Article(id=1193543217355391257, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1193543214067056904, articleNumber=null, orderNo=null, doi=10.16790/j.cnki.1009-9239.im.2025.03.006, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1716134400000, receivedDateStr=2024-05-20, revisedDate=1720368000000, revisedDateStr=2024-07-08, acceptedDate=null, acceptedDateStr=null, onlineDate=1762492477978, onlineDateStr=2025-11-07, pubDate=1742400000000, pubDateStr=2025-03-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1762492477978, onlineIssueDateStr=2025-11-07, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1762492477978, creator=13701087609, updateTime=1762492477978, updator=13701087609, issue=Issue{id=1193543214067056904, tenantId=1146029695717560320, journalId=1149653034449285133, year='2025', volume='58', issue='3', pageStart='1', pageEnd='157', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1762492477194, creator=13701087609, updateTime=1762498203949, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1193567233872982429, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1193543214067056904, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1193567233872982430, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1193543214067056904, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=51, endPage=59, ext={EN=ArticleExt(id=1193543217569300762, articleId=1193543217355391257, tenantId=1146029695717560320, journalId=1149653034449285133, language=EN, title=Research on extrusion process technology of ethylene-butyl acrylate based semi-conductive shielding material for high-voltage cable, columnId=1193543215723806988, journalTitle=Insulating Materials, columnName=Special Issue on Advanced Cable Insulation, runingTitle=null, highlight=null, articleAbstract=
The extrusion process technology of semi-conductive shielding material (SCSM) for high-voltage cables is crucial for the uniform dispersion and distribution of conductive carbon black (CB), as well as the interfacial interaction between CB and matrix resin. To investigate the influence of processing methods and parameters on the structure and properties of SCSM, this study employed twin-screw extrusion granulation and single-screw extrusion sheet processes. The influence of extrusion temperature, screw speed on the microstructure, electrical properties, mechanical properties, and surface smoothness of the SCSM were investigated. The results show that the optimal parameters for the twin-screw extrusion granulation process are 160℃ of extrusion temperature and 120 r/min of screw speed. Under these conditions, the volume resistivity of the shielding material at 23℃ and 90℃ is 9.6 Ω·cm and 265.0 Ω·cm, respectively. In the single-screw extrusion sheet process, when the extrusion temperature and screw speed are 105℃ and 50 r/min, respectively, the CB achieves sufficient shear force and dispersion time, effectively preventing pre-crosslinking of the SCSM. Consequently, there is no protrusions larger than 50 μm in diameter observed on the surface of the shielding material.
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高压电缆半导电屏蔽料的挤出工艺技术对导电炭黑均匀分散和分布、导电炭黑与基体树脂界面相互作用至关重要。为了探究屏蔽料生产过程中工艺方法和工艺参数对屏蔽料结构和性能的影响规律,本文通过双螺杆挤出造粒和单螺杆挤出片材工艺,研究挤出温度和螺杆转速对屏蔽料微观形貌、电学性能、力学性能和表面光洁度的影响。结果表明:双螺杆挤出造粒工艺中较优的工艺参数是挤出温度为160℃、螺杆转速为120 r/min。在该工艺条件下,屏蔽料在23℃和90℃下的体积电阻率分别为9.6 Ω·cm和265.0 Ω·cm。在单螺杆挤出片材工艺中,当挤出温度和螺杆转速分别为105℃和50 r/min时,导电炭黑获得了足够的剪切作用力和分散时间,并有效防止了屏蔽料的预交联现象,因此屏蔽料表面没有出现直径大于50 μm的凸起。
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何文(1975-),男(汉族),广东梅州人,高级工程师,主要从事输电电缆的研究。
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2 Electric Power Research Institute, China Southern Power Grid, Guangzhou 510663, China), AuthorCompanyExt(id=1195076694684995909, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, companyId=1195076694672412995, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
2 南方电网科学研究院有限责任公司,广东 广州 510663)])], figs=[ArticleFig(id=1195076697490985337, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=EN, label=Fig.1, caption=
Rheological properties of EBA matrix resin, figureFileSmall=AUqoiwNuElaG63//zxUKgw==, figureFileBig=hPQCs31/3ALYH6mXriedtA==, tableContent=null), ArticleFig(id=1195076697562288506, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=CN, label=图1, caption=
EBA基体树脂的流变性能, figureFileSmall=AUqoiwNuElaG63//zxUKgw==, figureFileBig=hPQCs31/3ALYH6mXriedtA==, tableContent=null), ArticleFig(id=1195076697671340411, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=EN, label=Fig.2, caption=
Effect of extrusion temperature on the electrical and mechanical properties of semi-conductive shielding materials, figureFileSmall=dE0DGA3Nn4FHd/I28IuVLA==, figureFileBig=pJmf15MfBOVANy+PjGqZ+g==, tableContent=null), ArticleFig(id=1195076697759420796, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=CN, label=图2, caption=
挤出温度对半导电屏蔽料电学和力学性能的影响, figureFileSmall=dE0DGA3Nn4FHd/I28IuVLA==, figureFileBig=pJmf15MfBOVANy+PjGqZ+g==, tableContent=null), ArticleFig(id=1195076697918804349, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=EN, label=Fig.3, caption=
Rheological curves of semi-conductive shielding materials prepared at different extrusion temperatures, figureFileSmall=p89VR6diFo3aKcHMNlx9/A==, figureFileBig=pfdU3TtUvTM5xjsLeIX7kw==, tableContent=null), ArticleFig(id=1195076698032050558, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=CN, label=图3, caption=
不同挤出温度制备的半导电屏蔽料流变曲线, figureFileSmall=p89VR6diFo3aKcHMNlx9/A==, figureFileBig=pfdU3TtUvTM5xjsLeIX7kw==, tableContent=null), ArticleFig(id=1195076698174656895, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=EN, label=Fig.4, caption=
Cross-sectional SEM images of semi-conductive shielding materials prepared at different extrusion temperatures, figureFileSmall=588I7OMP4HTPOMXiW5LWgg==, figureFileBig=kA7xXKBI5LrZPzrAjU901Q==, tableContent=null), ArticleFig(id=1195076698229182848, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=CN, label=图4, caption=
不同挤出温度制备的半导电屏蔽料断面SEM图, figureFileSmall=588I7OMP4HTPOMXiW5LWgg==, figureFileBig=kA7xXKBI5LrZPzrAjU901Q==, tableContent=null), ArticleFig(id=1195076698283708801, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=EN, label=Fig.5, caption=
Effect of screw rotation speeds on the electrical and mechanical properties of semi-conductive shielding materials, figureFileSmall=KxjdOHNqMvRSJbxt/q85SA==, figureFileBig=XLuRzX6deCcKFyZBDd5aBw==, tableContent=null), ArticleFig(id=1195076698338234754, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=CN, label=图5, caption=
螺杆转速对半导电屏蔽料电学和力学性能的影响, figureFileSmall=KxjdOHNqMvRSJbxt/q85SA==, figureFileBig=XLuRzX6deCcKFyZBDd5aBw==, tableContent=null), ArticleFig(id=1195076698396955011, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=EN, label=Fig.6, caption=
Rheological curves of semi-conductive shielding materials prepared at different screw rotation speeds, figureFileSmall=BWP7gTJJyJ1/YnQ7I1CxSg==, figureFileBig=lV9uJy//M7kNe2apTFNoqQ==, tableContent=null), ArticleFig(id=1195076698447286660, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=CN, label=图6, caption=
不同螺杆转速制备的半导电屏蔽料流变曲线, figureFileSmall=BWP7gTJJyJ1/YnQ7I1CxSg==, figureFileBig=lV9uJy//M7kNe2apTFNoqQ==, tableContent=null), ArticleFig(id=1195076698573115781, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=EN, label=Fig.7, caption=
Cross-sectional SEM images of semi-conductive shielding materials prepared at different screw rotation speeds, figureFileSmall=erE0LDi6CGnEuM2eeoQ3cQ==, figureFileBig=Dy4OmgFZYYGjvhaqMG9b4Q==, tableContent=null), ArticleFig(id=1195076698631836038, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=CN, label=图7, caption=
不同螺杆转速制备的半导电屏蔽料断面SEM图, figureFileSmall=erE0LDi6CGnEuM2eeoQ3cQ==, figureFileBig=Dy4OmgFZYYGjvhaqMG9b4Q==, tableContent=null), ArticleFig(id=1195076698686361991, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=EN, label=Fig.8, caption=
Comparison on surface smoothness of semi-conductive shielding materials prepared at different extrusion temperatures, figureFileSmall=2b3kkM34cr6LNPtD+1reKQ==, figureFileBig=n48ZzJobB3OuxCjPzv8X4g==, tableContent=null), ArticleFig(id=1195076698749276552, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=CN, label=图8, caption=
不同挤出温度制备的半导电屏蔽料表面光洁度对比, figureFileSmall=2b3kkM34cr6LNPtD+1reKQ==, figureFileBig=n48ZzJobB3OuxCjPzv8X4g==, tableContent=null), ArticleFig(id=1195076698816385417, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=EN, label=Fig.9, caption=
Comparison on surface smoothness of semi-conductive shielding materials prepared at different screw rotation speeds, figureFileSmall=hzxhHL1SIOz/cP65UuxGLw==, figureFileBig=XRyQOtCo9nam7ExuaIJNow==, tableContent=null), ArticleFig(id=1195076698896077194, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193543217355391257, language=CN, label=图9, caption=
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