5(a)),这样既可以显著提升电路集成度,又可以提升电路性能(图5(b))[22]
三星和英特尔将GAAFET技术作为下一代芯片的技术选择;台积电宣布3 nm节点仍采用FinFET技术,但未来2 nm节点也将采用GAAFET技术。虽然台积电、三星、英特尔都已完成GAAFET技术的前期论证,但是该技术最终能否实现量产化,还取决于芯片制造的技术难题能否被全部攻克,特别是芯片良率问题[23]。目前,中国大陆GAAFET技术研究工作主要由高校及研究院所开展,集成电路企业量产技术积累相对较少。
近年来,研究人员也在充分开发利用集成电路的第三个维度,即电路级三维集成。电路级三维集成技术已应用于实际产品,其中最具有代表性的是晶圆级三维堆叠技术。图6(a)是长江存储提出的Xtacking存储技术。该技术分别在2个独立的晶圆上完成存储阵列电路和互补金属氧化物半导体(Complementary Metal-Oxide-Semiconductor, CMOS)外围电路的制造,然后通过垂直金属互连通道将两片晶圆键合(Bonding),实现存储电路和外围电路的晶圆级三维堆叠[24]。当存储单元层数达到120层及以上时,外围电路占整体面积的50%以上,所以Xtacking存储技术在提升芯片存储密度方面优势巨大。图6(b)为日本索尼2021年报道的CMOS接触式图像传感器(Contact Image Sensor, CIS)芯片,该芯片通过硅通孔(Through Silicon Via, TSV)技术和键合技术,将CIS传感晶圆、存储晶圆、逻辑晶圆沿垂直方向堆叠,在提升芯片密度和性能的同时,实现感存算一体化[25]。晶圆级三维堆叠技术能有效突破摩尔定律在集成密度、互连密度、信号传输等方面的瓶颈,支撑集成电路性能、功能、能效的不断演进。此外,晶圆级三维堆叠技术可实现芯片性能的跨越式提升,有望成为中国研制高端芯片的一个重要突破口。
晶圆级三维堆叠涉及的核心工艺是硅通孔和键合工艺,这两项工艺是晶圆封测企业的技术强项。封测环节是当前中国在集成电路产业中实力最强的部分,全球十大封测厂家中中国大陆企业占据3家,分别是江苏长电、富通微电、天水华天,因此中国在先进封装和晶圆级三维堆叠技术领域有着很强的竞争力和研发实力。需要说明的是,晶圆代工企业也正在加速研发先进封装技术,前道工艺与后道工艺界限已趋于模糊,“前道制造向后走、后道制造向前走”的趋势越发明显[26]。近期台积电、三星、英特尔分别推出了基于各自工艺特色的晶圆级三维堆叠技术方案,例如台积电的系统整合芯片(System on Integrated Chips, SoIC)技术、三星的拓展的立方体(eXtended-Cube, X-Cube)技术、英特尔的Foveros技术。中芯国际的先进封装收入占比也在逐年提升,晶圆级三维堆叠技术处于研发攻关阶段;长江存储具备晶圆级三维堆叠技术的代工能力。鉴于中国大陆先进封装技术的雄厚基础,加之人才梯队不断完善,相关从业人员不断增多,中国晶圆级三维堆叠技术的发展与突破指日可待。
随着集成电路先进工艺技术复杂度的不断提升,芯片生产面临严重的成本问题:一方面,芯片的制造成本越来越高;另一方面,芯片的设计成本也越来越高。为了解决该问题,研究人员引入了芯片级三维集成技术,提出模块化的设计方法,其中最具发展前景的是芯粒技术[27]。如图7(a)所示,芯粒技术核心思想类似于组装计算机,把功能模块分解成多个高良率、低成本的小型芯片模块(称为芯粒),然后根据芯片功能的需求将芯粒灵活组合,并应用到不同场景[28]。芯粒技术的大规模应用需要解决芯片接口标准化的问题。2022年3月,英特尔联合AMD、ARM、高通、微软、谷歌云、Meta、台积电、日月光、三星行业巨头成立通用芯粒高速互连(Universal Chiplet Interconnect Express, UCIe)联盟,制定了UCIe技术标准,为推动芯粒技术产业化铺平道路。日前,苹果公司发布的M1 Ultra芯片通过Ultra Fusion封装架构将两块M1 Max芯片内部互连,实现了极强的芯片性能,包括2.5 TB/s的片间带宽(图7(b))[29],这是芯粒技术提升芯片性能的范例。
芯粒技术的内涵是通过基板将多颗芯粒进行互连,从而组成一个芯片系统,实现过程依赖于先进封装技术。如前文所述,封测环节是中国大陆在集成电路产业中的强项,所以芯粒技术有望成为中国集成电路产业实现技术飞跃的引擎。然而,需要注意以下几点:①中国集成电路企业应尽快加入UCIe联盟;②芯粒技术虽然属于先进封装技术,但并非由封装企业主导,而是由芯片设计企业主导,由代工企业支持,最后由封装企业完成芯片实现[30];③芯粒技术应用在先进工艺上的效果更为显著,但中国大陆企业先进工艺的晶圆代工能力仍需增强。
研发集成电路新概念、新原理、新设计方法,实现器件和电路层面的技术创新,是后摩尔时代集成电路的重要发展方向之一,中国学者在该领域取得了令人瞩目的成果。
在新型晶体管方面,北京大学对隧穿场效应晶体管(Tunneling Field-Effect Transistor, TFET)进行了持续性研究,提出了面向超低功耗电路应用的肖特基-隧穿混合控制新机理器件,实现了具有超陡亚阈值摆幅(SS=29 mV/dec)的MOSFET器件,并与集成电路企业合作开展了隧穿场效应晶体管技术的产业化研发[31]。西安电子科技大学在第三代半导体氮化镓外延生长、器件结构以及制造工艺的理论与技术方面取得了系列突破,实现了从核心设备、材料到器件的创新,使中国氮化物第三代半导体电子器件研究步入国际前沿行列[32]
在新型存储器方面,北京大学、清华大学、中国科学院微电子学研究所、北京航空航天大学、华中科技大学对以阻变式随机存取存储器(RRAM)为代表的新型存储器和基于忆阻器的存算一体化技术进行了深入的研究,从工作机理、性能优化、器件结构、工艺集成、电路设计及架构与算法等多层次实现创新突破,取得了系列研究成果,推动了新型存储器的大规模制作和商业化应用[33-38],部分成果已经开始向集成电路制造企业转移,对量产技术的研发也在进行中。
除以上研究成果之外,中国研究人员在铁电及反铁电晶体管、薄膜晶体管及显示电路、柔性电子器件、人工智能芯片等研究方向取得了诸多重要的进展。从研究成果的数量和质量上看,中国科研人员的研究能力、研究实力、研究潜力都是世界一流水平的。
集成电路技术涉及通信工程、计算机科学、信息工程、物理学、数学、化学、自动化、机械、电子学、材料学、集成电路设计制造等多个学科,是一门高技术密集性交叉学科[39]。因此,将其他学科的宝贵经验、科研成果、先进技术引入到集成电路学科,会对集成电路技术的发展起到带动作用。
北京大学在碳基电子学领域的发展形成了碳基CMOS集成电路无掺杂制备新技术,解决了长期困扰碳基半导体材料制备的问题,研制出性能优良、栅长为5 nm的碳基晶体管[40]。复旦大学在二维材料集成电路新型器件领域取得了丰硕的研究成果,在制约集成电路能效的存储墙问题和高能效存储计算等方面开展了深入的研究工作[41]。北京航空航天大学长期从事自旋电子学、新型信息器件、非易失存储器等领域的研究[42,43]。复旦大学长期从事集成电路设计和设计自动化方向的研究工作,开发了基于人工智能技术的模拟集成电路自动化设计工具,实现了电路设计从“人工密集型”到“机器密集型”的跨越[44]。浙江大学围绕二维材料、光电器件、类脑人工智能器件与芯片等前沿交叉方向开展了长期的研究工作[45,46]。此外,中国研究人员在硅光器件及集成、有机电子器件及电路、生物传感、医信交叉等前瞻性研究方向也取得了诸多重要进展。
(1)扩大成熟工艺市场占有率。未来五年,成熟工艺占集成电路市场份额仍将不低于50%,广阔的市场空间有待中国企业进一步开拓,这为中国集成电路产业发展提供了重要平台,为中国晶圆代工企业扩大规模提供了重要机会,为中国制造业转型升级提供了重要契机。在此背景下,可给予集成电路企业更大的政策支持,鼓励提升产品核心竞争力,扩大成熟工艺市场占有率;同时大力扶持新企业进入成熟工艺市场,稳固并提升中国在成熟工艺市场的地位和话语权;此外,注重集成电路人才的培养,为企业发展储备人才力量。
(2)推动先进工艺持续性研发。掌握先进工艺不仅能提升中国晶圆代工企业的竞争力,更能推动中国集成电路产业占据技术高地和利润高地。因此,要调动企业研发先进工艺的积极性,大力推动10 nm及以下技术节点集成电路的发展,给予政策、资金、人力支持,为先进工艺的研发生产提供更多便利条件。要鼓励企业与高校、科研院所进行深度合作,研发先进工艺,勇于尝试、敢于试错,让科研工作者有机会在先进产线验证新的科技理论。
(3)推进三维集成技术发展成熟。三维集成技术是先进工艺的延伸和拓展。在器件级三维集成方面,GAAFET技术对先进设备有极高要求,国内设备企业开展集成电路先进设备的研发势在必行。应鼓励相关企业进行科研攻关,大力引进有先进设备设计和生产经验的国外人才、挖掘有潜力的国内人才,使集成电路制造企业和设备制造企业紧密结合、齐头并进、共同发展。在电路级三维集成方面,“前道制造向后走、后道制造向前走”的趋势非常明显,前道工艺与后道工艺的界限趋于模糊。应引导中国大陆集成电路设计企业、制造企业、封测企业相互支持、协同合作,通过技术整合解决晶圆级三维堆叠技术及相关互连技术、电路的系统性集成设计等难题。在芯片级三维集成方面,需首先突破先进工艺技术难题,让企业“有米下炊”、有芯粒可用;芯粒技术涉及芯片设计、制造、封装、电子设计自动化(Electronic Design Automation, EDA)等多方面技术,所以要加强集成电路产业联动性;此外,鼓励企业和高校互动交流,加强跨界人才的培养,为芯粒技术培养更多新生力量。
(4)鼓励研发集成电路新概念、新原理、新设计方法。集成电路里程碑式的技术突破一般是由高校、科研院所完成理论和实验论证,并由企业实现产业化。而基于新概念、新原理、新设计方法的创新性工作,本身根植于集成电路现有体系,部分研究成果在短期内有望服务于产业化。所以,应重视基础性研究,进一步强化国家科技重大专项、国家自然科学基金、省部级基金等项目对集成电路学科的支持力度,增大科研项目覆盖面,多渠道大力支持集成电路技术的发展。
(5)积极引入其他学科的先进技术。该部分研究成果正处于前期研究阶段甚至是概念探索阶段,距离实际产业化还有一定距离,但是其中部分成果极有希望推动中国集成电路技术跨越式进步。所以,应给予这部分研究工作以支持,在重点专项、基金等方面予以适当倾斜,加强产学研紧密结合,引导研究工作服务于集成电路产业。
集成电路技术依旧在向前快速推进,随着智慧城市、智慧医疗、物联网等新兴技术的兴起,集成电路技术将获得更加广阔的应用空间,这也为中国发展成为集成电路强国提供了宝贵的机会。在成熟工艺方面,中国晶圆代工企业有着良好的技术积累,整体发展趋势向好,占成熟工艺的市场份额逐年提高,这为成熟工艺反哺先进工艺提供了条件。在先进工艺方面,尤其是10 nm及以下技术节点,中国晶圆代工企业面临着一定的困难,但是我们应以积极的心态看待这些困难:首先,成熟工艺占据集成电路市场份额的半壁江山;其次,集成电路先进工艺节点的演进趋势放缓;此外,可以通过三维集成、芯粒技术、架构设计等方式对集成电路性能进行弥补。在基础性研究方面,中国政策支持力度大,人才积累雄厚,科研人员的研究能力、研究实力、研究潜力均处于世界前列。因此,后摩尔时代必将见证中国集成电路产业的发展腾飞!
  • 国家自然科学基金(62004003)
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2022年第1卷第3期
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doi: 10.3981/j.issn.2097-0781.2022.03.003
  • 接收时间:2022-08-09
  • 出版时间:2022-09-20
  • 发布时间:2022-11-04
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  • 收稿日期:2022-08-09
  • 修回日期:2022-08-29
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国家自然科学基金(62004003)
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    1.北京信息科技大学信息与通信工程学院,北京 100101
    2.北京大学集成电路学院,北京 100871

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表12种不同金属材料的力学参数

Family
属数
Number of
genus
种数
Number of
species
占总种数比例
Percentage of
total species (%)

Genus
种数
Number of
species
占总种数比例
Percentage of total
species (%)
鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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