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Article(id=1193543214750728457, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1193543214067056904, articleNumber=null, orderNo=null, doi=10.16790/j.cnki.1009-9239.im.2025.03.012, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1715184000000, receivedDateStr=2024-05-09, revisedDate=1723392000000, revisedDateStr=2024-08-12, acceptedDate=null, acceptedDateStr=null, onlineDate=1762492477356, onlineDateStr=2025-11-07, pubDate=1742400000000, pubDateStr=2025-03-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1762492477356, onlineIssueDateStr=2025-11-07, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1762492477356, creator=13701087609, updateTime=1762492477356, updator=13701087609, issue=Issue{id=1193543214067056904, tenantId=1146029695717560320, journalId=1149653034449285133, year='2025', volume='58', issue='3', pageStart='1', pageEnd='157', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1762492477194, creator=13701087609, updateTime=1762498203949, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1193567233872982429, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1193543214067056904, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1193567233872982430, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1193543214067056904, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=109, endPage=116, ext={EN=ArticleExt(id=1193543216193569042, articleId=1193543214750728457, tenantId=1146029695717560320, journalId=1149653034449285133, language=EN, title=Simulation study on critical condition of current density for ablation of high voltage cable buffer layer to insulating shield layer, columnId=1193543215723806988, journalTitle=Insulating Materials, columnName=Special Issue on Advanced Cable Insulation, runingTitle=null, highlight=null, articleAbstract=

To investigate the critical conditions of high voltage cable buffer layer ablation, the types of insulation shielding damage caused by actual cable ablation were summarized in this paper. A three-dimensional asymmetric high-voltage cable model was established by finite element simulation. The ablation development process of high-voltage cables under both dry and wet conditions, as well as the mechanisms of their damage to insulation shielding, were studied separately. The difficulty of ablation under the two conditions was compared and analyzed. The results show that damage under dry condition is attributed to current-induced thermal effects caused by prolonged poor contact. When poor contact extends to 7.5 m, the surface current density on the buffer layer reaches as high as 442 A/m2, and the temperature reaches high as 200℃ within the buffer layer. Damage under wet condition arises from current-induced thermal effects caused by the high resistance products from electrochemical corrosion, and these products can penetrate areas where current and temperature are concentrated within the buffer layer. When the coverage rate of white powder reaches 97.9%, the surface current density on the buffer layer is up to 416 A/m2. Simulation results align closely with actual dissolution observed in faulty cables affected by ablation, thus validating our analysis findings presented in this paper.

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为了研究高压电缆缓冲层烧蚀的临界条件，本文针对实际电缆烧蚀致绝缘屏蔽损伤的类型进行分类总结，通过有限元仿真构建三维不对称高压电缆模型，分别研究了干燥和潮湿条件下高压电缆烧蚀发展过程及其对绝缘屏蔽造成损伤的机理，并对比分析两种条件下烧蚀的难易程度。结果表明：干燥条件下绝缘屏蔽层损伤源于电缆长段不良接触导致的电流热效应，不良接触达到7.5 m时缓冲层表面电流密度高达442 A/m2，温度为200℃；潮湿条件下绝缘屏蔽层损伤源于电化学腐蚀高阻性产物生成导致的电流热效应，高阻性产物在电流密度与温度集中的区域会贯穿缓冲层，被白色粉末覆盖比例达到97.9%时缓冲层表面电流密度高达416 A/m2。仿真结果能够与实际烧蚀故障电缆的解体情况对应良好，验证了本文分析结果的合理性。

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张可（2001-），男（汉族），安徽六安人，硕士生，主要从事高电压与绝缘技术方面的研究。
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门业堃（1990-），男（汉族），山东潍坊人，高级工程师，主要从事高压电缆设备状态的评估与诊断工作。

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门业堃（1990-），男（汉族），山东潍坊人，高级工程师，主要从事高压电缆设备状态的评估与诊断工作。

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门业堃（1990-），男（汉族），山东潍坊人，高级工程师，主要从事高压电缆设备状态的评估与诊断工作。

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Coatings,2021,11(12):1498., articleTitle=Preparation of 1060, 2024 and 7075 aluminum alloy anodic oxide films, refAbstract=null)], funds=[Fund(id=1195077115138810264, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, awardId=5108-202218280A-2-353-XG, language=CN, fundingSource=国家电网公司总部科技项目(5108-202218280A-2-353-XG), fundOrder=null, country=null)], companyList=[AuthorCompany(id=1195077110042730757, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, xref=1, ext=[AuthorCompanyExt(id=1195077110046925062, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, companyId=1195077110042730757, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=1 Electric Power Research Institute of State Grid Beijing Electric Power Company, Beijing 100075, China), AuthorCompanyExt(id=1195077110063702279, 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departmentName=null, remark=2 西安交通大学，陕西 西安 710049)]), AuthorCompany(id=1195077110214697230, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, xref=3, ext=[AuthorCompanyExt(id=1195077110218891535, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, companyId=1195077110214697230, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=3 State Grid Beijing Electric Power Company, Beijing 100075, China), AuthorCompanyExt(id=1195077110227280144, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, companyId=1195077110214697230, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=3 国网北京市电力公司，北京 100075)])], figs=[ArticleFig(id=1195077113083601248, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, language=EN, label=Fig.1, caption=Characteristics of ablation defects under dry condition, figureFileSmall=SDfG/f4j1wDTx1QQ6WrJ2g==, figureFileBig=ZCAO+ycXtUAgHTzIGQ2MjQ==, tableContent=null), ArticleFig(id=1195077113201041763, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, language=CN, label=图1, caption=干燥条件下的烧蚀缺陷特征, figureFileSmall=SDfG/f4j1wDTx1QQ6WrJ2g==, figureFileBig=ZCAO+ycXtUAgHTzIGQ2MjQ==, tableContent=null), ArticleFig(id=1195077113289122149, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, language=EN, label=Fig.2, caption=Characteristics of ablation defects under moisture condition, figureFileSmall=bDSTSUblryfOErt+nrKDyQ==, figureFileBig=xrex5F5iAAS3t0T9OEEGCw==, tableContent=null), ArticleFig(id=1195077113356231015, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, language=CN, label=图2, caption=潮湿条件下的烧蚀缺陷特征, figureFileSmall=bDSTSUblryfOErt+nrKDyQ==, 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label=Fig.6, caption=Temperature distribution of the cable under the effect of radial leakage current, figureFileSmall=ThU6Re6iYzgPmxBqLR/HxA==, figureFileBig=QSFTKEmgkCcPJ/0kyvjTUQ==, tableContent=null), ArticleFig(id=1195077113893101943, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, language=CN, label=图6, caption=径向泄漏电流作用下电缆的温度分布, figureFileSmall=ThU6Re6iYzgPmxBqLR/HxA==, figureFileBig=QSFTKEmgkCcPJ/0kyvjTUQ==, tableContent=null), ArticleFig(id=1195077113976988025, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, language=EN, label=Fig.7, caption=Current density and temperature distribution of the buffer layer with poor contact with aluminum sheath, figureFileSmall=wcmRcnt5UmKy37oBYXUDTg==, figureFileBig=Vtq+RMJc7u0qsmO/82omHQ==, tableContent=null), ArticleFig(id=1195077114035708283, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, language=CN, label=图7, 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articleId=1193543214750728457, language=EN, label=Table 1, caption=Material parameters of the model, figureFileSmall=null, figureFileBig=null, tableContent=
结构 电导率/(S/m) 相对介电常数 导热系数/(W/(m·K)) 恒压热容/(J/(kg·K)) 密度/(kg/m3) 厚度/mm 外径/mm
缆芯 5.99×107 1 400 385 8 960 — 33.70
导体屏蔽 20 700 0.4 2 180 1 150 1.47 36.64
主绝缘 1×10-14 2.3 0.286 2 600 930 15.78 68.20
绝缘屏蔽 20 700 0.4 2 180 1 150 1.35 70.90
缓冲层 1×10-3 100 0.08 2 120 140 4 78.90
空气隙 1×10-14 1 0.026 1 005 1.2 — 90.90
铝护套 3.45×107 1 238 900 2 700 2 94.90
外护套 1×10-14 2.25 0.02 2 000 200 3.5 101.90
), ArticleFig(id=1195077115004592533, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543214750728457, language=CN, label=表1, caption=

模型材料参数

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结构 电导率/(S/m) 相对介电常数 导热系数/(W/(m·K)) 恒压热容/(J/(kg·K)) 密度/(kg/m3) 厚度/mm 外径/mm
缆芯 5.99×107 1 400 385 8 960 — 33.70
导体屏蔽 20 700 0.4 2 180 1 150 1.47 36.64
主绝缘 1×10-14 2.3 0.286 2 600 930 15.78 68.20
绝缘屏蔽 20 700 0.4 2 180 1 150 1.35 70.90
缓冲层 1×10-3 100 0.08 2 120 140 4 78.90
空气隙 1×10-14 1 0.026 1 005 1.2 — 90.90
铝护套 3.45×107 1 238 900 2 700 2 94.90
外护套 1×10-14 2.25 0.02 2 000 200 3.5 101.90
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高压电缆缓冲层烧蚀至绝缘屏蔽层的电流密度临界条件仿真研究
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门业堃 1 , 张可 2 , 郭卫 1 , 及洪泉 1 , 任志刚 1 , 张竟成 3 , 高建 2
绝缘材料 | 先进电缆绝缘专题 2025,58(3): 109-116
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绝缘材料 | 先进电缆绝缘专题 2025, 58(3): 109-116
高压电缆缓冲层烧蚀至绝缘屏蔽层的电流密度临界条件仿真研究
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门业堃1, 张可2, 郭卫1, 及洪泉1, 任志刚1, 张竟成3, 高建2
作者信息
  • 1 国网北京市电力公司电力科学研究院，北京 100075
  • 2 西安交通大学，陕西 西安 710049
  • 3 国网北京市电力公司，北京 100075

    • 门业堃（1990-），男（汉族），山东潍坊人，高级工程师，主要从事高压电缆设备状态的评估与诊断工作。

通讯作者:

张可（2001-），男（汉族），安徽六安人，硕士生，主要从事高电压与绝缘技术方面的研究。
Simulation study on critical condition of current density for ablation of high voltage cable buffer layer to insulating shield layer
Yekun MEN1, Ke ZHANG2, Wei GUO1, Hongquan JI1, Zhigang REN1, Jingcheng ZHANG3, Jian GAO2
Affiliations
  • 1 Electric Power Research Institute of State Grid Beijing Electric Power Company, Beijing 100075, China
  • 2 Xi′an Jiaotong University, Xi′an 710049, China
  • 3 State Grid Beijing Electric Power Company, Beijing 100075, China
出版时间: 2025-03-20 doi: 10.16790/j.cnki.1009-9239.im.2025.03.012
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摘要
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为了研究高压电缆缓冲层烧蚀的临界条件，本文针对实际电缆烧蚀致绝缘屏蔽损伤的类型进行分类总结，通过有限元仿真构建三维不对称高压电缆模型，分别研究了干燥和潮湿条件下高压电缆烧蚀发展过程及其对绝缘屏蔽造成损伤的机理，并对比分析两种条件下烧蚀的难易程度。结果表明：干燥条件下绝缘屏蔽层损伤源于电缆长段不良接触导致的电流热效应，不良接触达到7.5 m时缓冲层表面电流密度高达442 A/m2，温度为200℃；潮湿条件下绝缘屏蔽层损伤源于电化学腐蚀高阻性产物生成导致的电流热效应，高阻性产物在电流密度与温度集中的区域会贯穿缓冲层，被白色粉末覆盖比例达到97.9%时缓冲层表面电流密度高达416 A/m2。仿真结果能够与实际烧蚀故障电缆的解体情况对应良好，验证了本文分析结果的合理性。

缓冲层烧蚀  /  绝缘屏蔽层  /  电流热效应  /  电化学腐蚀  /  有限元仿真

To investigate the critical conditions of high voltage cable buffer layer ablation, the types of insulation shielding damage caused by actual cable ablation were summarized in this paper. A three-dimensional asymmetric high-voltage cable model was established by finite element simulation. The ablation development process of high-voltage cables under both dry and wet conditions, as well as the mechanisms of their damage to insulation shielding, were studied separately. The difficulty of ablation under the two conditions was compared and analyzed. The results show that damage under dry condition is attributed to current-induced thermal effects caused by prolonged poor contact. When poor contact extends to 7.5 m, the surface current density on the buffer layer reaches as high as 442 A/m2, and the temperature reaches high as 200℃ within the buffer layer. Damage under wet condition arises from current-induced thermal effects caused by the high resistance products from electrochemical corrosion, and these products can penetrate areas where current and temperature are concentrated within the buffer layer. When the coverage rate of white powder reaches 97.9%, the surface current density on the buffer layer is up to 416 A/m2. Simulation results align closely with actual dissolution observed in faulty cables affected by ablation, thus validating our analysis findings presented in this paper.

buffer layer ablation  /  insulation shield layer  /  current heating effect  /  electrochemical corrosion  /  finite element simulation
门业堃, 张可, 郭卫, 及洪泉, 任志刚, 张竟成, 高建. 高压电缆缓冲层烧蚀至绝缘屏蔽层的电流密度临界条件仿真研究. 绝缘材料, 2025 , 58 (3) : 109 -116 . DOI: 10.16790/j.cnki.1009-9239.im.2025.03.012
Yekun MEN, Ke ZHANG, Wei GUO, Hongquan JI, Zhigang REN, Jingcheng ZHANG, Jian GAO. Simulation study on critical condition of current density for ablation of high voltage cable buffer layer to insulating shield layer[J]. Insulating Materials, 2025 , 58 (3) : 109 -116 . DOI: 10.16790/j.cnki.1009-9239.im.2025.03.012
正文
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0 引言
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高压电缆是城市电力系统的重要组成部分，是保障城市电网稳定运行的重要电力设备[1-4]。近年来，国内多次发生电缆阻水缓冲层烧蚀事故，且目前在运电缆中仍存在大量潜在的烧蚀隐患，现有手段难以直接检测[5-7]。因此，有必要研究高压电缆缓冲层烧蚀的发展过程，从而预防在运高压电缆缓冲层烧蚀缺陷风险。
国内外学者已针对高压电缆缓冲层烧蚀机理开展了大量研究[8-11]。电流热效应烧蚀机理表明，电缆中的电流或铝护套环流的热效应是引发缓冲层烧蚀破坏的重要原因。刘英等[12]通过有限元仿真分析发现，潮湿缓冲层与铝护套紧密接触位置存在电流集中现象，当接触不良长度达到3 m时，缓冲层温度将达到324℃，远高于缓冲层的热分解温度，从而引发缓冲层的烧蚀破坏。气隙放电烧蚀机理表明，缓冲层与皱纹铝护套之间接触不良是导致缓冲层烧蚀的重要原因。门业堃等[13]通过仿真和实验研究，发现缓冲层和铝护套间的气隙能够产生放电，对缓冲层产生烧蚀破坏。电化学腐蚀是缓冲层受潮后产生高阻性白色粉末的直接原因，高阻性白色粉末能使缓冲层的电流密度集中或产生电位差[9,14]，引发电流热效应或气隙放电，从而导致烧蚀。
现有研究均主要针对缓冲层本身的烧蚀破坏机理展开讨论。从已公开的大量现场电缆线路解体情况可知，高压电缆缓冲层烧蚀会进一步损伤绝缘屏蔽层，并最终引发电缆本体击穿故障。然而，现阶段对于缓冲层烧蚀引发绝缘屏蔽层损伤的临界条件尚不明确，因此亟需开展相关研究。
本文通过高压电缆建模仿真分析，研究在干燥与潮湿两种情况下缓冲层烧蚀发展至绝缘屏蔽层的过程，通过电流密度与温度的变化得到缓冲层烧蚀的电流密度临界条件，并关联干燥与潮湿两种条件下电流密度与温度的关系。希望本文的研究结果可为完善烧蚀导致的电缆故障发展过程的认识、深入研究实际电缆线路的缓冲层烧蚀缺陷隐患提供参考。
1 电缆烧蚀特征
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根据文献[15]，缓冲层含水率（水的质量除以干燥试样质量）达到7%后体积电阻率开始迅速上升，超过了JB/T 10259—2014[16]中规定的1×105 Ω·cm的阈值，因此认为缓冲层含水率低于7%时为干燥条件，含水率高于7%时为潮湿条件。对近年来已公开的高压电缆缓冲层烧蚀故障解体情况进行梳理，可以分为干燥与潮湿两种条件下缓冲层烧蚀引发的损伤。
1.1 干燥条件下的烧蚀损伤特征
干燥条件下的烧蚀损伤特征如图1所示。其中缓冲层的烧蚀缺陷特征主要表现为表面存在烧蚀孔洞，无白色粉末的产生，如图1(a)所示；绝缘屏蔽层的损伤表现为表面出现凹坑状损伤，无白色粉末附着，且表面的损伤位置主要对应于皱纹铝护套波谷处附近，如图1(b)所示。
1.2 受潮条件下的烧蚀损伤特征
受潮条件下的烧蚀损伤特征如图2所示。缓冲层的损伤特征如图2(a)所示，表面的白色粉末呈连续分布，仅部分位置的白色粉末能够向内发展并嵌入绝缘屏蔽层。同时，皱纹铝护套波谷处产生明显的电化学腐蚀痕迹，与缓冲层表面白色粉末的位置一致。绝缘屏蔽层的烧蚀损伤特征如图2(b)所示，绝缘屏蔽层表面存在明显的白色粉末嵌入，且白色粉末在绝缘屏蔽层表面凸起，并与缓冲层的穿孔形状一致，表明潮湿条件下的烧蚀形成了从缓冲层到绝缘屏蔽层内的贯穿式分布白色粉末。
综合上述结果可以看出，缓冲层烧蚀引发的绝缘屏蔽层损伤类型可以分为两类：
第一类是绝缘屏蔽层表面呈凹坑状损伤，且无白色粉末嵌入，绝缘屏蔽层损伤位置对应于皱纹铝护套波谷附近。相应地，缓冲层出现贯穿式烧蚀穿孔，铝护套波谷附近存在放电痕迹，对应于干燥烧蚀情况。
第二类是绝缘屏蔽层表面存在白色粉末嵌入，且白色粉末导致缓冲层产生贯穿式破坏。相应地，缓冲层表面存在连续分布的白色粉末，仅有部分白色粉末能够穿透缓冲层并嵌入绝缘屏蔽层，对应于潮湿烧蚀情况。
比较两种条件下的烧蚀损伤特征可以发现，绝缘屏蔽层发生损伤均涉及缓冲层的贯穿式破坏，其位置均对应于皱纹铝护套波谷处附近。其中干燥条件下缓冲层为穿孔破坏，此时屏蔽层表面呈凹坑状损伤；而潮湿条件下缓冲层则受到白色粉末造成的贯穿式破坏，导致屏蔽层表面存在白色粉末嵌入。
2 仿真模型
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构建110 kV高压XLPE电缆三维仿真模型，如图3所示。由于重力作用，电缆底部铝护套与缓冲层形成弧形紧密接触区域。当皱纹铝护套波谷内圈对缓冲层的挤压程度不同时，底部铝护套与缓冲层接触面积不同[17]。
定义与铝护套接触的底部缓冲层的圆心角为θ，铝护套波谷内径为R，缓冲层外径为 r，铝护套嵌入缓冲层的深度为d，如图4所示。θ与底部接触面积成正比，在d与r确定时与（R-r）成反比。仿真中采用的电缆模型的尺寸和材料参数如表1所示。干燥情况下，缓冲层的电阻率为1×103 Ω·m，相对介电常数为100；受潮情况下，缓冲层的电阻率为1×105 Ω·m，相对介电常数为1 000[15]。本文仿真取d=0.1 mm，R-r=1 mm。
根据GB/T 11017.2—2014[18]，110 kV电缆导体截面积为800 mm2，载流量为837 A，取载流量的50%，在仿真模型上施加的线芯电流为400 A。所加相电压为63 000 V，频率为50 Hz，模型总长度为500 mm，铝护套设置为接地且其节距为25 mm。设置电缆表面与环境的对流换热系数为5 W/(m2·K)，环境温度为20℃，电缆外表面热发射率为0.85[8]。
3 仿真结果分析
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3.1 缓冲层与铝护套均匀接触
电缆运行过程中，缓冲层等内部结构的温升主要来源于线芯电流产生的热量以及径向泄漏电流产生的热量。由线芯电流产生的温升如图5所示，可以看出缓冲层温度范围为38.4～48.5℃。在线芯电流大小及材料参数不变的情况下，认为线芯电流造成的温升值不变。
高压电缆产生的径向泄漏电流经过铝护套波谷最后流入接地点。缓冲层与铝护套良好接触时，电缆温度分布如图6所示，可以看出，径向泄漏电流的影响下缓冲层与绝缘屏蔽层产生的热量低，温升均不明显。
3.2 干燥条件下绝缘屏蔽层的损伤过程
理想情况下，电缆铝护套每处波谷与缓冲层环绕一周并紧密接触。当铝护套波谷与缓冲层间存在空隙时，有效接触面积与电流通路减少，较大电流密度的集中使缓冲层与绝缘屏蔽层因受热遭到破坏。
在仿真模型中设置电缆不良接触部分轴向长度为475 mm，良好接触部分为25 mm，良好接触部分占比为0.5%，嵌入深度为0.1 mm，缓冲层电阻率为1×105 Ω·m，该情况下缓冲层电流密度及内部温度分布如图7所示。从图7可以看出，表面电流密度最高可达91.6 A/m2，此时缓冲层发热明显，缓冲层内部最高温度为22.2℃，相对环境温度升高2.2℃。
由上可知，不良接触段长度的增加会造成电流密度的集中程度增大，随之升高的电流密度会使得缓冲层与绝缘屏蔽层的温升增大。缓冲层电流密度、缓冲层及绝缘屏蔽层温度随不良接触长度的变化如图8所示。从图8可以看出，当不良接触长度增加到2 m时，电流密度达到185 A/m2，此时缓冲层温度为36.9℃，绝缘屏蔽层温度可达29.8℃；当不良接触长度增加到7.5 m时，电流密度达到442 A/m2，此时缓冲层温度为200℃，绝缘屏蔽层温度高达125℃，缓冲层和绝缘屏蔽层因高温受到灼伤。
3.3 潮湿条件下绝缘屏蔽层的损伤过程
由已有研究[12,14]可知，潮湿条件下，烧蚀电缆中缓冲层与绝缘屏蔽层上的白色粉末状烧蚀产物主要成分为Al2O3和Na2CO3，由缓冲层中阻水粉与铝护套在电流与水分影响下的电化学腐蚀产生。水分与缓冲层中的阻水粉共同营造了碱性环境，生成的Al(OH)3分解成Al2O3，同时空气中CO2参与反应生成Na2CO3或NaHCO3，产物种类取决于CO2的浓度。
仿真中在缓冲层与铝护套波谷紧密接触部位添加高阻性物质以模拟白色粉末。因500℃以下温度范围内Na2CO3电阻率远高于Al2O3 [19-20]，故仿真参数不考虑Na2CO3的电阻率。根据Al2O3参数[21-22]，设置白色粉末电导率为1×10-10 S/m，相对介电常数为11。因Al2O3相变温度高于1 000℃，远高于缓冲层分解温度200℃，故忽略温度变化对白色粉末参数的影响。设置高阻性白色粉末厚度为1 mm，半径为1 mm，添加白色粉末后缓冲层电流密度分布如图9所示。
从图9可以看出，高阻性物质阻塞了电流通路，有白色粉末覆盖处的电流密度极低，由电流发热产生的温升也不明显；而在白色粉末与缓冲层交接的边缘有电流密度集中的趋势，升高的电流密度会使得白色粉末沿着接触表面生成，直至完全覆盖紧密接触部位，此时该部位电流密度整体保持较低数值，电化学腐蚀过程完成。白色粉末的覆盖会使得电流密度逐渐集中在少部分区域，径向通路中的容性电流将在少数通路中汇集，同时伴随着温度的集中升高。
在仿真模型中设置仅一处铝护套波谷与缓冲层紧密接触部位无白色粉末覆盖，此时总体未覆盖面积比例为5%，缓冲层最高温度为116℃，绝缘屏蔽层最高温度为59℃。继续添加白色粉末，改变白色粉末的面积以改变剩余接触部分未覆盖面积的比例，缓冲层电流密度、缓冲层与绝缘屏蔽层的温度变化随剩余未覆盖面积比例的变化如图10所示。从图10可以看出，随着白色粉末覆盖面积的增大，缓冲层与绝缘屏蔽层的温度均逐渐升高。在剩余未覆盖面积比例为2.1%时，缓冲层电流密度达到442 A/m2，绝缘屏蔽层温度高达101.3℃，此时缓冲层温度为200℃，已经达到了缓冲层材料的起始分解温度[8]，在热的作用下缓冲层逐渐被破坏。在高温以及外界压力的作用下，白色粉末会向着缓冲层内部发展。
当缓冲层被逐渐破坏，水分及阻水粉提供的碱性环境依然存在，铝合金中含有的Cu、Mg等少量金属在表面生成的氧化膜无法完全隔绝空气[23]，依旧可以与铝继续进行电化学腐蚀。为探究白色粉末深度对温度的影响，固定白色粉末未覆盖面积比例为2.1%，改变白色粉末厚度直至贯穿缓冲层，得到缓冲层与绝缘屏蔽的温度随着白色粉末厚度的变化如图11所示。从图11可以看出，随着白色粉末厚度的增加，缓冲层与绝缘屏蔽层温度均维持在较为平稳的数值范围，即白色粉末在缓冲层中的发展不影响温度变化，因此电化学腐蚀持续积累的白色粉末发展至绝缘屏蔽层无较大影响。在到达绝缘屏蔽层时，屏蔽层温度保持在101.5～102.6℃，状态为熔融态，因此在压力作用下白色粉末得以嵌入绝缘屏蔽层内。
4 烧蚀发展临界条件机理分析
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绝缘屏蔽的热重（TGA）曲线与差示扫描量热（DSC）曲线如图12所示。从图12可以看出，绝缘屏蔽的熔融温度为82℃，起始分解温度为272℃，远高于缓冲层的分解温度。
由上述仿真结果可知，干燥条件下，不良接触长度为7.5 m时缓冲层的温度达到分解温度，此时绝缘屏蔽层温度约为125℃；潮湿条件下，白色粉末覆盖面积比例达到97.9%时缓冲层开始受热分解，生成的白色粉末发展至绝缘屏蔽层，此时绝缘屏蔽层温度约为102℃，均达到了熔融温度。
为了比较两种情况下的烧蚀难易程度，统一干燥条件下的接触部分与潮湿条件下未被覆盖部分均为同一处缓冲层与铝护套波谷接触部分，则干燥条件下需要7.5 m不良接触段，不良接触段电缆所占比例为99.3%；潮湿条件下需要1.25 m白色粉末覆盖段，覆盖比例为97.9%。另外，不良接触为电缆敷设或内部结构上的问题，相比于缓冲层受潮更难解决。
干燥与潮湿两种条件下缓冲层温度随电流密度的变化如图13所示。从图13可以看出，如达到缓冲层热分解温度，干燥条件下需要442 A/m2的电流密度，潮湿条件下需要416 A/m2的电流密度，说明干燥条件下需要更高的电流密度才可使缓冲层开始热分解。两种情况下电流密度的差异，主要是因为潮湿条件下缓冲层的电阻率更高，导致更低电流密度条件下即可产生更多的热量，更快达到缓冲层热分解条件。
5 结论
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（1）在干燥条件下，由于缓冲层与铝护套的不良接触形成电流热效应，在不良接触长度达到7.5 m时，缓冲层温度可高达200℃，绝缘屏蔽层温度可高达125℃，会对缓冲层、绝缘屏蔽层产生过热损伤。对应解体电缆中的特征，缓冲层表面存在烧蚀孔洞，无白色粉末产生，绝缘屏蔽层表面出现凹坑状损伤。
（2）在潮湿条件下，缓冲层内阻水粉与铝护套发生电化学腐蚀，生成白色粉末，阻断了径向的电流通路，不断减小的接触面积形成了逐渐集中的电流密度，电流热效应导致缓冲层温度不断升高，在高温与压力的作用下白色粉末向缓冲层内部发展；同时白色粉末厚度的增加没有影响到温度的变化，当其贯穿缓冲层发展至绝缘屏蔽层时，在压力作用下嵌入绝缘屏蔽层，造成绝缘屏蔽层的损伤。对应解体电缆中的特征，绝缘屏蔽层表面存在白色粉末嵌入，且白色粉末已对缓冲层产生贯穿式破坏，而缓冲层表面存在连续分布的白色粉末，但仅有部分白色粉末能够穿透缓冲层并嵌入绝缘屏蔽层。
（3）干燥条件下缓冲层烧蚀发展至绝缘屏蔽层的临界电流密度约为442 A/m2，此时缓冲层与铝护套的不良接触部分占比为99.3%；潮湿条件下缓冲层烧蚀发展至绝缘屏蔽层的临界电流密度约为416 A/m2，此时白色粉末在缓冲层的覆盖区域占比约为97.9%。潮湿情况相比于干燥情况更容易达到临界条件，即潮湿情况更容易引发烧蚀故障。
基金
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  • 国家电网公司总部科技项目(5108-202218280A-2-353-XG)
文献
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2025年第58卷第3期
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doi: 10.16790/j.cnki.1009-9239.im.2025.03.012
  • 接收时间：2024-05-09
  • 首发时间：2025-11-07
  • 出版时间：2025-03-20
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  • 收稿日期：2024-05-09
  • 修回日期：2024-08-12
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国家电网公司总部科技项目(5108-202218280A-2-353-XG)
作者信息
    1 国网北京市电力公司电力科学研究院，北京 100075
    2 西安交通大学，陕西 西安 710049
    3 国网北京市电力公司，北京 100075

通讯作者:

张可（2001-），男（汉族），安徽六安人，硕士生，主要从事高电压与绝缘技术方面的研究。
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2种不同金属材料的力学参数
科
Family		 属数
Number of
genus		 种数
Number of
species		 占总种数比例
Percentage of
total species (%)		 属
Genus		 种数
Number of
species		 占总种数比例
Percentage of total
species (%)
鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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