Article(id=1193543216411669011, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1193543214067056904, articleNumber=null, orderNo=null, doi=10.16790/j.cnki.1009-9239.im.2025.03.002, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1712505600000, receivedDateStr=2024-04-08, revisedDate=1716998400000, revisedDateStr=2024-05-30, acceptedDate=null, acceptedDateStr=null, onlineDate=1762492477753, onlineDateStr=2025-11-07, pubDate=1742400000000, pubDateStr=2025-03-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1762492477753, onlineIssueDateStr=2025-11-07, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1762492477753, creator=13701087609, updateTime=1762492477753, updator=13701087609, issue=Issue{id=1193543214067056904, tenantId=1146029695717560320, journalId=1149653034449285133, year='2025', volume='58', issue='3', pageStart='1', pageEnd='157', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1762492477194, creator=13701087609, updateTime=1762498203949, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1193567233872982429, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1193543214067056904, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1193567233872982430, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1193543214067056904, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=15, endPage=23, ext={EN=ArticleExt(id=1193543216688493076, articleId=1193543216411669011, tenantId=1146029695717560320, journalId=1149653034449285133, language=EN, title=Effect of voltage stabilizer on space charge characteristics of XLPE, columnId=1193543215723806988, journalTitle=Insulating Materials, columnName=Special Issue on Advanced Cable Insulation, runingTitle=null, highlight=null, articleAbstract=

To investigate the effects of voltage stabilizers on the insulation properties of crosslinked polyethylene (XLPE) under DC voltage, anthraquinone (EK) was selected as the voltage stabilizer, and XLPE composites with different mass fractions of EK were prepared through physical blending. The impact of different content of EK on the DC insulation properties of XLPE was analyzed by differential scanning calorimetry (DSC) as well as surface potential decay, space charge, and conduction current measurements. The results show that as the mass fraction of EK increases, both space charge accumulation, space charge injection deepth, maximun distortion field strength, and conductivity of XLPE composites decrease at first and then increase. This phenomenon is attributed to the change of the trap distribution characteristics in XLPE by EK. When the mass fraction of EK does not exceed 1%, the deep traps are mainly introduced, which contribute to field homogenization, reduce space charge accumulation, and inhibit carrier migration, thereby decreasing DC conductivity. When the mass fraction of EK is 1%, the improvement effect of XLPE insulation performance is the best.

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为研究直流电压下电压稳定剂对交联聚乙烯(XLPE)绝缘特性的影响规律,本文选取蒽醌(EK)作为电压稳定剂,通过物理共混制备含不同质量分数EK的XLPE复合材料。结合差示扫描量热分析(DSC)以及表面电位衰减、空间电荷和电导电流等测试,分析不同含量EK对XLPE直流绝缘特性的影响规律。结果表明:随着EK质量分数的增加,XLPE复合材料空间电荷积聚量、空间电荷注入深度、最大畸变场强和电导率均呈现先减小后增大的趋势。分析认为EK会改变XLPE内部陷阱分布特性,当EK质量分数不超过1%时,引入深陷阱为主。深陷阱的引入有利于均匀化电场,减少空间电荷积聚,抑制载流子迁移,进而减小直流电导率。当EK质量分数为1%时,对XLPE绝缘性能的提升效果最好。

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周远翔(1966-),男(汉族),福建莆田人,教授,主要从事高电压技术与绝缘材料研究。

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周远翔(1966-),男(汉族),福建莆田人,教授,主要从事高电压技术与绝缘材料研究。

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周远翔(1966-),男(汉族),福建莆田人,教授,主要从事高电压技术与绝缘材料研究。

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组别 ΔH m/(J/g) T m/℃ X c/%
E0 96.01 103.97 33.0
E1 92.13 104.65 32.1
E2 90.49 105.27 31.5
E3 91.21 104.43 31.7
E4 81.02 104.56 28.2
E5 78.31 104.73 27.2
), ArticleFig(id=1195076961614701432, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543216411669011, language=CN, label=表1, caption=

XLPE及其复合材料DSC参数

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组别 ΔH m/(J/g) T m/℃ X c/%
E0 96.01 103.97 33.0
E1 92.13 104.65 32.1
E2 90.49 105.27 31.5
E3 91.21 104.43 31.7
E4 81.02 104.56 28.2
E5 78.31 104.73 27.2
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电压稳定剂对XLPE空间电荷特性的影响研究
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周远翔 1, 2 , 戚国庆 1 , 李科 1 , 朱小倩 2 , 姜贵敏 1, 2
绝缘材料 | 先进电缆绝缘专题 2025,58(3): 15-23
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绝缘材料 | 先进电缆绝缘专题 2025, 58(3): 15-23
电压稳定剂对XLPE空间电荷特性的影响研究
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周远翔1, 2, 戚国庆1, 李科1, 朱小倩2, 姜贵敏1, 2
作者信息
  • 1 新疆大学 电气工程学院,新疆 乌鲁木齐 830017
  • 2 清华大学 电机工程与应用电子技术系 新型电力系统运行与控制全国重点实验室,北京 100084
  • 周远翔(1966-),男(汉族),福建莆田人,教授,主要从事高电压技术与绝缘材料研究。

Effect of voltage stabilizer on space charge characteristics of XLPE
Yuanxiang ZHOU1, 2, Guoqing QI1, Ke LI1, Xiaoqian ZHU2, Guimin JIANG1, 2
Affiliations
  • 1 School of Electrical Engineering, Xinjiang University, Urumqi 830017, China
  • 2 State Key Laboratory of Power System Operation and Control, Department of Electrical Engineering, Tsinghua University, Beijing 100084, China
出版时间: 2025-03-20 doi: 10.16790/j.cnki.1009-9239.im.2025.03.002
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为研究直流电压下电压稳定剂对交联聚乙烯(XLPE)绝缘特性的影响规律,本文选取蒽醌(EK)作为电压稳定剂,通过物理共混制备含不同质量分数EK的XLPE复合材料。结合差示扫描量热分析(DSC)以及表面电位衰减、空间电荷和电导电流等测试,分析不同含量EK对XLPE直流绝缘特性的影响规律。结果表明:随着EK质量分数的增加,XLPE复合材料空间电荷积聚量、空间电荷注入深度、最大畸变场强和电导率均呈现先减小后增大的趋势。分析认为EK会改变XLPE内部陷阱分布特性,当EK质量分数不超过1%时,引入深陷阱为主。深陷阱的引入有利于均匀化电场,减少空间电荷积聚,抑制载流子迁移,进而减小直流电导率。当EK质量分数为1%时,对XLPE绝缘性能的提升效果最好。

交联聚乙烯  /  蒽醌  /  空间电荷  /  电导率

To investigate the effects of voltage stabilizers on the insulation properties of crosslinked polyethylene (XLPE) under DC voltage, anthraquinone (EK) was selected as the voltage stabilizer, and XLPE composites with different mass fractions of EK were prepared through physical blending. The impact of different content of EK on the DC insulation properties of XLPE was analyzed by differential scanning calorimetry (DSC) as well as surface potential decay, space charge, and conduction current measurements. The results show that as the mass fraction of EK increases, both space charge accumulation, space charge injection deepth, maximun distortion field strength, and conductivity of XLPE composites decrease at first and then increase. This phenomenon is attributed to the change of the trap distribution characteristics in XLPE by EK. When the mass fraction of EK does not exceed 1%, the deep traps are mainly introduced, which contribute to field homogenization, reduce space charge accumulation, and inhibit carrier migration, thereby decreasing DC conductivity. When the mass fraction of EK is 1%, the improvement effect of XLPE insulation performance is the best.

XLPE  /  anthraquinone  /  space charge  /  conductivity
周远翔, 戚国庆, 李科, 朱小倩, 姜贵敏. 电压稳定剂对XLPE空间电荷特性的影响研究. 绝缘材料, 2025 , 58 (3) : 15 -23 . DOI: 10.16790/j.cnki.1009-9239.im.2025.03.002
Yuanxiang ZHOU, Guoqing QI, Ke LI, Xiaoqian ZHU, Guimin JIANG. Effect of voltage stabilizer on space charge characteristics of XLPE[J]. Insulating Materials, 2025 , 58 (3) : 15 -23 . DOI: 10.16790/j.cnki.1009-9239.im.2025.03.002
高压电力电缆因其体积小、输送容量大等优势,在跨海输电、城市供电系统、风电等新能源发电系统中有着独特的优势,其使用量呈逐年增长的趋势[1]。目前,220 kV及以上电压等级的交联聚乙烯(XLPE)电缆绝缘料大部分依赖进口[2],高电压等级国产电缆的研发仍处于试运行阶段,其绝缘可靠性有待进一步验证。因此,提高XLPE的绝缘可靠性对于我国的能源输送和用电安全至关重要。
目前,提升交联聚乙烯绝缘可靠性的途径主要有:生产高纯度的基料[3]、添加纳米材料[4]、添加电压稳定剂[5]、改变结晶特性[6]等。其中提升低密度聚乙烯(LDPE)基料的纯净度的技术难度较高,也是我国基料长期被国外“卡脖子”的重要原因;纳米材料主要存在容易团聚、引入局部缺陷和工业生产中容易堵塞杂质过滤网等问题;改变结晶特性对于提升XLPE的绝缘强度效果有限。
电压稳定剂主要为芳香族化合物[7],稳压效果主要来源于其具有的苯环结构,苯环通过sp2轨道杂化形成共轭π键,其电负性强于XLPE,容易捕获高能电子,高能电子在芳香族化合物的电子轨道运动会通过荧光、热等形式耗散能量,从而对XLPE的分子链起到保护作用[8]。因此,通过共混或接枝在XLPE中引入电压稳定剂从而改性XLPE成为研究热点。
国内外学者对于电压稳定剂展开了大量的研究。李春阳等[9-10]将芳香族化合物接枝到XLPE的分子链上,使其低温下的电导率有所下降,并通过增大浅陷阱密度,减少了直流场强下的空间电荷积聚。Y YAMANO[11]研究了多种稠环芳香烃对LDPE直流电气强度的影响,结果表明,未连接任何基团的稠环芳香烃中,蒽的提升效果最明显,并指出蒽的自由基种类也会影响LDPE的陷阱深度。陈向荣等[12]选取了3种俘获高能电子类电压稳定剂对LDPE进行绝缘改性,发现该类电压稳定剂可增大LDPE的浅陷阱密度,抑制空间电荷积累,进而提高材料的绝缘性能。随后,陈向荣等[3]又研究了接枝不同含量4-乙酰氧基苯乙烯对XLPE直流绝缘性能的影响,结果表明接枝该电压稳定剂引入了更多更深的浅陷阱,形成了致密的浅陷阱点阵,阻碍了载流子迁移,进而提高了XLPE直流绝缘性能。DU B X等[13-14]在LDPE中加入具有低电离势能的电压稳定剂,发现该类电压稳定剂通过引入深陷阱,改善了LDPE的直流电导率,抑制了空间电荷的积聚。已有研究表明,电压稳定剂对XLPE绝缘性能的提升具有重要意义,但对比目前大部分研究可知电压稳定剂对XLPE直流场强下空间电荷的影响规律和作用机理尚未明确,其影响机理尚待进一步研究和验证。
蒽醌(EK)作为一种芳香酮类有机小分子,具有较大的电子亲和能,能够有效吸收高能电子。因此,本文选择EK作为电压稳定剂,制备不同EK含量的XLPE样品,结合陷阱特性、空间电荷、电导率测试,研究EK对XLPE直流绝缘特性的影响规律及作用机理,希望有助于推动电压稳定剂在XLPE直流高压电缆中的应用。
低密度聚乙烯(LDPE),牌号为2220H,熔体流动速率为3.3~3.6 g/10min,密度为0.922~0.966 g/cm3,熔点为110℃,扬子石化-巴斯夫有限责任公司。交联剂为过氧化二异丙苯(DCP),CAS号为80-43-3,纯度为98%,上海阿拉丁生化科技股份有限公司。电压稳定剂为蒽醌(EK),其分子式如图1所示,CAS号为84-65-1,纯度为98%,上海麦克林生化科技股份有限公司。
首先采用双螺杆挤出机将不同质量比的LDPE、DCP和EK在125℃下进行共混,得到不同EK含量的LDPE混合颗粒。然后将LDPE混合颗粒放入不锈钢模具中,先在120℃、10 MPa条件下热压10 min,再在180℃、20 MPa条件下交联10 min。最后将交联后的试样在室温下冷却结晶,得到厚度为200 μm的薄膜试样。将EK质量分数分别为0、0.5%、0.75%、1%、1.25%、1.5%的EK/XLPE试样分别记为E0、E1、E2、E3、E4和E5,其中DCP的质量分数均为2%。为消除试样制备过程中产生的水分和交联副产物,先将试样在70℃下真空脱气24 h,再进行后续测试。
使用傅里叶变换红外光谱仪(FTIR,VERTEX 70V型,德国耐驰公司)表征试样的特征官能团变化,测试波数范围为4 000~500 cm-1。使用差示扫描量热仪(DSC,Q 5000 IR型,美国TA公司)测试试样的结晶度,氮气气氛,测试温度范围为30~200℃,升温速率和降温速率均为10℃/min。
采用等温表面电位衰减法(ISPD)测量试样的表面电位。测试时采用带栅极的针-板电极,通过电晕充电使试样表面带电,设置针电极为-7.5 kV,板电极为-3.5 kV,极化时间为5 min。极化结束后,迅速将试样放置在静电计探头下方,静电计探头距试样2 mm,采集2 h内试样的表面电位,经过数据处理得到其表面电位衰减曲线。
使用温控电声脉冲法空间电荷测量系统对XLPE及其复合材料开展空间电荷的测量,测量系统由程控计算机、烘箱、高压直流发生器、程控电源、测量单元、示波器等组成。测试之前,根据IEC/TS 62758:2012对测量系统进行校准。试验时,外施电场强度为-50 kV/mm,极化时间为60 min,去极化时间为15 min,数据采集间隔为3 s,负极(-HVDC,SC)为上电极,正极(GND,Al)为下电极,每组测试重复2~3次。
根据GB/T 1410—2006《固体绝缘材料体积电阻率和表面电阻率试验方法》的要求,采用三电极法测试试样的电导电流,测量系统置于金属屏蔽罩内以防止环境的电磁干扰。测试环境为室温,测试极化时间为30 min,外施场强为50 kV/mm,中心电极直径为20 mm。为保证试验结果可重复性,电导电流数据取5次测试结果的平均值,根据式(1)计算出试样的体积电导率(σ)。
σ = I E S
式(1)中:I为电导电流,A;E为外施电场强度,V/m;S为中心电极的面积,m2
图2为XLPE和E5试样脱气前后的FTIR谱图。从图2可以看出,波数为720、1 471、2 856、2 920 cm-1处为XLPE的亚甲基特征峰,1 580~1 600 cm-1和1 675 cm-1处分别为蒽醌苯环的骨架振动峰和羰基C=O的伸缩振动峰[15],1 650 cm-1和1 724 cm-1处分别为交联副产物α-甲基苯乙烯的C=C双键伸缩振动峰和苯乙酮的羰基伸缩振动峰[16]。从图2还可以看出,添加EK后,试样的FTIR光谱中出现了蒽醌苯环的骨架振动峰和羰基C=O的伸缩振动峰,说明通过熔融共混后成功在XLPE中引入了EK。对比脱气前后E5试样的FTIR谱图可知,1 580~1 600 cm-1和1 675 cm-1处的特征峰强度没有明显变化,但1 650和1 724 cm-1处特征峰强度有所减小,说明脱气处理可以减少交联副产物且不会导致EK分子析出。
图3为XLPE及其复合材料的DSC熔融曲线,根据曲线计算得到了试样熔融过程中的DSC参数,如表1所示,ΔH m为熔融热焓,T m为熔融峰峰值温度,X c为结晶度。其中,结晶度计算公式[3]式(2)所示。
X c = H m H 100
式(2)中,ΔH m为XLPE试样的实际熔融焓;ΔH 100为XLPE试样完全结晶时的熔融焓,本文取ΔH 100=287.3 J/g。
表1可以看出,添加了EK的试样T m均略高于XLPE,其中E2的T m最高,为105.27℃,而XLPE的T m最低,为103.97℃,说明添加了EK可以在一定程度上提高XLPE的热稳定性。此外,添加了EK的试样结晶度均小于XLPE,EK质量分数小于1%时结晶度下降幅度较小,最大仅下降了4.5%。但当EK质量分数大于1%且继续增加时,试样结晶度的下降幅度逐渐增大,其中E5结晶度相比XLPE下降了17.6%。电压稳定剂EK作为小分子材料,通常分散在XLPE无定形区域中,其存在会影响XLPE分子链的有序排列,进而影响XLPE结晶度[17]。当EK添加含量较低时,其对XLPE分子链的有序排列影响较小,大多数分子链之间仍能保持紧密有序的排列,因此结晶度仅表现为小幅度下降。但随着添加含量的增加,EK分子会减弱XLPE分子链的对称性,干扰分子链之间的紧密排列和有序性[18],从而使结晶度大幅下降。
为方便数据处理,本文将表面电位幅值进行取正,得到XLPE及其复合材料的表面电位衰减曲线如图4所示。从图4可以看出,XLPE及其复合材料表面电位均从3 kV左右开始衰减,随着EK质量分数的增加,表面电位的衰减速率呈现先减小后增大趋势。经2 h衰减后,E3电位下降至1 342 V,衰减速率最慢。E5前期衰减速率最快,最终电位下降至616 V。由此可见,EK会改变XLPE内部载流子的输运和消散特性。
采用双陷阱能级模型对测得的表面电位衰减曲线进行拟合,计算公式[19]式(3)所示。
V ( t ) = a e x p ( b t ) + c e x p ( d t )
式(3)中:V(t)为表面电位;a为浅陷阱分量;b为浅陷阱衰减时间常数;t为时间;c为深陷阱分量;d为深陷阱衰减时间常数。
根据试样的表面电位衰减曲线,通过ISPD法计算材料内部的陷阱能级(E T)和陷阱密度(N t),计算公式[20]如式(4)~(6)所示。
E T = k B T · l n   ( ν A · t )
Q S t = t · ε 0 ε r q e L · d   ϕ s ( t ) d   t
N t = - Q S t · 2 d   f ( E T ) · δ ( E T , t )
式(4)~(6)中:k B为波尔曼兹常数;T为绝对温度,K;ν A为逃逸频率,取1012 s-1Q S(t)为电荷密度;ε 0为真空介电常数;ε r为相对介电常数; ϕ s(t)为试样表面电位;q e为电子电荷量;L为试样厚度;f为费米-狄克拉函数;δ为狄克拉函数。
通过计算可得到由两条单峰曲线叠加而成的复合陷阱曲线,两个峰分别对应式(3)中双能级模型的浅陷阱分量和深陷阱分量。为了更好地分析陷阱特性,对复合陷阱曲线进行分峰处理,得到XLPE及其复合材料的浅陷阱和深陷阱分布曲线,如图5所示。
图5可以看出,随着EK质量分数的增加,浅陷阱密度呈先下降后上升的趋势,而深陷阱密度则呈先上升后下降的趋势。其中E3的深陷阱密度最大,浅陷阱密度最小,分别为13.3×1020 eV-1·m-3和10×1020 eV-1·m-3,E5的浅陷阱密度最大,深陷阱密度最小,分别为13.9×1020 eV-1·m-3和7.36×1020 eV-1·m-3。由此可见,添加EK后改变了XLPE的陷阱特性,当EK质量分数不超过1%时,表现为引入了更多的深陷阱,且深陷阱密度随着添加含量的增加逐渐增大,浅陷阱密度则随着添加含量的增加逐渐减小;当EK质量分数大于1%时,表现为引入了更多的浅陷阱,且随着EK质量分数的增加,浅陷阱密度逐渐增大,深陷阱密度逐渐减小。
分析认为,EK具有较强的电负性,对电荷有较强的束缚作用,从而在EK与XLPE之间的界面处引入深陷阱[21],因此在添加质量分数不超过1%时,深陷阱密度随EK含量增加而增大。然而,当EK质量分数高于1%时,一方面由于EK含量增加,EK与XLPE之间的界面逐渐变多,导致界面区域陷阱势垒交叠[19],使得陷阱深度降低,形态发生了变化,最终深陷阱变为浅陷阱[22],深陷阱减少。另一方面,当EK含量较高时,EK/XLPE的结晶度大幅下降,无定形区域扩大,进而导致浅陷阱能级的降低和密度的增大[23]。因此,当EK质量分数大于1%时表现为引入了更多的浅陷阱。
空间电荷的主要来源是电极的注入和聚合物内部杂质的电离[24]。在外施电场的作用下,电荷会突破电极与绝缘聚合物的界面势垒,通过Schottky效应注入到绝缘聚合物内部[25]。注入电荷在外电场的作用下由阳极向阴极运动,在运动过程中部分电荷会被绝缘聚合物中的陷阱捕获,另一部分电荷流向阴极。电荷的入陷、脱陷及迁移过程会对聚合物分子链造成局部损伤,加剧电荷的积聚,进而导致绝缘的劣化[26]
图6图7图8分别为XLPE及其复合材料的空间电荷分布曲线、空间电荷分布二维彩图和电场演变曲线。下面分别从电荷注入绝对总量、电荷注入深度、最大畸变场强3个方面来分析EK含量对XLPE空间电荷特性的影响。
图6可以看出,XLPE及其复合材料均在阳极附近出现了不同程度的同极性空间电荷积聚。为进一步分析电荷积聚量与EK添加量的关系,本文根据极化过程中电荷分布数据,计算得到XLPE及其复合材料的空间电荷注入绝对总量,其计算公式[27]式(7)所示。
Q ( t ) = 1 d 0 d ρ ( x , t ) S d x
式(7)中:Q(t)为t时刻单位厚度空间电荷积聚量绝对值,C;d为试样厚度,m;ρ(x,t)为t时刻位于x处的空间电荷密度,C/m3S为上电极表面积,m2
图9为XLPE及其复合材料的空间电荷积聚量随极化时间的变化曲线。
图9可以看出,随着EK质量分数的增加,试样内部的电荷积聚量先减小后增大。当EK质量分数不超过1%时,EK/XLPE的空间电荷积聚绝对总量均低于XLPE,其中E3的空间电荷积聚量最低。这是由于EK质量分数不超过1%时,引入了更多的深陷阱。这些陷阱能够捕获电极注入的同极性电荷,形成静电屏蔽层,从而削弱了阳极附近的电场,阻碍了电荷的注入,抑制了空间电荷的积聚[28]。但当EK质量分数大于1%时,EK/XLPE的空间电荷积聚绝对总量均高于XLPE。分析认为,当EK质量分数大于1%时,试样内部浅陷阱逐渐增多,深陷阱逐渐减少,空间电荷抑制能力逐渐减弱,导致空间电荷注入总量增多,空间电荷积聚变多[29]
图7可以看出,随着EK质量分数的增加,电荷注入深度先减小后增大,其中E3对电荷迁移的限制效果最好,注入深度最小。这是由于E3引入的深陷阱数量最多,深陷阱能够捕获载流子,阻碍了载流子向材料内部迁移,进而减小了空间电荷注入深度。而E4和E5的深陷阱数量变少,引入了更多的浅陷阱,促进了电荷向材料内部的迁移,导致电荷注入深度增大。
同极性电荷积聚形成的电场会削弱阳极附近的电场强度,同时增大向阴极方向的电场强度,进而导致试样内部电场出现畸变。从图8可以看出,随着EK质量分数的增加,XLPE及其复合材料的最大畸变场强呈现出先减小后增大的趋势。其中E3的电场畸变最小,为57.59 kV/mm,与XLPE相比下降了4.7%,表现出最佳的电场畸变抑制效果。这是因为E3内部引入大量的深陷阱,抑制了空间电荷的注入和空间电荷的积聚,进而抑制了电场畸变。
XLPE是半结晶聚合物,由晶体和非晶体组成,通常在较低的电场下,电子在晶区和非晶区穿行的过程中较难形成隧穿效应,主要通过振动的形式跨越晶区和非晶区间的势垒,形成跳跃电导[30]。电子跳跃电导的载流子迁移率计算公式如式(8)所示。
μ = u 0 e - E / k B T
式(8)中:μ为载流子迁移率;u 0为微晶体之间的势垒;k B为玻尔兹曼常数;E为电子跳跃所要跨越的势垒;T为温度。
由于σ=qnμ,电导率可以表示为式(9)
σ = q n u 0 e - E / k B T
式(9)中:q为电荷量;n为自由载流子的密度。
图10是计算所得XLPE及其复合材料的电导率。从图10可以看出,随着EK质量分数的增加,XLPE及其复合材料的电导率先下降后上升,其中E3的电导率最低,为4.74×10-13 S/m,比XLPE下降了27%,E5的电导率最高,为7.97×10-13 S/m,比XLPE上升了22%。分析认为,当EK质量分数不超过1%时,在材料内部引入了深陷阱,深陷阱的势垒较大,抑制了载流子的迁移,进而导致电导率的下降。而当EK质量分数大于1%时,在材料内部引入的深陷阱减少,浅陷阱增多,促进了载流子的迁移,进而提升了电导率。电导率的测试结果与陷阱特性以及空间电荷变化规律一致。
(1)电压稳定剂EK会改变XLPE内部陷阱分布特性。当EK质量分数不超过1%时,在XLPE内部引入了更多的深陷阱,深陷阱密度增大,浅陷阱密度减小;当EK质量分数大于1%时,XLPE内部引入了更多的浅陷阱,浅陷阱密度增大,深陷阱密度减小。
(2)随着EK含量的增加,空间电荷积聚量、空间电荷注入深度、最大畸变场强以及电导率均呈现先减小后增大的趋势。当EK质量分数为1%时,XLPE复合材料空间电荷的积聚量最小,空间电荷注入深度最浅,最大畸变场强最小,直流电导率最低,具有最佳的绝缘性能。
  • 国家电网公司总部科技项目(5500-202058475A-0-0-00)
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2025年第58卷第3期
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doi: 10.16790/j.cnki.1009-9239.im.2025.03.002
  • 接收时间:2024-04-08
  • 首发时间:2025-11-07
  • 出版时间:2025-03-20
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  • 收稿日期:2024-04-08
  • 修回日期:2024-05-30
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国家电网公司总部科技项目(5500-202058475A-0-0-00)
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    1 新疆大学 电气工程学院,新疆 乌鲁木齐 830017
    2 清华大学 电机工程与应用电子技术系 新型电力系统运行与控制全国重点实验室,北京 100084
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2种不同金属材料的力学参数

Family
属数
Number of
genus
种数
Number of
species
占总种数比例
Percentage of
total species (%)

Genus
种数
Number of
species
占总种数比例
Percentage of total
species (%)
鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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