Article(id=1208361647761109023, tenantId=1146029695717560320, journalId=1146031591421210625, issueId=1208361635656352181, articleNumber=null, orderNo=21, doi=10.3981/j.issn.1000-7857.2025.04.00081, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1744905600000, receivedDateStr=2025-04-18, revisedDate=1753977600000, revisedDateStr=2025-08-01, acceptedDate=1756915200000, acceptedDateStr=2025-09-04, onlineDate=1766025467100, onlineDateStr=2025-12-18, pubDate=1757692800000, pubDateStr=2025-09-13, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1762358400000, onlineIssueDateStr=2025-11-06, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1766025467099, creator=13701087609, updateTime=1774079940445, updator=sys-migrate, issue=Issue{id=1208361635656352181, tenantId=1146029695717560320, journalId=1146031591421210625, year='2025', volume='43', issue='17', pageStart='1', pageEnd='144', issueExtLink='null', onlineDate='null', pubDate='1757692800000', pubDateStr='2025-09-13', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1766025464214, creator='13701087609', updateTime=1774330860874, updator='13041195026', preIssue=null, nextIssue=null, articleTotal=null, ext={EN=IssueExt(id=1243196994169189037, tenantId=1146029695717560320, journalId=1146031591421210625, issueId=1208361635656352181, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1243196994169189038, tenantId=1146029695717560320, journalId=1146031591421210625, issueId=1208361635656352181, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null, downloadFileDto=null}, startPage=100, endPage=106, ext={EN=ArticleExt(id=1208361648318951479, articleId=1208361647761109023, tenantId=1146029695717560320, journalId=1146031591421210625, language=EN, title=Research progress on wide bandgap semiconductor gallium nitride Schottky diodes, columnId=1150494644690366681, journalTitle=Science & Technology Review, columnName=Papers, runingTitle=null, highlight=null, articleAbstract=

GaN Schottky diodes offer significant advantages, including high electron mobility, low on−resistance, and high integration capabilities. These characteristics make them well−suited for applications in power electronics and microwave radio frequency (RF) fields, positioning them as a key enabler for advancing cutting−edge technologies. This paper provides an overview of recent research progress on GaN Schottky diodes, with a particular emphasis on how device structure influences performance. Through continuous structural optimization, the performance of GaN Schottky diodes has been substantially enhanced, demonstrating improvements in both forward and reverse characteristics. Their application scope has expanded from high−voltage environments to RF circuits. Meanwhile, it is recommended that future efforts focus on overcoming existing technical limitations by improving material quality, enhancing device reliability, and reducing manufacturing costs. With the sustained growth of China's integrated circuit industry, GaN Schottky diodes, benefiting from their superior high−frequency and high−voltage performance, are expected to become core components in next−generation electronic devices. In the future, these diodes will find broader applications across various domains and play a more significant role in addressing practical challenges and advancing industrial innovation.

, authors=null, authorsList=Zihan HE, Tao ZHANG, Zeyang REN, Jincheng ZHANG, authorCompany=null, correspAuthors=Tao ZHANG, authorNote=null, correspAuthorsNote=null, copyrightStatement=All rights reserved. Unauthorized reproduction is prohibited., copyrightOwner=null, extLink=null, articleAbsUrl=null, sourceXml=null, magXml=null, pdfUrl=null, pdf=null, pdfFileSize=null, pdfExtLink=null, richHtmlUrl=null, mobilePdfUrl=null, reviewReport=null, pdfFirstPage=null, abstractGraph=null, abstractGraphContent=null, abstractVideo=null, citation=null, cebUrl=null, magXmlContent=null, mapNumber=null, fund=null), CN=ArticleExt(id=1208361651540177113, articleId=1208361647761109023, tenantId=1146029695717560320, journalId=1146031591421210625, language=CN, title=宽禁带半导体氮化镓肖特基二极管研究进展, columnId=1146540929516700224, journalTitle=科技导报, columnName=研究论文, runingTitle=null, highlight=null, articleAbstract=

氮化镓肖特基二极管具有电子迁移率高、导通电阻低、集成度高等优势,能够很好地应用于电力电子及微波射频领域,已成为促使创新前沿技术进步的重要手段。回顾了近年来氮化镓肖特基二极管的研究历程,聚焦于器件结构对器件性能的影响,通过对氮化镓肖特基二极管结构的不断优化,其性能已得到长足的改善,从正向特性到反向特性,性能持续提升;从高压领域到射频电路,应用持续扩大;同时,建议从提升材料质量、提高器件可靠性、降低成本等方面入手,进一步突破现有技术瓶颈。可以预测,随着中国集成电路事业的不断发展,GaN肖特基二极管凭借其优异的高频、高压特性,将成为下一代电子设备的核心器件。未来GaN肖特基二极管在各领域的应用将更为广泛,在解决实际问题和行业挑战上发挥更大的作用。

, authors=

何子涵,硕士研究生,研究方向为氮化镓功率器件,电子信箱:

, authorsList=何子涵, 张涛, 任泽阳, 张进成, authorCompany=null, correspAuthors=张涛, authorNote=null, correspAuthorsNote=
张涛(通信作者),副教授,研究方向为宽禁带半导体氮化镓器件与集成技术,电子信箱:
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宽禁带半导体氮化镓肖特基二极管研究进展
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何子涵 , 张涛 * , 任泽阳 , 张进成
科技导报 | 研究论文 2025,43(17): 100-106
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科技导报 |研究论文 2025 , 43 (17) : 100 -106
宽禁带半导体氮化镓肖特基二极管研究进展
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何子涵 , 张涛* , 任泽阳, 张进成
作者信息
  • 西安电子科技大学宽禁带半导体器件与集成技术全国重点实验室,西安 710071
通讯作者:
张涛(通信作者),副教授,研究方向为宽禁带半导体氮化镓器件与集成技术,电子信箱:
Research progress on wide bandgap semiconductor gallium nitride Schottky diodes
Zihan HE , Tao ZHANG* , Zeyang REN, Jincheng ZHANG
Affiliations
  • State Key Laboratory of Wide−Bandgap Semiconductor Devices and Integrated Technology, Xidian University, Xi'an 710071, China
出版时间: 2025-09-13 doi: 10.3981/j.issn.1000-7857.2025.04.00081
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氮化镓肖特基二极管具有电子迁移率高、导通电阻低、集成度高等优势,能够很好地应用于电力电子及微波射频领域,已成为促使创新前沿技术进步的重要手段。回顾了近年来氮化镓肖特基二极管的研究历程,聚焦于器件结构对器件性能的影响,通过对氮化镓肖特基二极管结构的不断优化,其性能已得到长足的改善,从正向特性到反向特性,性能持续提升;从高压领域到射频电路,应用持续扩大;同时,建议从提升材料质量、提高器件可靠性、降低成本等方面入手,进一步突破现有技术瓶颈。可以预测,随着中国集成电路事业的不断发展,GaN肖特基二极管凭借其优异的高频、高压特性,将成为下一代电子设备的核心器件。未来GaN肖特基二极管在各领域的应用将更为广泛,在解决实际问题和行业挑战上发挥更大的作用。

氮化镓  /  肖特基二极管  /  凹槽阳极  /  低功函数金属

GaN Schottky diodes offer significant advantages, including high electron mobility, low on−resistance, and high integration capabilities. These characteristics make them well−suited for applications in power electronics and microwave radio frequency (RF) fields, positioning them as a key enabler for advancing cutting−edge technologies. This paper provides an overview of recent research progress on GaN Schottky diodes, with a particular emphasis on how device structure influences performance. Through continuous structural optimization, the performance of GaN Schottky diodes has been substantially enhanced, demonstrating improvements in both forward and reverse characteristics. Their application scope has expanded from high−voltage environments to RF circuits. Meanwhile, it is recommended that future efforts focus on overcoming existing technical limitations by improving material quality, enhancing device reliability, and reducing manufacturing costs. With the sustained growth of China's integrated circuit industry, GaN Schottky diodes, benefiting from their superior high−frequency and high−voltage performance, are expected to become core components in next−generation electronic devices. In the future, these diodes will find broader applications across various domains and play a more significant role in addressing practical challenges and advancing industrial innovation.

GaN  /  Schottky barrier diode  /  recessed anode  /  low work−function metal
何子涵, 张涛, 任泽阳, 张进成. 宽禁带半导体氮化镓肖特基二极管研究进展. 科技导报, 2025 , 43 (17) : 100 -106 . DOI: 10.3981/j.issn.1000-7857.2025.04.00081
Zihan HE, Tao ZHANG, Zeyang REN, Jincheng ZHANG. Research progress on wide bandgap semiconductor gallium nitride Schottky diodes[J]. Science & Technology Review, 2025 , 43 (17) : 100 -106 . DOI: 10.3981/j.issn.1000-7857.2025.04.00081
宽禁带半导体作为21世纪材料科学的重大突破之一,凭借其独特的物理特性,显著拓展了半导体器件的性能边界和应用边界,支撑了移动通信、人工智能、清洁能源等技术革命性的突破。第3代半导体氮化镓(GaN)具有禁带宽度大(~3.4 eV)、击穿场强高(~3.3 MV/cm)、电子迁移率高(~2000 cm2/Vs)、介电常数大(~9.5)等优势,是高功率电子器件研制中最具优势的材料之一[12],已成为宽禁带半导体电子器件研究的主流。对于GaN肖特基势垒二极管(schottky barrier diode,SBD)而言,由于受到材料外延、器件制备、封装技术等方面的限制,导致器件无法最大限度逼近其理论极限;另外,肖特基势垒二极管器件正向开启电压与反向泄漏电流之间存在相互制约的钳制关系,进一步限制了器件的工作效率,通过优化材料生长方式及器件制备工艺能够有效缓解上述问题。
氮化镓肖特基二极管从结构上可分为横向结构、准垂直结构和全垂直结构3种。准垂直结构和全垂直结构均属于纵向结构器件,器件在垂直方向承受耐压,击穿电压受漂移层厚度和掺杂浓度的共同影响,其峰值电场在漂移层内部,具有电流分布均匀,尺寸小及可靠性高等优势[3]。但受限于GaN衬底的高制造成本,基于同质外延工艺的GaN垂直器件难以实现大规模量产应用[4]。准垂直结构器件虽然可以在异质衬底上外延获得,但较薄的外延层厚度导致器件击穿电压较低,难以满足高压应用需求。相比于全垂直结构和准垂直结构器件而言,横向结构GaN 肖特基二极管能够与GaN高电子迁移率晶体管更好地实现单片集成,增加芯片集成度,降低制备成本[5]。但高密度二维电子气容易受到表面电场的影响,导致电流崩塌现象,使器件可靠性发生退化;与此同时,高耐压器件需要通过较大的沟道长度来实现,导致芯片面积的进一步增加 [6]
长期以来,如何实现较低的器件开启电压一直是GaN二极管的研究重点,混合阳极结构的提出为解决这一难题提供了思路。器件阳极电极分别由欧姆接触和肖特基接触组成,阳极电极内侧为欧姆接触,阳极电极外侧为肖特基接触,与单阳极金属GaN肖特基二极管相比,混合阳极GaN二极管通过改变2种电极的结构,实现开启电压可调的器件特性[6]。当器件处于反向关断状态时,肖特基金属通过实现高肖特基势垒阻挡反向漏电;当器件处于正向导通状态时,随着正向偏压的逐渐增大,肖特基金属下方的电子在电场作用下逐渐聚集形成导电沟道,此时器件由阴极欧姆区域到阳极欧姆区域的电流路径形成[7],器件导通。该结构器件在1.5~1.8 V电压下,电阻降低了25%~75%,击穿电压超过1 kV。在此基础上,采用混合阳极结合凹槽结构,并优化刻蚀工艺,获得了表面形貌均匀的肖特基凹槽面,提升了器件的性能。此外,还可以通过减薄AlGaN层的厚度,达到与凹槽阳极相同的效果,有效防止了刻蚀损伤。当器件反向偏压时,肖特基电极通过薄势垒层有效控制二维电子气(two−dimensional electron gas,2DEG)耗尽,阻断了漏电流。在确保器件具有较小开启电压的同时,实现漏电流的进一步降低。
当横向结构AlGaN/GaN二极管处于反向偏置状态时,阳极边缘较高的电场会产生较大的反向漏电流和过早击穿等问题[8],导致GaN二极管的实际击穿电压与理论值相差较远。欧洲微电子研究中心通过在阳极金属与AlGaN势垒层之间引入SiN插入层制备了栅边缘终端结构,当器件处于反向关断状态时,绝缘层减小了电场对阳极边缘的影响,提高了器件的反向性能[9]。与在同一晶圆上加工的传统肖特基二极管相比,栅极边缘终端器件可以获得更低反向漏电(−600 V时1 µA/mm以内)。但该结构会增加阳极的势垒高度,因此,栅边缘终端结构常常与凹槽阳极结构相结合,以平衡器件的正向和反向性能。通过进一步优化介质沉积工艺及界面处理工艺,也能够进一步抑制器件反向漏电,提升器件正向导通特性及击穿电压。
早期鳍式场效应晶体管结构的提出是为了应对传统平面栅场效应晶体管所面临的短沟道效应,该鳍型栅结构分别从顶侧和侧壁围绕沟道主体,能够有效提升栅极对沟道电流的控制能力 [10]。受到这一结构的启发,洛桑联邦理工学院成功研制出鳍型阳极结构AlGaN/GaN二极管,一方面,鳍式阳极直接与2DEG形成肖特基接触,这使SBD具有较低的开启电压;另一方面,当器件处于反向关断状态时,阳极边缘漏电通道被介质层及栅下耗尽区所阻断,使剩余反向压降全部降落至栅边缘而非肖特基结上,有效抑制了器件反向泄漏电流[11];通过改变鳍型栅结构的宽度可以实现对器件开启电压的调控,从而实现较低的开启电压,在快速开关功率集成电路的应用中具有巨大潜力[12]。此外,与其他结构相比,得益于鳍式三阳极结构的大表面积,器件散热能力大幅增强,热阻降低。
西安电子科技大学平面阳极易受高密度穿透位错影响导致器件反向漏电较大,以及阳极肖特基势垒较高导致器件开启电压较大的难题,提出位错免疫的低功函数金属阳极技术,不仅阻断了阳极下方由穿透位错导致的漏电,同时获得了极低的开启电压,在此基础上,成功研制了国际首款GaN肖特基二极管产品,并实现了器件的大规模应用。
GaN材料较高的禁带宽度导致传统肖特基接触具有较大的势垒高度,器件开启电压通常高达0.7 V,远高于目前商用的硅肖特基二极管器件[1314],严重阻碍了GaN肖特基二极管的商业化应用。如图1所示,低功函数金属W阳极工程技术能够有效突破AlGaN/GaN 肖特基二极管正向开启特性和反向漏电特性之间的钳制难题,实现了0.35 V的超低开启电压,同时保持0.01 mA/mm泄漏电流和3.1 mΩ·cm2导通电阻,大幅度降低器件开启电压、抑制器件反向漏电、提升器件击穿电压,为装备性能的提升奠定了基础。尽管凹槽阳极技术具备以上诸多优点,但仍面临一些关键挑战:首先,如何精准控制刻蚀凹槽的深度依然是该技术的一大难题;其次,等离子刻蚀过程中产生的晶格损伤可能影响器件的可靠性。要使该技术能够应用于工业化生产,必须首先解决这2个技术难题。
为了实现较高的整流效率,肖特基二极管需要具有较低的开启电压和较小的反向漏电,由于受到GaN材料高密度穿透位错以及高肖特基势垒等因素的影响,使得器件难以实现良好的正反向特性。凹槽阳极结构通过移除 AlGaN 势垒层,使阳极金属与二维电子气导电沟道直接接触,正向导通时沟道电子气仅需跨越较窄的势垒宽度与较低的势垒高度即可到达阳极金属,从而提升器件的正向电学特性[15]。另外,该结构将肖特基结从位错顶面转移至剖面,有效避免了大电流工作时由位错区域电流集聚引发的可靠性问题,实现了位错免疫效果。
目前,GaN材料主要通过在碳化硅、氧化铝,以及硅等异质衬底材料上外延获得,受到异质衬底和GaN材料之间较大的晶格失配和热失配的影响,GaN材料中存在高密度的缺陷,极大地影响了器件的漏电特性及击穿电压,给GaN基电子器件的稳定性和寿命带来不良影响[16]。如图2所示,对于传统平面阳极结构GaN肖特基二极管而言,从外延材料底部延伸出的穿透位错与阳极金属底部直接接触,当器件施加反向偏压时,阳极金属中的电子会通过穿透位错流向沟道,形成沿位错方向的漏电通道,导致器件反向漏电的增加,而对于势垒层被完全刻蚀的凹槽阳极结构GaN肖特基二极管而言,该结构有效阻断了凹槽底部区域穿透位错与导电沟道的连接,且外延表面的穿透位错线与凹槽阳极侧壁平行,有效地避免了位错的影响[17]
对于凹槽阳极结构GaN肖特基二极管而言,由于阳极金属与GaN非极性侧壁直接接触,故阳极金属与GaN非极性面的界面特性直接决定了器件的最终性能。半导体表面态通常是影响肖特基势垒的重要因素,对器件的载流子运输具有重要的影响,图3[18]为GaN非极性面的电子态密度和能带结构图,重构后的表面原子在导带底和价带顶中分别引入2种类型的表面态,导带底附近形成未占据的受主表面态,价带顶附近形成已占据的施主表面态,除此之外,禁带中再无其他能带或表面态出现,有效避免了GaN非极性面的费米钉扎现象。由于这些表面态的能级较浅,不会显著影响载流子的运输特性,因此凹槽侧壁非极性GaN表面为肖特基结的设计和制备提供了良好基础。
当阳极金属与GaN非极性侧壁接触后,金属原子和GaN表面的Ga原子和N原子均形成化学键,且金属与GaN界面原子均出现明显移动,由于界面处原子的杂化作用,接触面形成肖特基势垒。以镍、钨金属为例,当镍金属与GaN材料接触后,GaN带隙内引入了大量金属诱导间隙态,体现了界面间杂化作用,这也是肖特基势垒形成的原因之一,此外,由杂化所形成的电荷层使界面处的GaN导带呈现明显上弯,形成电子势垒。与上述情况类似,钨与GaN非极性面接触后,在界面处杂化作用下也会形成电子势垒,但势垒高度相较于镍金属出现明显降低,这也是低功函数金属阳极能够实现较低开启电压的根本原因。在此基础上,西安电子科技大学采用低功函数金属钨阳极和阳极后退火技术,成功实现了开启电压仅为0.35 V,击穿电压高达1.9 kV的横向结构AlGaN/GaN肖特基二极管,大幅度提升了GaN肖特基二极管性能,器件直流特性如图4[18]所示。
无线微波能量传输能够摆脱传统传能中电缆的束缚,从而实现远距离能量传输,可广泛应用在卫星、无人机和军事武器等领域,近年来被高度重视。GaN肖特基二极管具有击穿电压高、电流密度大及截止频率高等优势,在能量接收端可实现高效大功率整流,非常适合上述场景的应用[19]。另外,得益于GaN肖特基二极管的削波作用,也可广泛用于高频大功率限幅电路,与传统PIN二极管相比,肖特基二极管单一载流子导电的特点使其不存在电荷存储效应,可应用在更高的工作频段,且响应时间与恢复时间也更具有优势[20]
凹槽阳极结构GaN肖特基二极管的非线性特性使得其在不同频率下呈现出不同的阻抗,为了能够较为准确地表征GaN肖特基二极管的阻抗特性,往往需要建立精确的模型,因此,准确提取器件本征参数和外围寄生参数很有必要。高精度测试是实现器件侧重于集成电路的仿真程序(simulation program with integrated circuit emphasis,SPICE)建模的前提。值得注意的是,在准确模拟器件工作状态的同时,要尽可能地简化参数数量,以降低后续工作量,同时保证模型收敛性。首先,通过对器件正、反向I−V特性及C−V特性的测试,结合二极管拓扑电路模型,提取二极管SPICE参数,实现对器件本征参数的完善。然后,将构建好的SPICE模型导入到仿真软件中,以实现器件直流特性的模拟,并对仿真结果和测试数据进行对比,验证模型的准确性。
对于凹槽阳极结构GaN肖特基二极管而言,除了理想的二极管模型结构外,还存在包括阳极与二维电子气间的寄生参数、阴极电极和阳极电极间的寄生参数等在内的外围寄生[21],因此,需对该部分寄生参数进行提取保障模型的精准性。通常可采用SOLT(dhort−open−load−thru)和TRL(thru−reflect−line)方法对二极管外围寄生参数进行确定,由于SOLT方法对校准件的精度要求较高,而制作校准件的板材和连接头引入的误差会导致校准与实际结果偏差较大;TRL方法主要依赖于传输校准件,而不是过多地依赖反射校准件,能够更好地实现高精准性,所以通常可选用TRL校准方法。
微波整流电路作为微波无线传能系统接收端的核心模块,其转换效率和功率容量直接影响负载端能量接受的效率。图5为典型的微波整流结构[22],从左至右依次由匹配网络、隔直电容、输入滤波器、肖特基二极管、输出滤波器和负载构成。肖特基二极管作为核心元件,其串联电阻与击穿电压等参数是决定电路性能的关键。
传统微波整流模块大多采用Si或GaAs肖特基二极管,能够满足小功率下的性能需求,在大功率应用时,需要功率分配与功率合成网络组成的阵列来实现,不仅导致电路结构复杂化,更降低了电路的转换效率,进一步限制了微波整流模块在大功率整流环境下的应用潜力。得益于GaN材料较大的禁带宽度、高迁移率和高面密度二维电子气等特性,GaN肖特基二极管能够有效突破大功率整流瓶颈。西安电子科技大学基于自主研发的4英寸SiC基AlGaN/GaN材料实现了高性能凹槽阳极结构AlGaN/GaN微波肖特基二极管的制备,并采用该器件设计实现了如图6[23]所示的微波整流电路,在2.45 GHz频段下整流电路的峰值整流效率高达79%,功率容量为Si肖特基二极管整流电路的10~50倍。
限幅电路的核心器件为限幅二极管,根据所使用的二极管种类不同,其对应的限幅电路工作原理也有所区别,主要可以分为3种:基于整流二极管的整流限幅、基于变容二极管的变容限幅和基于PIN二极管的射频电导调制限幅。整流限幅电路通常由2个背对背放置的整流二极管组成,两者通过传输线相连,利用二极管导通的削波作用使负载电平稳定在预定范围内,有效限制了输入信号的功率。变容限幅电路利用变容二极管的结电容随着二极管两端电压变化的特性,当输入信号功率较小时,二极管的电容几乎不变,电路谐振使信号几乎可以无损通过,当输入信号功率增大时,变容二极管的结电容随之增大,导致电路失谐,使高功率信号被反射,从而起到限幅作用。射频电导调制限幅主要利用PIN二极管的电导调制特性,当输入高功率微波信号时,在信号的正半周期内,PIN二极管两侧的载流子会在电压作用下向I层注入,而在负半周期时,仅有一部分I层内的载流子能够漂移出I层或复合,使得I层中的载流子不断积累,导致I层由高阻态变为低阻态,此时微波信号通过主链路时会有较大的反射,从而限制信号的幅度。
根据限幅电路结构的不同,可分为无源限幅电路、半有源限幅电路和有源限幅电路。无源限幅电路通常采用二极管对管并联或二极管与扼流电感并联结构,其中电感为二极管提供直流偏置,当输入信号较小时,二极管等效为电容,与电感共同组成并联谐振电路,使信号几乎无损通过;当输入信号较大时,二极管等效为低阻抗电阻,此时电路转换成失谐振状态来反射入射功率,达到限制输出功率的目的。无源限幅电路结构简单,无需额外添加外置电路,但由于其工作特性完全依靠限幅二极管自身特性,无源限幅电路的起限电平和限幅能力难以满足高功率应用需求。半有源限幅电路通过给大功率PIN限幅二极管提供直流偏置来降低电路的起限电平,提高电路的限幅能力,当输入高功率微波信号时,电路通过耦合器从信号中耦合出一部分能量, 通过检波二极管将交流信号转换为直流信号,为大功率PIN限幅二极管提供直流偏置。半有源限幅电路通过耦合检波部分提供直流偏置,提高电路限幅能力,不用额外添加外置电路,不易受环境因素的影响,结构相对复杂。有源限幅电路则通过外部电压源为PIN限幅二极管提供偏置,使得电路结构更为复杂,并且需要持续供电,故应用较少。
随着半导体技术的快速发展,以GaN为代表的第3代宽禁带半导体材料及器件逐渐展现出显著应用优势,特别是在电力电子和微波射频领域都实现了多项技术突破,具备高频率及高功率特性的凹槽阳极结构AlGaN/GaN肖特基二极管在一系列半导体电子器件中脱颖而出,成为高频高功率应用的极佳选择。
目前针对其开启电压、击穿特性和表面态密度等问题进行的各种优化趋向成熟,在市场上也展现出良好的应用前景。在可预见的未来,GaN肖特基二极管在各领域的应用将持续扩大,在提升材料质量、提高器件可靠性、降低成本等方面将实现质的飞跃,为中国集成电路事业的发展作出重要贡献。

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2025年第43卷第17期
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doi: 10.3981/j.issn.1000-7857.2025.04.00081
  • 接收时间:2025-04-18
  • 首发时间:2025-12-18
  • 出版时间:2025-09-13
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  • 收稿日期:2025-04-18
  • 修回日期:2025-08-01
  • 录用日期:2025-09-04
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    西安电子科技大学宽禁带半导体器件与集成技术全国重点实验室,西安 710071

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张涛(通信作者),副教授,研究方向为宽禁带半导体氮化镓器件与集成技术,电子信箱:
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2种不同金属材料的力学参数

Family
属数
Number of
genus
种数
Number of
species
占总种数比例
Percentage of
total species (%)

Genus
种数
Number of
species
占总种数比例
Percentage of total
species (%)
鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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