Article(id=1241765088336610020, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1241765084528181978, articleNumber=null, orderNo=null, doi=10.16790/j.cnki.1009-9239.im.2021.07.014, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1597075200000, receivedDateStr=2020-08-11, revisedDate=1599494400000, revisedDateStr=2020-09-08, acceptedDate=null, acceptedDateStr=null, onlineDate=1773989467938, onlineDateStr=2026-03-20, pubDate=1626710400000, pubDateStr=2021-07-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1773989467938, onlineIssueDateStr=2026-03-20, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1773989467938, creator=13701087609, updateTime=1773989467938, updator=13701087609, issue=Issue{id=1241765084528181978, tenantId=1146029695717560320, journalId=1149653034449285133, year='2021', volume='54', issue='7', pageStart='1', pageEnd='120', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1773989467027, creator=13701087609, updateTime=1773989590112, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1241765600834421400, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1241765084528181978, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1241765600834421401, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1241765084528181978, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=95, endPage=101, ext={EN=ArticleExt(id=1241765089003504361, articleId=1241765088336610020, tenantId=1146029695717560320, journalId=1149653034449285133, language=EN, title=XLPE Insulation Reliability Assessment Based on Accelerated Performance Degradation Data, columnId=1192878364340924664, journalTitle=Insulating Materials, columnName=Test and Analysis, runingTitle=null, highlight=null, articleAbstract=

The traditional insulation reliability evaluation method based on failure life data for solid dielectric need long test time, and the failure data is little and difficult to obtain. In view of this issue, a reliability assessment method based on the test data of accelerated performance degradation was studied in this paper. Firstly, the average charge density was used as the characteristic parameter of performance degradation, and accelerated performance degradation tests were conducted to obtain performance degradation data under 140 kV/mm, 160 kV/mm, and 180 kV/mm of field strength, respectively. Secondly, the pseudo-failure life of XLPE insulation material under different field strengths was calculated, and its statistical distribution was determined. Finally, the pseudo-failure life data was expanded in combination with the virtual augmentation theory, and the expanded data was analyzed by statistical analysis methods. The results show that the performance reliability indicators such as sample reliability, failure distribution density function, and average life can be obtained through using accelerated performance degradation test method to assess the reliability of XLPE insulation. In combination with the accelerated life model theory, the life expectancy of the XLPE insulating material is 15.3 years under 20 kV/mm of stable field strength, and the reliability when reaching the expected life is 0.445 1.

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传统的基于失效寿命数据的固体电介质绝缘可靠性评估方法,试验时间长、失效数据少且难以获取。针对这一问题,本文研究了基于加速性能退化试验数据的可靠性评估方法。首先,采用平均电荷密度作为性能退化特征量,分别在140、160、180 kV/mm场强条件下进行加速性能退化试验,获取性能退化数据。其次,计算得出各场强条件下交联聚乙烯(XLPE)绝缘材料的伪失效寿命并确定其统计分布。最后,结合虚拟增广理论对伪失效寿命数据进行扩充,利用统计分析方法对扩充后的数据进行分析。结果表明:采用加速性能退化试验方法进行XLPE绝缘可靠性评估,经理论计算得到样本可靠度、失效分布密度函数、平均寿命等性能可靠性指标。结合加速寿命模型理论推导出20 kV/mm稳定场强条件下该XLPE绝缘材料的预期寿命为15.3年,且到达预期寿命时可靠度为0.445 1。

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杨平(1994-),男(汉族),四川资阳人,硕士生,主要从事高电压与绝缘技术的研究。
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陈新岗(1968-),男(汉族),重庆人,教授,主要从事电气设备状态监测、智能发变电运行与控制、信号采集与信号处理的研究。

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陈新岗(1968-),男(汉族),重庆人,教授,主要从事电气设备状态监测、智能发变电运行与控制、信号采集与信号处理的研究。

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陈新岗(1968-),男(汉族),重庆人,教授,主要从事电气设备状态监测、智能发变电运行与控制、信号采集与信号处理的研究。

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时间/s平均电荷密度/(C·m-3)
140 kV/mm160 kV/mm180 kV/mm
50070.52770.66177.014
60071.02376.65477.373
70071.01976.56977.568
80071.10676.48578.060
90071.01678.68378.446
1 10071.07080.72679.064
1 20071.16580.30879.341
1 30071.25680.42079.586
1 40071.31280.53179.747
1 50071.33581.15580.222
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部分不同场强条件下XLPE绝缘材料加速退化试验性能退化数据均值

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时间/s平均电荷密度/(C·m-3)
140 kV/mm160 kV/mm180 kV/mm
50070.52770.66177.014
60071.02376.65477.373
70071.01976.56977.568
80071.10676.48578.060
90071.01678.68378.446
1 10071.07080.72679.064
1 20071.16580.30879.341
1 30071.25680.42079.586
1 40071.31280.53179.747
1 50071.33581.15580.222
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拟合函数140 kV/mm160 kV/mm180 kV/mm
SSEθψSSEθψSSEθψ
幂函数0.115 47.455×10-367.5515.582 78.110×10-370.110.1503.720×10-260.94
对数函数0.115 20.53067.4514.884 57.90624.90.1622.91758.67
指数函数0.139 37.77×10-670.5323.4041.026×10-470.550.0824.110×10-275.54
线性函数0.139 15.526×10-470.5322.609 98.111×10-370.110.0763.160×10-375.48
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各拟合模型曲线函数及参数估计

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拟合函数140 kV/mm160 kV/mm180 kV/mm
SSEθψSSEθψSSEθψ
幂函数0.115 47.455×10-367.5515.582 78.110×10-370.110.1503.720×10-260.94
对数函数0.115 20.53067.4514.884 57.90624.90.1622.91758.67
指数函数0.139 37.77×10-670.5323.4041.026×10-470.550.0824.110×10-275.54
线性函数0.139 15.526×10-470.5322.609 98.111×10-370.110.0763.160×10-375.48
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A1A2A3A4A5A6A7A8A9A10A11A12A13A14A15
0.060.120.180.240.360.600.961.001.061.121.181.241.361.601.85
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虚拟增广之后伪失效寿命数据

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A1A2A3A4A5A6A7A8A9A10A11A12A13A14A15
0.060.120.180.240.360.600.961.001.061.121.181.241.361.601.85
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HPKC
Weibull分布00.966 70.096 30.412 5
正态分布00.932 30.113 60.412 5
对数正态分布00.931 00.108 50.412 5
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各分布假设检验结果

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HPKC
Weibull分布00.966 70.096 30.412 5
正态分布00.932 30.113 60.412 5
对数正态分布00.931 00.108 50.412 5
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基于加速性能退化数据的XLPE绝缘可靠性评估
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陈新岗 1, 2 , 杨平 1 , 马志鹏 3 , 陈姝婷 1 , 罗浩 1 , 刘新宇 1
绝缘材料 | 测试与分析 2021,54(7): 95-101
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绝缘材料 | 测试与分析 2021, 54(7): 95-101
基于加速性能退化数据的XLPE绝缘可靠性评估
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陈新岗1, 2, 杨平1, 马志鹏3, 陈姝婷1, 罗浩1, 刘新宇1
作者信息
  • 1重庆理工大学 电气与电子工程学院,重庆 400054
  • 2重庆市能源互联网工程技术研究中心,重庆 400054
  • 3重庆大学 电气工程学院,重庆 400044
  • 陈新岗(1968-),男(汉族),重庆人,教授,主要从事电气设备状态监测、智能发变电运行与控制、信号采集与信号处理的研究。

通讯作者:

杨平(1994-),男(汉族),四川资阳人,硕士生,主要从事高电压与绝缘技术的研究。
XLPE Insulation Reliability Assessment Based on Accelerated Performance Degradation Data
Xingang CHEN1, 2, Ping YANG1, Zhipeng MA3, Shuting CHEN1, Hao LUO1, Xinyu LIU1
Affiliations
  • 1School of Electrical and Electronic Engineering, Chongqing University of Technology, Chongqing 400054, China
  • 2Chongqing Engineering Research Center of Energy Internet, Chongqing 400054, China
  • 3School of Electrical Engineering, Chongqing University, Chongqing 400044, China
出版时间: 2021-07-20 doi: 10.16790/j.cnki.1009-9239.im.2021.07.014
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传统的基于失效寿命数据的固体电介质绝缘可靠性评估方法,试验时间长、失效数据少且难以获取。针对这一问题,本文研究了基于加速性能退化试验数据的可靠性评估方法。首先,采用平均电荷密度作为性能退化特征量,分别在140、160、180 kV/mm场强条件下进行加速性能退化试验,获取性能退化数据。其次,计算得出各场强条件下交联聚乙烯(XLPE)绝缘材料的伪失效寿命并确定其统计分布。最后,结合虚拟增广理论对伪失效寿命数据进行扩充,利用统计分析方法对扩充后的数据进行分析。结果表明:采用加速性能退化试验方法进行XLPE绝缘可靠性评估,经理论计算得到样本可靠度、失效分布密度函数、平均寿命等性能可靠性指标。结合加速寿命模型理论推导出20 kV/mm稳定场强条件下该XLPE绝缘材料的预期寿命为15.3年,且到达预期寿命时可靠度为0.445 1。

XLPE  /  加速性能退化  /  虚拟增广  /  可靠性评估  /  退化轨迹

The traditional insulation reliability evaluation method based on failure life data for solid dielectric need long test time, and the failure data is little and difficult to obtain. In view of this issue, a reliability assessment method based on the test data of accelerated performance degradation was studied in this paper. Firstly, the average charge density was used as the characteristic parameter of performance degradation, and accelerated performance degradation tests were conducted to obtain performance degradation data under 140 kV/mm, 160 kV/mm, and 180 kV/mm of field strength, respectively. Secondly, the pseudo-failure life of XLPE insulation material under different field strengths was calculated, and its statistical distribution was determined. Finally, the pseudo-failure life data was expanded in combination with the virtual augmentation theory, and the expanded data was analyzed by statistical analysis methods. The results show that the performance reliability indicators such as sample reliability, failure distribution density function, and average life can be obtained through using accelerated performance degradation test method to assess the reliability of XLPE insulation. In combination with the accelerated life model theory, the life expectancy of the XLPE insulating material is 15.3 years under 20 kV/mm of stable field strength, and the reliability when reaching the expected life is 0.445 1.

XLPE  /  accelerated performance degradation  /  virtual augmentation  /  reliability assessment  /  degradation trajectory
陈新岗, 杨平, 马志鹏, 陈姝婷, 罗浩, 刘新宇. 基于加速性能退化数据的XLPE绝缘可靠性评估. 绝缘材料, 2021 , 54 (7) : 95 -101 . DOI: 10.16790/j.cnki.1009-9239.im.2021.07.014
Xingang CHEN, Ping YANG, Zhipeng MA, Shuting CHEN, Hao LUO, Xinyu LIU. XLPE Insulation Reliability Assessment Based on Accelerated Performance Degradation Data[J]. Insulating Materials, 2021 , 54 (7) : 95 -101 . DOI: 10.16790/j.cnki.1009-9239.im.2021.07.014
绝缘材料的性能决定着电力电缆是否能正常运行,交联聚乙烯(cross-linked polyethylene, XLPE)绝缘材料具有良好的耐热性、较高的绝缘电阻和耐压强度,电气性能优良。对XLPE绝缘材料进行老化评估有助于预测电缆更换的时间,节省电缆维护成本。电、热等应力会加速XLPE的寿命失效,加速寿命试验是研究其失效原理、评估失效寿命的有效方式,但随着绝缘技术、生产工艺的提升,XLPE电缆绝缘材料这类长寿命产品在传统的加速寿命试验中容易表现出零失效或者极小概率失效的情况,从而导致试验时间加长、试验经费增加等问题,使得在可靠性试验方法的发展上有了一定的局限性。因此,有必要开展基于加速性能退化数据的可靠性评估方法研究。
传统的加速寿命试验需要记录大量失效数据,而针对XLPE绝缘材料这类长寿命、高成本产品要做到大样本、长时间试验并不现实,而加速性能退化试验能有效解决这类问题[1]。原理是在强应力下表征性能退化的特征量累积达到某一阈值就会导致产品失效,在不同时刻性能特征量退化数据基础上进行分析处理,利用统计分析手段对其可靠性进行评估。
对于加速性能退化数据可靠性评估问题,国内外已经做了大量的研究工作。文献[2]结合Monte Carlo法对性能退化数据进行分析处理并推断出产品的伪失效寿命;文献[3]则对性能退化轨迹的建立提出了方法及流程;文献[4]就性能退化轨迹和性能退化量分布分别进行了可靠性评估方法研究,并利用加速性能退化数据对碳膜电阻器的可靠性进行了评估;文献[5]利用函数模型对某电子产品加速退化轨迹进行了拟合;文献[6]利用一种极大似然分析方法对性能退化数据进行了处理;文献[7]对产品性能退化轨迹模型进行估计并推导出产品的寿命;文献[8]对性能退化数据的应用和可靠性建模进行了深入研究;文献[9]利用加速退化试验数据对给定失效阈值的产品进行退化轨迹建模,并对其可靠性进行了评估。
本文首先介绍性能退化的概念与基于加速性能退化数据可靠性评估的优势,随后基于伪失效寿命分布法分析性能退化试验获取的XLPE绝缘材料性能退化数据,利用文中所提及方法对该XLPE绝缘材料可靠性进行评估,并推导出电力电缆稳定运行场强条件下该绝缘材料的预期寿命。
在1993年LU C J等[2]就提出了基于性能退化数据分析的通用数学模型,如式(1)所示。
Dij=T(tij,Φ(γi,φij))+ξij
式(1)中:Dij是第i组试验样本在测试tj时刻表现出的表征性能退化的特征量测试值;T(tij,Φ(γi,φij))为实际退化量值,γiφij为相应参数;ξij是与T(tij,Φ(γi,φij))相互独立且服从正态分布的测量误差。一般地,以式(1)中的Dij=T(tij,Φ(γi,φij))为性能退化轨迹模型。
加速性能退化试验是对性能退化过程的规律性进行量化,其机理性、退化规律、分布模型与性能退化试验数据分析相同。性能退化模型的试验样本很难通过物理失效分析方法得到,一般情况下需要结合现有的数学模型和优化分析手段通过拟合、优化得到所需的退化轨迹模型。
对于绝大多数具有性能退化特点的试验样本,其退化轨迹可用式(2)~(5) 4类数学模型进行有效拟合[10]
线性退化模型:
D(t)=θt+ψ
幂函数模型:
D(t)=ψtθ
对数函数模型:
D(t)=θlnt+ψ
指数函数模型:
D(t)=ψeθt
式(2)~(5)中:D(t)为试验样本退化试验特征量在t时刻的性能退化检测值;θψ为未知参数,可以通过试验数据拟合求得。
性能退化轨迹模型的建立主要包括拟合模型的选择、拟合优度的评价以及模型参数的估计。本研究利用平方误差和(sum of squared error, SSE)对拟合模型的拟合优度进行评估,其数学表达式如式(6)所示。
SSE=i=1n(Dij-D¯)2
式(6)中:SSE为平方误差和,即试验误差大小的偏差平方和,反映测量数据点与拟合函数之间的偏差总量,其值的大小表示拟合效果的优劣;Dijj时刻第i组样本性能退化量的检测值;D¯是其拟合函数对应值。
在前文确定的轨迹模型中求取其伪失效寿命值,再根据伪失效分布法检验其分布的合理性。伪失效分布法通过建立试验样本加速退化特征量数据与时间的函数关系,利用加速退化轨迹模型表示样品伪失效寿命值与施加应力之间的关系[11]。具体步骤如下:
(1)对试验样本进行加速退化试验,并记录退化数据,根据试验要求制定加速退化失效阈值。然后利用已知性能退化轨迹数学模型对记录数据进行非线性最小二乘法拟合[12],评价出最优拟合度数学模型并求解模型参数。
(2)结合失效阈值,获取伪失效寿命数据并对其进行分布假设性检验。一般对于电力设备,特别是XLPE绝缘材料而言,其寿命分布通常符合Weibull分布、正态分布或者对数正态分布[13]
(3)结合虚拟增广理论确定样本寿命分布,对XLPE绝缘材料寿命进行可靠性评估。
在对成本昂贵、寿命较长的产品进行老化试验时往往很难得到大样本失效数据,而利用小样本数据虚拟增广方法对样本数据进行扩充能很好地解决样本数据不足的缺点[14]。设n为增广后的样本数据检测量,A¯为增广前试验样本数据量的均值。虚拟增广样本数据前后均值A¯应保持相等,且增广后试验样本数据的标准差ω与增广之后类似样本的标准差相等[15],即满足式(7)
1ni=1nAi=A¯1n-1i=1n(A¯-Ai)2=ω2
为使增广后数据更为合理,建议用式(8)所示增广公式对原始数据进行增广。
Ai=A¯±(α1×(i-1)α2+λ)ω;i=1,...n/2
式(8)中:α1α2为控制系数(根据经验自行设定);λ为待定系数;n为需要增广的样本数据量。
在加速试验过程中,性能退化试验和寿命试验失效原理相同。加速性能退化试验是在加速寿命试验基础上,选取材料某种性能(如表征空间电荷积聚特性的平均电荷密度)作为变量,获取试验过程中的特征量退化数据。由于加速性能退化数据分析获得的寿命为伪失效数据,但其失效机理符合加速寿命试验,可以使用加速寿命模型分析方法对性能退化数据分析进行推广[16],具体模型如式(9)所示。
lnL=a+bΦ(s)
式(9)中:L为特征寿命;Φ(s)为应力水平;ab为性能参数,可由高斯-马尔可夫定理求取其最佳线性无偏估计值。
电力设备特别是XLPE电缆,由于微孔、气隙等影响,在电场的作用下,不同老化程度的绝缘材料内部电子被绝缘层内的陷阱捕获,导致电荷在绝缘层内积聚而形成空间电荷[17]
平均电荷密度的变化特性能有效反映交联聚乙烯的老化程度[18],可利用平均电荷密度的变化量作为电缆绝缘材料性能退化特征量对其寿命进行评估分析。平均电荷密度可以根据式(10)获取。
q(t)=1x1-x0x0x1|ρ(x,t)|dx
式(10)中:q(t)为某时刻空间电荷平均电荷密度;x0x1为电极位置;ρ(x,t)t时刻样本厚度方向上位置x处的空间电荷密度。
采用电声脉冲(pulsed electro-acoustic,PEA)法对试验样本的空间电荷进行测试,具体试验装置如图1所示,在试验中选取电场强度作为加速试验条件,结合恒定应力试验方法对交联聚乙烯材料压片进行性能退化试验[19]
首先,选取长宽均为2 cm、厚度为0.06 mm、型号为LS4258DCE的XLPE绝缘材料压片,经缺陷挑选选择27片,将其分为A、B、C 3组,每组各9片,经干燥、脱气处理后分别在140、160、180 kV/mm场强条件下进行PEA试验。图2为不同场强条件下空间电荷密度分布图。
其次,重复完成各组压片试验,分别记录各场强条件下的PEA测试数据。因为设备、人为等因素可能会造成试验误差较大,所以试验结束后选择剔除掉误差较大的试验组数据。
最后,结合式(10)计算各组平均电荷密度值,选择各组数据的平均值作为当前试验组测试值并截取期间某一段间隔时刻试验数据进行分析处理。数据分布如图3所示,部分数据如表1所示。
图4为不同场强条件下各平均电荷密度的拟合结果。不同老化程度、不同生产制作工艺的XLPE绝缘材料,其内部空间电荷分布特性会有不同,无法准确确定其失效阈值。因此本试验采用同一批次、老化程度相近的XLPE绝缘材料压片进行加速性能退化试验。
根据交联聚乙烯交联程度,综合考虑样本厚度与其杂质质量分数情况,其阈值选用加速退化试验中首先达到本批次样本失效寿命时其内部平均电荷密度的Weibull统计结果值(115.62 C/m3)作为伪失效寿命失效阈值[20],再结合不同拟合模型(如表2所示)分别计算出140、160、180 kV/mm场强条件下样本的伪失效寿命分别为107 914.3、106 713.2、12 700.0 s。
利用虚拟增广数据容量的方法将寿命数据增广到n=15,结合1.3节理论依据将所得伪失效寿命数据均值设定为A¯,增广数据标准差ω为已知。增广后的数据如表3所示。
得到样本伪失效数据后需要对其进行分布检验。失效数据分布包括正态分布、Weibull分布、对数正态分布等常用分布[21]。分别对所得伪失效寿命数据进行分布检验,如图5所示。在各分布假设图中,越接近直线则表示该假设分布越接近可行分布。结合MATLAB软件工具对各分布进行Kolmogorov-Smienov(K-S)检验,结果如表4所示。
表4中,H的数值表示是否接受假设,1为拒绝,0则为接受;P为服从假设分布的概率值,KC为观测值。
根据假设检验结果可知,该失效寿命数据均服从表4中的3种概率密度分布,其中服从Weibull分布的概率最高,因此本研究选择Weibull分布作为该XLPE绝缘材料试验样本失效寿命数据分布是合理的。
依据Weibull分布试验数据可靠性分析方法,结合加速寿命模型的分析,对分布拟合后的非线性曲线进行时间尺度变换,再结合求极值分布参数的最佳线性无偏估计法分别对其极值参数进行求解[22],对增广寿命数据进行加速寿命模型推广,结果如式(11)所示。
μ̂=i=-77D(n,r,j)lntij=20.08δ̂=i=-77C(n,r,j)lntij=2.35
式(11)中:D(r,n,j)是最优线性不变估计系数;C(r,n,j)是最优线性无偏估计系数,可查表获得[23]。求得Weibull分布尺度与形状参数的点估计η̂=exp(μ̂)m̂=gr,n·δ̂-1,其中gr,n是样本对应估计m̂的偏修系数。
根据服从Weibull分布的XLPE绝缘材料性能退化数据分析,可以对其试验样本的可靠度R(t)、失效概率密度函数f(t)、平均寿命时间L(t)等性能指标进行求解,具体求解方法如式(11)所示。
由于本研究选用Weibull分布作为XLPE绝缘绝缘材料失效寿命数据分布,存在式(12)所示关系。
R(t)=exp(-(η̂t-1)m̂)=exp(-(71277.1×t-1)1.42795)
式(12)中:R(t)为试验样本可靠度,其函数曲线如图6所示。
失效概率密度函数如式(13)所示,该函数曲线如图7所示。
f(t)=m̂η̂(tη̂)m̂-1exp(-(tη̂)m̂)=1.4279571277.1×(t71277.1)0.42795exp(-(t71277.1)1.42795)
图7可以看出,加速性能退化试验初期,XLPE绝缘材料由于气隙、微孔等原因,在场强作用下,绝缘内部空间电荷迅速注入、积聚导致电树枝的形成[24],且电树枝呈扇状随场强畸变程度向外扩散,故性能下降较快。然而一段时间后,电树枝扩散达到滞长阶段,使其扩散减缓,所以性能下降趋势变得平缓[25]
预期平均寿命如式(14)所示。
L(t)=exp(GH-IMEG-I2+EM-IHEG-I2Φ˜(s))×Γ(1+1m̂)=5.282×108×0.911
式(14)中:GHIMEMIHEGI2函数值可以在文献[23]中查到;Φ˜(s)为20 kV/mm稳定场强条件。计算求得该XLPE绝缘材料在20 kV/mm稳定场强条件下的预期平均寿命为4.81×108(s)≈15.3年,结合式(12)可以计算出平均寿命的可靠度为R=0.445 1。
(1)选取平均电荷密度作为性能退化量,利用加速退化试验获取能表征性能退化的特征量数据,再结合已有的数学经验模型对退化试验数据进行拟合,能有效解决物理失效数据获取较难,且时间较长的缺点。
(2)针对XLPE绝缘材料多样本试验难度大、成本消耗快等问题,本文在利用伪寿命分布方法的加速退化试验基础上,结合虚拟增广理论对试验样本可靠性进行评估,得到其伪失效寿命分别为107 914.3、106 713.2、12 700.0 s。
(3)理论推算得到试验用XLPE绝缘材料样本在稳定场强20 kV/mm条件下运行15.3年达到预期失效寿命,且达到失效寿命时的可靠度为0.445 1,即当该材料达到平均寿命时间时,仍有44.51%处于未失效状态。
  • 国家重点研发计划项目(2016YFB0900701)
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2021年第54卷第7期
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doi: 10.16790/j.cnki.1009-9239.im.2021.07.014
  • 接收时间:2020-08-11
  • 首发时间:2026-03-20
  • 出版时间:2021-07-20
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  • 收稿日期:2020-08-11
  • 修回日期:2020-09-08
基金
国家重点研发计划项目(2016YFB0900701)
作者信息
    1重庆理工大学 电气与电子工程学院,重庆 400054
    2重庆市能源互联网工程技术研究中心,重庆 400054
    3重庆大学 电气工程学院,重庆 400044

通讯作者:

杨平(1994-),男(汉族),四川资阳人,硕士生,主要从事高电压与绝缘技术的研究。
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2种不同金属材料的力学参数

Family
属数
Number of
genus
种数
Number of
species
占总种数比例
Percentage of
total species (%)

Genus
种数
Number of
species
占总种数比例
Percentage of total
species (%)
鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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