Article(id=1242130939397079833, tenantId=1146029695717560320, journalId=1146031591421210625, issueId=1242130930203165434, articleNumber=null, orderNo=null, doi=10.3981/j.issn.1000-7857.2013.h2.004, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=null, receivedDate=1368720000000, receivedDateStr=2013-05-17, revisedDate=1375718400000, revisedDateStr=2013-08-06, acceptedDate=null, acceptedDateStr=null, onlineDate=1382025600000, onlineDateStr=2013-10-18, pubDate=1382025600000, pubDateStr=2013-10-18, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1382025600000, onlineIssueDateStr=2013-10-18, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1774076693625, creator=sys-migrate, updateTime=1774076693625, updator=sys-migrate, issue=Issue{id=1242130930203165434, tenantId=1146029695717560320, journalId=1146031591421210625, year='2013', volume='31', issue='28-29', pageStart='null', pageEnd='null', issueExtLink='null', onlineDate='null', pubDate='1382025600000', pubDateStr='2013-10-18', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=3, issueType=-1, specialIssue=null, createTime=1774076691433, creator='sys-migrate', updateTime=1774076691433, updator='sys-migrate', preIssue=null, nextIssue=null, articleTotal=null, ext=null, issueFiles=null, downloadFileDto=null}, startPage=35, endPage=38, ext={EN=ArticleExt(id=1242130942530224954, articleId=1242130939397079833, tenantId=1146029695717560320, journalId=1146031591421210625, language=EN, title=Si-PIN Detector Response Function Model and Its Applications in EDXRF Technology, columnId=1242116080374710456, journalTitle=Science & Technology Review, columnName=Articles, runingTitle=null, highlight=null, articleAbstract=The spectrum analysis can be carried out via establishing the detector response function(DRF), to improve the automation level and the computation accuracy of the spectrum data processing. A general DRF model is established for Si-PIN detectors via the analysis of the X-ray physical detect procedure. The model contains four parts: a flat continuum shift from zero to full energy; a Gaussian shaped principal component of full energy peak; a Gaussian shaped Si escape peak; and an exponential tail on the low energy side of the full energy peak. Each part of the model, with a simple format, has a clear and definite physical meaning. Parameters are obtained by using the program, based on the Weighted Least-Squares(WLS) method. Nineteen elements' X-ray spectra in total are fitted in the study, and the fitting reduced chi-squares are also obtained simultaneously, which is in the range of 1.05-2.71. It is shown that this DRF model can represent the characteristic X-ray spectrum peak shape very well., authors=LI Zhe^1,3, TUO Xianguo², SHI Rui¹, authorsList=LI Zhe;TUO Xianguo;SHI Rui, authorCompany=1. Provincial Key Laboratory of Applied Nuclear Technology in Geosciences, Chengdu University of Technology, Chengdu 610059, China;2. Key Discipline Laboratory of National Defense for Radioactive Waste and Environmental Security, Southwest University of Science and Technology, Mianyang 621010, Sichuan Province, China;3. Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China, correspAuthors=null, authorNote=null, correspAuthorsNote=null, copyrightStatement=null, copyrightOwner=null, extLink=null, articleAbsUrl=null, sourceXml=null, magXml=null, pdfUrl=null, pdf=9xodJNu4OPOntmRG667dgQ==, pdfFileSize=785674, pdfExtLink=null, richHtmlUrl=null, mobilePdfUrl=null, reviewReport=null, pdfFirstPage=null, abstractGraph=null, abstractGraphContent=null, abstractVideo=null, citation=null, cebUrl=null, magXmlContent=null, mapNumber=null, fund=null), CN=ArticleExt(id=1242130941636841692, articleId=1242130939397079833, tenantId=1146029695717560320, journalId=1146031591421210625, language=CN, title=Si-PIN探测器响应函数模型及其在EDXRF技术中的应用, columnId=1146540929516700224, journalTitle=科技导报, columnName=研究论文, runingTitle=null, highlight=null, articleAbstract=建立探测器响应函数模型实现对测量X射线能谱的分析,可提高EDXRF技术中谱数据处理的自动化程度和计算精度。通过对X射线的探测物理过程进行分析,建立了一种Si-PIN探测器响应函数模型,该模型包括4部分:全能峰低能侧的连续平台、全能峰的高斯型主成分、高斯型的Si逃逸和全能峰低能侧的指数拖尾。模型形式简单,各部分物理意义明确,各参数用自行编制的基于加权最小二乘法的程序拟合得到。研究中对19种单元素样品的特征X射线谱进行了拟合,并计算得到了相应的拟合优度因子在1.05~2.71范围内。表明该模型可以较好地表征Si-PIN探测测量的X射线谱峰峰形,有助于提高EDXRF的自动化分析过程。, authors=李哲^1,3, 庹先国², 石睿¹, authorsList=李哲;庹先国;石睿, authorCompany=1. 成都理工大学地学核技术四川省重点实验室, 成都 610059;2. 西南科技大学核废物与环境安全国防重点学科实验室, 四川绵阳 621010;3. 中国科学院高能物理研究所, 北京 100049, correspAuthors=null, authorNote=null, correspAuthorsNote=null, copyrightStatement=null, copyrightOwner=null, extLink=null, articleAbsUrl=null, sourceXml=null, magXml=null, pdfUrl=null, pdf=lPDa6Ul1W8B9ulRbfU5sig==, pdfFileSize=785674, pdfExtLink=null, richHtmlUrl=null, mobilePdfUrl=null, reviewReport=null, pdfFirstPage=null, abstractGraph=null, abstractGraphContent=null, abstractVideo=null, citation=null, cebUrl=null, magXmlContent=null, mapNumber=null, fund=null)}, authors=null, 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