Article(id=1198667879383138497, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1198667875570516115, articleNumber=null, orderNo=null, doi=10.16790/j.cnki.1009-9239.im.2023.06.015, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1659196800000, receivedDateStr=2022-07-31, revisedDate=1662220800000, revisedDateStr=2022-09-04, acceptedDate=null, acceptedDateStr=null, onlineDate=1763714292617, onlineDateStr=2025-11-21, pubDate=1687190400000, pubDateStr=2023-06-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1763714292617, onlineIssueDateStr=2025-11-21, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1763714292617, creator=13701087609, updateTime=1763714292617, updator=13701087609, issue=Issue{id=1198667875570516115, tenantId=1146029695717560320, journalId=1149653034449285133, year='2023', volume='56', issue='6', pageStart='1', pageEnd='109', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1763714291707, creator=13701087609, updateTime=1766563574379, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1210618633332585027, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1198667875570516115, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1210618633332585028, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1198667875570516115, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=94, endPage=99, ext={EN=ArticleExt(id=1198667879873872074, articleId=1198667879383138497, tenantId=1146029695717560320, journalId=1149653034449285133, language=EN, title=Bulk resistivity measurement and internal charging effect of epoxy glass fiber cloth substrate under different temperatures, columnId=1192878364340924664, journalTitle=Insulating Materials, columnName=Test and Analysis, runingTitle=null, highlight=null, articleAbstract=

Temperature is an important factor that affects the insulating property and the charging state of internal charging effect of insulating materials forspacecraft. In this paper, the change rule of bulk resistivity of substrate materials for satallite circuit board at different temperatures was measured by three-electrode method, on this basis, the effect of temperature on the surface charging potential and internal maximum electric field of insulating materials was simulated and analyzed by using DICTAT program. The results show that in the temperature range from -50℃to 60℃, the bulk resistivity of substrate material decreases with the increase of temperature, and its variation amplitude is more than two orders of magnitude. At the same time, the surface charging potential amplitude and internal electric field intensity of the substrate material increase with the decrease of temperature, and there is a great risk of electrostatic discharge when the temperature is lower than 0℃.

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温度是影响卫星绝缘材料绝缘性能及内带电效应充电状态的重要因素。本文采用三电极法测试了不同温度下星载电路板基板材料的体积电阻率变化规律,并在此基础上利用DICTAT程序仿真分析了温度对绝缘材料表面充电电位和内部最大电场的影响。结果表明:在-50~60℃下,基板材料的体积电阻率随温度的升高而减小,其变化幅值超过两个数量级;同时基板材料的表面充电电位幅值和内部电场强度均随温度的降低而上升,在温度低于0℃时存在较大的静电放电风险。

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王金晓(1982-),女(汉族),河南禹州人,高级工程师,主要从事空间功能材料与环境适应性的研究。
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陈益峰(1981-),男(汉族),江苏南通人,副教授,主要从事卫星材料环境效应及防护设计的研究。

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陈益峰(1981-),男(汉族),江苏南通人,副教授,主要从事卫星材料环境效应及防护设计的研究。

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陈益峰(1981-),男(汉族),江苏南通人,副教授,主要从事卫星材料环境效应及防护设计的研究。

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tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1198667879383138497, language=EN, label=Tab.1, caption=The parameters of epoxy glass fiber cloth substrate, figureFileSmall=null, figureFileBig=null, tableContent=
设置参数参数数值
厚度/mm1.6
密度/(g/cm3)1.8
电导率/(S/m)根据不同温度给出
电气强度/(V/m)107
kp6.5×10-14
Δ1
), ArticleFig(id=1217470456416879507, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1198667879383138497, language=CN, label=表1, caption=

环氧玻纤布基板参数设置

, figureFileSmall=null, figureFileBig=null, tableContent=
设置参数参数数值
厚度/mm1.6
密度/(g/cm3)1.8
电导率/(S/m)根据不同温度给出
电气强度/(V/m)107
kp6.5×10-14
Δ1
), ArticleFig(id=1217470456538514326, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1198667879383138497, language=EN, label=Tab.2, caption=Test data of bulk resistivity and corresponding conductivity of epoxy glass fiber cloth substrate under different temperatures, figureFileSmall=null, figureFileBig=null, tableContent=
温度/℃体积电阻率/(Ω·m)电导率/(S/m)
-501.64×10146.10×10-15
-201.16×10148.62×10-15
08.03×10131.25×10-14
203.18×10133.14×10-14
401.53×10136.54×10-14
602.47×10124.05×10-13
), ArticleFig(id=1217470456651760538, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1198667879383138497, language=CN, label=表2, caption=

不同温度下环氧玻纤布基板体积电阻率的测试数据及对应的电导率

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温度/℃体积电阻率/(Ω·m)电导率/(S/m)
-501.64×10146.10×10-15
-201.16×10148.62×10-15
08.03×10131.25×10-14
203.18×10133.14×10-14
401.53×10136.54×10-14
602.47×10124.05×10-13
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不同温度下环氧玻纤布基板体积电阻率测试与内带电效应研究
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陈益峰 1 , 袁小平 2 , 梅飞 3 , 张红垒 2 , 谭文军 1 , 冯娜 3 , 蔡锟 1 , 王金晓 1
绝缘材料 | 测试与分析 2023,56(6): 94-99
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绝缘材料 | 测试与分析 2023, 56(6): 94-99
不同温度下环氧玻纤布基板体积电阻率测试与内带电效应研究
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陈益峰1, 袁小平2, 梅飞3, 张红垒2, 谭文军1, 冯娜3, 蔡锟1, 王金晓1
作者信息
  • 1许昌学院 化工与材料学院,河南 许昌 461000
  • 2许绝电工股份有限公司,河南 许昌 461000
  • 3北京东方计量测试研究所,北京 100086
  • 陈益峰(1981-),男(汉族),江苏南通人,副教授,主要从事卫星材料环境效应及防护设计的研究。

通讯作者:

王金晓(1982-),女(汉族),河南禹州人,高级工程师,主要从事空间功能材料与环境适应性的研究。
Bulk resistivity measurement and internal charging effect of epoxy glass fiber cloth substrate under different temperatures
Yifeng CHEN1, Xiaoping YUAN2, Fei MEI3, Honglei ZHANG2, Wenjun TAN1, Na FENG3, Kun CAI1, Jinxiao WANG1
Affiliations
  • 1College of Chemical and Materials Engineering, Xuchang University, Xuchang 461000, China
  • 2XuJue Electricial Co., Ltd., Xuchang, 461000 China
  • 3Beijing Orient Institute for Measurement & Test, Beijing 100086, China
出版时间: 2023-06-20 doi: 10.16790/j.cnki.1009-9239.im.2023.06.015
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温度是影响卫星绝缘材料绝缘性能及内带电效应充电状态的重要因素。本文采用三电极法测试了不同温度下星载电路板基板材料的体积电阻率变化规律,并在此基础上利用DICTAT程序仿真分析了温度对绝缘材料表面充电电位和内部最大电场的影响。结果表明:在-50~60℃下,基板材料的体积电阻率随温度的升高而减小,其变化幅值超过两个数量级;同时基板材料的表面充电电位幅值和内部电场强度均随温度的降低而上升,在温度低于0℃时存在较大的静电放电风险。

星载电路板  /  温度  /  体积电阻率  /  内带电效应

Temperature is an important factor that affects the insulating property and the charging state of internal charging effect of insulating materials forspacecraft. In this paper, the change rule of bulk resistivity of substrate materials for satallite circuit board at different temperatures was measured by three-electrode method, on this basis, the effect of temperature on the surface charging potential and internal maximum electric field of insulating materials was simulated and analyzed by using DICTAT program. The results show that in the temperature range from -50℃to 60℃, the bulk resistivity of substrate material decreases with the increase of temperature, and its variation amplitude is more than two orders of magnitude. At the same time, the surface charging potential amplitude and internal electric field intensity of the substrate material increase with the decrease of temperature, and there is a great risk of electrostatic discharge when the temperature is lower than 0℃.

satallite circuit board  /  temperature  /  bulk resistivity  /  internal charging effect
陈益峰, 袁小平, 梅飞, 张红垒, 谭文军, 冯娜, 蔡锟, 王金晓. 不同温度下环氧玻纤布基板体积电阻率测试与内带电效应研究. 绝缘材料, 2023 , 56 (6) : 94 -99 . DOI: 10.16790/j.cnki.1009-9239.im.2023.06.015
Yifeng CHEN, Xiaoping YUAN, Fei MEI, Honglei ZHANG, Wenjun TAN, Na FENG, Kun CAI, Jinxiao WANG. Bulk resistivity measurement and internal charging effect of epoxy glass fiber cloth substrate under different temperatures[J]. Insulating Materials, 2023 , 56 (6) : 94 -99 . DOI: 10.16790/j.cnki.1009-9239.im.2023.06.015
卫星在轨运行时将遭遇高能电子辐射等恶劣的空间环境,引发危害卫星正常运行的辐射效应。高能电子具有很强的穿透力,可以穿透卫星屏蔽层,沉积在星内绝缘材料中,当沉积电荷量形成的电场超过材料击穿阈值时,会诱发静电放电,该现象称为空间绝缘材料内带电效应[1-3]。因为内带电效应通常发生在卫星内部,对卫星造成的影响更为直接和严重,所以又称为“卫星杀手”[4-5]
卫星在轨运行期间会反复穿越光照区和阴影区,导致卫星工作于严酷的高低温交变环境中。现有研究表明即使采用一定热控防护措施后,星载电路板也将经历-50~60℃的温度环境[6]
温度的变化将直接影响绝缘材料的电阻性能,这使得该工况下内带电过程更为复杂[7-8]。绝缘材料的体积电阻率决定了其内部积累电荷的泄漏速率,是确定内带电效应过程中材料内部电场强度的重要参数[9-11]。目前虽然内带电效应已经得到了广泛关注与研究,但针对环境温度对内带电效应影响的研究较少,且未见利用不同温度下绝缘材料体积电阻率的实测数据来考察温度对内带电程度及放电风险评估的报道。
环氧玻纤布基板(FR4)由于其良好的力学性能、尺寸稳定性和抗冲击性等优点,是卫星印制电路板的重要基材,但其具有较高的体积电阻率,且靠近核心电子器件,一旦发生静电放电将直接损伤卫星电路的电子器件,因此是内带电效应防护设计中需重点研究的对象[12-13]
本研究在-50~60℃下测试FR4环氧玻纤布基板的体积电阻率,分析温度对其电阻性能的影响机制,并在此基础上利用DICTAT程序计算不同温度下星载电路板材料表面充电电位和内部最大电场强度,揭示温度对其内带电效应的影响规律,以期对卫星内带电效应的预示评估和防护设计提供参考。
绝缘材料的体积电阻率采用三电极法[14-15]测试,样品为Φ75 mm×1.6 mm的FR4环氧玻纤布基板,测试平台示意图如图1所示。将测试样品放在电极1和电极3之间,并在两个电极之间施加100 V电压,产生的电流由吉时利公司6517B型静电计来测量,同时底部的电极2连到保护端,以避免在测试中计入表面泄漏电流。
利用式(1)式(2)即可计算得到绝缘材料的体积电阻率。
R=VI
ρ=R×Ah
式(1)~(2)中:R为测试样品的电阻值;V为样品之间施加的电压值;I为静电计测得的电流值;ρ为样品的体积电阻率;h为样品厚度;A为样品的有效面积,其计算公式如式(3)所示。
A=π(d1+g)24
式(3)中:d1为电极3的直径,取75 mm;g为电极2半径与电极1半径的差值,本项试验中电极2内径为54 mm,电极1半径为50 mm,因此g取2 mm。
温控试验台的低温环境通过液氮制冷获得,高温环境通过电阻丝加热实现。试验中测试样品的温度通过热电阻进行测量。在温控试验台和测试样品之间放置了厚度为20 μm的聚酰亚胺绝缘膜(杜邦公司Kapton),以防止测试样品电极与温控试验台发生短路。
由于绝缘材料具有很高的电阻值,测试获得电流值很小(约为pA级)。考虑到热电阻置于测试样品上时将对电流测试信号产生影响,因此测试中设计了电阻率测试样品和温度测试样品(如图1所示),并同时置于温控试验台上。上述两个测试样品具有完全相同的结构和尺寸,区别在于电阻率测试样品可通过热电阻1连接温度测试装置,同时可通过三电极连接体积电阻率测试装置,而温度测试样品仅能通过热电阻2连接温度测试装置。
为验证电阻率测试样品和温度测试样品温度变化的一致性,试验前将热电阻1和热电阻2分别连接电阻率测试样品和温度测试样品,并通过改变温控试验台的温度(变化范围为-85~75℃),监测电阻率测试样品和温度测试样品的温度变化规律,测试结果如图2所示。
图2可以看出,测试样品的温度可控制在-50~60℃,且与试验台温度呈一定的线性关系,但在高温区和低温区的变化幅值均小于试验台温度变化,如试验台温度为-85℃时,测试样品仅为-50℃,试验台为75℃时,测试样品为60℃。这主要是由于测试样品与温控试验台之间放置了一层绝缘膜,使得热量在传导和吸收的过程中有一定的损耗,导致其温度变化小于试验台的变化幅值。
但总体而言,电阻率测试样品和温度测试样品的温度变化规律在随试验台温度变化过程中保持了很好的一致性。因此在体积电阻率测试试验中可利用温度测试样品的测试结果表征样品所处的温度,同时通过监测测试样品电阻率的测试结果获得不同温度下绝缘材料的体积电阻率。
利用上述测试方法在-50~60℃下对环氧玻纤布基板的体积电阻率进行测试,结果如图3所示。从图3可以看出,环氧玻纤布基板的体积电阻率随温度的升高呈减小的趋势,在最低温度(-50℃)下,测试样品的体积电阻率为1.64×1014 Ω·m;当温度上升至60℃时,体积电阻率为2.47×1012 Ω·m,体积电阻率变化范围超过两个数量级。这主要是由于绝缘材料的导电性能主要依赖于材料内部载流子的热运动,温度越高,载流子具有的能量越大,则更容易实现能带的跃迁,提高材料的导电能力,因此绝缘材料的体积电阻率随温度的上升而减小。
图3还可以看出,当温度低于0℃时,材料的体积电阻率随温度变化的幅值较小,即温度从-50℃升高至0℃时,体积电阻率仅减小了1/2;而当温度高于0℃时,材料的体积电阻率随温度的升高迅速降低,当温度升高至60℃时,体积电阻率减小为0℃时的1/32。根据导电理论,绝缘材料导电性能由离子电导和电子电导共同决定[16]。当温度较低时,绝缘材料中的离子因温度降低而减少迁移量,电子电导起主导作用,样品测试过程中内部电场强度较小(约为105 V/m),隧道效应不明显,因此主要依赖于导带电子通过热振动穿越势垒,实现其向相邻微晶带的跃迁形成电子电导[17],此时温度的升高仅能提升电子穿越势垒的概率,因此体积电阻率随温度变化的幅值较小。当温度上升至较高的范围内时,不仅电子电导随温度的升高而增加,离子迁移率也将随温度升高而大幅增加,离子电导逐渐成为决定绝缘材料导电性能的主要因素,因此体积电阻率随温度的上升而迅速减小。
绝缘材料的体积电阻率是影响卫星内带电效应的重要因素。而温度对绝缘材料体积电阻率影响明显,因此温度的变化也将直接影响卫星内带电过程。本文采用DICTAT程序仿真研究温度对绝缘材料内带电效应影响。
DICTAT程序是欧洲航天局(european space agency,ESA)为解决卫星内部绝缘材料充放电问题而开发的工程工具,该程序通过计算空间高能电子在绝缘材料内部传输和沉积时形成的电子电流,计算得到材料表面充电电位和内部最大电场。将该电场与绝缘材料的电气强度进行比较,以确定材料是否存在静电放电风险[18]。目前,DICTAT程序已应用于多种卫星绝缘材料的内带电效应风险评估[19-20]
图4为采用DICTAT程序计算不同温度下环氧玻纤布基板表面电位和内部电场的仿真模型。仿真模型中将绝缘材料置于空间高能电子辐照下,入射电子环境采用DICTAT程序自带的内带电通量模型(flux model for internal charging, FLUMIC)[21],其高能电子为能谱分布,能量范围为0.2~6.0 MeV,电子束流积分通量随能量变化如图5所示。
绝缘材料选取为环氧玻纤布基板,厚度为1.6 mm。材料设置为背面接地,其特性参数如密度、辐射诱导电导率相关参数(辐射诱导系数kp和剂量率系数Δ)、电气强度等均按DICTAT程序数据库默认值,具体数值如表1所示。
表1中电导率的数值是根据不同温度下体积电阻率的测试结果通过式(4)计算获得。
σ=1ρ
式(4)中:σ为电导率;ρ为体积电阻率。
-50~60℃下,环氧玻纤布基板体积电阻率的测试数据及对应的电导率如表2所示。
利用DICTAT程序计算获得的不同温度下环氧玻纤布基板表面充电电位随时间的变化规律如图6所示。从图6可以看出,当温度为-50~60℃时,环氧玻纤布基板的表面充电电位幅值随充电时间的增加均呈先上升后趋于稳定的趋势。以20℃温度为例,当高能电子刚开始辐照时,绝缘材料表面电位幅值迅速上升,当辐照近0.5 h时,电位幅值上升趋势变缓,当辐照时间为1 h时,表面充电电位已接近平衡状态,电位幅值逐渐稳定在1 850 V左右。表面充电电位变化规律与文献[22-23]中报道的试验结果相一致,从而验证了仿真分析结果的准确性。
对于不同温度下的材料,其达到平衡状态所需的充电时间随温度的升高而不断缩短,如-50℃时,材料需要约3.5 h才能达到平衡,0℃时充电时间减少为2.5 h,而60℃时仅需要0.2 h就能达到平衡;同时,处于不同温度环境下环氧玻纤布基板表面平衡电位的幅值随温度的升高呈不断下降的规律,当温度为-50℃时其表面平衡电位幅值高达6 500 V,0℃时表面平衡电位幅值下降为3 900 V,而温度为60℃时其表面平衡电位幅值仅为165 V。
图6还可以看出,温度的变化将直接影响绝缘材料的表面平衡电位幅值及充电平衡时间。造成该现象的原因是在卫星内带电过程中,绝缘材料的平衡电位取决于材料内部积累的电荷量,而积累的电荷量为空间电子注入材料内部的电荷量与材料自身泄漏电荷量的差值。当空间辐照电子环境一定时,绝缘材料的注入电荷量保持不变,此时材料内部积累电荷量与泄漏电荷量相关,而温度越高绝缘材料的电导率越大,泄漏电荷量越多,则材料内部积累的电荷量越少,因此表面电位幅值随温度的升高而不断下降。
绝缘材料充电平衡的时间取决于电荷的注入速率和泄漏速率的平衡。刚开始充电时,电荷注入速率大于泄漏速率,空间辐射电子在材料内部出现电荷积累,但因为FLUMIC模型中低能电子的数量远大于高能电子数量,所以电荷主要积累在靠近电子注入端,从而在材料内部形成由接地端指向电子注入端的电场(如图7所示),在该电场作用下材料积累电荷向接地端移动,电荷泄漏速率增大。随着充电时间的增加,材料积累的电荷量不断增大,内部电场强度也随之增大,电荷泄漏速率也逐渐增大,最终泄漏速率与注入速率相等,此时材料积累的电荷量保持稳定状态,表面充电电位也达到平衡。由于温度低时绝缘材料的电导率较小,在刚开始充电时的电荷泄漏速率也较小,因此需要较长的充电时间在材料内部积累更多的电荷量,从而构建更强电场以增大电荷的泄漏速率,使材料达到充电平衡状态;而温度高时绝缘材料的电导率大,在充电开始时已具有较大的电荷泄漏速率,因此达到充电平衡所需的时间更少。
图8为-50~60℃下环氧玻纤布基板材料内部最大充电电场强度随温度的变化规律。从图8可以看出,当温度为-50℃时,材料内部电场强度最大,为1.24×107 V/m;随着温度的升高,电场强度不断减小,当温度升高至60℃时,电场强度仅为2.82×105 V/m。这一变化规律与绝缘材料表面充电电位的相类似。
从静电放电风险方面来看:当温度为20℃时,材料内部最大电场强度约为3×106 V/m,静电放电风险较小,当温度为0℃时,最大电场强度约为8×106 V/m,已接近静电放电场强阈值1×107 V/m,存在一定静电放电风险;当温度低于0℃时,材料内部最大场强已超过放电阈值,存在较大的静电放电风险。因此,内带电效应防护设计中应考虑绝缘材料的温度控制,对于星载电路板应保障其工作于20℃以上,以确保不发生静电放电。
(1)环氧玻纤布基板的体积电阻率随温度的升高而减小,在-50~60℃下,测试样品的最小体积电阻率为2.47×1012 Ω·m,最大体积电阻率为1.64×1014 Ω·m,其变化范围超过两个数量级;同时当温度低于0℃时,材料体积电阻率随温度变化的幅值较小,而温度高于0℃时体积电阻率随温度的升高迅速降低。
(2)环氧玻纤布基板的表面充电电位幅值和内部电场强度均随温度的降低而增大,最高电位幅值可达6 500 V,最大场强为1.24×107 V/m;同时研究表明当温度低于0℃时环氧玻纤布基板内部最大场强超出放电阈值,存在较大的静电放电风险。
  • 装备预研重点实验室基金项目(6142205200102)
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2023年第56卷第6期
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doi: 10.16790/j.cnki.1009-9239.im.2023.06.015
  • 接收时间:2022-07-31
  • 首发时间:2025-11-21
  • 出版时间:2023-06-20
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  • 收稿日期:2022-07-31
  • 修回日期:2022-09-04
基金
装备预研重点实验室基金项目(6142205200102)
作者信息
    1许昌学院 化工与材料学院,河南 许昌 461000
    2许绝电工股份有限公司,河南 许昌 461000
    3北京东方计量测试研究所,北京 100086

通讯作者:

王金晓(1982-),女(汉族),河南禹州人,高级工程师,主要从事空间功能材料与环境适应性的研究。
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2种不同金属材料的力学参数

Family
属数
Number of
genus
种数
Number of
species
占总种数比例
Percentage of
total species (%)

Genus
种数
Number of
species
占总种数比例
Percentage of total
species (%)
鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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