Article(id=1241795752469532949, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1241795749348967189, articleNumber=null, orderNo=null, doi=10.16790/j.cnki.1009-9239.im.2021.08.015, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1600444800000, receivedDateStr=2020-09-19, revisedDate=1606665600000, revisedDateStr=2020-11-30, acceptedDate=null, acceptedDateStr=null, onlineDate=1773996778837, onlineDateStr=2026-03-20, pubDate=1629388800000, pubDateStr=2021-08-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1773996778837, onlineIssueDateStr=2026-03-20, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1773996778837, creator=13701087609, updateTime=1773996778837, updator=13701087609, issue=Issue{id=1241795749348967189, tenantId=1146029695717560320, journalId=1149653034449285133, year='2021', volume='54', issue='8', pageStart='1', pageEnd='114', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1773996778094, creator=13701087609, updateTime=1773997690758, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1241799577397953390, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1241795749348967189, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1241799577397953391, tenantId=1146029695717560320, journalId=1149653034449285133, issueId=1241795749348967189, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=94, endPage=101, ext={EN=ArticleExt(id=1241795754507964701, articleId=1241795752469532949, tenantId=1146029695717560320, journalId=1149653034449285133, language=EN, title=Study on Ablation of Buffer Layer in High Voltage XLPE Cable Induced by Concentrated Radial Current, columnId=1192878364340924664, journalTitle=Insulating Materials, columnName=Test and Analysis, runingTitle=null, highlight=null, articleAbstract=

In order to study the ablation mechanism of buffer layer of corrugation aluminum (Al) sheath high voltage cross-linked polyethylene (XLPE), firstly, we analyzed a ablation failure of 110 kV XLPE insulated cable, and proposed that the concentrated radial current was the cause of ablation failure. Secondly, a simulation model of the faulty cable was established. The current density and its distribution of the contact part of buffer layer and corrugated Al sheath were simulated, and the simulation results were proved by model experiment and calculation. It was found that the size and distribution of radial current were affected by the embedded depth of Al sheath in the buffer layer and the volume resistivity of the buffer layer. Finally, simulation experiments were designed to prove that the radial current concentrated was one of the causes of buffer layer ablation, and the experimental conditions of the simulated ablation experiment were controlled in the thermostat. The surface morphology of the experimental sample and the ablated Al sheath were compared by optical microscope. The results show that the ablation process in the ablation experiment is the same as that in the actual faulty cable, and with the increase of the current density in buffer layer, the ablation start time decreases. This paper reveals the physical mechanism of radial current concentration in the ablation fault of corrugated Al sheath, which provides guideline for relevant fault diagnosis and protection.

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为研究皱纹铝护套高压交联聚乙烯绝缘电缆缓冲层烧蚀机理,首先,通过对发生烧蚀的110 kV XLPE绝缘电缆进行故障分析,提出电缆径向电流集中是导致烧蚀故障的原因。其次,建立故障电缆的仿真模型,计算缓冲层与皱纹铝护套接触部分的电流密度最大值及其分布情况,并通过模型试验与公式计算验证仿真结果,发现皱纹铝护套波谷嵌入缓冲层的深度和缓冲层体积电阻率影响着径向电流的大小与分布。最后,通过设计模拟试验,证明径向电流集中是导致缓冲层烧蚀的原因之一,并在恒温箱中对模拟烧蚀试验的环境条件进行控制,通过偏光显微镜对比试验样品和烧蚀铝护套的表面形貌。结果表明:模拟烧蚀试验中发生的烧蚀过程与实际故障电缆中的烧蚀过程相同,且随着缓冲层中电流密度最大值的增大,烧蚀的起始时间缩短。本文揭示了皱纹铝护套烧蚀故障径向电流集中的物理机理,为相关故障诊断及防护提供了理论和试验依据。

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刘宏亮(1990-),男(汉族),辽宁朝阳人,工程师,主要从事电缆检测技术的研究。

高景晖(1984-),男(汉族),陕西西安人,教授,主要从事电气绝缘及电介质理论的研究。

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刘宏亮(1990-),男(汉族),辽宁朝阳人,工程师,主要从事电缆检测技术的研究。

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刘宏亮(1990-),男(汉族),辽宁朝阳人,工程师,主要从事电缆检测技术的研究。

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高景晖(1984-),男(汉族),陕西西安人,教授,主要从事电气绝缘及电介质理论的研究。

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高景晖(1984-),男(汉族),陕西西安人,教授,主要从事电气绝缘及电介质理论的研究。

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闫洪瑞, journalName=科技创新导报, refType=null, unstructuredReference=高翾宇,王然,闫洪瑞,.浅谈电力电缆绝缘的分类与发展[J].科技创新导报,2019,16(23):26,28., articleTitle=浅谈电力电缆绝缘的分类与发展, refAbstract=null), Reference(id=1245062205616538212, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1241795752469532949, doi=null, pmid=null, pmcid=null, year=2003, volume=null, issue=4, pageStart=44, pageEnd=45,48, url=null, language=null, rfNumber=[5], rfOrder=4, authorNames=杨俊家, 吴宗新, 孙青, journalName=电线电缆, refType=null, unstructuredReference=杨俊家,吴宗新,孙青.高压XLPE绝缘电力电缆皱纹铝护套的应用[J].电线电缆,2003(4):44-45,48., articleTitle=高压XLPE绝缘电力电缆皱纹铝护套的应用, refAbstract=null), Reference(id=1245062205717201511, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1241795752469532949, doi=null, pmid=null, pmcid=null, year=2019, volume=36, issue=2, pageStart=119, pageEnd=120, url=null, language=null, rfNumber=[6], rfOrder=5, authorNames=吴俊鹏, journalName=集成电路应用, refType=null, unstructuredReference=吴俊鹏.高压单芯电缆外护套烧蚀故障分析[J].集成电路应用,2019,36(2):119-120., articleTitle=高压单芯电缆外护套烧蚀故障分析, refAbstract=null), Reference(id=1245062205809476204, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1241795752469532949, doi=null, pmid=null, pmcid=null, year=2019, volume=null, issue=5, pageStart=5, pageEnd=10, url=null, language=null, rfNumber=[7], rfOrder=6, authorNames=王伟, 欧阳本红, 徐明忠, journalName=电线电缆, refType=null, unstructuredReference=王伟,欧阳本红,徐明忠,.电缆缓冲层烧蚀现象初步分析[J].电线电缆,2019(5):5-10., articleTitle=电缆缓冲层烧蚀现象初步分析, refAbstract=null), Reference(id=1245062205897556590, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1241795752469532949, doi=null, pmid=null, pmcid=null, year=null, volume=2009, issue=19, pageStart=91, pageEnd=null, url=null, language=null, rfNumber=[8], rfOrder=7, authorNames=吕彤, journalName=科技创新导报, refType=null, unstructuredReference=吕彤.电力电缆烧蚀原因分析及防范措施[J].科技创新导报,2009(19):91., articleTitle=电力电缆烧蚀原因分析及防范措施, 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Cause analysis of aging ablation on sheath of 110 kV single core high voltage cable[C]// 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena. Washington, America: IEEE,2019., articleTitle=Cause analysis of aging ablation on sheath of 110 kV single core high voltage cable, refAbstract=null), Reference(id=1245062206606393990, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1241795752469532949, doi=null, pmid=null, pmcid=null, year=2019, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[16], rfOrder=15, authorNames=JIANG L, XIN Y, ZHAO X Y, journalName=null, refType=null, unstructuredReference=JIANG L, XIN Y, ZHAO X Y, et al. Study on the mechanism of buffer layer ablation on high voltage XLPE Insulated cable with corrugation aluminum sheath[C]//International Conference on Insulated Power Cables. 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组件电导率/(S/m)相对介电常数厚度/半径/mm
导体5.99×10716.85
导体屏蔽4.97×10-2530.01.47
绝缘1.83×10-152.315.78
绝缘屏蔽4.83×10-2325.01.35
缓冲层4.25×10-3330.04.00
铝护套3.45×1072.00
外护套1.62×10-14150.03.50
外半导电层4.56×10-2140.00.50
), ArticleFig(id=1245062204815426130, tenantId=1146029695717560320, journalId=1149653034449285133, articleId=1241795752469532949, language=CN, label=表1, caption=

110 kV XLPE绝缘电缆模型参数

, figureFileSmall=null, figureFileBig=null, tableContent=
组件电导率/(S/m)相对介电常数厚度/半径/mm
导体5.99×10716.85
导体屏蔽4.97×10-2530.01.47
绝缘1.83×10-152.315.78
绝缘屏蔽4.83×10-2325.01.35
缓冲层4.25×10-3330.04.00
铝护套3.45×1072.00
外护套1.62×10-14150.03.50
外半导电层4.56×10-2140.00.50
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径向电流集中诱发的高压交联聚乙烯电缆缓冲层烧蚀研究
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刘宏亮 1 , 刘若溪 1 , 赵西元 2 , 任志刚 1 , 陈平 1 , 李华春 1 , 高景晖 2
绝缘材料 | 测试与分析 2021,54(8): 94-101
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绝缘材料 | 测试与分析 2021, 54(8): 94-101
径向电流集中诱发的高压交联聚乙烯电缆缓冲层烧蚀研究
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刘宏亮1, 刘若溪1, 赵西元2, 任志刚1, 陈平1, 李华春1, 高景晖2
作者信息
  • 1国网北京市电力公司,北京 100075
  • 2西安交通大学 电力设备电气绝缘国家重点实验室,陕西 西安 710049
  • 刘宏亮(1990-),男(汉族),辽宁朝阳人,工程师,主要从事电缆检测技术的研究。

    高景晖(1984-),男(汉族),陕西西安人,教授,主要从事电气绝缘及电介质理论的研究。

Study on Ablation of Buffer Layer in High Voltage XLPE Cable Induced by Concentrated Radial Current
Hongliang LIU1, Ruoxi LIU1, Xiyuan ZHAO2, Zhigang REN1, Ping CHEN1, Huachun LI1, Jinghui GAO2
Affiliations
  • 1State Grid Beijing Electric Power Company, Beijing 100075, China
  • 2State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an 710049, China
出版时间: 2021-08-20 doi: 10.16790/j.cnki.1009-9239.im.2021.08.015
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为研究皱纹铝护套高压交联聚乙烯绝缘电缆缓冲层烧蚀机理,首先,通过对发生烧蚀的110 kV XLPE绝缘电缆进行故障分析,提出电缆径向电流集中是导致烧蚀故障的原因。其次,建立故障电缆的仿真模型,计算缓冲层与皱纹铝护套接触部分的电流密度最大值及其分布情况,并通过模型试验与公式计算验证仿真结果,发现皱纹铝护套波谷嵌入缓冲层的深度和缓冲层体积电阻率影响着径向电流的大小与分布。最后,通过设计模拟试验,证明径向电流集中是导致缓冲层烧蚀的原因之一,并在恒温箱中对模拟烧蚀试验的环境条件进行控制,通过偏光显微镜对比试验样品和烧蚀铝护套的表面形貌。结果表明:模拟烧蚀试验中发生的烧蚀过程与实际故障电缆中的烧蚀过程相同,且随着缓冲层中电流密度最大值的增大,烧蚀的起始时间缩短。本文揭示了皱纹铝护套烧蚀故障径向电流集中的物理机理,为相关故障诊断及防护提供了理论和试验依据。

高压XLPE绝缘电缆  /  缓冲层烧蚀  /  径向电流集中  /  模拟烧蚀实验

In order to study the ablation mechanism of buffer layer of corrugation aluminum (Al) sheath high voltage cross-linked polyethylene (XLPE), firstly, we analyzed a ablation failure of 110 kV XLPE insulated cable, and proposed that the concentrated radial current was the cause of ablation failure. Secondly, a simulation model of the faulty cable was established. The current density and its distribution of the contact part of buffer layer and corrugated Al sheath were simulated, and the simulation results were proved by model experiment and calculation. It was found that the size and distribution of radial current were affected by the embedded depth of Al sheath in the buffer layer and the volume resistivity of the buffer layer. Finally, simulation experiments were designed to prove that the radial current concentrated was one of the causes of buffer layer ablation, and the experimental conditions of the simulated ablation experiment were controlled in the thermostat. The surface morphology of the experimental sample and the ablated Al sheath were compared by optical microscope. The results show that the ablation process in the ablation experiment is the same as that in the actual faulty cable, and with the increase of the current density in buffer layer, the ablation start time decreases. This paper reveals the physical mechanism of radial current concentration in the ablation fault of corrugated Al sheath, which provides guideline for relevant fault diagnosis and protection.

HV XLPE insulated cable  /  ablation of buffer layer  /  concentrated radial current  /  ablation experiment
刘宏亮, 刘若溪, 赵西元, 任志刚, 陈平, 李华春, 高景晖. 径向电流集中诱发的高压交联聚乙烯电缆缓冲层烧蚀研究. 绝缘材料, 2021 , 54 (8) : 94 -101 . DOI: 10.16790/j.cnki.1009-9239.im.2021.08.015
Hongliang LIU, Ruoxi LIU, Xiyuan ZHAO, Zhigang REN, Ping CHEN, Huachun LI, Jinghui GAO. Study on Ablation of Buffer Layer in High Voltage XLPE Cable Induced by Concentrated Radial Current[J]. Insulating Materials, 2021 , 54 (8) : 94 -101 . DOI: 10.16790/j.cnki.1009-9239.im.2021.08.015
随着全球城市化的发展进程不断加快,电能的需求日益增长,这对电力传输中应用的电缆系统提出了更高的要求[1-2]。挤出型XLPE绝缘电缆凭借其电气性能优良、传输容量大、质量轻、制造工艺简单、安装与维护方便等优势,成为高压交流电力电缆的主要形式[3-4]。波纹铝护套由于其具有良好的弯曲性能而被广泛用于高压XLPE绝缘电缆,并成为中国高压XLPE绝缘电缆的主流护套结构[5]
然而,近年来在波纹铝护套结构的电缆中出现缓冲层烧蚀引发的故障,严重危害电网的可靠性与安全性[6-8]。目前针对缓冲层烧蚀故障的研究主要集中在缓冲层局部放电与局部过热方面,宫瑞磊等[9]研究了110 kV XLPE绝缘电缆皱纹铝护套松动时的情况,发现当缓冲层与皱纹铝护套之间存在间隙时,会出现放电现象;李陈莹等[10]归纳了3起缓冲层烧蚀故障,认为绝缘屏蔽外层与皱纹铝护套之间的放电是造成烧蚀的主要原因,并对缓冲层性能提出了相关要求;汪传斌等[11]仿真研究了单芯电缆受重力作用而在电缆上方出现缓冲层与铝护套间隙的情况,认为这会导致电场畸变出现放电现象;杨娟等[12]分析了高压XLPE绝缘电缆的阻水结构,认为现有的电缆阻水结构可能导致典型的局部放电;吴科等[13]建立了电缆本体局部放电模型,发现绝缘屏蔽层与铝护套间的间隙是导致绝缘屏蔽层烧蚀击穿的重要原因,并对如何降低电势差提出了改进措施。刘顺成等[14]通过试验得出外护套环流带来的发热现象是导致缓冲层烧蚀的原因之一。XIN Y等[15]通过仿真与试验研究了外护套环流的大小对缓冲层烧蚀的影响,发现环流越大,烧蚀越严重。
虽然在上述两种烧蚀机理方面进行了大量研究,但是局部放电与局部过热现象只有在电缆烧蚀部位存在一定缺陷或电缆其他部位出现故障导致护套环流激增等特殊情况下才会出现[16],缓冲层烧蚀故障的原因依然没有统一的结论。
根据标准AEIC-CS9-06:2006的内容,在电缆运行过程中有6种径向电流流过缓冲层[17],皱纹铝护套结构可能导致电缆系统中径向电流在缓冲层部分区域集中,这种现象可能会成为诱发缓冲层烧蚀故障的原因之一。本文通过仿真模拟、径向电流集中的模拟烧蚀试验、形貌观察等方法研究径向电流集中对缓冲层烧蚀的影响,以期为预防缓冲层烧蚀故障提供参考。
在某110 kV高压XLPE绝缘电缆线路运行过程中出现电缆本体击穿故障,电缆顶端出现直径约为11 cm的击穿点,周围护套开裂脱落,如图1所示。
对故障电缆进行解体后发现,皱纹铝护套和缓冲层上都出现了烧蚀痕迹,上面粘附着黄色粉末,如图2所示。从图2可以观察到烧蚀痕迹都集中出现在缓冲层与皱纹铝护套紧密接触的地方,未接触的区域没有烧蚀痕迹,说明缓冲层烧蚀与缓冲层和皱纹铝护套之间的接触情况直接相关,缓冲层与皱纹铝护套之间的接触如图3所示。
图3中可以看出,皱纹铝护套只有在波谷位置才和缓冲层接触,这会导致径向电流在接触部分集中,接触部分的电流密度增大。根据AEIC-CS9-06:2006中的规定,电缆运行过程中缓冲层内流经6种径向电流,其中包括正常运行时的漏电流、电容电流和故障情况下的故障电流、相间不平衡电流、中性点不平衡电流和浪涌电流。电缆正常运行时,缓冲层与皱纹铝护套之间等效电路如图4所示[18]
图4R为皱纹铝护套与缓冲层之间的接触电阻,主要与皱纹铝护套波谷嵌入缓冲层的深度有关;RHXCH分别为缓冲层的等效电阻与等效容抗,在形状不变的前提下,主要与缓冲层的体积电阻率和相对介电常数有关。为了明确这些因素对流经缓冲层径向电流的影响规律,本研究建立110 kV电缆仿真模型,并通过模型试验与计算对仿真结果进行验证。
为了探究皱纹铝护套波谷嵌入缓冲层的深度、缓冲层体积电阻率和相对介电常数对径向电流分布和大小的影响,利用Comsol多物理场有限元分析软件建立110 kV XLPE绝缘电缆的仿真模型,分别针对这3种因素进行仿真、模型试验与计算,探究其对应的径向电流分布与电流密度数值大小情况。
在仿真开始之前,需要在Comsol中建立110 kV XLPE绝缘电缆的几何模型,电缆的横截面如图5所示[14]
通过实际测量与查阅电缆手册可以确定各部分的尺寸和参数[19],其中缓冲层的参数手册中没有详细规定,因此根据相关标准与测试方法,对不同厂家的电缆缓冲层参数进行测试并取平均值[20-21],得到电缆各层参数如表1所示。
此外,在不影响仿真计算精度的前提下,采用以下假设来简化计算过程:
(1)假定材料各项参数在仿真过程中不随外加电压、电流及其他材料参数的变化而改变。
(2)假定电缆中各部分结合紧密,重力对电缆各部分之间的接触无影响,故可采用二维轴对称模型进行仿真。
(3)在实际电缆中,皱纹铝护套和外护套之间有一层沥青,因沥青较薄,且处于电缆外端,对缓冲层和皱纹铝护套之间的电场无影响,故在建模中忽略。
根据表1所示电缆各组件的参数及上述假设,在Comsol中建立二维轴对称模型,如图6所示。
仿真中设定导体对地电压为相电压64 kV,频率为50 Hz,皱纹铝护套外侧接地,分别针对嵌入缓冲层深度、缓冲层体积电阻率、缓冲层相对介电常数的变化进行电流密度仿真。
保持各组件参数不变,改变皱纹铝护套嵌入缓冲层的深度,变化范围为0.01~1.00 mm,其中电流密度仿真图如图7所示,电流密度最大值随嵌入缓冲层深度的变化如图8所示。
图7可以看出,径向电流都集中在缓冲层与皱纹铝护套波谷接触的地方,与之前的设想一致。从图8可以看出,随着皱纹铝护套波谷嵌入缓冲层深度的增大,电流密度最大值减小,这是因为随着嵌入缓冲层深度的增大,缓冲层与皱纹铝护套波谷接触部分的面积大幅增加,使得电流密度最大值减小,径向电流集中程度减弱。电流密度最大值约为1.6 A/m2,最小值约为0.2 A/m2
为了探究缓冲层体积电阻率对缓冲层内电流密度最大值的影响,保持其他组件各参数不变,在一定嵌入深度的条件下,改变缓冲层的电导率从10-6 S/m逐渐增大至1 S/m,电流密度最大值随缓冲层电导率的变化趋势如图9所示。
图9可以看出,随着缓冲层电导率的增大,缓冲层与皱纹铝护套波谷接触部分的电流密度最大值也增大,且嵌入深度越小,电流密度随缓冲层电导率变化的幅度越大。
根据对不同厂家电缆缓冲层相对介电常数的测试结果,缓冲层相对介电常数为200~600,为了探究相对介电常数对缓冲层内电流密度最大值的影响,保持缓冲层电导率为4.25×10-3 S/m不变,改变缓冲层相对介电常数从10逐渐增大至1 000,电流密度最大值随缓冲层相对介电常数的变化趋势如图10所示。从图10可以看出,在一定嵌入深度下,缓冲层与皱纹铝护套波谷接触部分的电流密度最大值几乎不随缓冲层相对介电常数变化。
为了验证2.2.1的仿真结果,开展模型试验研究,试验装置示意图如图11所示。
对110 kV电缆中使用的皱纹铝护套波谷部分进行测量计算,并据此设计制作半圆柱型铝电极,保证铝电极与缓冲层试样接触部分的曲率半径与实际皱纹铝护套波谷部分相同。假设铝电极嵌入缓冲层的深度为h,铝电极曲率半径已知为R,铝电极长度已知为L,则缓冲层与铝电极的接触面积S式(1)所示。
S=2LRarccos1-hR
因为在实际电缆中XLPE绝缘承受绝大部分电压,使得缓冲层与皱纹铝护套之间电压几乎不发生变化,所以模型试验中可保持电压不变。从图8可知,当皱纹铝护套波谷嵌入缓冲层深度为0.5 mm时,电流密度最大值约为0.3 A/m2,对应模型试验中的电流值约为54 μA。调整电源电压,使得半圆柱型铝电极嵌入缓冲层深度为0.5 mm时,电流表示数为54 μA,保持电压值不变,调整嵌入缓冲层深度,记录不同嵌入深度下电流表的示数,在每一嵌入深度下进行5组实验,取平均值,再结合式(1)得到的面积,即可求得嵌入深度对应的电流密度最大值,结果如图12所示。
对比图8图12可知,试验结果中电流密度随嵌入深度变化的趋势与仿真结果相同,即随着嵌入深度的增大,电流密度逐渐减小。
根据图4可知,缓冲层可以等效为一个电阻与一个电容的并联结构,其中等效电阻主要受缓冲层体积电阻率的影响,等效电容值主要受缓冲层相对介电常数的影响。根据2.3.1中分析,在实际电缆中,XLPE绝缘承受了绝大部分电压,使得缓冲层-皱纹铝护套部分的分压很小,几乎不随缓冲层自身以及缓冲层与皱纹铝护套之间接触情况的变化而变化,因此可以认为缓冲层与皱纹铝护套之间的电压为定值。
当嵌入深度一定时,缓冲层部分可等效为同轴圆柱体,假设同轴圆柱内径为r1,外径为r2,长度为L,则沿径向的电阻如式(2)所示。
RH=ρ2πLlnr2r1
代入表1中数据可得式(3)
RH=0.017ρL
可见缓冲层的等效电阻RH会随着缓冲层体积电阻率的增大而增大,即会随着缓冲层电导率的增大而减小,又因为电压不变,所以径向电流会随着缓冲层电导率的增大而增大,在嵌入深度一定的情况下,电流密度最大值随缓冲层电导率的增大而增大,这与2.2.2中仿真得到的趋势相同。
缓冲层的等效电容可以由式(4)计算[22]
CH=2πε0εrLlnr2r1
式(4)中:ε0为真空介电常数,取8.85×10-12 F/m;εr为缓冲层相对介电常数。
容抗XCH满足式(5)
XCH=12πfCH
式(5)中:f为电场频率,即50 Hz。
式(4)式(5)联立,带入表1中的数据,可得式(6)
XCH=3.6×107Lεr
L取值较大,对比式(3)式(6)可知,XCH远远大于缓冲层等效电阻RH,所以RHXCH并联时可忽略XCH,因此电流密度最大值几乎不随缓冲层相对介电常数的变化而变化,这与2.2.2中仿真结果相符。
通过对仿真结果进行分析可知,皱纹铝护套波谷嵌入缓冲层越深、缓冲层体积电阻率越大,则接触部分的电流密度最大值越小,径向电流越不集中,反之,皱纹铝护套波谷嵌入缓冲层越浅、缓冲层体积电阻率越小,则电流密度最大值越大,径向电流越集中。为了进一步说明电流密度最大值的变化情况,即径向电流集中程度对缓冲层烧蚀故障的影响,进行模拟烧蚀实验。
为了证明径向电流集中是导致缓冲层烧蚀的原因之一,先在某电缆厂家进行受潮电缆对比试验,选取4段长度为2 m的电缆段,置于潮湿环境中自然受潮6个月,剖开后检查,均未发现缓冲层和铝带异常,皱纹铝护套内表面光亮如新。同时选取长度为50 m的电缆,使缓冲层与皱纹铝护套之间的接触不连续,在潮湿环境中加1.5倍额定电压,为期50天,期间电缆温度正常,未检测到局部放电信号,加压结束后发现缓冲层与皱纹铝护套接触部分出现烧蚀痕迹,如图13所示。
根据上述对比试验,在未加电压的情况下没有出现缓冲层烧蚀现象,在加电压且未出现局部放电与过热情况下依然出现缓冲层烧蚀痕迹,一定程度上说明加电压后因不连续接触而出现的径向电流集中可能是诱发缓冲层烧蚀的原因之一。
为了进一步明确缓冲层与皱纹铝护套接触部分的径向电流集中对缓冲层烧蚀造成的影响,在恒温恒湿箱中进行模拟烧蚀试验,试验装置示意图如图14所示。
在该试验装置中,恒温箱保证整个试验过程中温度保持恒定;重力载荷用于使缓冲层处于和实际电缆中一样的受压情况,对故障电缆进行测量,皱纹铝护套内径为77.38 mm,包括导体、绝缘屏蔽,XLPE绝缘和缓冲层的外径为78.90 mm,通过计算可得皱纹铝护套波谷嵌入缓冲层深度为0.76 mm,据此选择合适的载荷,使缓冲层具有相同的受压深度;上电极选用和皱纹铝护套材质相同的1060铝板,下电极选用直径为25 mm的不锈钢圆柱电极,避免受烧蚀影响;环氧树脂用于支撑和绝缘防护,同时用电流表实时监测流过缓冲层的电流值。
因为缓冲层烧蚀是一个缓慢的过程,在试验中需要对烧蚀过程进行加速来获得缓冲层烧蚀随电流密度变化的规律,所以需要提高试验中的电流密度值与试验温度值。已知电缆实际运行时缓冲层处温度在10~20℃之间,试验中为了加速烧蚀过程,同时考虑电缆敷设环境的影响以及电缆外护层、防腐层等对热量扩散的抑制作用,设定试验温度为30℃;根据仿真结果可知,电流密度最大值为1.6 A/m2,试验中为了加速烧蚀过程并获得变化规律,在该值10倍附近进行模拟烧蚀试验,设定电流密度最大值为10、16、20、30 A/m2
下电极直径为25 mm,计算可得其面积为 5×10-4 m2,将电流密度最大值转化为电流值分别为5、8、10、15 mA。试验前,先使缓冲层吸收足量的水分,然后调节电源,使得通过缓冲层的电流分别为上述值,在恒温箱中持续通电并计时,当上电极铝板发生烧蚀时,试验停止,记录烧蚀发生所用的时间。
设置不同的电流值,分别进行模拟烧蚀试验并记录烧蚀起始时间,同时通过偏光显微镜对比观察故障电缆皱纹铝护套和模拟烧蚀试验后上电极铝板的表面形貌,如图15所示,烧蚀时间随着电流密度的变化趋势如图16所示。
图15可以看出,模拟试验后的上电极铝板上出现的烧蚀痕迹和实际故障电缆铝护套上的烧蚀痕迹高度相似,都出现了黄色粉末与孔洞,说明模拟试验中发生的烧蚀过程与实际故障电缆中发生的烧蚀过程一致。从图16可以看出,随着缓冲层中电流密度最大值的增大,缓冲层烧蚀时间大幅缩短,说明电流密度最大值增大对缓冲层烧蚀有加速作用,通过试验说明,径向电流集中会诱发缓冲层烧蚀,同时会使得缓冲层烧蚀过程加快。
(1)对110 kV XLPE绝缘电缆缓冲层烧蚀故障进行解体,发现烧蚀痕迹集中在缓冲层与皱纹铝护套波谷紧密接触的地方,因此认为缓冲层烧蚀故障与皱纹铝护套的特殊结构带来的径向电流集中有关,分析发现皱纹铝护套波谷嵌入缓冲层的深度与缓冲层自身性能影响着径向电流的大小与集中情况。
(2)通过对实际电缆进行建模仿真,确定了影响径向电流大小与集中情况的因素及规律。发现皱纹铝护套波谷嵌入缓冲层越深,缓冲层体积电阻率越大,接触部分的电流密度最大值越小,径向电流越不集中;皱纹铝护套波谷嵌入缓冲层越浅,缓冲层体积电阻率越小,接触部分的电流密度最大值越大,径向电流越集中。
(3)通过在电缆厂家进行的模型电缆对比试验,发现在没有局部放电信号与温度异常的情况下依然存在缓冲层烧蚀现象,说明径向电流集中是诱发缓冲层烧蚀故障的原因之一;设计并进行模拟烧蚀试验,通过偏光显微镜对比烧蚀试验中的铝板样品和故障电缆中铝护套的烧蚀痕迹,证明模拟烧蚀试验中的烧蚀过程与实际故障电缆中的烧蚀过程相同;通过记录铝板样品在不同电流密度最大值下的烧蚀起始时间,发现大电流密度对烧蚀过程有加速作用,即径向电流集中对烧蚀过程有加速促进作用。
(4)通过仿真与试验的结果可知,径向电流集中带来的局部大电流密度是诱发缓冲层烧蚀的原因之一,而径向电流集中的情况与皱纹铝护套和缓冲层的接触情况及缓冲层自身性能相关。为了避免局部大电流密度的出现,在电缆制造、运输、敷设与运行的过程中应保证皱纹铝护套与缓冲层之间的紧密接触,同时缓冲层的体积电阻率不宜过小。
  • 国家电网公司总部科技项目(520201190008)
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doi: 10.16790/j.cnki.1009-9239.im.2021.08.015
  • 接收时间:2020-09-19
  • 首发时间:2026-03-20
  • 出版时间:2021-08-20
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  • 收稿日期:2020-09-19
  • 修回日期:2020-11-30
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国家电网公司总部科技项目(520201190008)
作者信息
    1国网北京市电力公司,北京 100075
    2西安交通大学 电力设备电气绝缘国家重点实验室,陕西 西安 710049
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2种不同金属材料的力学参数

Family
属数
Number of
genus
种数
Number of
species
占总种数比例
Percentage of
total species (%)

Genus
种数
Number of
species
占总种数比例
Percentage of total
species (%)
鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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