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Article(id=1199640635268493813, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1199640628146565556, articleNumber=null, orderNo=null, doi=10.16790/j.cnki.1009-9239.im.2023.08.012, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1663948800000, receivedDateStr=2022-09-24, revisedDate=1670774400000, revisedDateStr=2022-12-12, acceptedDate=null, acceptedDateStr=null, onlineDate=1763946215693, onlineDateStr=2025-11-24, pubDate=1692460800000, pubDateStr=2023-08-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1763946215693, onlineIssueDateStr=2025-11-24, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1763946215693, creator=13701087609, updateTime=1763946215693, updator=13701087609, issue=Issue{id=1199640628146565556, tenantId=1146029695717560320, journalId=1149653034449285133, year='2023', volume='56', issue='8', pageStart='1', pageEnd='118', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1763946213995, creator=13701087609, updateTime=1766563621744, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1210618832004190662, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1199640628146565556, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1210618832004190663, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1199640628146565556, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=80, endPage=86, ext={EN=ArticleExt(id=1199640635583066622, articleId=1199640635268493813, tenantId=1146029695717560320, journalId=1149653034449285133, language=EN, title=Influence of inhomogeneous force on development process of high voltage cables buffer layer ablation faults, columnId=1190369198472794288, journalTitle=Insulating Materials, columnName=Insulation Technology, runingTitle=null, highlight=null, articleAbstract=

External force is the significant factor affecting the buffer layer ablation faults development of high voltage cables. The actual cable laying conditions and cable core gravity will lead to inhomogeneous force on the buffer layers. However, the influence of inhomogeneous force on the development process of buffer layer ablation faults is still unclear. In this paper, a simulating ablation experiment platform of buffer layers under inhomogeneous force was built. The influence of local inhomogeneous force on the buffer layer ablation development process was studied under dry and wet conditions. Then combining with the variation of buffer layer local volume conductivity, micromorphology and the components of ablation products, the affecting mechanisms of inhomogeneous force on the fault development were analyzed. The results show that in the dry condition, the current density of buffer layer decreases gradually with the ablation time, and the decreasing rate is higher in the force concentration region. While in the wet condition, the current density of buffer layer surges dramatically in the initial ablation stage, and then drops rapidly, exhibiting the characteristic of a current density peak. In the local force concentration region, the peak value of current density is larger, and the current density variation rate inner the peak is faster. It is analyzed that the local force concentration could increase the effective contact area between the buffer layer semi-conductive fibers, leading to the rising of current density and aggravating of ablation process.

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外界压力是影响高压电缆缓冲层烧蚀故障发展的重要因素。实际电缆的敷设条件以及缆芯重力会造成缓冲层受力不均匀，然而该不均匀性对缓冲层烧蚀故障发展过程的影响目前尚不明确。本文搭建了缓冲层不均匀烧蚀模拟实验平台，分别研究了干燥与潮湿条件下局部受力不均对缓冲层烧蚀发展过程的影响。然后结合缓冲层的局部体积电导率变化、微观形貌特征以及烧蚀产物成分，分析了受力不均匀性对烧蚀故障发展过程的影响机理。结果表明：在干燥条件下，缓冲层的电流密度随烧蚀时间逐渐衰减，受力集中部位的电流密度衰减速率更快；而在潮湿条件下，缓冲层的电流密度在烧蚀初期先急剧增加，随后迅速下降，呈现出电流密度尖峰特征，受力集中部位的电流密度尖峰的峰值更大，且尖峰内电流密度的变化速率更快。分析认为，局部受力集中会增大缓冲层半导电纤维之间的有效接触面积，导致电流密度上升，加剧烧蚀过程。

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任志刚（1983-），男（汉族），内蒙赤峰人，高级工程师，主要研究方向为高电压与绝缘技术、高压电缆；

高建（1996-），男（汉族），辽宁大连人，博士生，主要从事先进电工材料、高压电缆领域的研究工作。

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任志刚（1983-），男（汉族），内蒙赤峰人，高级工程师，主要研究方向为高电压与绝缘技术、高压电缆；

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任志刚（1983-），男（汉族），内蒙赤峰人，高级工程师，主要研究方向为高电压与绝缘技术、高压电缆；

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高建（1996-），男（汉族），辽宁大连人，博士生，主要从事先进电工材料、高压电缆领域的研究工作。

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高建（1996-），男（汉族），辽宁大连人，博士生，主要从事先进电工材料、高压电缆领域的研究工作。

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组名回路1回路2(受力集中)回路3
A干燥2.5 kPa干燥2.5 kPa干燥2.5 kPa
B干燥2.5 kPa干燥7.5 kPa干燥2.5 kPa
C注水1 mL2.5 kPa注水1 mL7.5 kPa注水1 mL2.5 kPa
), ArticleFig(id=1211277137902965066, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1199640635268493813, language=CN, label=表1, caption=

不均匀受力烧蚀模拟实验条件设置

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组名回路1回路2(受力集中)回路3
A干燥2.5 kPa干燥2.5 kPa干燥2.5 kPa
B干燥2.5 kPa干燥7.5 kPa干燥2.5 kPa
C注水1 mL2.5 kPa注水1 mL7.5 kPa注水1 mL2.5 kPa
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受力不均匀性对高压电缆缓冲层烧蚀故障发展过程的影响
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任志刚 1 , 郭卫 1 , 门业堃 1 , 陈平 1 , 高建 2 , 张浩然 2 , 李建英 2
绝缘材料 | 绝缘技术 2023,56(8): 80-86
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绝缘材料 | 绝缘技术 2023, 56(8): 80-86
受力不均匀性对高压电缆缓冲层烧蚀故障发展过程的影响
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任志刚1, 郭卫1, 门业堃1, 陈平1, 高建2, 张浩然2, 李建英2
作者信息
  • 1国网北京市电力公司电力科学研究院，北京 100075
  • 2西安交通大学，西安 710049

    • 任志刚（1983-），男（汉族），内蒙赤峰人，高级工程师，主要研究方向为高电压与绝缘技术、高压电缆；

    高建（1996-），男（汉族），辽宁大连人，博士生，主要从事先进电工材料、高压电缆领域的研究工作。

Influence of inhomogeneous force on development process of high voltage cables buffer layer ablation faults
Zhigang REN1, Wei GUO1, Yekun MEN1, Ping CHEN1, Jian GAO2, Haoran ZHANG2, Jianying LI2
Affiliations
  • 1State Grid Beijing Electric Power Research Institute, Beijing 100075, China
  • 2Xi′an Jiaotong University, Xi′an 710049, China
出版时间: 2023-08-20 doi: 10.16790/j.cnki.1009-9239.im.2023.08.012
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摘要
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外界压力是影响高压电缆缓冲层烧蚀故障发展的重要因素。实际电缆的敷设条件以及缆芯重力会造成缓冲层受力不均匀，然而该不均匀性对缓冲层烧蚀故障发展过程的影响目前尚不明确。本文搭建了缓冲层不均匀烧蚀模拟实验平台，分别研究了干燥与潮湿条件下局部受力不均对缓冲层烧蚀发展过程的影响。然后结合缓冲层的局部体积电导率变化、微观形貌特征以及烧蚀产物成分，分析了受力不均匀性对烧蚀故障发展过程的影响机理。结果表明：在干燥条件下，缓冲层的电流密度随烧蚀时间逐渐衰减，受力集中部位的电流密度衰减速率更快；而在潮湿条件下，缓冲层的电流密度在烧蚀初期先急剧增加，随后迅速下降，呈现出电流密度尖峰特征，受力集中部位的电流密度尖峰的峰值更大，且尖峰内电流密度的变化速率更快。分析认为，局部受力集中会增大缓冲层半导电纤维之间的有效接触面积，导致电流密度上升，加剧烧蚀过程。

高压电缆缓冲层  /  不均匀受力  /  发展过程  /  导电路径

External force is the significant factor affecting the buffer layer ablation faults development of high voltage cables. The actual cable laying conditions and cable core gravity will lead to inhomogeneous force on the buffer layers. However, the influence of inhomogeneous force on the development process of buffer layer ablation faults is still unclear. In this paper, a simulating ablation experiment platform of buffer layers under inhomogeneous force was built. The influence of local inhomogeneous force on the buffer layer ablation development process was studied under dry and wet conditions. Then combining with the variation of buffer layer local volume conductivity, micromorphology and the components of ablation products, the affecting mechanisms of inhomogeneous force on the fault development were analyzed. The results show that in the dry condition, the current density of buffer layer decreases gradually with the ablation time, and the decreasing rate is higher in the force concentration region. While in the wet condition, the current density of buffer layer surges dramatically in the initial ablation stage, and then drops rapidly, exhibiting the characteristic of a current density peak. In the local force concentration region, the peak value of current density is larger, and the current density variation rate inner the peak is faster. It is analyzed that the local force concentration could increase the effective contact area between the buffer layer semi-conductive fibers, leading to the rising of current density and aggravating of ablation process.

high voltage cable buffer layer  /  inhomogeneous force  /  development process  /  electrical conduction path
任志刚, 郭卫, 门业堃, 陈平, 高建, 张浩然, 李建英. 受力不均匀性对高压电缆缓冲层烧蚀故障发展过程的影响. 绝缘材料, 2023 , 56 (8) : 80 -86 . DOI: 10.16790/j.cnki.1009-9239.im.2023.08.012
Zhigang REN, Wei GUO, Yekun MEN, Ping CHEN, Jian GAO, Haoran ZHANG, Jianying LI. Influence of inhomogeneous force on development process of high voltage cables buffer layer ablation faults[J]. Insulating Materials, 2023 , 56 (8) : 80 -86 . DOI: 10.16790/j.cnki.1009-9239.im.2023.08.012
正文
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0 引言
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缓冲层烧蚀故障是目前危害高压电缆安全稳定运行的重要隐患，这种故障会损伤电缆皱纹铝护套、缓冲层、绝缘屏蔽层，严重时甚至会造成电缆本体击穿[1-2]。据统计，发生缓冲层烧蚀故障的电缆多为国产高压电缆[3]，且服役的年限远低于其设计使用寿命。同时，缓冲层烧蚀故障具有较高的潜伏性，采用现有的X射线探测、宽频阻抗谱等技术难以检测到缓冲层烧蚀的初期特征[4]。因此，研究电缆缓冲层烧蚀故障的发展过程，对于提升故障检出能力，降低电缆运行隐患具有重要的意义。
国内外已对高压电缆缓冲层烧蚀现象开展了大量研究。赵西元[5]认为操作过电压作用下缓冲层与铝护套间的气隙放电会导致烧蚀故障，发现放电烧蚀后电缆铝护套上存在黑色烧蚀痕迹，同时缓冲层出现微小的烧蚀孔洞。刘洋等[6]对缓冲层烧蚀故障电缆进行局部放电分析，发现放电信号集中出现在正、负半周的上升沿，表现出电气接触不良所致的放电特征。刘宏亮等[7]认为电缆径向电流集中是诱发缓冲层烧蚀故障的原因之一，并且通过模拟电流集中实验获得了与实际电缆缓冲层烧蚀相似的故障特征。刘英等[8]通过电热耦合仿真研究了皱纹铝护套与缓冲层间轴向接触不良引起的电流集中发热，发现连续2 m长的接触不良会造成476℃的局部高温，导致缓冲层发生热烧蚀。郑建康等[9]研究了潮湿缓冲层的烧蚀特性，认为烧蚀过程中因电化学腐蚀生成的白斑会增大缓冲层与铝护套的接触电阻，使得电流发热增加并最终导致烧蚀故障。
目前普遍认为缓冲层烧蚀故障的诱因主要包括：缓冲层与铝护套间的气隙场强过高导致的局部放电、电缆径向电流集中导致的过热以及缓冲层与铝护套间的电化学反应过程。而缓冲层承受的外界压力会显著改变其与铝护套的电气接触情况，进而对局部气隙中的场强、电缆径向电流集中情况以及电化学反应进程产生影响，因此受力是缓冲层烧蚀故障的重要因素。
由于缆芯自身重力的作用，位于电缆底部的缓冲层会承受更大的压力[10]，并且由于皱纹铝护套的结构特征，缓冲层在沿电缆轴向方向上的受力分布也存在不均匀性。然而，目前关于受力不均匀性对烧蚀发展过程的影响机理尚不明确，导致对实际电缆缓冲层烧蚀故障的发展过程认识不够充分。
为了研究不均匀受力对缓冲层烧蚀发展过程的影响，本文搭建了缓冲层不均匀受力的烧蚀模拟实验平台，监测干燥与潮湿条件下烧蚀过程中缓冲层电流密度的动态变化规律。同时，结合对缓冲层局部体积电导率变化以及烧蚀产物的分析，研究干燥与潮湿条件下的受力不均匀对缓冲层烧蚀发展过程的影响机制。
1 实验
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1.1 缓冲层不均匀受力烧蚀模拟实验
实验采用的是BHZD200型缓冲层试样，搭建了如图1所示的不均匀受力烧蚀模拟实验平台。该平台可对缓冲层的3个不同部位均施加交流电压，调节每个部位的砝码质量，以模拟不均匀受力下的烧蚀过程，烧蚀时间为6 h，电压激励的幅值取20 V[11]。
图1实验平台各回路的上电极与缓冲层之间放置有电工铝片，以模拟实际电缆的运行环境。缓冲层试样的尺寸为15 cm×5 cm×0.2 cm，电工铝片的尺寸为1 cm×4 cm×0.1 cm。各回路中串接的电流表可以实时测量烧蚀部位的电流变化。
本文将图1中三处烧蚀部位从左到右分别记为回路1、回路2、回路3，并将回路2设置为不均匀受力点，具体设置条件如表1所示。其中回路1和回路3的砝码配重为100 g，回路2的砝码配重为300 g，不均匀受力换算成压强分别是2.5 kPa与7.5 kPa。同时为了模拟潮湿的情形，实验设置向缓冲层区域注水1 mL。
1.2 体积电导率测试
采用两种方法测试缓冲层不均匀烧蚀部位的体积电导率，根据JB/T 10259—2014的要求，按照标准尺寸的两电极系统进行测试。由于缓冲层具有半导电特性（体积电导率普遍处于10-3～10-5  S/m[5,12-13]），而四探针法是表征半导电材料微区体积电导率最常用方法之一[14]，故本文也采用该方法对烧蚀缓冲层进行测试，实验仪器是RTS-9型双电四探针测试仪（广州四探针科技有限公司）。上述体积电导率测试均重复3次并取平均值。
1.3 微观形貌表征
采用HITACHI SU3500型扫描电子显微镜（SEM）表征缓冲层烧蚀前后的表面微观形貌变化。
1.4 X射线光电子能谱测试
采用Thermo Fisher ESCALAB Xi+型X射线光电子能谱（XPS）表征缓冲层表面烧蚀固体产物的元素组成和化合价态，射线源为铝靶（光子能量为1 486.6 eV），测试过程中实验腔的气压始终低于10-5 Pa。
2 结果与讨论
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2.1 缓冲层烧蚀过程中电流密度的动态变化
2.1.1 干燥且受力均匀
干燥且受力均匀的条件下，缓冲层烧蚀过程中电流密度的动态变化规律如图2所示。从图2可以看出，干燥条件下，流经缓冲层的电流密度随烧蚀时间延长逐渐衰减，且电流密度曲线存在许多“毛刺”。由于缓冲层受力均匀，因此三处烧蚀部位的电流密度衰减过程基本一致，在烧蚀持续4 h后电流密度均从约70 A/m2下降至约6.5 A/m2的稳定值。
2.1.2 干燥且受力不均
在干燥且受力不均的条件下，缓冲层烧蚀过程中电流密度的动态变化规律如图3所示。从图3可以看出，三条回路的电流密度同样随烧蚀过程逐渐衰减，这与图2中的规律一致。但是，中间承受更多压力的烧蚀回路2中的电流密度明显增大，其初始值约为245.8 mA/m2，而另外两条回路的起始电流密度则分别是86.4 mA/m2和52.8 mA/m2，表明当干燥缓冲层的局部压强增至3倍时，会导致其局部电流密度增至约3～5倍，使电流密度沿缓冲层轴向的分布不均。
从图3还可以看出，相较于两侧的回路，回路2电流密度曲线的“毛刺”现象更为显著，并且在烧蚀过程中，回路2电流密度的衰减速率明显高于回路1和回路3，反映出受力增加会加速缓冲层局部区域的烧蚀过程。
2.1.3 潮湿且受力不均
在潮湿（即注水1 mL）且受力不均的条件下，缓冲层烧蚀过程中电流密度的动态变化规律如图4所示。
从图4可以看出，潮湿且受力不均条件下电流密度变化规律与干燥条件下具有显著差异。对于潮湿缓冲层，在烧蚀初始的1 h内，三条回路的电流密度曲线均先迅速增加，之后迅速下降，出现一个明显的电流尖峰。尖峰的峰值以及尖峰内电流密度的增长和衰减速率与缓冲层的局部压力有关。回路2处承受的压力更大，相应地，其电流密度尖峰的峰值（约1 127.6 A/m2）要远高于另外两条回路（约813.2 A/m2、413.1 A/m2）。同时，回路2尖峰中电流密度的增长速率以及衰减速率相比于另外两条回路更快。在烧蚀持续1 h后，三条回路的电流密度均缓慢下降。并且从图4观察到，潮湿缓冲层的电流密度曲线较为平滑，几乎没有出现干燥条件下的“毛刺”现象，本文认为产生这种差异的原因可能是干燥和潮湿条件下的烧蚀机制存在区别。
2.2 缓冲层烧蚀后的形貌特征
图5给出了缓冲层模拟烧蚀后的表面形貌。从图5(a)～(b)可以看出，干燥缓冲层烧蚀后表面均无明显的肉眼可见变化，而图5(c)潮湿缓冲层表面则在与电工铝片的接触部位附着有白色物质，该物质的分布区域与铝片的形状一致，表明其来自缓冲层烧蚀时与电工铝片的反应过程。
同时，本文还采用SEM对烧蚀后缓冲层表面的微观形貌进行了更加细致地观察，干燥以及潮湿烧蚀部位的微观形貌分别如图6(a)和6(b)所示。从图6可以看到，干燥缓冲层在烧蚀后，纤维丝之间的粘接部位发生断裂（由红圈标注）。而潮湿缓冲层烧蚀后，其内部的半导电纤维上覆盖有固体物质，分析认为这种物质是图5(c)中的白色附着物。
2.3 缓冲层不均匀烧蚀后的局部体积电导率
缓冲层不均匀烧蚀后的局部体积电导率测试结果如图7所示，其中图7(a)是按JB/T 10259—2014测试的结果，图7(b)则是使用四探针法测试的结果。从图7可以看出，两种方法所得结果的变化规律相同，即缓冲层烧蚀后受力集中部位的体积电导率会明显降低，表明缓冲层的受力不均匀性会导致其体积电导率分布的不均匀。
同时在潮湿条件下，缓冲层烧蚀部位的体积电导率明显低于其他两组干燥条件下的测试结果，表明潮湿部位在烧蚀后呈现高电阻状态，认为是图 5(c)中缓冲层表面生成的白色物质具有高电阻性，导致此处的体积电导率明显下降。
另外，采用四探针法测试得到的干燥缓冲层烧蚀后的体积电导率在100 S/m数量级，大于行业标准的测试结果（10-2～10-3 S/m），分析认为产生这种差异的原因与测试方法有关。行业标准采用两电极系统，会在电极与试样的接触处引入接触电阻，导致体积电导率的测试结果偏低。而四探针法具有4个测试端子，其电压和电流在不同的回路中测试，能有效消除试样与电极间接触电阻的干扰[15]，因此四探针法得到的体积电导率测试结果偏大。
2.4 烧蚀白色物质成分分析
前述实验发现潮湿缓冲层烧蚀后表面附着有白色物质，这种物质是电缆缓冲层烧蚀故障的特征表现。CHEN Y等[16]使用电子探针显微分析（EDAX）技术测试发现烧蚀缓冲层的附着物质含有C、O、Na元素，并且利用XPS测试发现铝护套内表面的腐蚀产物中存在氧化铝Al2O3。KONG J等[17]以及郑建康等[9]使用能谱分析仪（EDS）和X射线衍射（XRD）分析发现缓冲层外表面的附着物含有C、O、Na、Al等元素，并认为其由NaHCO3、Al(OH)3、Na3Al(CO3)(OH)2等成分构成。
XPS可以对物质表面的元素组成和化合价态进行定性和定量分析。在前人工作的基础上，本文利用XPS技术对该白色物质的成分进行了更为深入的分析，实验结果如图8所示，所有谱图已按照烃基碳（C 1s: 285.0 eV）的标准参考位置进行校正[18]。从图8(a)可以看出，缓冲层表面白色物质的XPS谱图中含有Al 2p、C 1s、O 1s、Na 1s等谱线，表明白色物质中含有Al、C、O、Na等元素。
图8(b)给出了Na元素的1s谱图，金属钠和钠离子的1s电子结合能差距不大（约为0.8 eV[19]），但由于钠单质的性质活泼，所以图中1 079.1 eV处的结合能峰代表Na+[20]，分析认为实验中测得的Na+来自缓冲层中聚丙烯酸钠 （NaPA）阻水粉的吸水电离。
铝元素的2p电子结合能常采用双峰拟合，形成Al 2p3/2和Al 2p1/2两个分峰，两者面积之比为2∶1[21]。图8(c)中Al 2p3/2的结合能是74.3 eV，Al 2p1/2的结合能是74.9 eV，它们加权后的平均结合能为74.5 eV，比对后发现74.5 eV同Al2O3[22]或Al(OH)3[23]中Al3+的2p电子结合能相吻合。
缓冲层在结构上由涤纶纤维组成，化学成分是聚对苯二甲酸乙二醇酯（PET）。图8(d)中氧的1s谱图存在3个分峰，分析认为峰1（531.8 eV）代表PET链上的双键氧；峰2（533.4 eV）代表PET分子链上的单键氧[24]；峰3（536.0 eV）则可能反映了潮湿缓冲层附带的水中氧原子[25]；同时，图8(d)中结合能峰1、峰2的峰面积之比为1.0∶0.16，这与PET中氧的峰1、峰2理论面积之比1.0∶1.0相差较大，反映峰1的强度明显偏高。深入探究发现，峰1的数值（531.8 eV）恰好同Al2O3或Al(OH)3中氧的1s电子结合能接近（531.5±0.9 eV）[21-22,26-27]，所以峰1的部分信号额外地来自Al2O3或Al(OH)3中的氧，这进一步证实了白色物质的成分。
综上，受潮缓冲层表面烧蚀部位的XPS谱图中存在PET、Na+、Al2O3或Al(OH)3等成分，由于PET和Na+分别来自缓冲层本身以及阻水粉的吸水电离，所以这种白色物质的主要成分是Al2O3或Al(OH)3。
3 机理分析
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3.1 不均匀受力对干燥烧蚀过程的影响机理分析
根据缓冲层的微观形貌特征，可以给出干燥缓冲层在不均匀受力下的微观结构示意图如图9所示。由于缓冲层中的半导电涤纶纤维呈网状分布，当其承受外力不均匀时，受力集中处的半导电纤维间有效接触面积可能会增加，使得该处的局部体积电导率增大，流过该处的电流密度增加，对应于图3所示的结果。
当缓冲层局部的半导电纤维持续承受较高的电流密度时，会不断累积焦耳热，最终导致温度超过局部半导电纤维的熔点，造成如图6(a)所示的纤维丝断裂，阻断导电路径，使得电流密度降低。因此干燥条件下缓冲层的电流密度在烧蚀过程中逐渐衰减。而由于应力集中点的局部体积电导率更高，通过的电流密度更大，使得在烧蚀过程中该区域内产生的局部热量更高，导致纤维丝的断裂速率更快，加剧该局部区域的烧蚀过程，造成该区域内的电流密度衰减速率更快。
缓冲层中的导电通路包含半导电聚酯纤维丝以及由半导电胶液包覆的阻水粉颗粒，在微观上形成了不均匀的导电路径。这会导致材料内部的电流密度分布不均，使电流密度在某些部位或节点发生集中，引起局部过热，导致半导电聚酯纤维发生热收缩或熔断。在熔断的瞬间，原本纤维丝中流通的电流密度会发生剧烈波动，表现为电流密度曲线上的“毛刺”现象。另外，应力集中部位的电流密度更高，使得纤维断裂导致的电流波动加剧，因而图3缓冲层受力较高的回路“毛刺”现象更加显著。
3.2 不均匀受力对潮湿烧蚀过程的影响机理分析
缓冲层中的聚丙烯酸钠阻水粉是一种强碱弱酸盐，吸水后会电离出大量可自由迁移的Na+和OH-，在缓冲层间形成弱碱性电解质溶液，聚丙烯酸钠的电离过程如式（1）所示。
NaPA+H2O ↔ HPA+Na++OH-
同时，由于阻水粉吸水后会形成弱碱性电解质溶液，此时电工铝、电解质溶液以及缓冲层中的半导电纤维会构成电化学电池，发生电化学反应[5]，反应方程式如式（2）～（4）所示[1,28]。
Al3++3OH-=Al(OH)3↓
2Al3++3H2O+6e-=Al2O3↓+3H2↑
2H++2e-=H2↑
如式（2）～（4）所示，电工铝在反应过程中作为阳极失去电子，形成A13+并从表面氧化层的缺陷处[29]进入阻水粉溶液，与溶液中的OH-反应生成Al2O3以及Al(OH)3，这些化合物沉淀在缓冲层以及电工铝片表面，构成了图5(c)和图6(b)中的白色物质。在铝表面发生电化学反应后，烧蚀回路中的电荷转移过程被促进，导致图4中的电流密度曲线上升。同时，由于产物Al2O3以及Al(OH)3是绝缘的，它们会阻隔缓冲层的导电路径，导致缓冲层的体积电导率显著下降。随着电化学反应的逐渐进行，这种白色反应产物会逐渐覆盖缓冲层中原始的导电路径，加剧电气接触不良现象，体现为电流密度曲线的迅速下降。
当潮湿缓冲层局部受力集中时，与干燥情况类似，缓冲层内部半导电纤维间的有效接触增大，缓冲层材料本身与电工铝片的接触状况也有所改善，这会促进铝片表面的电化学腐蚀反应，增加回路中得失电子引起的电荷转移，使得该受力集中部位的电流密度增大，增长速率更快。
4 结论
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本文搭建了缓冲层不均匀受力烧蚀模拟实验平台，研究了干燥与潮湿条件下不均匀受力对缓冲层烧蚀发展过程的影响与机理，主要得到如下结论：
（1）干燥条件下，缓冲层的电流密度随烧蚀时间延长逐渐衰减，局部受力集中会导致该处的烧蚀电流密度增大，且电流密度随烧蚀时间的延长衰减速率更快。潮湿条件下，缓冲层的电流密度在烧蚀初期呈现出尖峰状，局部受力集中时，电流密度尖峰的峰值增大，同时尖峰内电流密度的增长更快。
（2）不均匀受力烧蚀后缓冲层的局部体积电导率测试结果表明，干燥缓冲层烧蚀后受力集中部位的体积电导率更低，表明受力不均会造成缓冲层烧蚀后体积电导率的分布不均匀。潮湿缓冲层烧蚀后的体积电导率显著降低，原因是材料表面附着的Al2O3及Al(OH)3的高电阻物质阻碍了导电路径。
（3）受力集中会导致缓冲层局部半导电纤维间的有效接触面积增大，承受更高的电流密度，从而加速该处的烧蚀过程。在干燥条件下，受力集中会导致缓冲层局部的热量积累更高，引起电流密度加速衰减。而在潮湿情况下，受力集中会改善缓冲层内部纤维及其同电工铝片的接触情况，促进电化学反应进程，导致电流密度曲线尖峰的峰值增大，变化速率更快。
基金
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  • 国家电网有限公司科技项目资助(5108-202218280A-2-353-XG)
文献
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2023年第56卷第8期
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doi: 10.16790/j.cnki.1009-9239.im.2023.08.012
  • 接收时间：2022-09-24
  • 首发时间：2025-11-24
  • 出版时间：2023-08-20
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  • 收稿日期：2022-09-24
  • 修回日期：2022-12-12
基金
国家电网有限公司科技项目资助(5108-202218280A-2-353-XG)
作者信息
    1国网北京市电力公司电力科学研究院，北京 100075
    2西安交通大学，西安 710049
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2种不同金属材料的力学参数
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鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
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