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Article(id=1193230654193238228, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1193230615618220608, articleNumber=null, orderNo=null, doi=10.16790/j.cnki.1009-9239.im.2025.02.014, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1710950400000, receivedDateStr=2024-03-21, revisedDate=1718812800000, revisedDateStr=2024-06-20, acceptedDate=null, acceptedDateStr=null, onlineDate=1762417957113, onlineDateStr=2025-11-06, pubDate=1739980800000, pubDateStr=2025-02-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1762417957113, onlineIssueDateStr=2025-11-06, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1762417957113, creator=13701087609, updateTime=1762417957113, updator=13701087609, issue=Issue{id=1193230615618220608, tenantId=1146029695717560320, journalId=1149653034449285133, year='2025', volume='58', issue='2', pageStart='1', pageEnd='138', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1762417947916, creator=13701087609, updateTime=1762418457365, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1193232752444145866, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1193230615618220608, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1193232752444145867, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1193230615618220608, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=102, endPage=109, ext={EN=ArticleExt(id=1193230654524588246, articleId=1193230654193238228, tenantId=1146029695717560320, journalId=1149653034449285133, language=EN, title=Temperature distribution characteristics of FXBW-500 composite insulator with internal carbonization creepage defect, columnId=1192878364340924664, journalTitle=Insulating Materials, columnName=Test and Analysis, runingTitle=null, highlight=

Regarding the internal carbonization creepage defect of composite insulator, a finite element model of electromagnetic and thermal coupling calculation for FXBW-500 large-small-small shed type composite insulator was established, and the influencing laws of defect location and surface pollution on the temperature rise caused by internal carbonization creepage defect in core rod were analyzed. The results show that when there is a local carbonization creepage defect at different positions of composite insulators, the local temperature rise from high to low is high voltage end, low voltage end, and middle end. When there is pollution, the temperature distribution of the carbonization creepage defective insulator does not change significantly, but the maximum temperature rise values of each part all increase significantly, among which the maximum temperature rise of high voltage end increases from 9.3℃ to 18.2℃, and the temperature rise along the surface increases from 2.52℃ to 4.94℃. Although the existence of pollution makes the overall temperature of the insulator rise, it still does not conceal the temperature jump at the defect location. Therefore, when the location of carbonization creepage defects are identified through temperature, the temperature jump can be taken as a reference.

, articleAbstract=

Regarding the internal carbonization creepage defect of composite insulator, a finite element model of electromagnetic and thermal coupling calculation for FXBW-500 large-small-small shed type composite insulator was established, and the influencing laws of defect location and surface pollution on the temperature rise caused by internal carbonization creepage defect in core rod were analyzed. The results show that when there is a local carbonization creepage defect at different positions of composite insulators, the local temperature rise from high to low is high voltage end, low voltage end, and middle end. When there is pollution, the temperature distribution of the carbonization creepage defective insulator does not change significantly, but the maximum temperature rise values of each part all increase significantly, among which the maximum temperature rise of high voltage end increases from 9.3℃ to 18.2℃, and the temperature rise along the surface increases from 2.52℃ to 4.94℃. Although the existence of pollution makes the overall temperature of the insulator rise, it still does not conceal the temperature jump at the defect location. Therefore, when the location of carbonization creepage defects are identified through temperature, the temperature jump can be taken as a reference.

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针对复合绝缘子内部碳化爬电缺陷，建立FXBW-500大-小-小伞型线路复合绝缘子的电磁热耦合计算有限元模型，分析缺陷位置、表面污秽对芯棒内部碳化爬电缺陷引起的温升影响规律。结果表明：当复合绝缘子不同位置存在局部碳化爬电缺陷时，局部温升从大到小依次为高压端、低压端和中端。存在污秽时，碳化爬电缺陷绝缘子的温度分布没有明显变化，但各部位最大温升值均明显增大，其中高压端最大温升值由9.3℃增大至18.2℃，沿面温升由2.52℃增大至4.94℃。虽然污秽的存在使得绝缘子整体温度升高，但并未掩盖缺陷处的温度突变。因此在通过温度识别碳化爬电缺陷位置时，可重点将温升突变情况作为参考依据。

, articleAbstract=

针对复合绝缘子内部碳化爬电缺陷，建立FXBW-500大-小-小伞型线路复合绝缘子的电磁热耦合计算有限元模型，分析缺陷位置、表面污秽对芯棒内部碳化爬电缺陷引起的温升影响规律。结果表明：当复合绝缘子不同位置存在局部碳化爬电缺陷时，局部温升从大到小依次为高压端、低压端和中端。存在污秽时，碳化爬电缺陷绝缘子的温度分布没有明显变化，但各部位最大温升值均明显增大，其中高压端最大温升值由9.3℃增大至18.2℃，沿面温升由2.52℃增大至4.94℃。虽然污秽的存在使得绝缘子整体温度升高，但并未掩盖缺陷处的温度突变。因此在通过温度识别碳化爬电缺陷位置时，可重点将温升突变情况作为参考依据。

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武永泉（1984-），男（汉族），内蒙古包头人，高级工程师，研究方向为输电运检管理。

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武永泉（1984-），男（汉族），内蒙古包头人，高级工程师，研究方向为输电运检管理。

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武永泉（1984-），男（汉族），内蒙古包头人，高级工程师，研究方向为输电运检管理。

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结构部位介质材料导热系数/(W/(m·K))电阻率/(Ω·m)相对介电常数
芯棒玻璃纤维0.291.36×10132.25
伞裙硅橡胶0.271.42×10132.8
钢帽钢脚均压环钢材409.78×10-8—
其余计算域空气0.031.0×10161
碳化通道碳801.0×10-320
), ArticleFig(id=1193616392881664728, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193230654193238228, language=CN, label=表1, caption=

FXBW-500绝缘子材料物性参数

, figureFileSmall=null, figureFileBig=null, tableContent=
结构部位介质材料导热系数/(W/(m·K))电阻率/(Ω·m)相对介电常数
芯棒玻璃纤维0.291.36×10132.25
伞裙硅橡胶0.271.42×10132.8
钢帽钢脚均压环钢材409.78×10-8—
其余计算域空气0.031.0×10161
碳化通道碳801.0×10-320
), ArticleFig(id=1193616392948773593, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193230654193238228, language=EN, label=Table 2, caption=Temperature rise statistics of FXBW-500 composite insulator under multiple operating conditions, figureFileSmall=null, figureFileBig=null, tableContent=
工况沿面最大温升/℃内部最大温升/℃
高压端中端低压端
正常洁净0.19约等于00.100.80
污秽0.420.231.70
低压端碳化洁净0.64—1.244.40
污秽1.26—2.438.70
中端碳化洁净—0.50—1.80
污秽—0.99—3.50
高压端碳化洁净2.52——9.30
污秽4.94——18.20
), ArticleFig(id=1193616393036853978, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1193230654193238228, language=CN, label=表2, caption=

多工况下FXBW-500复合绝缘子温升统计

, figureFileSmall=null, figureFileBig=null, tableContent=
工况沿面最大温升/℃内部最大温升/℃
高压端中端低压端
正常洁净0.19约等于00.100.80
污秽0.420.231.70
低压端碳化洁净0.64—1.244.40
污秽1.26—2.438.70
中端碳化洁净—0.50—1.80
污秽—0.99—3.50
高压端碳化洁净2.52——9.30
污秽4.94——18.20
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FXBW-500复合绝缘子内部碳化爬电缺陷下温度分布特性研究
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武永泉 1 , 张四维 1 , 江宗毅 1 , 焦彦俊 1 , 高敏程 1 , 龙涛 1 , 郭子晗 2 , 张东东 2
绝缘材料 | 测试与分析 2025,58(2): 102-109
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绝缘材料 | 测试与分析 2025, 58(2): 102-109
FXBW-500复合绝缘子内部碳化爬电缺陷下温度分布特性研究
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武永泉1, 张四维1, 江宗毅1, 焦彦俊1, 高敏程1, 龙涛1, 郭子晗2, 张东东2
作者信息
  • 1国网江苏省电力有限公司南京供电分公司，江苏 南京 210019
  • 2南京工程学院，江苏 南京 211167

    • 武永泉（1984-），男（汉族），内蒙古包头人，高级工程师，研究方向为输电运检管理。

Temperature distribution characteristics of FXBW-500 composite insulator with internal carbonization creepage defect
Yongquan WU1, Siwei ZHANG1, Zongyi JIANG1, Yanjun JIAO1, Mincheng GAO1, Tao LONG1, Zihan GUO2, Dongdong ZHANG2
Affiliations
  • 1Nanjing Power Supply Branch, State Grid Jiangsu Electric Power Co., Ltd., Nanjing 210019, China
  • 2Nanjing Institute of Technology, Nanjing 211167, China
出版时间: 2025-02-20 doi: 10.16790/j.cnki.1009-9239.im.2025.02.014
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摘要
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针对复合绝缘子内部碳化爬电缺陷，建立FXBW-500大-小-小伞型线路复合绝缘子的电磁热耦合计算有限元模型，分析缺陷位置、表面污秽对芯棒内部碳化爬电缺陷引起的温升影响规律。结果表明：当复合绝缘子不同位置存在局部碳化爬电缺陷时，局部温升从大到小依次为高压端、低压端和中端。存在污秽时，碳化爬电缺陷绝缘子的温度分布没有明显变化，但各部位最大温升值均明显增大，其中高压端最大温升值由9.3℃增大至18.2℃，沿面温升由2.52℃增大至4.94℃。虽然污秽的存在使得绝缘子整体温度升高，但并未掩盖缺陷处的温度突变。因此在通过温度识别碳化爬电缺陷位置时，可重点将温升突变情况作为参考依据。

输电线路  /  复合绝缘子  /  碳化爬电  /  有限元  /  电热场

Regarding the internal carbonization creepage defect of composite insulator, a finite element model of electromagnetic and thermal coupling calculation for FXBW-500 large-small-small shed type composite insulator was established, and the influencing laws of defect location and surface pollution on the temperature rise caused by internal carbonization creepage defect in core rod were analyzed. The results show that when there is a local carbonization creepage defect at different positions of composite insulators, the local temperature rise from high to low is high voltage end, low voltage end, and middle end. When there is pollution, the temperature distribution of the carbonization creepage defective insulator does not change significantly, but the maximum temperature rise values of each part all increase significantly, among which the maximum temperature rise of high voltage end increases from 9.3℃ to 18.2℃, and the temperature rise along the surface increases from 2.52℃ to 4.94℃. Although the existence of pollution makes the overall temperature of the insulator rise, it still does not conceal the temperature jump at the defect location. Therefore, when the location of carbonization creepage defects are identified through temperature, the temperature jump can be taken as a reference.

transmission lines  /  composite insulators  /  carbonization creepage  /  finite element  /  electric thermal field
武永泉, 张四维, 江宗毅, 焦彦俊, 高敏程, 龙涛, 郭子晗, 张东东. FXBW-500复合绝缘子内部碳化爬电缺陷下温度分布特性研究. 绝缘材料, 2025 , 58 (2) : 102 -109 . DOI: 10.16790/j.cnki.1009-9239.im.2025.02.014
Yongquan WU, Siwei ZHANG, Zongyi JIANG, Yanjun JIAO, Mincheng GAO, Tao LONG, Zihan GUO, Dongdong ZHANG. Temperature distribution characteristics of FXBW-500 composite insulator with internal carbonization creepage defect[J]. Insulating Materials, 2025 , 58 (2) : 102 -109 . DOI: 10.16790/j.cnki.1009-9239.im.2025.02.014
正文
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0 引言
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复合绝缘子因其质量轻、抗污闪特性优良等特点，已广泛应用于高压和超/特高压输电系统中[1-4]。虽然目前大多数复合绝缘子运行状态良好，但仍有些复合绝缘子由于内部缺陷而逐渐发展至断裂或存在其他极端故障[5-6]，已对输电系统的安全稳定运行造成影响。
早期的复合绝缘子故障通常会引起发热现象，而发热产生的温升容易导致复合材料加速老化，使其憎水性降低，从而降低绝缘子的绝缘性能[7]，甚至引发污闪、雨闪等外绝缘闪络事故。复合绝缘子发热的类型较多，有表面问题造成的发热，也有本体问题造成的发热。表面问题造成的发热通常由积污或正常老化导致[8]，为正常现象；而本体问题造成的发热是指当存在本体导通性故障时[9]，例如芯棒碳化、芯棒-护套粘接不良[10]以及芯棒酥朽时，绝缘子产生的异常发热现象[11]，应该重点关注。异常发热现象也与绝缘子外部潮湿的环境条件密切相关，当水分渗入复合绝缘子时，缺陷产生的极化损耗、泄漏电流、局部放电等也可能会导致绝缘子的局部温度升高[5,11]。
如上所述，复合绝缘子故障通常会引起发热现象，这为复合绝缘子故障的非接触式在线监测提供了可能[12-14]。为了提高复合绝缘子的运行可靠性，国内外学者对复合绝缘子的发热及发热检测进行了大量的研究[6,8,12,15-25]。在发热方面，文献[15]研究表明，当复合绝缘子憎水性变差，吸湿能力增强时，其饱和吸湿介质损耗因数增大，进而使其端部护套异常发热，导致护套老化复合绝缘子被误诊为酥朽绝缘子。文献[8]研究表明，污秽会引起并加剧复合绝缘子异常发热，在高湿度环境下当全尺寸样品的污秽等级超过b级时，绝缘子的发热温度将超过0.5℃，污秽对材料老化的复合绝缘子影响更为显著。文献[11]基于有限元原理，建立110 kV复合绝缘子热-电-流多物理场仿真模型，研究了芯棒碳化缺陷下，缺陷位置、缺陷程度等对复合绝缘子表面发热的影响。文献[17]通过实验研究了湿度、污秽和局部电场对老化绝缘子温度和介电性能的影响，结果表明局部发热是绝缘子表面硅橡胶（SIR）材料老化的主要原因，老化后的SIR材料在高局部交流电场和高相对湿度下具有较高的介质损耗。在发热检测方面，文献[16]在不同环境相对湿度下对复合绝缘子的性能进行试验分析，结果表明在较高环境相对湿度下，复合绝缘子红外测温结果上升，因此建议红外测温技术的使用环境湿度应低于67.5%。文献[19]也得出了类似的结论，为了优化现有的复合绝缘子检测标准，应尽可能在干燥环境中检测复合绝缘子。文献[12]研究发现复合绝缘子的不稳定温升现象与环境湿度、红外热像仪的观测角度有关。文献[18]研究表明复合绝缘子的不正常温升（ATR）可分为点状温升（PFTR）和条状温升（BFTR），建议在复合绝缘子上检测到PFTR时，应适当缩短绝缘子的检测周期，而一旦检测到BFTR时，则应立即更换复合绝缘子。
上述研究对于揭示复合绝缘子异常发热及基于红外图像的故障识别具有重要的意义。但根据上述分析，现场应用中，发热识别受到环境等因素影响，可能使由湿污引起的正常发热与缺陷等导致的异常发热（芯棒内部爬电碳化）产生混淆，造成误判。因此，有必要研究缺陷、表面污秽对于芯棒内部温升的影响规律。本文针对复合绝缘子内部碳化爬电缺陷，建立FXBW-500大-小-小伞型线路复合绝缘子的电磁热耦合计算有限元模型，分析缺陷位置、表面污秽对芯棒内部碳化爬电缺陷引起的温升影响规律，以期为劣化复合绝缘子诊断方法的研究提供参考。
1 多工况复合绝缘子热场计算模型
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1.1 有限元计算原理
针对FXBW-500大-小-小伞型线路复合绝缘子运行正常，高压、低压、中端分别存在因爬电导致的局部碳化，以及表面存在湿润污层时的发热特性进行多物理场仿真研究，仿真模型中主要涉及电磁场和热场的耦合，以此得到不同工况下复合绝缘子的热场分布特性。
碳化爬电位置的电场分布受位移电流影响较大，而电场分布会影响绝缘子的发热特性。因此，首先在频域下进行静电场计算，根据静电场原理，基于Comsol静电场接口，得到FXBW-500大-小-小伞型线路复合绝缘子的电场分布。
在研究FXBW-500大-小-小伞型线路复合绝缘子的电热耦合问题时，稳态热分析所使用的热传导方程如式（1）所示。
∂2T∂x2+∂2T∂y2+∂2T∂z2=0
式（1）中：x、y、z表示空间坐标；T表示温度。
若要求解上述方程，需要给定物体的热边界条件。热边界条件是结构边界与外部相互作用的结果，一般包含温度边界、热流边界、换热边界3种形式。其中温度边界给定物体边界温度的绝对值；热流边界给定物体边界上的热流密度；换热边界给定物体表面与周围介质的换热值。这3类边界条件可统一成式（2）。
λ∂T∂nΓ+αT-Tm-q0=0
式（2）中：λ为导热系数；α为换热系数；q0为边界热流密度；Γ表示边界；n表示法向方向；Tm为环境温度。
与电磁场求解边界问题一样，同样采用变分法数值计算求得近似解，其构造边值问题的泛函如式（3）所示。
F(T)=∬Ωλ2∂T∂x2+∂T∂y2+∂T∂z2dA+∫Γ12αT2-αTmT-q0Tds
式（3）中：dA表示面积微元；ds表示线元；Ω是求解区域。
因此，边值问题的求解等价于极值问题的求解，这就是建立热分析有限元方程的依据，基于此可对运行正常，高压、低压、中端存在缺陷，以及表面存在湿润污层的FXBW-500大-小-小伞型线路复合绝缘子的热场分布进行求解。
1.2 多物理场仿真模型
以FXBW-500大-小-小伞型线路复合绝缘子为研究对象[26]，其结构高度为5 315 mm，大小伞直径分别为174 mm、88 mm，芯棒直径和杆径分别为30 mm、40 mm。根据实际情况对绝缘子串下端钢脚加载500×1.1×2/3 kV高电位。
计算过程中为了提高计算效率，网格划分采用局部加密的方式，局部加密划分结果如图1所示，绝缘子不同材料的物性参数如表1所示。其中，表面污层设置为d级污秽等级下的电导率，即0.1 S/m，环境温度为20℃，污秽层为充分湿润的情况，污秽的相对介电常数为79，且考虑憎水性丧失较为严重的情况下湿润污层可等同于盐溶液，故其余参数均以盐溶液为参考设置。碳化区域位置及长度设置如图2所示。
2 仿真结果及分析
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2.1 温度分布特性仿真结果与分析
在FXBW-500大-小-小伞型线路复合绝缘子运行正常，以及高压、低压、中端分别存在局部碳化爬电缺陷情况下，计算得到其整体热场分布和沿面温度曲线如图3～5所示。
从图3可以看出，在正常工况下，绝缘子表面的温升较低，但是整体上看沿串呈不均匀分布，其高压端和低压端温升较大，最大温升可达0.80℃；绝缘子串中端温升不明显，几乎与环境温度相同。当低压端存在沿面碳化爬电缺陷时，中端温升不明显；但是低压端和高压端温升均有所增大，整体最大温升达到4.40℃。但从红外热成像应用的角度出发，本文主要统计沿面温升值，低压端沿面温升由正常工况下的0.10℃增大至1.24℃，高压端沿面温升值由正常工况下的0.19℃增大至0.64℃。从温升增幅看，存在沿面碳化爬电缺陷的低压端增幅明显。
从图4可以看出，当中端存在沿面碳化爬电缺陷时，整体最大温升在中端位置，达到1.80℃；对于沿面温升，中端温升值虽然不大，但是温升突变明显，为0.50℃。
从图5可以看出，当高压端存在沿面碳化爬电缺陷时，整体最大温升值较大，且位于高压端位置，达到9.30℃；对于沿面温升，高压端存在明显突变，由正常工况下的0.19℃增大至2.52℃，因此存在沿面碳化爬电缺陷的高压端温升增幅明显。
综上，对于FXBW-500大-小-小伞型线路复合绝缘子，其高压、低压、中端存在局部碳化爬电缺陷时，局部温升从大到小依次是高压端、低压端和中端；即使是温升最小的中端，也存在温度突变现象，这表明通过红外热像仪测量洁净绝缘子表面温度可识别碳化爬电缺陷的位置。
2.2 沿面污秽层对局部缺陷温升的影响
在FXBW-500大-小-小伞型线路复合绝缘子表面存在污秽，以及高压、低压、中端分别存在局部碳化爬电缺陷情况下，计算得到其整体热场分布和沿面温度曲线如图6～9所示。
从图6可以看出，复合绝缘子表面存在污秽情况下的温度分布与正常工况下的相比没有明显变化，但即使是正常工况下的复合绝缘子，整体温度也呈现上升趋势。绝缘子表面存在污秽时整体最大温升值由0.80℃增大至1.70℃；对于沿面温升，湿润污秽的存在使得高压端沿面温升由正常工况下的0.19℃增大至0.42℃，低压端沿面温升由正常工况下的0.10℃增大至0.23℃，但中端温度依然接近环境温度。
从图7可以看出，当复合绝缘子高压端存在碳化爬电缺陷和表面污秽时，其温度分布与正常工况下相比仍没有明显变化，但高低压端的温升值明显增大，其中整体最大温升值由9.30℃增大至18.20℃；对于沿面温升，湿润污秽的存在使高压端的沿面温升值由2.52℃增大至4.94℃。
从图8～9可以看出，当复合绝缘子低压端和中端存在碳化爬电缺陷和表面污秽时，其温度分布与正常工况下相比仍没有明显变化，但碳化爬电位置的温升值均明显增大。其中低压端碳化和中端碳化爬电位置整体最大温升值分别由4.4℃、1.8℃增大至8.7℃、3.5℃；对于沿面温升，湿润污秽的存在使低压端沿面温升值由1.24℃增大至2.43℃、中端沿面温升值由0.5℃增大至0.99℃。
综上，虽然污秽的存在使得复合绝缘子整体的温度升高，但是并未掩盖缺陷处的温度突变。
2.3 讨论
由于现阶段的发热识别方法通常以温升绝对值作为判断依据，而本研究证实了湿润污秽层的存在将增大温升绝对值，缺陷位置的差异也会导致温升绝对值的不同，在此情况下容易造成缺陷的误判误报。因此，本研究对考虑污秽、碳化爬电位置等多工况的FXBW-500复合绝缘子进行温升统计，为复杂情况下其温升缺陷识别提供更加准确的理论依据，统计结果如表2所示。
结合表2与前文分析结果可知，污秽使得复合绝缘子整体温度升高，这会对单独通过温升绝对值作为复合绝缘子局部缺陷的判断依据产生影响；虽然污秽的存在使得复合绝缘子整体温度升高，但是仍未掩盖缺陷处的温度突变。因此在通过温度识别碳化爬电缺陷位置时，可重点将温升突变情况作为参考依据，而不是单一的温升。例如，对于局部中端碳化爬电时，其温升绝对值在1℃以下，在识别过程中，由于测试误差，很容易造成漏报或误报，但是其温度突变较为明显（如图9(b)所示），且温度突变不受污秽的影响，因此利用温度突变来识别碳化爬电缺陷及其位置相比利用温升绝对值具有更高的可靠性。需要注意的是，现场测温建议在晴朗天气下开展，该测试条件下绝缘子表面干燥，干燥污层对发热的影响微弱，可以不用考虑污秽的校正。
为了验证本研究仿真的正确性，对现场在运复合绝缘子串进行了红外热像试验，得到正常500 kV输电线路复合绝缘子串的红外热像图如图10所示。从图10可以看出，复合绝缘子串表面的最大温升小于3℃。虽然温升值比本文仿真值略大，但是整体上看温度沿绝缘子串呈不均匀分布，其高压端和低压端温升较大，绝缘子串中部温升不明显，几乎与环境温度相同，这与本研究仿真结果一致。
此外，本研究对某故障绝缘子进行了测试，其局部温升图如图11所示。从图11可以看出，故障绝缘子的发热云图与本研究中端存在碳化爬电缺陷时的仿真云图十分接近，解剖发现绝缘子的故障原因确实为碳化爬电缺陷。因此，本研究的仿真结果可靠性较高。此外，根据仿真与试验结果可以发现，碳化爬电缺陷通常导致的是段状发热，是相对特有且比较严重的一种缺陷；其余类型缺陷发热的红外图像特征与碳化爬电缺陷发热的红外图像存在区别，因此可以从发热特征反推判断是否为碳化爬电缺陷。
3 结论
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本文建立了FXBW-500大-小-小伞型线路复合绝缘子热电耦合有限元模型，计算得到在正常工况，高压、低压、中端分别存在局部碳化爬电缺陷，以及表面存在湿润污层等情况下其发热特性，主要得出以下结论：
（1）对于FXBW-500大-小-小伞型线路复合绝缘子，其高压、低压、中端存在局部碳化爬电缺陷时，局部温升均增大，且局部温升从大到小依次为高压端、低压端和中端；即使是温升最小的中端，也存在温度突变现象。
（2）在表面存在污秽情况下，复合绝缘子的温度分布与正常工况下相比没有明显变化，但即使是正常工况的复合绝缘子，存在污秽时其整体温度也呈现上升趋势。污秽的存在使得正常工况复合绝缘子的整体最大温升值由0.8℃增大至1.7℃。
（3）当复合绝缘子同时存在碳化爬电缺陷与表面污秽时，其温度分布相比正常工况下没有明显变化，但最大温升值均明显增大且并未掩盖缺陷处的温度突变。
（4）污秽使得复合绝缘子整体温度升高，这对单独通过温升绝对值作为复合绝缘子局部缺陷的判断依据产生影响；在通过温度识别碳化爬电缺陷位置时，可重点将温升突变情况作为参考依据，而不是单一的温升。
基金
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  • 国网江苏省电力有限公司科技项目(J2023087)
文献
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2025年第58卷第2期
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doi: 10.16790/j.cnki.1009-9239.im.2025.02.014
  • 接收时间：2024-03-21
  • 首发时间：2025-11-06
  • 出版时间：2025-02-20
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  • 收稿日期：2024-03-21
  • 修回日期：2024-06-20
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国网江苏省电力有限公司科技项目(J2023087)
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    1国网江苏省电力有限公司南京供电分公司，江苏 南京 210019
    2南京工程学院，江苏 南京 211167
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2种不同金属材料的力学参数
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Number of
species		 占总种数比例
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total species (%)		 属
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Number of
species		 占总种数比例
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鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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