Article(id=1209928459263012939, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1209928452547933122, articleNumber=null, orderNo=null, doi=10.16790/j.cnki.1009-9239.im.2024.06.013, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1686240000000, receivedDateStr=2023-06-09, revisedDate=1690214400000, revisedDateStr=2023-07-25, acceptedDate=null, acceptedDateStr=null, onlineDate=1766399024071, onlineDateStr=2025-12-22, pubDate=1718812800000, pubDateStr=2024-06-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1766399024071, onlineIssueDateStr=2025-12-22, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1766399024071, creator=13701087609, updateTime=1766399024071, updator=13701087609, issue=Issue{id=1209928452547933122, tenantId=1146029695717560320, journalId=1149653034449285133, year='2024', volume='57', issue='6', pageStart='1', pageEnd='120', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1766399022471, creator=13701087609, updateTime=1766563931405, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1210620130816561673, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1209928452547933122, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1210620130816561674, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1209928452547933122, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=86, endPage=95, ext={EN=ArticleExt(id=1209928459523059801, articleId=1209928459263012939, tenantId=1146029695717560320, journalId=1149653034449285133, language=EN, title=Research on locating defects in water-blocking buffer layer of high-voltage cables based on frequency domain reflection method, columnId=1192878364340924664, journalTitle=Insulating Materials, columnName=Test and Analysis, runingTitle=null, highlight=null, articleAbstract=

In order to obtain the location information of defects in buffer layer of HV cable, at first, according to the surface morphological characteristics of buffer layer, the buffer layer states were devided into dry state, damp state, corroded state, and corroded-ablative state, and the change law of volume resistivity and relative dielectric constant during the development of defects from dry state to corroded-ablative state of buffer layer was studied via thin slice samples. Then the computing formula of the distributed capacitance and distributed conductance in the network of HV cables transmission line was derived. The feasibility of applying the FDR method to locate defects in the buffer layer of HV cables was also evaluated. Finally, a long cable experimental platform was built in the laboratory to study the effectiveness of the FDR method in locating buffer layer defects. The results show that the development of buffer layer defect mainly affects the distributed capacitance, and impedance discontinuity points generate in the process. FDR can locate the moisture and defects of the buffer layer, but the further distinction between corrosion defects and ablation defects needs to be combined with other state detection methods.

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为了获取高压电缆缓冲层缺陷的位置信息,本文首先根据缓冲层表面形貌特征将缓冲层状态划分为干燥态、受潮态、腐蚀态以及腐蚀烧蚀态,通过薄片样本研究了缓冲层从干燥态到腐蚀烧蚀态这一缺陷发展过程中体积电阻率和相对介电常数的变化规律。然后推导了高压电缆传输线网络中的分布电容以及分布电导的计算公式,评估了FDR法应用于高压电缆缓冲层缺陷定位的可行性。最后在实验室中搭建了长电缆实验平台,研究了频域反射法定位缓冲层缺陷的有效性。结果表明:缓冲层缺陷的发展主要影响高压电缆的分布电容,产生阻抗不连续点。FDR能够实现对缓冲层受潮及缺陷的定位,但对于腐蚀缺陷及烧蚀缺陷的进一步区分还需结合其他状态检测手段。

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黄友聪(1987-),男(汉族),福建福州人,高级工程师,主要从事高压电缆运维管理的研究。

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黄友聪(1987-),男(汉族),福建福州人,高级工程师,主要从事高压电缆运维管理的研究。

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黄友聪(1987-),男(汉族),福建福州人,高级工程师,主要从事高压电缆运维管理的研究。

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journalId=1149653034449285133, articleId=1209928459263012939, language=EN, label=Fig.13, caption=Time domain waveform recovery results, figureFileSmall=pro3QSy9Me9u2bGprxK1oQ==, figureFileBig=FqZdGbpz2YRqfDg1E42rIw==, tableContent=null), ArticleFig(id=1217500328132530405, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1209928459263012939, language=CN, label=图13, caption=时域波形的恢复结果, figureFileSmall=pro3QSy9Me9u2bGprxK1oQ==, figureFileBig=FqZdGbpz2YRqfDg1E42rIw==, tableContent=null), ArticleFig(id=1217500328224805096, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1209928459263012939, language=EN, label=Tab.1, caption=Volume resistivity measurement results of buffer layer in dry state, figureFileSmall=null, figureFileBig=null, tableContent=
样本编号12345
体积电阻率/(×105 Ω·cm)0.117 50.434 10.127 20.235 50.238 9
样本编号678910
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基于频域反射法的高压电缆阻水缓冲层缺陷定位研究
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黄友聪 1 , 郑钟楠 1 , 林梓圻 1 , 张莹 1 , 赵琦 2 , 袁豪 2 , 周凯 2
绝缘材料 | 测试与分析 2024,57(6): 86-95
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绝缘材料 | 测试与分析 2024, 57(6): 86-95
基于频域反射法的高压电缆阻水缓冲层缺陷定位研究
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黄友聪1, 郑钟楠1, 林梓圻1, 张莹1, 赵琦2, 袁豪2, 周凯2
作者信息
  • 1国网福建省电力有限公司电力科学研究院,福建 福州 350000
  • 2四川大学 电气工程学院,四川 成都 610065
  • 黄友聪(1987-),男(汉族),福建福州人,高级工程师,主要从事高压电缆运维管理的研究。

Research on locating defects in water-blocking buffer layer of high-voltage cables based on frequency domain reflection method
Youcong HUANG1, Zhongnan ZHENG1, Ziqi LIN1, Ying ZHANG1, Qi ZHAO2, Hao YUAN2, Kai ZHOU2
Affiliations
  • 1Electric Power Research Institute of State Grid Fujian Electric Power Company, Fuzhou 350000, China
  • 2College of Electrical Engineering, Sichuan University, Chengdu 610065, China
出版时间: 2024-06-20 doi: 10.16790/j.cnki.1009-9239.im.2024.06.013
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为了获取高压电缆缓冲层缺陷的位置信息,本文首先根据缓冲层表面形貌特征将缓冲层状态划分为干燥态、受潮态、腐蚀态以及腐蚀烧蚀态,通过薄片样本研究了缓冲层从干燥态到腐蚀烧蚀态这一缺陷发展过程中体积电阻率和相对介电常数的变化规律。然后推导了高压电缆传输线网络中的分布电容以及分布电导的计算公式,评估了FDR法应用于高压电缆缓冲层缺陷定位的可行性。最后在实验室中搭建了长电缆实验平台,研究了频域反射法定位缓冲层缺陷的有效性。结果表明:缓冲层缺陷的发展主要影响高压电缆的分布电容,产生阻抗不连续点。FDR能够实现对缓冲层受潮及缺陷的定位,但对于腐蚀缺陷及烧蚀缺陷的进一步区分还需结合其他状态检测手段。

高压电缆  /  阻水缓冲层  /  缺陷定位  /  频域反射法

In order to obtain the location information of defects in buffer layer of HV cable, at first, according to the surface morphological characteristics of buffer layer, the buffer layer states were devided into dry state, damp state, corroded state, and corroded-ablative state, and the change law of volume resistivity and relative dielectric constant during the development of defects from dry state to corroded-ablative state of buffer layer was studied via thin slice samples. Then the computing formula of the distributed capacitance and distributed conductance in the network of HV cables transmission line was derived. The feasibility of applying the FDR method to locate defects in the buffer layer of HV cables was also evaluated. Finally, a long cable experimental platform was built in the laboratory to study the effectiveness of the FDR method in locating buffer layer defects. The results show that the development of buffer layer defect mainly affects the distributed capacitance, and impedance discontinuity points generate in the process. FDR can locate the moisture and defects of the buffer layer, but the further distinction between corrosion defects and ablation defects needs to be combined with other state detection methods.

HV cable  /  water-blocking buffer layer  /  defect location  /  FDR
黄友聪, 郑钟楠, 林梓圻, 张莹, 赵琦, 袁豪, 周凯. 基于频域反射法的高压电缆阻水缓冲层缺陷定位研究. 绝缘材料, 2024 , 57 (6) : 86 -95 . DOI: 10.16790/j.cnki.1009-9239.im.2024.06.013
Youcong HUANG, Zhongnan ZHENG, Ziqi LIN, Ying ZHANG, Qi ZHAO, Hao YUAN, Kai ZHOU. Research on locating defects in water-blocking buffer layer of high-voltage cables based on frequency domain reflection method[J]. Insulating Materials, 2024 , 57 (6) : 86 -95 . DOI: 10.16790/j.cnki.1009-9239.im.2024.06.013
高压电缆阻水缓冲层是高压电缆中具有纵向阻水、保持绝缘屏蔽层与皱纹铝护套电气连接以及机械缓冲作用的一层特殊结构[1]。近年来,由缓冲层事故引起的高压电缆本体击穿事故频发,严重影响城市地下输电系统的稳定性[2-5]。由此,由缓冲层引起的高压电缆击穿机理以及对缓冲层缺陷检测成为了高压电缆本体故障领域的研究热点。
现有研究表明,缓冲层由于本身所具有的吸潮特性,在制造和安装过程中易吸潮,从而导致其相对介电常数和体积电阻率发生明显的提升。文献[6]指出,缓冲层吸潮之后其体积电阻率上升了2个数量级,远高于JB/T 10259—2014的规定值。文献[7-8]研究表明缓冲层受潮会导致其在运行过程中与铝护套发生电化学腐蚀,生成氧化铝、氢氧化铝等绝缘性质的白斑,使得缓冲层体积电阻率上升并在白斑处引起强烈的电场畸变。文献[9]表明缓冲层相对介电常数的提升会提高缓冲层发生局部放电的概率。由此可见,在缓冲层从生产制造到吸潮、再到腐蚀以及烧蚀这一过程中存在着明显的体积电阻率以及相对介电常数的变化过程,并且这一变化直接导致缓冲层缺陷的产生并诱发高压电缆本体击穿。
现有的缓冲层缺陷检测技术研究大体是基于缓冲层缺陷导致击穿的机理来展开,主要有针对缓冲层中局部放电的局部放电检测[10]、针对缓冲层形貌变化的X射线检测[11-15]以及通过缓冲层中气体种类及浓度判断缓冲层状态的方法[16]。但文献[2]指出,缓冲层缺陷只有发展到能够影响主绝缘才容易检出局部放电,且由于环境电磁噪声的干扰和放电间歇性的存在,很难发现微弱缺陷产生的局部放电信号。受X射线检测原理的限制,在对同一段电缆进行检测时,需要多次调整射线源以及接收板的角度才能对某段电缆进行较为全面的检测[17]。且金属护套会对X射线产生较大的屏蔽作用而干扰检测结果。加之X射线检测仪的体积和质量较大,因此X射线不适合用于长线路大规模检测。对于气体法,存在的不足之处主要在于难以对缓冲层产生气体的位置进行定位,仅仅能实现缓冲层状态的分类[16]。由此可见,现有的检测方法均存在着一定的局限性,主要是难以对电缆中的缓冲层缺陷具体位置进行诊断。
对于电缆中缺陷位置的定位,现有较为成熟的方法包括时域反射法(time domain reflectometry,TDR)[18-19]、频域反射法(frequency domain reflectometry,FDR)[20]、时频域反射法(time-frequency domain reflectometry,TFDR)[21]以及局部放电定位方法等[22]。相较于其他方法,频域反射法具有丰富的频谱信息,近年来在微弱缺陷定位中取得了良好的成效[23]。但目前该方法仅仅在中低压电缆中得到了广泛的应用,针对高压电缆存在的缓冲层特殊结构,该方法是否能够定位出其中的缓冲层缺陷,尚未有相关的系统性研究,仅有部分文献说明了其可行性[24-25]。同时,上述方法基本都是基于传输线网络,通过电磁波在电缆中阻抗不匹配之处的反射或折射进行定位。因此,若要研究基于FDR的缓冲层缺陷定位,就必须对缓冲层全寿命周期下的电气参数及其对电缆特征参数的影响进行研究。
为了解决缓冲层缺陷定位问题,本文首先根据缓冲层形貌特征将缓冲层状态分为干燥态、受潮态、腐蚀态以及腐蚀烧蚀态,并对缓冲层样本从干燥态到腐蚀烧蚀态这一缺陷发展过程中的体积电阻率和相对介电常数进行测量。其次,基于传输线理论对高压电缆分布电容以及分布电导进行推导计算。最后,在实验室中搭建长电缆平台验证FDR法对缓冲层缺陷定位的有效性。
首先,本文结合前期调研,根据缓冲层形貌特征将缓冲层状态分为干燥态、受潮态、腐蚀态以及腐蚀烧蚀态。干燥态是指制造完成之后的缓冲层经过干燥之后的状态;受潮态是指缓冲层吸潮之后的状态;腐蚀态是指受潮态的缓冲层与铝护套发生腐蚀后的状态;腐蚀烧蚀态是指腐蚀态的缓冲层在电应力及化学应力的长期作用下发生了纤维熔断的腐蚀态缓冲层。各状态缓冲层的基本特征如图1所示。
实验前先将缓冲层裁成5 cm×5 cm的尺寸,放置于90℃的真空干燥箱中干燥24 h。对干燥后的样本均匀喷洒水雾使其受潮,获得受潮态缓冲层。结合文献[16]的实验,使受潮缓冲层与铝片贴合,在其上方放置200 g的砝码以施加足够的表面压力,随后施加30 V、50 Hz的交流电,进行为期2.5 h的加速腐蚀实验,获取不同程度的腐蚀态样本。最后,直接升高缓冲层两端电压使其烧蚀。从干燥态到腐蚀烧蚀态这一过程被本文定义为缓冲层的全寿命过程。分别在干燥态、受潮态、腐蚀态时间隔0.5 h后以及烧蚀后对样本的体积电阻率以及相对介电常数进行测量。体积电阻率按照JB/T 10259—2014附录D中的方法进行测试。相对介电常数采用阻抗分析仪(HIOKI 3532-50LCR HITESTER型)进行测量。
受潮态缓冲层样本受潮程度n式(1)计算。
n=m1-m0m0×100%
式(1)中:m1为缓冲层样本受潮后的质量;m0为干燥缓冲层样本的质量。
结合1.1节中缓冲层状态的划分,本文从自然腐蚀以及带电加速腐蚀两方面进行长电缆实验。受实验条件限制,自然腐蚀平台电缆长度为37.3 m,带电加速腐蚀平台电缆长度为7.95 m,缺陷中心位置距离电缆首端分别为23 m以及4 m,高压电缆型号为ZC-YJLW03 64/110。平台示意图以及缺陷设置分别如图2图3所示。
由于未带电下的缓冲层自然腐蚀速率较低,对于自然腐蚀缓冲层主要采用逐次加水逐次测试的方式进行实验,以研究连续阻抗变化情况下的缓冲层缺陷定位特性。每个孔每次加水2 mL、连续添加4次,每次加水之后静置10 min后开始测试,加水顺序为a、b、c、d。由于缓冲层每个位置吸水能力有限,对打孔加水的方式进行了优化,打孔方式如图3(a)所示。
对于带电腐蚀样本则采取每个孔加水5 mL的方式进行实验,施加的电压幅值为10 kV、频率为500 Hz,每加电30 h进行一次FDR测试,全实验周期为120 h。带电腐蚀电缆平台在腐蚀期间,对回路中电流进行了测量。测量结果表明在本文设置的实验条件下,电缆回路中的电流幅值为2 mA。
FDR法主要基于传输线网络:首先将高频电源下的电缆等效为分布参数网络,然后基于分布参数网络分析信号在电缆中的传播特性。电缆的基本分布参数网络如图4所示。图4中,R0L0G0C0分别为单位长度下的电阻、电感、电导以及电容。
在电缆中,由于趋肤效应以及邻近效应的影响,单位长度电阻R0和电感L0计算方法分别如式(2)式(3)所示。
R012πμ0ω2(1rcρc+1rsρs)
L0μ02πlnrsrc+14π2μ0ω(1rcρc+1rsρs)
式(2)~(3)中:角频率ω=2πfrcrs为缆芯半径和金属屏蔽层的内半径;ρcρs为电缆缆芯电阻率和金属屏蔽层电阻率;μ0为真空磁导率。
在高压电缆结构中,分布电容C的计算可以通过电容的基本公式进行计算[26],如式(4)所示。
C=QU
式(4)中:Q为电容电荷量;U为电容两端的电压。
在高压电缆结构中,电缆缆芯与金属铝护套之间的结构包含了导体屏蔽层、XLPE绝缘、绝缘屏蔽层以及缓冲层。单位长度内4层结构的总电容即为电缆的分布电容。单位长度内4层结构的总电导即为电缆的分布电导。根据传输线理论的电气参数计算原理,在高压电缆中,当缓冲层电气参数发生改变时,并不会影响电缆的分布电导和分布电容。
高压电缆截面如图5所示,假设电缆缆芯中电荷为Q,漏电流为I,电缆长度为lεδ以及ρ分别为各结构的相对介电常数、电导率以及电阻率。根据含介质的静电场中高斯定理(式(5)),同轴电缆结构中M点处的电场强度如式(6)所示。
Eds=Qε=Qε0εx
E=Q2πrlε0εx
式(6)沿着电缆径向进行积分,可得U的表达式如式(7)所示。
U=rcr1Q2πrlε0εp+r1r2Q2πrlε0εx+r2r3Q2πrlε0εp+r3rsQ2πrlε0εb=Q2πlε0(1εplnr1rc+1εxlnr2r1+1εplnr3r2+1εblnrsr3)
可得l长度电缆的电容C的表达式为式(8)
C=QU=QQ2πlε0(1εplnr1rc+1εxlnr2r1+1εplnr3r2+1εblnrsr3)   =2πlε01εplnr1rc+1εxlnr2r1+1εplnr3r2+1εblnrsr3
则高压电缆分布电容和分布电导的计算公式分别为式(9)式(10)
C=2πε01εplnr1rc+1εxlnr2r1+1εplnr3r2+1εblnrsr3
G=2π1σplnr1rc+1σxlnr2r1+1σplnr3r2+1σblnrsr3
根据电路原理,推导出电缆任意位置z处的电压U(z)和电流I(z)分别如式(11)式(12)所示[27]
U(z)=Ui2eγ(l-z)+Ur2e-γ(l-z)
I(z)=1Z0(Ui2eγ(l-z)-Ur2e-γ(l-z))
式(11)~(12)中:Ui2为负载侧的入射电压波;Ur2为负载侧的反射电压波;γ为电缆的传播系数;Z0为电缆的特性阻抗。γZ0的表达式分别如式(13)式(14)所示。
γ(ω)=(R0+jωL0)(G0+jωC0)
Z0(ω)=R0+jωL0G0+jωC0
在入射信号为高频信号的情况下,wL>>RwC>>G,则Z0计算公式转化为式(15)
Z0(ω)=L0C0
传播常数γ可以表示为式(16)~(17)。
γ=α+jβ
β=ωv=2πfv
式(16)~(17)中:v为电缆中电磁波信号的传播速度;α为衰减常数;β为相位常数。
当高压电缆缓冲层出现受潮、腐蚀或者烧蚀时,缓冲层的体积电阻率以及相对介电常数将发生明显变化,导致在电缆的传输线网络中出现阻抗不连续点。根据行波理论可知,信号在经过电缆中阻抗不连续点时将会发生折射以及反射现象,如图6所示。
线路末端的反射系数ΓL计算公式为式(18)
ΓL=Ur2Ui2=ZL-Z0ZL+Z0
式(18)中:ZL为负载阻抗。电缆末端呈开路状态时,ΓL=1。
可得到电缆任意位置z处的电压U(z)和电流I(z)和电缆末端反射系数ΓL之间的关系式如式(19)~(21)所示。
U(z)=Ui2eγ(l-z)(1+ΓLe-2γ(l-z))
I(z)=Ui2eγ(l-z)z0(1-ΓLe-2γ(l-z))
Z(z)=U(z)I(z)=Z0(1+ΓLe-2γ(l-z)1-ΓLe-2γ(l-z))
z=0时,电缆首端输入阻抗Z(0)如式(22)所示。
Z(0)=Z0(1+ΓLe-2γl1-ΓLe-2γl)
通过分解获取电缆首端输入阻抗的实部以及虚部就能实现电缆中阻抗不连续点的定位。利用虚部进行定位的原理如下。
式(22)利用欧拉公式展开,简化之后可得式(23)
Z(0)=Z0(1+2e2αl[cos(2βl)+jsin(2βl)])
得到首端输入阻抗谱虚部含三角函数部分,如式(24)所示。
Z*(0)=sin(4πlfv)
Z(0)视为以f为自变量的函数,角频率w为4πl/f的正弦信号,其频率计算式为式(25)
f=ω2π=2lv
则电缆首端输入阻抗谱的虚部部分可表征为时间变量函数,其频率f为2l/v。因此,在电缆长度为l,电缆中波数v为常数的情况下,可以利用离散傅里叶变换(DFT)通过寻找特征频率f,来判断电缆中阻抗不匹配的位置[27]
根据前述实验步骤,对不同状态下的缓冲层样本进行体积电阻率以及相对介电常数测量。表1表2分别为干燥态样本的体积电阻率以及相对介电常数测量结果。
表1可以看出,在本实验条件下,干燥状态缓冲层的体积电阻率均处于JB/T 10259—2014中的规定值(≤1×105 Ω·cm)。10组样本的体积电阻率平均值为0.186 4×105 Ω·cm,符合标准中所规定的范围。
相较于体积电阻率,干燥样本的缓冲层介电常数的差别较大,10组样本的相对介电常数平均值为43.17。对比文献[6]中对干燥态样本的电气参数测量,本文的测量结果与之基本符合。
对干燥态缓冲层样本进行处理,得到受潮态缓冲层的吸潮率分别为41.81%、38.22%、23.89%、32.60%。对受潮态样本进行加速老化处理,得到样本全寿命过程中体积电阻率以及相对介电常数的变化规律如图7所示。从图7(a)可以看出,受潮缓冲层体积电阻率在带电腐蚀过程中呈现出增长的趋势。加电腐蚀过程中缓冲层总体的体积电阻率相较于最初的干燥样本最大提升了17.04倍。而烧蚀态缓冲层较上一阶段的腐蚀态缓冲层体积电阻率出现了较大的提升,最大的体积电阻率可达146.987×105 Ω·cm,相较于初始的体积电阻率0.177 5×105 Ω·cm,体积电阻率提升了约827倍。缓冲层中承担导电作用的是掺杂有炭黑的缓冲棉层以及无纺布层,而阻水粉吸潮之后产生的凝胶状产物将会阻档缓冲棉层以及无纺布层的接触,从而使缓冲层的体积电阻率增大。进一步地,随着受潮样本的腐蚀,缓冲层中逐渐生成氢氧化铝,其为绝缘产物,使其体积电阻率进一步增加。而最终缓冲层发生烧蚀时,缓冲层中的导电纤维被熔断,此时体积电阻率急剧增大[16]
图7(b)可以看出,在缓冲层受潮之后,样本的相对介电常数呈现明显的提升,相较于干燥状态的缓冲层,受潮缓冲层的相对介电常数最大提升了1 125倍,达到35 238。随着受潮样本加电腐蚀的开始,0.5 h之后缓冲层的相对介电常数均跌至1 100及以下,并且随着腐蚀程度的加深而逐渐减小。相较腐蚀阶段中的缓冲层相对介电常数,烧蚀后样本的相对介电常数并未出现较大的变化,只是最后腐蚀状态下的样本相对介电常数有所减小,与体积电阻率在腐蚀态与烧蚀态转变时呈现的差异形成了对比。缓冲层吸潮后,阻水粉主要材料聚丙烯酸钠(NaPA)会与水形成离子溶液,导致缓冲层中离子极化强度急剧增加,表现为相对介电常数增大。而随着腐蚀及烧蚀的发生,缓冲层中不断生成氢氧化铝绝缘产物及缓冲层纤维被熔断,并且水溶液在此过程中不断被消耗,因此相对介电常数又逐渐减小。
值得注意的是,图7表明,受潮缓冲层的电气参数并不随受潮程度规律变化,这主要是缓冲层中阻水粉分布不均匀导致的,因此缓冲层的受潮程度难以通过体积电阻率与相对介电常数进行判定。尽管如此,对于不同吸潮程度的缓冲层样本,其电气参数随缺陷发展的变化规律却是一致的,因此这并不影响本文得出的缓冲层缺陷演变过程下电气参数的变化规律。
根据2.1节中推导的高压电缆分布电容和分布电导计算公式,以及3.1节中缓冲层全寿命过程下的电气参数实验结果,得到缓冲层全寿命过程下高压电缆分布电导以及分布电容的变化情况,如图8所示。从图8可以看出,在全寿命过程中,缓冲层体积电阻率难以发生明显改变,整体的分布电导维持在8.486 2×10-19 S/cm的水平,这是由于XLPE主绝缘体积电阻率超出其他结构近12个数量级。缓冲层在干燥状态下的分布电容约为171.354 3 pF/m,在缓冲层受潮情况下介电常数提升导致分布电容值上升为172.706 3 pF/m,相较于初始状态上升了约1.008倍。
为了评估高压电缆结构中皱纹铝护套波峰与缓冲层之间存在气隙对高压电缆本体分布电容的影响,根据前文中电缆实际尺寸,在多元物理仿真软件COMSOL Multiphysics 5.4中建立了高压电缆本体的二维轴对称模型,用以模拟计算高压电缆的电容值。仿真得到在空气隙的影响下电缆本体分布电容的变化范围为21.700 69~21.953 735 pF/m。由此可见电缆中皱纹铝护套与缓冲层之间形成的气隙也会影响电缆本体段的分布电容值。但总的来说,在全寿命过程中高压电缆分布电容相较于分布电导会呈现出较大的变化,可为电缆中的缺陷检测提供理论参考依据。
为了研究在制作缺陷过程中在铝护套上钻孔是否会影响电缆首端的定位效果,本文在自然腐蚀电缆缺陷制作之前以及钻孔之后在电缆首端进行了测试,结果如图9所示。从图9可以看出,在铝护套波峰打孔对电缆定位结果影响较小,几乎与原始状态重合。图9中出现的略微差别可能是由于测试夹具导致的,并不影响定位结果。
在后续的缓冲层缺陷识别中,为了避免由于FDR存在的频谱泄露问题导致对缺陷位置判断产生影响,本文首先对比了几种常见的抑制频谱泄露、减少旁瓣效应的窗函数对定位首端反射系数实部的处理结果,包含Hanning窗、Kaiser窗、Blackman窗以及Hamming窗[28]。以各孔注水2 mL的测试结果进行对比,结果如图10所示。
图10可以看出,Hanning窗以及Blackman窗与初始状态未加窗函数相比较差别较大,主要表现为主瓣宽度较宽,距离分辨率较低。相较于其他几种窗函数,Kaiser窗函数处理之后的定位结果在缺陷位置表现出较为明显的峰值,并且其旁瓣也较小,同时可通过调节Kaiser窗函数的参数灵活调节被测电缆主瓣宽度与旁瓣的抑制效果[30],因此在后续的处理中均选用Kaiser窗函数对定位结果进行处理。其中,针对带电腐蚀相对较短的电缆定位结果选择的Kaiser窗函数宽度为3.5,针对仅加水腐蚀的相对较长的电缆定位结果选择Kaiser窗函数宽度为6。
自然腐蚀状态下首端定位结果如图11所示。从图11可以看出,FDR法能够对被测试高压电缆的长度进行准确测量,并且在自然腐蚀全过程中实现缓冲层缺陷定位。相较于初始状态的电缆,在各孔加水2 mL之后首端反射系数中出现了明显的缺陷峰,如图11(a)所示。此外,随着注入水分的增加,在缺陷邻近段出现了更多的峰,这可能是由于过多的水分在缓冲层中存在迁移行为导致的,如图11(c)(d)所示。图11(d)的实验结果表明,虽然继续人为地在缺陷中注入水分并静置,但在电缆首端获得的定位结果并未出现明显的改变,表明电缆中缺陷处缓冲层以及缺陷临近段缓冲层的吸水暂时处于饱和且稳定状态,使得其电气参数也处于稳定的状态,最终在定位结果上表现出极大的相似性。图11(e)的定位结果表明,自然腐蚀3个月后的首端定位结果并未与之前缺陷制作完成时的定位结果出现较大的差别,依然能够对缓冲层缺陷进行准确的定位,缺陷峰的特征也一致。根据文献[16]中腐蚀阶段气体逸出机理可知,在不带电的作用下受潮缓冲层仅与铝护套发生原电池腐蚀反应,整体反应速率将远低于带电情况下的电解池腐蚀。结合3.2节中缓冲层在全寿命过程中腐蚀阶段高压电缆特征参数的规律来看,腐蚀阶段进展缓慢的直接结果就是缓冲层相对介电常数在腐蚀阶段将会变化缓慢,即使产生了腐蚀反应,其电气参数变化也不明显,这也导致了为期3个月的腐蚀并不会明显改变电缆的首端定位结果。
带电加速腐蚀条件下高压电缆定位结果如图12所示。图12同样表明FDR法能够对电缆的长度以及缓冲层缺陷进行准确定位。在带电腐蚀过程中最明显的变化是缺陷位置处缺陷峰形的变化特性:注水后缺陷处出现明显的尖峰,在加电30 h之后,缺陷处尖峰变为驼峰,驼峰左右峰距首端分别为3.8 m和4.2 m,如图13(b)所示。带电60 h后,缺陷处驼峰重新变为尖峰,并在后续带电90 h、120 h过程中逐渐发展成为驼峰。通过分析本文的实验设置,认为这主要是水分在带电过程中的迁移与消耗导致的。带电30 h后呈现的驼峰表明注入的水分在缓冲层中出现了扩散的行为,导致缺陷段缓冲层介电常数出现较大的提升,电磁波在缺陷段的首端以及末端均出现反射与折射信号,两峰的叠加使原有的单峰呈现出驼峰的状态。带电30~60 h过程中,由于扩散出去的水分始终少于原缺陷打孔处的水分,随着带电的进行,扩散出的水分逐渐被消耗,使得此时电缆中水分的分布特性与初始注水时的分布特性一致,驼峰转变为原有的单个尖峰。60 h之后,缺陷处水分的继续消耗,水分的持续消耗使得缺陷处于缺陷邻近段缓冲层的电气参数逐渐接近,形成电气参数较为均一的缺陷段,电磁波在缺陷段首端以及末端的反射与折射行为重新在定位结果上呈现双峰叠加的驼峰状态。此外,图12中缺陷右端定位结果发生的变化说明带电过程中还存在着其他的缺陷发展过程。
综合图1112的实验结果可知,FDR法能够实现电缆长度的测量,并对缓冲层中的缺陷位置进行判断。水分在缓冲层中存在着明显的扩散行为,这一扩散行为通过影响不同位置缓冲层的电气参数而在电缆的首端反射系数谱中所体现。
为了对本文实验中产生的缓冲层缺陷类型进行识别,根据式(22)所示的反射系数以及文献[30]中时域波形恢复的技术对各组定位结果进行时域波形恢复的初步探索,结果如图13所示。从图13可以看出,缺陷处呈现出先负后正的波形状态,其他不同受潮程度样本的时域波形与之相似,限于篇幅,在此不一一列出。结合时域波形恢复的基本原理,先负后正波形的出现说明在该位置处引入了阻抗减小的缺陷[29-30]。这也与本文3.2节中电缆缓冲层受潮之后引起的分布电容增大(即阻抗减小)的缺陷所对应。需要说明的是,虽然腐蚀及烧蚀后缓冲层样本的阻抗相较于完好缓冲层也有一定程度的减小,但其变化相较于受潮对阻抗幅值的影响十分微弱,如图7所示,因此其时域波形恢复结果并不明显。因而可初步得出,根据FDR的时域波形恢复结果可以初步判定出缓冲层是否发生了受潮,而对于缓冲层的其他缺陷类型需要其他检测方法进行辅助判别。
对于加水腐蚀的参考样本,加水腐蚀50天之后对其进行取气进行气相色谱测试,色谱结果显示加水腐蚀之后缓冲层内部H2、CO2、CH4以及CO气体的体积分数分别为10×10-6、619×10-6、2×10-6、4×10-6,并未出现烯烃以及烷烃类产物。
在加电的过程中,分别在30 h以及120 h后通过注水孔抽取缓冲层中气体,并通过气相色谱的方式对气体含量进行测试,测试结果如表3所示。
气体分析结果表明,在本文电缆自然腐蚀过程中并未出现乙烷、乙烯以及乙炔等烃类产物,而仅出现了氢气的新增,根据文献[16]提出的特征气体法可以判断缓冲层仅仅处于腐蚀态,并未发生烧蚀。同理,发现电缆带电30 h后,缓冲层中出现了乙烯这一特征产物,说明30 h后电缆中的缓冲层就已经出现了烧蚀缺陷,存在缓冲层本身材料发生分解的情况。
由自然腐蚀电缆以及带电腐蚀电缆中的定位结果可以看出,FDR能够对缓冲层中缺陷位置进行精准判定。但是,根据3.2节中的实验结果,无论是缓冲层处于腐蚀态或烧蚀态,均表现为样本相对介电常数的减小。因此,单独分析FDR定位结果时,难以根据缺陷峰的变化情况判断出缓冲层的缺陷状态及做出相应评估。对此,可结合气体分析方法进行缺陷状态诊断。然而,气体采集的主要方式还是在缺陷处进行采集并测试,即气体法本身存在难以对缓冲层缺陷位置进行判断的局限性。因此,对于实际工程中存在缓冲层缺陷的长距离高压电缆,需要先采用本文所提的FDR方法对缺陷位置进行初步判定,再采用其他检测手段对缺陷类型及严重程度做出进一步的评判。本文研究有望为实际高压电缆缓冲层缺陷的位置判定提供理论依据与实验参考。
(1)在缓冲层缺陷发展过程中,缓冲层历经了干燥态、受潮态、腐蚀态并最终过度到腐蚀烧蚀态。在这一过程中,缓冲层的体积电阻率呈现出在受潮以及腐蚀过程中平稳增长,在烧蚀后大幅增长的趋势。缓冲层的相对介电常数在受潮后会大幅提升,相较于干燥缓冲层最大提升了1 125倍。之后相对介电常数随着腐蚀的进行而逐渐下降,即使烧蚀也不会出现较大的变化。
(2)缓冲层电气参数变化主要影响高压电缆分布电容,FDR法能够根据分布电容的变化进行缺陷定位,并反映水分在电缆中的扩散行为。
(3)受制于定位原理的限制,FDR不能实现对缓冲层烧蚀状态以及腐蚀状态的区分,仅通过定位结果反应缺陷距离电缆首端的距离。但将特征气体法与FDR结合使用可以实现对缓冲层状态的综合诊断。
  • 国家自然科学基金资助项目(52277156)
  • 国网福建省电力有限公司科技项目(DKFW2022GJT080009)
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doi: 10.16790/j.cnki.1009-9239.im.2024.06.013
  • 接收时间:2023-06-09
  • 首发时间:2025-12-22
  • 出版时间:2024-06-20
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  • 收稿日期:2023-06-09
  • 修回日期:2023-07-25
基金
国家自然科学基金资助项目(52277156)
国网福建省电力有限公司科技项目(DKFW2022GJT080009)
作者信息
    1国网福建省电力有限公司电力科学研究院,福建 福州 350000
    2四川大学 电气工程学院,四川 成都 610065
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2种不同金属材料的力学参数

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鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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