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Article(id=1235553559312396663, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1235553554455392591, articleNumber=null, orderNo=null, doi=10.16790/j.cnki.1009-9239.im.2021.05.016, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1595347200000, receivedDateStr=2020-07-22, revisedDate=1599494400000, revisedDateStr=2020-09-08, acceptedDate=null, acceptedDateStr=null, onlineDate=1772508524014, onlineDateStr=2026-03-03, pubDate=1621440000000, pubDateStr=2021-05-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1772508524014, onlineIssueDateStr=2026-03-03, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1772508524014, creator=13701087609, updateTime=1772508524014, updator=13701087609, issue=Issue{id=1235553554455392591, tenantId=1146029695717560320, journalId=1149653034449285133, year='2021', volume='54', issue='5', pageStart='1', pageEnd='108', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1772508522857, creator=13701087609, updateTime=1773989531393, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1241765354544890513, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1235553554455392591, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1241765354544890514, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1235553554455392591, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=104, endPage=108, ext={EN=ArticleExt(id=1235553559605997957, articleId=1235553559312396663, tenantId=1146029695717560320, journalId=1149653034449285133, language=EN, title=Application of Visual Identity System in Appearance Defect Detection of Polyimide Film Sintering Wire, columnId=1192878364340924664, journalTitle=Insulating Materials, columnName=Test and Analysis, runingTitle=null, highlight=null, articleAbstract=

The traditional electromagnetic wire appearance defect detection uses manual detection, which is low efficiency and high cost. With the continuous improvement of requirements of motor on the appearance quality of electromagnetic wire, it is necessary to enhance the identification efficiency of electromagnetic wire appearance defects. A visual identity system of electromagnetic wires defects was developed, and the practical application effect of the system was verified. The results show that the defect visual identity system can improve the detection rate of the thin film sintering line appearance defects. By analyzing the statistical types and quantities of defects, the problems of raw materials or the production process problems of electromagnetic wire can be found in time, so as to formulate corrective measures in time and reduce the rejection rate of the thin film sintering line.

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传统的电磁线外观缺陷识别采用人工检测，效率低且成本高。随着电机对电磁线外观质量要求的不断提高，有必要增强电磁线外观缺陷识别效能。本文研制了电磁线缺陷视觉识别系统，并对缺陷视觉识别系统的实际应用效果进行验证。结果表明：该缺陷视觉识别系统能提升薄膜烧结线外观缺陷的检出率，通过分析缺陷统计类型及数量，能及时发现原材料问题或电磁线生产工艺问题，从而及时制定纠正措施，降低薄膜烧结线的废品率。

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王文进（1980-），男（汉族），湖北仙桃人，高级工程师，主要从事电机绝缘材料及绝缘结构设计的研究。

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王文进（1980-），男（汉族），湖北仙桃人，高级工程师，主要从事电机绝缘材料及绝缘结构设计的研究。

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王文进（1980-），男（汉族），湖北仙桃人，高级工程师，主要从事电机绝缘材料及绝缘结构设计的研究。

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Boston, USA:IEEE,2002., articleTitle=Influence of different square voltage waveforms on the partial discharges behaviour during tests on twisted pair speciments, refAbstract=null), Reference(id=1243118814284595601, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1235553559312396663, doi=null, pmid=null, pmcid=null, year=2001, volume=34, issue=5, pageStart=20, pageEnd=23, url=null, language=null, rfNumber=[6], rfOrder=5, authorNames=毛亚莉, 顾新梅, journalName=绝缘材料, refType=null, unstructuredReference=毛亚莉,顾新梅. 耐电晕特种绕组线的制造及应用[J]. 绝缘材料,2001,34(5):20-23., articleTitle=耐电晕特种绕组线的制造及应用, refAbstract=null), Reference(id=1243118814368481687, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1235553559312396663, doi=null, pmid=null, pmcid=null, year=2016, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[7], rfOrder=6, authorNames=陈琛, journalName=null, refType=null, unstructuredReference=陈琛. 牵引电机用薄膜绕包线的工艺改进[D]. 湘潭:湘潭大学,2016., articleTitle=牵引电机用薄膜绕包线的工艺改进, refAbstract=null), Reference(id=1243118814460756379, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1235553559312396663, doi=null, pmid=null, pmcid=null, year=2000, volume=21, issue=8, pageStart=373, pageEnd=375, url=null, language=null, rfNumber=[8], rfOrder=7, authorNames=陈范才, 周海晖, 何德良, journalName=腐蚀与防护, refType=null, unstructuredReference=陈范才,周海晖,何德良,等. 绝缘层下电磁线表面发黑原因分析[J]. 腐蚀与防护,2000,21(8):373-375., articleTitle=绝缘层下电磁线表面发黑原因分析, refAbstract=null), Reference(id=1243118814561419681, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1235553559312396663, doi=null, pmid=null, pmcid=null, year=2006, volume=39, issue=2, pageStart=39, pageEnd=46, url=null, language=null, rfNumber=[9], rfOrder=8, authorNames=张国钦, 吴广宁, 佟来生, journalName=绝缘材料, refType=null, unstructuredReference=张国钦,吴广宁,佟来生,等. 缺陷和机械应力对变频牵引电机绝缘性能的影响[J]. 绝缘材料,2006,39(2):39-46., articleTitle=缺陷和机械应力对变频牵引电机绝缘性能的影响, refAbstract=null)], 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类型耐高频脉冲寿命/min下降率/%
试样1试样2试样3试样4试样5中值
正常试样268278312332576312—
凸点(0.2～0.4)/mm220821022426831122428
气泡(0.2～0.4)/mm210315317921735317943
黑点(0.2～0.4)/mm211018222632639522628
薄膜接头18718920724330220734
), ArticleFig(id=1243118813030498628, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1235553559312396663, language=CN, label=表1, caption=

高频脉冲电压试验结果

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类型耐高频脉冲寿命/min下降率/%
试样1试样2试样3试样4试样5中值
正常试样268278312332576312—
凸点(0.2～0.4)/mm220821022426831122428
气泡(0.2～0.4)/mm210315317921735317943
黑点(0.2～0.4)/mm211018222632639522628
薄膜接头18718920724330220734
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缺陷类型存在风险判定标准
凸点所有凸点会直接影响该处绝缘层的电气性能，也会在线圈成型过程甚至在电机运行期间损伤顶破绝缘层。所有凸点识别并标记
气泡较大气泡会降低薄膜与铜导体、薄膜与薄膜之间的粘接强度，在牵引电机运行过程中，这些气泡很容易引起局部放电，进而缩短电机绝缘寿命。设定面积大于0.1 mm²的气泡，识别并标记
黑点较大黑点会影响电磁线在电机中的应用，较小黑点一般不会影响电磁线的性能。设定面积大于0.4 mm²的黑点需要识别并标记
薄膜接头所有薄膜接头均存在影响电磁线性能的风险。所有接头识别并标记
), ArticleFig(id=1243118813244408146, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1235553559312396663, language=CN, label=表2, caption=

缺陷判定标准

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缺陷类型存在风险判定标准
凸点所有凸点会直接影响该处绝缘层的电气性能，也会在线圈成型过程甚至在电机运行期间损伤顶破绝缘层。所有凸点识别并标记
气泡较大气泡会降低薄膜与铜导体、薄膜与薄膜之间的粘接强度，在牵引电机运行过程中，这些气泡很容易引起局部放电，进而缩短电机绝缘寿命。设定面积大于0.1 mm²的气泡，识别并标记
黑点较大黑点会影响电磁线在电机中的应用，较小黑点一般不会影响电磁线的性能。设定面积大于0.4 mm²的黑点需要识别并标记
薄膜接头所有薄膜接头均存在影响电磁线性能的风险。所有接头识别并标记
), ArticleFig(id=1243118813357654362, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1235553559312396663, language=EN, label=Tab.3, caption=Defect statistics, figureFileSmall=null, figureFileBig=null, tableContent=
电磁线流水号长度/m凸点/个气泡/个黑点（个）接头/个总计/个
D公司薄膜制造的电磁线J20190828-176211103
J20190823-151730104
J20190823-265620114
J20190823-326220103
J20190823-471720103
J20190823-582611114
J20190822-164620114
J20190822-241210102
J20190822-340910102
J20190822-438721104
总计5 59417310333
Z公司薄膜制造的电磁线J20191229-160001012
J20191230-119910203
J20191230-223110203
J20191230-332800213
J20191230-469800202
J20191230-540101203
J20191230-627900202
J20191230-732700101
J20191230-840000112
J20191230-947200202
合计3 9352216323
), ArticleFig(id=1243118813449929056, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1235553559312396663, language=CN, label=表3, caption=

缺陷统计数据

, figureFileSmall=null, figureFileBig=null, tableContent=
电磁线流水号长度/m凸点/个气泡/个黑点（个）接头/个总计/个
D公司薄膜制造的电磁线J20190828-176211103
J20190823-151730104
J20190823-265620114
J20190823-326220103
J20190823-471720103
J20190823-582611114
J20190822-164620114
J20190822-241210102
J20190822-340910102
J20190822-438721104
总计5 59417310333
Z公司薄膜制造的电磁线J20191229-160001012
J20191230-119910203
J20191230-223110203
J20191230-332800213
J20191230-469800202
J20191230-540101203
J20191230-627900202
J20191230-732700101
J20191230-840000112
J20191230-947200202
合计3 9352216323
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视觉识别系统在聚酰亚胺薄膜烧结线外观缺陷检测中的应用
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王文进 1 , 唐畅 1 , 徐希强 2 , 陈红生 1 , 梁西川 1 , 薛长志 1
绝缘材料 | 测试与分析 2021,54(5): 104-108
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绝缘材料 | 测试与分析 2021, 54(5): 104-108
视觉识别系统在聚酰亚胺薄膜烧结线外观缺陷检测中的应用
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王文进1, 唐畅1, 徐希强2, 陈红生1, 梁西川1, 薛长志1
作者信息
  • 1中车株洲电机有限公司 电气绝缘技术湖南省重点实验室，湖南 株洲 412000
  • 2株洲兆源机电科技有限公司，湖南 株洲 412000

    • 王文进（1980-），男（汉族），湖北仙桃人，高级工程师，主要从事电机绝缘材料及绝缘结构设计的研究。

Application of Visual Identity System in Appearance Defect Detection of Polyimide Film Sintering Wire
Wenjin WANG1, Chang TANG1, Xiqiang XU2, Hongsheng CHEN1, Xichuan LIANG1, Changzhi XUE1
Affiliations
  • 1Hunan Key Laboratory of Electrical Insulation Technology, CRRC Zhuzhou Electric Co., Ltd., Zhuzhou 412000, China
  • 2Zhuzhou Zhaoyuan Electromechanical Technology Co., Ltd., Zhuzhou 412000, China
出版时间: 2021-05-20 doi: 10.16790/j.cnki.1009-9239.im.2021.05.016
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摘要
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传统的电磁线外观缺陷识别采用人工检测，效率低且成本高。随着电机对电磁线外观质量要求的不断提高，有必要增强电磁线外观缺陷识别效能。本文研制了电磁线缺陷视觉识别系统，并对缺陷视觉识别系统的实际应用效果进行验证。结果表明：该缺陷视觉识别系统能提升薄膜烧结线外观缺陷的检出率，通过分析缺陷统计类型及数量，能及时发现原材料问题或电磁线生产工艺问题，从而及时制定纠正措施，降低薄膜烧结线的废品率。

聚酰亚胺薄膜  /  烧结线  /  视觉识别系统  /  缺陷

The traditional electromagnetic wire appearance defect detection uses manual detection, which is low efficiency and high cost. With the continuous improvement of requirements of motor on the appearance quality of electromagnetic wire, it is necessary to enhance the identification efficiency of electromagnetic wire appearance defects. A visual identity system of electromagnetic wires defects was developed, and the practical application effect of the system was verified. The results show that the defect visual identity system can improve the detection rate of the thin film sintering line appearance defects. By analyzing the statistical types and quantities of defects, the problems of raw materials or the production process problems of electromagnetic wire can be found in time, so as to formulate corrective measures in time and reduce the rejection rate of the thin film sintering line.

polyimide film  /  sintering wire  /  visual identity system  /  defects
王文进, 唐畅, 徐希强, 陈红生, 梁西川, 薛长志. 视觉识别系统在聚酰亚胺薄膜烧结线外观缺陷检测中的应用. 绝缘材料, 2021 , 54 (5) : 104 -108 . DOI: 10.16790/j.cnki.1009-9239.im.2021.05.016
Wenjin WANG, Chang TANG, Xiqiang XU, Hongsheng CHEN, Xichuan LIANG, Changzhi XUE. Application of Visual Identity System in Appearance Defect Detection of Polyimide Film Sintering Wire[J]. Insulating Materials, 2021 , 54 (5) : 104 -108 . DOI: 10.16790/j.cnki.1009-9239.im.2021.05.016
正文
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0 引言
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聚酰亚胺薄膜烧结线是由聚酰亚胺薄膜与金属导体（铜或铝）经过加工而成，具有优异的耐热性能、电气性能和力学性能，因此聚酰亚胺薄膜烧结线能适用于各种恶劣的自然环境或运行工况，对电机绝缘寿命起着至关重要的作用[1-2]。作为一种十分重要的电磁线，聚酰亚胺薄膜烧结线一直被广泛应用于牵引电机领域。基于牵引电机绝缘系统高安全裕度和高可靠性的特点，对聚酰亚胺薄膜烧结线的质量要求也越来越严格[3-5]，因此做好对聚酰亚胺薄膜烧结线的表观缺陷识别意义重大。
本研究分析了聚酰亚胺薄膜烧结线制造过程出现的几类典型表观质量缺陷，通过引入一种视觉识别系统实现电磁线表观缺陷实时在线监控，能够大幅提高缺陷识别的准确率，同时还能对缺陷进行标识及分类，以便有效识别和剔除影响产品性能的缺陷，从而降低产品质量风险。
1 聚酰亚胺薄膜烧结线的典型缺陷
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1.1 制造流程
图1为聚酰亚胺薄膜烧结铜线（以下简称薄膜烧结线）的典型制造流程。薄膜烧结线一般采用高频感应器进行电磁感应加热，铜导体通过带氟层的聚酰亚胺薄膜绕包后经过磁场切割磁感线产生表面涡流，将铜导体表面发热至一定温度从而使薄膜表面氟层熔化[6-7]。之后再通过压轮使薄膜与铜导体之间、薄膜与薄膜之间粘接更紧密，同时排出绝缘层的空气。
为了检测烧结质量，薄膜烧结线的生产线均配置在线工频耐压装置，在线耐压值一般为2 000～3 000 V，但该装置仅能间接识别薄膜烧结线较严重的质量缺陷，如薄膜严重缺失、导体毛刺或凸点杂质刺穿薄膜等，还无法精确识别其他看似不严重的质量缺陷，同时大多数电磁线制造厂家对于电磁线表观缺陷的识别仍停留在人眼上，因此识别表观缺陷存在及时性和有效性方面的不足。
1.2 缺陷形成及分类
根据应用厂家对薄膜烧结线质量缺陷的统计，薄膜烧结线容易发生的质量缺陷主要包括凸点、气泡、黑斑和薄膜接头等4类，这些缺陷一旦进入电机绝缘系统中，经过长期高温、振动以及频繁启停带来的冷热冲击等作用，均产有生电机匝间绝缘故障的风险，故有必要对薄膜烧结线的质量缺陷进行识别和筛选。
（1）凸点。凸点产生的主要原因在于薄膜本身自带的胶粒或杂质，也可能是电磁线生产过程中带入的其他杂质，这些胶粒或杂质经过高频加热环节被薄膜包裹在内部而形成凸点。
（2）气泡。在薄膜烧结线的制作过程中，绕包薄膜的导线在高频加热前后要通过压轮挤压气泡，使薄膜与铜线、薄膜与薄膜之间粘接更紧密，同时排出绝缘层内部空气。如果材料之间的空气不能完全排出，就会形成气泡。
（3）黑斑。黑斑产生的主要原因在于绝缘层与铜导体表面之间滞留有水气、氧以及由于污染而带入的氯化物、硫化物、钠盐等。陈范才等[8]对电磁线的黑斑进行了成分分析，发现主要由Cu2O、CuO、CuCO3·Cu(OH)2组成，并含有少量铜的氯化物、硫化物、钠盐以及二氧化硅等。
（4）薄膜接头。聚酰亚胺薄膜在生产过程中由于长度不够将两段薄膜接在一起，接头一般采用热压粘结的方式。薄膜接头现象在电磁线行业几乎无法避免。
2 典型缺陷对电磁线性能的影响
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高频脉冲电压试验能有效检测绝缘材料在逆变器供电条件下的寿命。为研究薄膜烧结线典型缺陷对其性能的影响，采用高频脉冲电压试验分析各类典型缺陷试样对电磁线性能的影响。试样制备参照GB/T 4074.7—2009《绕组线试验方法 第7部分：测定漆包绕组线温度指数的试验方法》中的背靠背结构，如图2所示。
高频脉冲试验条件：温度为（155±2）℃；脉冲频率为5 kHz；脉冲波形为双极性对称方波；脉冲上升沿时间为（100±10）ns；过电流切断试验为20 mA；电压峰值VP-P为6 kV，试验结果如表1所示。
从表1可以看出，气泡对电磁线的高频脉冲电压寿命影响最大，相比正常试样，气泡缺陷电磁线的高频脉冲电压寿命下降率为43%。张国钦等[9]研究了气泡缺陷对电磁线绝缘性能的影响，结果表明，存在气泡试样的局部区域和正常试样相比，起始放电电压降低，局部放电的频度和强度增大，对绝缘的破坏速度加快，最终放电的通道贯穿整个材料，导致试样在很低的外加电压下发生击穿。薄膜接头对电磁线的高频脉冲电压寿命影响较大，可能与聚酰亚胺薄膜接头热压处理过程因不平整引入的气隙有关。凸点和黑斑对电磁线的高频脉冲电压寿命也都有一定程度的影响。
以上关于4类典型缺陷对电磁线性能的影响仅限于静态测试，电机运行期间因电、热、机械等综合应力作用，缺陷对电机绕组匝间绝缘性能的影响必定会放大，因此，在电磁线制造过程中要及时识别这些缺陷，以降低带缺陷电磁线用于电机中发生绝缘过早被破坏的风险。
3 缺陷视觉识别系统的应用
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3.1 缺陷视觉识别系统介绍
（1）工作原理
在电磁线制造过程中，当电磁线通过缺陷视觉识别系统的相机时，相机会根据编码器采集到的生产线运行速度信号进行同步拍摄，然后系统将采集到的图像传递给图像处理软件，通过高效的图像处理算法对提取的缺陷轮廓进行解析，从而有效地识别并判定缺陷种类及面积，对缺陷位置进行标记并发出报警提醒。
（2）硬件设计
基于薄膜烧结线的生产流程，缺陷视觉识别系统安装在电磁线生产过程中的在线耐压与冷却装置之间。缺陷视觉识别系统主要由光源、相机、镜头、图像采集卡和视觉处理器、执行机构等组成，系统结构如图3所示。在薄膜烧结线生产过程中，位于电磁线4个面的方向分别安装有一组LED光源和一台相机，如图4所示。
（3）软件设计
缺陷视觉识别系统的程序开始运行后，采集窗口能显示采集的图像，后台会首先对第一帧图像进行检测，进行图像增强等预处理。如果检测没有缺陷，处理窗口再开始显示处理图像，然后每隔十帧提取一次作差分；如果检测到有缺陷，系统则通过设计的算法将轮廓进行提取，然后将轮廓特点及面积显示出来，同时软件界面会显示检测到的缺陷类型及面积。
3.2 薄膜烧结线典型缺陷标准的设定
根据薄膜烧结线表观缺陷种类、对电磁线性能的影响程度以及可能存在的风险等级，初步确立缺陷判定标准，如表2所示。将缺陷判定标准设置在视觉识别系统中，根据缺陷判定标准对各类缺陷进行报警并标记，对于未超出设定阈值范围的则不进行处理。
3.3 缺陷视觉识别系统实际应用
为检验缺陷视觉识别系统的有效性和准确性，在薄膜烧结线生产过程中进行了实际应用，可以实现缺陷识别、缺陷标记、缺陷数据统计分析等功能。
（1）缺陷识别
缺陷视觉识别系统能按照设定的判断标准对各类缺陷进行报警，4类缺陷检出图片如图5所示。
（2）缺陷标记
缺陷视觉识别系统能对报警的缺陷点加以准确标记，便于人工进行缺陷确认及处理。缺陷点自动标记设备及效果如图6所示。
（3）缺陷数据统计
缺陷识别系统能对采集的每个批次的电磁线缺陷数据生成分析表，可分类统计不同缺陷的数量、大小及所在位置。针对D和Z两个厂家聚酰亚胺薄膜各制造的10盘电磁线进行缺陷识别，缺陷统计数据如表3所示。从表3可以看出，缺陷视觉识别系统不仅能及时、准确、有效地识别薄膜烧结线的各类典型缺陷，还能提醒电磁线制造厂家及时调整产品生产工艺，加强对上游产品，如聚酰亚胺薄膜的质量管控。D公司薄膜生产的电磁线凸点缺陷数量明显多于Z公司薄膜生产的电磁线，表明D公司薄膜本身存在较多的杂质点，需要加强对该公司薄膜的质量管控；气泡和黑点缺陷的存在表明还需要进一步改善生产现场环境及优化电磁线制造工艺。
4 结论
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缺陷视觉识别系统能提升薄膜烧结线外观缺陷的检出率，通过分析缺陷统计类型及数量，能及时发现原材料问题或电磁线生产工艺问题，从而及时制定纠正措施，降低薄膜烧结线的废品率。
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2021年第54卷第5期
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doi: 10.16790/j.cnki.1009-9239.im.2021.05.016
  • 接收时间：2020-07-22
  • 首发时间：2026-03-03
  • 出版时间：2021-05-20
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  • 收稿日期：2020-07-22
  • 修回日期：2020-09-08
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    1中车株洲电机有限公司 电气绝缘技术湖南省重点实验室，湖南 株洲 412000
    2株洲兆源机电科技有限公司，湖南 株洲 412000
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2种不同金属材料的力学参数
科
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鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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