Article(id=1154049703114166392, tenantId=1146029695717560320, journalId=1146031654075715584, issueId=1154049103748125137, articleNumber=null, orderNo=null, doi=10.13234/j.issn.2095-2805.2024.3.78, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=null, receivedDate=1706630400000, receivedDateStr=2024-01-31, revisedDate=1709136000000, revisedDateStr=2024-02-29, acceptedDate=1709222400000, acceptedDateStr=2024-03-01, onlineDate=1753076490428, onlineDateStr=2025-07-21, pubDate=1716998400000, pubDateStr=2024-05-30, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1753076490428, onlineIssueDateStr=2025-07-21, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1753076490428, creator=13701087609, updateTime=1753076490428, updator=13701087609, issue=Issue{id=1154049103748125137, tenantId=1146029695717560320, journalId=1146031654075715584, year='2024', volume='22', issue='3', pageStart='1', pageEnd='306', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=0, createTime=1753076347529, creator=13701087609, updateTime=1753780989436, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1157004586184695853, tenantId=1146029695717560320, journalId=1146031654075715584, issueId=1154049103748125137, language=EN, specialIssueTitle=, coverIllustrator=, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1157004586184695854, tenantId=1146029695717560320, journalId=1146031654075715584, issueId=1154049103748125137, language=CN, specialIssueTitle=, coverIllustrator=, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=78, endPage=86, ext={EN=ArticleExt(id=1154049703516819577, articleId=1154049703114166392, tenantId=1146029695717560320, journalId=1146031654075715584, language=EN, title=Electro-thermal Performance Optimization and Evaluation of Automotive SiC Power Module, columnId=1154049691676303617, journalTitle=Journal of Power Supply, columnName=Packaging Design and Optimization, runingTitle=null, highlight=null, articleAbstract=
Owing to their advantages in switching speed, temperature characteristics and voltage withstand capability, silicon carbide (SiC) power modules are gradually applied in the motor controllers of electric vehicles. As a core component of electric vehicles, the motor controller demands high electro-thermal characteristics of power modules, posing a significant challenge to SiC packaging. In this paper, the mainstream HybridPACK Drive module packaging is taken as an example, the driver and direct bonded copper(DBC) layout are optimized, and the copper wire bonding technology is introduced to balance the module's electro-thermal performance and reliability. In addition, the response surface methodology is used to optimize the elliptical Pin-Fin heat sink, thereby enhancing the module's heat dissipation performance. Finally, prototypes of SiC power modules before and after optimization were fabricated for comparison, and a double-pulse test setup and a power back-to-back test setup were established respectively to evaluate the electro-thermal performance of the two approaches. Experimental results indicate that when the chip spacing was equal to half the die width, the optimized power module can achieve a superior thermal performance while maintaining the electrical characteristics.
, correspAuthors=null, authorNote=null, correspAuthorsNote=null, copyrightStatement=null, copyrightOwner=null, extLink=null, articleAbsUrl=null, sourceXml=null, magXml=null, pdfUrl=null, pdf=null, pdfFileSize=null, pdfExtLink=null, richHtmlUrl=null, mobilePdfUrl=null, reviewReport=null, pdfFirstPage=null, abstractGraph=null, abstractGraphContent=null, abstractVideo=null, citation=null, cebUrl=null, magXmlContent=null, mapNumber=null, authorCompany=null, fund=null, authors=null, authorsList=Rongyao MA, Kaifeng TANG, Xiaofei PAN, Zhifeng SHAO, Peng SUN, Zheng ZENG), CN=ArticleExt(id=1154049746860757411, articleId=1154049703114166392, tenantId=1146029695717560320, journalId=1146031654075715584, language=CN, title=车用碳化硅功率模块的电热性能优化与评估, columnId=1154049691818909955, journalTitle=电源学报, columnName=封装设计与优化, runingTitle=null, highlight=null, articleAbstract=
由于在开关速度、温度特性和耐压能力等方面的优势,SiC(silicon carbide)功率模块开始逐步应用于电动汽车的电机控制器。电机控制器是电动汽车的核心部件,对功率模块的电热特性要求较高,因此对SiC 封装提出了很大的挑战。以主流的HybridPACK Drive 模块封装为例,优化设计了模块的驱动回路和DBC(direct bonded copper)布局,并引入了铜线键合技术,协同优化了模块的电热性能和可靠性。此外,采用响应面法优化了椭圆形Pin-Fin 散热基板,提升了模块的散热性能。最后,分别制造了优化前、后的 SiC 功率模块样机作为对比,搭建了双脉冲和功率对拖实验平台,评估了2种方案的电热性能。实验结果显示,当芯片交错距离为芯片宽度的1/2时,所优化的功率模块可以在兼顾电性能的同时,实现更优异的热性能。
, correspAuthors=null, authorNote=null, correspAuthorsNote=null, copyrightStatement=null, copyrightOwner=null, extLink=null, articleAbsUrl=null, sourceXml=xJbW2qUCyt4ESZHklmVYug==, magXml=muWwyUdoUve8YG9RO4htRw==, pdfUrl=null, pdf=wzVgZmTKdwSWkwfzYfI2zw==, pdfFileSize=null, pdfExtLink=null, richHtmlUrl=null, mobilePdfUrl=null, reviewReport=null, pdfFirstPage=null, abstractGraph=null, abstractGraphContent=null, abstractVideo=null, citation=null, cebUrl=null, magXmlContent=xRc56//qfFvz11YQsBgCLQ==, mapNumber=null, authorCompany=null, fund=null, authors=
 |
马荣耀(1983-),男,博士,高级工程师。研究方向:SiC 功率器件。E-mail:marongyao1@cq.crmicro.com。 |
唐开锋(1987-),男,中国电源学会会员,本科,工程师。研究方向:SiC 功率器件。E-mail: tangkaifeng@cq.crmicro.com。
潘效飞(1984-),男,博士,高级工程师。研究方向:SiC 功率模块封装。E-mail: panxiaofei011@163.com。
邵志峰(1982-),男,硕士,高级工程师。研究方向:SiC 功率模块封装。E-mail: shaozf@hj.crmicro.com。
孙鹏(1996-),男,中国电源学会学生会员,博士研究生。研究方向:SiC 功率模块封装。E-mail:sunpeng_96@cqu.edu.cn。
曾正(1986-),男,中国电源学会会员,通信作者,博士,教授。研究方向:SiC 功率模块封装。E-mail: zengerzheng@cqu.edu.cn。
, authorsList=马荣耀, 唐开锋, 潘效飞, 邵志峰, 孙鹏, 曾正)}, authors=[Author(id=1154049747896750528, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, orderNo=0, firstName=null, middleName=null, lastName=null, nameCn=null, orcid=null, stid=null, country=null, authorPic=null, dead=0, email=marongyao1@cq.crmicro.com, emailSecond=null, emailThird=null, correspondingAuthor=0, authorType=1, ext={EN=AuthorExt(id=1154049747976442308, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, authorId=1154049747896750528, language=EN, stringName=Rongyao MA, firstName=Rongyao, middleName=null, lastName=MA, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
1, 2, address=
1 School of Microelectronics and Communication Engineering Chongqing University Chongqing 400044 China
2 China Resources Microelectronics (Chongqing) Limited Chongqing 401332 China, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null), CN=AuthorExt(id=1154049748022579654, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, authorId=1154049747896750528, language=CN, stringName=马荣耀, firstName=null, middleName=null, lastName=null, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
1, 2, address=
1 重庆大学 微电子与通信工程学院 重庆 400044
2 华润微电子(重庆)有限公司 重庆 401332, bio={"img":"WW4RN80g/7t4mDX2x6oMAw==","content":"
马荣耀(1983-),男,博士,高级工程师。研究方向:SiC 功率器件。E-mail:marongyao1@cq.crmicro.com。
"}, bioImg=WW4RN80g/7t4mDX2x6oMAw==, bioContent=
马荣耀(1983-),男,博士,高级工程师。研究方向:SiC 功率器件。E-mail:marongyao1@cq.crmicro.com。
, aboutCorrespAuthor=null)}, companyList=[AuthorCompany(id=1154049747603149233, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, xref=1, ext=[AuthorCompanyExt(id=1154049747607343538, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747603149233, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
1 School of Microelectronics and Communication Engineering Chongqing University Chongqing 400044 China), AuthorCompanyExt(id=1154049747615732147, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747603149233, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
1 重庆大学 微电子与通信工程学院 重庆 400044)]), AuthorCompany(id=1154049747674452404, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, xref=2, ext=[AuthorCompanyExt(id=1154049747682841013, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747674452404, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
2 China Resources Microelectronics (Chongqing) Limited Chongqing 401332 China), AuthorCompanyExt(id=1154049747691229622, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747674452404, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
2 华润微电子(重庆)有限公司 重庆 401332)])]), Author(id=1154049748072911305, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, orderNo=1, firstName=null, middleName=null, lastName=null, nameCn=null, orcid=null, stid=null, country=null, authorPic=null, dead=0, email=tangkaifeng@cq.crmicro.com, emailSecond=null, emailThird=null, correspondingAuthor=0, authorType=1, ext={EN=AuthorExt(id=1154049748156797388, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, authorId=1154049748072911305, language=EN, stringName=Kaifeng TANG, firstName=Kaifeng, middleName=null, lastName=TANG, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
2, address=
2 China Resources Microelectronics (Chongqing) Limited Chongqing 401332 China, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null), CN=AuthorExt(id=1154049748223906254, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, authorId=1154049748072911305, language=CN, stringName=唐开锋, firstName=null, middleName=null, lastName=null, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
2, address=
2 华润微电子(重庆)有限公司 重庆 401332, bio={"content":"
唐开锋(1987-),男,中国电源学会会员,本科,工程师。研究方向:SiC 功率器件。E-mail: tangkaifeng@cq.crmicro.com。
"}, bioImg=null, bioContent=
唐开锋(1987-),男,中国电源学会会员,本科,工程师。研究方向:SiC 功率器件。E-mail: tangkaifeng@cq.crmicro.com。
, aboutCorrespAuthor=null)}, companyList=[AuthorCompany(id=1154049747674452404, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, xref=2, ext=[AuthorCompanyExt(id=1154049747682841013, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747674452404, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
2 China Resources Microelectronics (Chongqing) Limited Chongqing 401332 China), AuthorCompanyExt(id=1154049747691229622, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747674452404, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
2 华润微电子(重庆)有限公司 重庆 401332)])]), Author(id=1154049748282626513, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, orderNo=2, firstName=null, middleName=null, lastName=null, nameCn=null, orcid=null, stid=null, country=null, authorPic=null, dead=0, email=panxiaofei011@163.com, emailSecond=null, emailThird=null, correspondingAuthor=0, authorType=1, ext={EN=AuthorExt(id=1154049748387484117, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, authorId=1154049748282626513, language=EN, stringName=Xiaofei PAN, firstName=Xiaofei, middleName=null, lastName=PAN, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
3, 4, address=
3 School of Electrical Engineering Chongqing University Chongqing 400044 China
4 China Resources Runan Technologies(Chongqing) Co., Ltd Chongqing 400015 China, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null), CN=AuthorExt(id=1154049748446204375, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, authorId=1154049748282626513, language=CN, stringName=潘效飞, firstName=null, middleName=null, lastName=null, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
3, 4, address=
3 重庆大学 电气工程学院 重庆 400044
4 华润润安科技(重庆)有限公司 重庆 400015, bio={"content":"
潘效飞(1984-),男,博士,高级工程师。研究方向:SiC 功率模块封装。E-mail: panxiaofei011@163.com。
"}, bioImg=null, bioContent=
潘效飞(1984-),男,博士,高级工程师。研究方向:SiC 功率模块封装。E-mail: panxiaofei011@163.com。
, aboutCorrespAuthor=null)}, companyList=[AuthorCompany(id=1154049747754144184, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, xref=3, ext=[AuthorCompanyExt(id=1154049747758338489, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747754144184, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
3 School of Electrical Engineering Chongqing University Chongqing 400044 China), AuthorCompanyExt(id=1154049747766727098, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747754144184, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
3 重庆大学 电气工程学院 重庆 400044)]), AuthorCompany(id=1154049747821253051, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, xref=4, ext=[AuthorCompanyExt(id=1154049747825447356, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747821253051, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
4 China Resources Runan Technologies(Chongqing) Co., Ltd Chongqing 400015 China), AuthorCompanyExt(id=1154049747829641661, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747821253051, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
4 华润润安科技(重庆)有限公司 重庆 400015)])]), Author(id=1154049748492341722, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, orderNo=3, firstName=null, middleName=null, lastName=null, nameCn=null, orcid=null, stid=null, country=null, authorPic=null, dead=0, email=shaozf@hj.crmicro.com, emailSecond=null, emailThird=null, correspondingAuthor=0, authorType=1, ext={EN=AuthorExt(id=1154049748584616413, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, authorId=1154049748492341722, language=EN, stringName=Zhifeng SHAO, firstName=Zhifeng, middleName=null, lastName=SHAO, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
2, address=
2 China Resources Microelectronics (Chongqing) Limited Chongqing 401332 China, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null), CN=AuthorExt(id=1154049748643336670, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, authorId=1154049748492341722, language=CN, stringName=邵志峰, firstName=null, middleName=null, lastName=null, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
2, address=
2 华润微电子(重庆)有限公司 重庆 401332, bio={"content":"
邵志峰(1982-),男,硕士,高级工程师。研究方向:SiC 功率模块封装。E-mail: shaozf@hj.crmicro.com。
"}, bioImg=null, bioContent=
邵志峰(1982-),男,硕士,高级工程师。研究方向:SiC 功率模块封装。E-mail: shaozf@hj.crmicro.com。
, aboutCorrespAuthor=null)}, companyList=[AuthorCompany(id=1154049747674452404, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, xref=2, ext=[AuthorCompanyExt(id=1154049747682841013, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747674452404, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
2 China Resources Microelectronics (Chongqing) Limited Chongqing 401332 China), AuthorCompanyExt(id=1154049747691229622, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747674452404, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
2 华润微电子(重庆)有限公司 重庆 401332)])]), Author(id=1154049748706251232, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, orderNo=4, firstName=null, middleName=null, lastName=null, nameCn=null, orcid=null, stid=null, country=null, authorPic=null, dead=0, email=sunpeng_96@cqu.edu.cn, emailSecond=null, emailThird=null, correspondingAuthor=0, authorType=1, ext={EN=AuthorExt(id=1154049748773360099, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, authorId=1154049748706251232, language=EN, stringName=Peng SUN, firstName=Peng, middleName=null, lastName=SUN, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
3, address=
3 School of Electrical Engineering Chongqing University Chongqing 400044 China, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null), CN=AuthorExt(id=1154049748832080357, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, authorId=1154049748706251232, language=CN, stringName=孙鹏, firstName=null, middleName=null, lastName=null, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
3, address=
3 重庆大学 电气工程学院 重庆 400044, bio={"content":"
孙鹏(1996-),男,中国电源学会学生会员,博士研究生。研究方向:SiC 功率模块封装。E-mail:sunpeng_96@cqu.edu.cn。
"}, bioImg=null, bioContent=
孙鹏(1996-),男,中国电源学会学生会员,博士研究生。研究方向:SiC 功率模块封装。E-mail:sunpeng_96@cqu.edu.cn。
, aboutCorrespAuthor=null)}, companyList=[AuthorCompany(id=1154049747754144184, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, xref=3, ext=[AuthorCompanyExt(id=1154049747758338489, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747754144184, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
3 School of Electrical Engineering Chongqing University Chongqing 400044 China), AuthorCompanyExt(id=1154049747766727098, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747754144184, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
3 重庆大学 电气工程学院 重庆 400044)])]), Author(id=1154049748903383528, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, orderNo=5, firstName=null, middleName=null, lastName=null, nameCn=null, orcid=null, stid=null, country=null, authorPic=null, dead=0, email=zengerzheng@cqu.edu.cn, emailSecond=null, emailThird=null, correspondingAuthor=0, authorType=1, ext={EN=AuthorExt(id=1154049748970492395, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, authorId=1154049748903383528, language=EN, stringName=Zheng ZENG, firstName=Zheng, middleName=null, lastName=ZENG, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
3, address=
3 School of Electrical Engineering Chongqing University Chongqing 400044 China, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null), CN=AuthorExt(id=1154049749020824043, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, authorId=1154049748903383528, language=CN, stringName=曾正, firstName=null, middleName=null, lastName=null, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
3, address=
3 重庆大学 电气工程学院 重庆 400044, bio={"content":"
曾正(1986-),男,中国电源学会会员,通信作者,博士,教授。研究方向:SiC 功率模块封装。E-mail: zengerzheng@cqu.edu.cn。
"}, bioImg=null, bioContent=
曾正(1986-),男,中国电源学会会员,通信作者,博士,教授。研究方向:SiC 功率模块封装。E-mail: zengerzheng@cqu.edu.cn。
, aboutCorrespAuthor=null)}, companyList=[AuthorCompany(id=1154049747754144184, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, xref=3, ext=[AuthorCompanyExt(id=1154049747758338489, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747754144184, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
3 School of Electrical Engineering Chongqing University Chongqing 400044 China), AuthorCompanyExt(id=1154049747766727098, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747754144184, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
3 重庆大学 电气工程学院 重庆 400044)])])], keywords=[Keyword(id=1154049749310231022, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, orderNo=1, keyword=Silicon carbide metal-oxide-semiconductor field effect transistor(SiC MOSFET)), Keyword(id=1154049749364756975, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, orderNo=2, keyword=copper wire interconnec-tion), Keyword(id=1154049749410894320, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, orderNo=3, keyword=response surface methodology), Keyword(id=1154049749461225969, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, orderNo=4, keyword=direct bonded copper(DBC) layout), Keyword(id=1154049749511557618, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, orderNo=1, keyword=SiC MOSFET), Keyword(id=1154049749561889267, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, orderNo=2, keyword=铜线互联), Keyword(id=1154049749616415220, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, orderNo=3, keyword=响应面法), Keyword(id=1154049749666746869, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, orderNo=4, keyword=DBC 布局)], refs=[Reference(id=1154049752065888790, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2017, volume=64, issue=10, pageStart=8193, pageEnd=8205, url=null, language=null, rfNumber=[1], rfOrder=0, authorNames=She Xu, Huang A Q, Lucía Ó, et al., journalName=IEEE Transactions on Industrial Electronics, refType=null, unstructuredReference=
She Xu,
Huang A Q,
Lucía Ó,
et al.. Review of silicon carbide power devices and their applications[J].
IEEE Transactions on Industrial Electronics,
2017.
64(10): 8193-8205., articleTitle=Review of silicon carbide power devices and their applications, refAbstract=null), Reference(id=1154049752124609047, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2014, volume=29, issue=5, pageStart=2155, pageEnd=2163, url=null, language=null, rfNumber=[2], rfOrder=1, authorNames=Millán J, Godignon P, Perpiñà X, et al., journalName=IEEE Transactions on Power Electronics, refType=null, unstructuredReference=
Millán J,
Godignon P,
Perpiñà X,
et al.. A survey of wide bandgap power semiconductor devices[J].
IEEE Transactions on Power Electronics,
2014.
29(5): 2155-2163., articleTitle=A survey of wide bandgap power semiconductor devices, refAbstract=null), Reference(id=1154049752191717912, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2016, volume=14, issue=4, pageStart=32, pageEnd=38, url=null, language=null, rfNumber=[3], rfOrder=2, authorNames=李磊, 宁圃奇, 温旭辉, journalName=电源学报, refType=null, unstructuredReference=李磊, 宁圃奇, 温旭辉, 等. 1 200 V 碳化硅 MOSFET 与硅 IGBT 器件特性对比性研究[J].
电源学报,
2016.
14(4): 32-38., articleTitle=1 200 V 碳化硅 MOSFET 与硅 IGBT 器件特性对比性研究, refAbstract=null), Reference(id=1154049752246243865, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2016, volume=14, issue=4, pageStart=32, pageEnd=38, url=null, language=null, rfNumber=[3], rfOrder=3, authorNames=Li Lei, Ning Puqi, Wen Xuhui, et al., journalName=Journal of Power Supply, refType=null, unstructuredReference=
Li Lei,
Ning Puqi,
Wen Xuhui,
et al.. Comparative performance study of 1 200 V SiC MOSFET and Si IGBT[J].
Journal of Power Supply,
2016.
14(4): 32-38 (in Chinese)., articleTitle=Comparative performance study of 1 200 V SiC MOSFET and Si IGBT, refAbstract=null), Reference(id=1154049752304964122, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2019, volume=34, issue=4, pageStart=703, pageEnd=716, url=null, language=null, rfNumber=[4], rfOrder=4, authorNames=王莉娜, 邓洁, 杨军一, journalName=电工技术学报, refType=null, unstructuredReference=王莉娜, 邓洁, 杨军一, 等. Si 和 SiC 功率器件结温提取技术现状及展望[J].
电工技术学报,
2019.
34(4): 703-716., articleTitle=Si 和 SiC 功率器件结温提取技术现状及展望, refAbstract=null), Reference(id=1154049752359490075, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2019, volume=34, issue=4, pageStart=703, pageEnd=716, url=null, language=null, rfNumber=[4], rfOrder=5, authorNames=Wang Lina, Deng Jie, Yang Junyi, et al., journalName=Transactions of China Electrotechnical Society, refType=null, unstructuredReference=
Wang Lina,
Deng Jie,
Yang Junyi,
et al.. Junction temperature extraction methods for Si and SiC power devices: A review and possible alternatives[J].
Transactions of China Electrotechnical Society,
2019.
34(4): 703-716 (in Chinese)., articleTitle=Junction temperature extraction methods for Si and SiC power devices: A review and possible alternatives, refAbstract=null), Reference(id=1154049752409821724, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2021, volume=36, issue=20, pageStart=4204, pageEnd=4214, url=null, language=null, rfNumber=[5], rfOrder=6, authorNames=邵天骢, 郑琼林, 李志君, journalName=电工技术学报, refType=null, unstructuredReference=邵天骢, 郑琼林, 李志君, 等. 基于干扰动态响应机理的SiC MOSFET 驱动设计[J].
电工技术学报,
2021.
36(20): 4204-4214., articleTitle=基于干扰动态响应机理的SiC MOSFET 驱动设计, refAbstract=null), Reference(id=1154049752464347677, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2021, volume=36, issue=20, pageStart=4204, pageEnd=4214, url=null, language=null, rfNumber=[5], rfOrder=7, authorNames=Shao Tiancong, Zheng Trillion Q, Li Zhijun, et al., journalName=Transactions of China Electrotechnical Society, refType=null, unstructuredReference=
Shao Tiancong,
Zheng Trillion Q,
Li Zhijun,
et al.. SiC MOSFET gate driver design based on interference dynamic response mechanism[J].
Transactions of China Electrotechnical Society,
2021.
36(20): 4204-4214 (in Chinese)., articleTitle=SiC MOSFET gate driver design based on interference dynamic response mechanism, refAbstract=null), Reference(id=1154049752514679326, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2019, volume=34, issue=2, pageStart=1181, pageEnd=1196, url=null, language=null, rfNumber=[6], rfOrder=8, authorNames=Zhang Lei, Yuan Xibo, Wu Xiaojie, et al., journalName=IEEE Transactions on Power Electronics, refType=null, unstructuredReference=
Zhang Lei,
Yuan Xibo,
Wu Xiaojie,
et al.. Performance evaluation of high-power SiC MOSFET modules in comparison to Si IGBT modules[J].
IEEE Transactions on Power Electronics,
2019.
34(2): 1181-1196., articleTitle=Performance evaluation of high-power SiC MOSFET modules in comparison to Si IGBT modules, refAbstract=null), Reference(id=1154049752569205279, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2017, volume=2, issue=3, pageStart=170, pageEnd=186, url=null, language=null, rfNumber=[7], rfOrder=9, authorNames=Chen Cai, Luo Fang, Kang Yong, journalName=CPSS Transactions on Power Electronics and Applications, refType=null, unstructuredReference=
Chen Cai,
Luo Fang,
Kang Yong. A review of SiC power module packaging: Layout, material system and integration[J].
CPSS Transactions on Power Electronics and Applications,
2017.
2(3): 170-186., articleTitle=A review of SiC power module packaging: Layout, material system and integration, refAbstract=null), Reference(id=1154049752623731232, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2020, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[8], rfOrder=10, authorNames=曾正, journalName=null, refType=null, unstructuredReference=曾正. SiC 功率器件的封装测试与系统集成[M]. 北京: 科学出版社,
2020., articleTitle=SiC 功率器件的封装测试与系统集成, refAbstract=null), Reference(id=1154049752682451489, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2020, volume=null, issue=null, pageStart=null, pageEnd=null, url=null, language=null, rfNumber=[8], rfOrder=11, authorNames=Zeng Zheng, journalName=null, refType=null, unstructuredReference=
Zeng Zheng. Packaging, Characterizition, and Integration of SiC Power Devices[M]. Beijing: Science Press,
2020. (in Chinese)., articleTitle=Packaging, Characterizition, and Integration of SiC Power Devices, refAbstract=null), Reference(id=1154049752736977442, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2020, volume=8, issue=1, pageStart=239, pageEnd=255, url=null, language=null, rfNumber=[9], rfOrder=12, authorNames=Lee H, Smet V, Tummala R, journalName=IEEE Journal of Emerging and Selected Topics in Power Electronics, refType=null, unstructuredReference=
Lee H,
Smet V,
Tummala R. A review of SiC power module packaging technologies: Challenges, advances, and emerging issues[J].
IEEE Journal of Emerging and Selected Topics in Power Electronics,
2020.
8(1): 239-255., articleTitle=A review of SiC power module packaging technologies: Challenges, advances, and emerging issues, refAbstract=null), Reference(id=1154049752791503395, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2019, volume=null, issue=null, pageStart=272, pageEnd=276, url=null, language=null, rfNumber=[10], rfOrder=13, authorNames=null, journalName=2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WBPDA), refType=null, unstructuredReference=Overcurrent for aluminum bonding wires in WBG power semiconductors[C]//
2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WBPDA),
2019: 272-276., articleTitle=Overcurrent for aluminum bonding wires in WBG power semiconductors, refAbstract=null), Reference(id=1154049752837640740, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2018, volume=38, issue=16, pageStart=4823, pageEnd=4835, url=null, language=null, rfNumber=[11], rfOrder=14, authorNames=李晓玲, 曾正, 陈昊, journalName=中国电机工程学报, refType=null, unstructuredReference=李晓玲, 曾正, 陈昊, 等. SiC、Si、混合功率模块封装对比评估与失效分析[J].
中国电机工程学报,
2018.
38(16): 4823-4835., articleTitle=SiC、Si、混合功率模块封装对比评估与失效分析, refAbstract=null), Reference(id=1154049752887972389, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2018, volume=38, issue=16, pageStart=4823, pageEnd=4835, url=null, language=null, rfNumber=[11], rfOrder=15, authorNames=Li Xiaoling, Zeng Zheng, Chen Hao, et al., journalName=Proceedings of the CSEE, refType=null, unstructuredReference=
Li Xiaoling,
Zeng Zheng,
Chen Hao,
et al.. Comparative package evaluation and failure mode analysis of SiC, Si, and hybrid power modules[J].
Proceedings of the CSEE,
2018.
38(16): 4823-4835 (in Chinese)., articleTitle=Comparative package evaluation and failure mode analysis of SiC, Si, and hybrid power modules, refAbstract=null), Reference(id=1154049752946692646, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2021, volume=null, issue=null, pageStart=1, pageEnd=6, url=null, language=null, rfNumber=[12], rfOrder=16, authorNames=null, journalName=IEEE PCIM Europe digital days 2021; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. Online, refType=null, unstructuredReference=Wire bonding stress analysis under short-circuit tests for SiC MOSFETS[C]//
IEEE PCIM Europe digital days 2021; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. Online,
2021: 1-6., articleTitle=Wire bonding stress analysis under short-circuit tests for SiC MOSFETS, refAbstract=null), Reference(id=1154049753001218599, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2019, volume=null, issue=null, pageStart=1, pageEnd=3, url=null, language=null, rfNumber=[13], rfOrder=17, authorNames=null, journalName=2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), refType=null, unstructuredReference=Bonding wires for power modules: From aluminum to copper[C]//
2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC),
2019: 1-3., articleTitle=Bonding wires for power modules: From aluminum to copper, refAbstract=null), Reference(id=1154049753068327464, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2016, volume=31, issue=10, pageStart=7171, pageEnd=7182, url=null, language=null, rfNumber=[14], rfOrder=18, authorNames=Reigosa PD, Wang Huai, Yang Yongheng, et al., journalName=IEEE Transactions on Power Electronics, refType=null, unstructuredReference=
Reigosa PD,
Wang Huai,
Yang Yongheng,
et al.. Prediction of bond wire fatigue of IGBTs in a PV inverter under a long-term operation[J].
IEEE Transactions on Power Electronics,
2016.
31(10): 7171-7182., articleTitle=Prediction of bond wire fatigue of IGBTs in a PV inverter under a long-term operation, refAbstract=null), Reference(id=1154049753135436329, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2016, volume=6, issue=5, pageStart=814, pageEnd=821, url=null, language=null, rfNumber=[15], rfOrder=19, authorNames=ArjmE
, Agyakwa P A, Corfield M R, et al., journalName=IEEE Transactions on Components, Packaging and Manufacturing Technology, refType=null, unstructuredReference=
ArjmE ,
Agyakwa P A,
Corfield M R,
et al.. Predicting lifetime of thick Al wire bonds using signals obtained from ultrasonic generator[J].
IEEE Transactions on Components, Packaging and Manufacturing Technology,
2016.
6(5): 814-821., articleTitle=Predicting lifetime of thick Al wire bonds using signals obtained from ultrasonic generator, refAbstract=null), Reference(id=1154049753202545194, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, doi=null, pmid=null, pmcid=null, year=2020, volume=null, issue=null, pageStart=2216, pageEnd=2220, url=null, language=null, rfNumber=[16], rfOrder=20, authorNames=null, journalName=2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus), refType=null, unstructuredReference=Effects of gold-aluminum intermetallic compounds on chip wire bonding interconnections reliability[C]//
2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus),
2020: 2216-2220., articleTitle=Effects of gold-aluminum intermetallic compounds on chip wire bonding interconnections reliability, refAbstract=null)], funds=[Fund(id=1154049751952642580, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, awardId=52177169, language=EN, fundingSource=National Natural Science Foundation of China(52177169), fundOrder=null, country=null), Fund(id=1154049752002974229, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, awardId=52177169, language=CN, fundingSource=国家自然科学基金资助项目(52177169), fundOrder=null, country=null)], companyList=[AuthorCompany(id=1154049747603149233, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, xref=1, ext=[AuthorCompanyExt(id=1154049747607343538, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747603149233, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
1 School of Microelectronics and Communication Engineering Chongqing University Chongqing 400044 China), AuthorCompanyExt(id=1154049747615732147, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747603149233, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
1 重庆大学 微电子与通信工程学院 重庆 400044)]), AuthorCompany(id=1154049747674452404, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, xref=2, ext=[AuthorCompanyExt(id=1154049747682841013, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747674452404, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
2 China Resources Microelectronics (Chongqing) Limited Chongqing 401332 China), AuthorCompanyExt(id=1154049747691229622, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747674452404, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
2 华润微电子(重庆)有限公司 重庆 401332)]), AuthorCompany(id=1154049747754144184, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, xref=3, ext=[AuthorCompanyExt(id=1154049747758338489, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747754144184, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
3 School of Electrical Engineering Chongqing University Chongqing 400044 China), AuthorCompanyExt(id=1154049747766727098, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747754144184, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
3 重庆大学 电气工程学院 重庆 400044)]), AuthorCompany(id=1154049747821253051, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, xref=4, ext=[AuthorCompanyExt(id=1154049747825447356, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747821253051, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
4 China Resources Runan Technologies(Chongqing) Co., Ltd Chongqing 400015 China), AuthorCompanyExt(id=1154049747829641661, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, companyId=1154049747821253051, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
4 华润润安科技(重庆)有限公司 重庆 400015)])], figs=[ArticleFig(id=1154049750316863990, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 1, caption=
Structure of motor controller in electrical vehicle, figureFileSmall=I1KSGUjA4sukYVq6SL9zqQ==, figureFileBig=+9zu9ySUf/oH0ulfoOB1LA==, tableContent=null), ArticleFig(id=1154049750367195639, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图1, caption=
电动汽车电机控制器的结构, figureFileSmall=I1KSGUjA4sukYVq6SL9zqQ==, figureFileBig=+9zu9ySUf/oH0ulfoOB1LA==, tableContent=null), ArticleFig(id=1154049750438498808, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 2, caption=
Gate layout design of power module with or without Kelvin source, figureFileSmall=0OsciItpqzRWuD09fF8SxQ==, figureFileBig=032UDnx+tCfvzodgEL5+0w==, tableContent=null), ArticleFig(id=1154049750493024761, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图2, caption=
有、无开尔文源的模块栅极回路设计, figureFileSmall=0OsciItpqzRWuD09fF8SxQ==, figureFileBig=032UDnx+tCfvzodgEL5+0w==, tableContent=null), ArticleFig(id=1154049750547550714, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 3, caption=
Comparison of switching loss of SiC power module with and without Kelvin source, figureFileSmall=Vq8dFQv/PHhTja6uFrdIMw==, figureFileBig=pdhFU7ANS0rP926TyRN2mg==, tableContent=null), ArticleFig(id=1154049750593688059, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图3, caption=
有、无开尔文源的 $\mathrm{{SiC}}$ 功率模块开关损耗对比, figureFileSmall=Vq8dFQv/PHhTja6uFrdIMw==, figureFileBig=pdhFU7ANS0rP926TyRN2mg==, tableContent=null), ArticleFig(id=1154049750648214012, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 4, caption=
Current capacity of bonding wires and DTS copper wire interconnection technology, figureFileSmall=jkhFUKWdXMF1SuR92muNnQ==, figureFileBig=v42PGxLwIuaTDS+CKiOPOQ==, tableContent=null), ArticleFig(id=1154049750690157053, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图4, caption=
键合线通流能力和 DTS 铜线互联技术, figureFileSmall=jkhFUKWdXMF1SuR92muNnQ==, figureFileBig=v42PGxLwIuaTDS+CKiOPOQ==, tableContent=null), ArticleFig(id=1154049750744683006, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 5, caption=
Different packaging layouts of power module, figureFileSmall=7P/woK5sqThyvc0Yqd5IZg==, figureFileBig=2Kxc+oWEEVCsS+EiONMTDw==, tableContent=null), ArticleFig(id=1154049750790820351, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图5, caption=
功率模块的不同封装布局, figureFileSmall=7P/woK5sqThyvc0Yqd5IZg==, figureFileBig=2Kxc+oWEEVCsS+EiONMTDw==, tableContent=null), ArticleFig(id=1154049750841152000, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 6, caption=
Electro-thermal performance evaluation of module at different chip spacings, figureFileSmall=GEdEVsM9V8Q1grMZlWiFSw==, figureFileBig=VLlgsMziKBCrir1yUBOH/Q==, tableContent=null), ArticleFig(id=1154049750887289345, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图6, caption=
不同交错距离下的模块电热性能评估, figureFileSmall=GEdEVsM9V8Q1grMZlWiFSw==, figureFileBig=VLlgsMziKBCrir1yUBOH/Q==, tableContent=null), ArticleFig(id=1154049750933426690, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 7, caption=
Comparison of electro-thermal performance between different packaging layouts, figureFileSmall=X40QR7j8SKxhdGEryYiWGA==, figureFileBig=3V4z4RVTgLbG/vx/qNi3Dg==, tableContent=null), ArticleFig(id=1154049750983758339, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图7, caption=
不同封装布局的电-热性能对比, figureFileSmall=X40QR7j8SKxhdGEryYiWGA==, figureFileBig=3V4z4RVTgLbG/vx/qNi3Dg==, tableContent=null), ArticleFig(id=1154049751038284292, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 8, caption=
Parameter optimization of elliptical Pin-Fin heat sink, figureFileSmall=gK4VCjKyFI1T/2L2tq1KEw==, figureFileBig=AXuyP5HWZoAJhj8f/hPSfg==, tableContent=null), ArticleFig(id=1154049751092810245, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图8, caption=
椭圆 Pin-Fin 散热器参数优化过程, figureFileSmall=gK4VCjKyFI1T/2L2tq1KEw==, figureFileBig=AXuyP5HWZoAJhj8f/hPSfg==, tableContent=null), ArticleFig(id=1154049751138947590, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 9, caption=
Prototypes of SiC power module, figureFileSmall=to1boJOM7rOv2XUfX/1Pmw==, figureFileBig=f24c9yRHOU6Ok94yc4Kn3Q==, tableContent=null), ArticleFig(id=1154049751189279239, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图9, caption=
SiC 功率模块样机, figureFileSmall=to1boJOM7rOv2XUfX/1Pmw==, figureFileBig=f24c9yRHOU6Ok94yc4Kn3Q==, tableContent=null), ArticleFig(id=1154049751239610888, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 10, caption=
Testing principle of parasitic inductance and setup of double-pulse test for SiC power module, figureFileSmall=WXtKANpoyxirheYn172RMA==, figureFileBig=PQkhLQI7K7ZNMahDWrEf/g==, tableContent=null), ArticleFig(id=1154049751289942537, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图10, caption=
SiC 功率模块的寄生电感测试原理和双脉冲实验平台, figureFileSmall=WXtKANpoyxirheYn172RMA==, figureFileBig=PQkhLQI7K7ZNMahDWrEf/g==, tableContent=null), ArticleFig(id=1154049751340274186, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 11, caption=
Results of double-pulse test for SiC power module, figureFileSmall=BsPYHErc1cZK1lPjmwXJsA==, figureFileBig=Uz6muLGnzg86naGEvujw2A==, tableContent=null), ArticleFig(id=1154049751390605835, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图11, caption=
SiC 功率模块的双脉冲实验结果, figureFileSmall=BsPYHErc1cZK1lPjmwXJsA==, figureFileBig=Uz6muLGnzg86naGEvujw2A==, tableContent=null), ArticleFig(id=1154049751445131788, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 12, caption=
Toplolgical structure and setup of back-to-back test for SiC power module, figureFileSmall=JPbKL258h/ez8+ytZy3P3Q==, figureFileBig=eAi/QuUbmy9pkQ6+bChJkw==, tableContent=null), ArticleFig(id=1154049751499657741, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图12, caption=
SiC 功率模块的拓扑结构和对拖实验平台, figureFileSmall=JPbKL258h/ez8+ytZy3P3Q==, figureFileBig=eAi/QuUbmy9pkQ6+bChJkw==, tableContent=null), ArticleFig(id=1154049751558377998, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Fig. 13, caption=
Maximum measured junction temperature of different SiC power modules, figureFileSmall=oHL9cZUrjM5oDR+EP4Lb7Q==, figureFileBig=5jajLWfZw/MxNt0hCwSCLA==, tableContent=null), ArticleFig(id=1154049751612903951, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=图13, caption=
不同 SiC 功率模块的实测最高结温, figureFileSmall=oHL9cZUrjM5oDR+EP4Lb7Q==, figureFileBig=5jajLWfZw/MxNt0hCwSCLA==, tableContent=null), ArticleFig(id=1154049751667429904, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Tab. 1, caption=
Parameters and technologies for prototypes of SiC power module, figureFileSmall=null, figureFileBig=null, tableContent=
| 模块 | 额定 | 芯片 | 芯片 | 衬底 | 芯片 | 基板 |
| 功率 | 并联数 | 互联 | 类型 | 焊接 |
| A | 1200 V/ | 6 | 铝线 | ZTA | 银烧结 | 圆形 |
| 600 A | 键合 | 基板 | Pin-Fin |
| B | 1200 V/ | 6 | DTS | AMB | 银烧结 | 椭圆 |
| 600 A | 技术 | 基板 | Pin-Fin |
), ArticleFig(id=1154049751730344465, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=表1, caption=
SiC 模块样机的参数与工艺, figureFileSmall=null, figureFileBig=null, tableContent=
| 模块 | 额定 | 芯片 | 芯片 | 衬底 | 芯片 | 基板 |
| 功率 | 并联数 | 互联 | 类型 | 焊接 |
| A | 1200 V/ | 6 | 铝线 | ZTA | 银烧结 | 圆形 |
| 600 A | 键合 | 基板 | Pin-Fin |
| B | 1200 V/ | 6 | DTS | AMB | 银烧结 | 椭圆 |
| 600 A | 技术 | 基板 | Pin-Fin |
), ArticleFig(id=1154049751789064722, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=EN, label=Tab. 2, caption=
Parameters of power back-to-back test setup, figureFileSmall=null, figureFileBig=null, tableContent=
| 参数 | 数值 |
| 功率等级(V/A) | 300/150 |
| 寄生电感/mH | 0.5 |
| 输出频率/Hz | 100 |
| 开关频率/kHz | 15 |
| 水温/℃ | 65 |
| 流速$/\left({\mathrm{L}\cdot {\mathrm{{min}}}^{-1}}\right)$ | 10(可调) |
), ArticleFig(id=1154049751839396371, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1154049703114166392, language=CN, label=表2, caption=
功率对拖平台参数, figureFileSmall=null, figureFileBig=null, tableContent=
| 参数 | 数值 |
| 功率等级(V/A) | 300/150 |
| 寄生电感/mH | 0.5 |
| 输出频率/Hz | 100 |
| 开关频率/kHz | 15 |
| 水温/℃ | 65 |
| 流速$/\left({\mathrm{L}\cdot {\mathrm{{min}}}^{-1}}\right)$ | 10(可调) |
)], attaches=null, journal=Journal(id=1046111678587809797, delFlag=0, nameCn=电源学报, nameEn=Journal of Power Supply, nameHistory1=null, nameHistory2=null, issn=2095-2805, eissn=, cn=12-1420/TM, coden=null, periodic=bio-monthly, language=CN, oaType=是, ccby=null, superviseOffice=null, ownerOffice=null, pubOffice=null, editorOffice=null, officeType=null, aims=null, clcCode=null, officeProv=null, officeCity=null, officeAddr=null, officeZip=null, officeEmail=null, officePhone=null, editDirector=null, officeDirector=null, officeDirectorPhone=null, officeStaffNum=null, officeEmpNum=null, coverPicUrl=Mx+A2dn+ULnPHuEAI1LruQ==, journalPrice=null, startedYear=null, abbrevIsoEn=J Power Supp, journalRemark=null, publicationField=null, createdTime=null, updatedTime=1759802942253, createdBy=null, updatedBy=18614031015, firstLetterCn=J, firstLetterEn=J, subjectCode=Engineering, subjectName=工程, subjectCodeEn=Engineering, subjectNameEn=null, picCn=Mx+A2dn+ULnPHuEAI1LruQ==, picEn=yHt2vwjzkDgqh+JDCfJKoQ==, jcr=null, cjcr=null, exts=[JournalExt(id=1162453073839375337, language=CN, name=电源学报, nameHistory1=null, nameHistory2=null, managedBy=, sponsoredBy=, publishedBy=, editorOffice=, officeProv=null, officeCity=null, officeAddr=, officeZip=, editDirector=null, officeDirector=null, officePhone=null, coverPicUrl=null, journalRemark=, submitArticleUrl=null, websiteUrl=http://www.jops.cn/EN/home, createdTime=1755080010137, updatedTime=1755080010137, createdBy=13701087609, updatedBy=13701087609, submissionGuidelinesUrl=http://www.jops.cn/CN/column/column7.shtml, submissionAuthorUrl=https://mc03.manuscriptcentral.com/jops, submissionEditorUrl=https://mc03.manuscriptcentral.com/jops, submissionReviewUrl=https://mc03.manuscriptcentral.com/jops, submissionCeEditorUrl=https://mc03.manuscriptcentral.com/jops, submissionAeEditorUrl=https://mc03.manuscriptcentral.com/jops, option={"copyright":""}), JournalExt(id=1162453073902289898, language=EN, name=Journal of Power Supply, nameHistory1=null, nameHistory2=null, managedBy=, sponsoredBy=, publishedBy=, editorOffice=, officeProv=null, officeCity=null, officeAddr=, officeZip=, editDirector=null, officeDirector=null, officePhone=null, coverPicUrl=null, journalRemark=, submitArticleUrl=null, websiteUrl=http://www.jops.cn/CN/home, createdTime=1755080010152, updatedTime=1755080010152, createdBy=13701087609, updatedBy=13701087609, submissionGuidelinesUrl=http://www.jops.cn/EN/column/column7.shtml, submissionAuthorUrl=https://mc03.manuscriptcentral.com/jops, submissionEditorUrl=https://mc03.manuscriptcentral.com/jops, submissionReviewUrl=https://mc03.manuscriptcentral.com/jops, submissionCeEditorUrl=https://mc03.manuscriptcentral.com/jops, submissionAeEditorUrl=https://mc03.manuscriptcentral.com/jops, option={"copyright":""})], databaseList=null, tenantJournalId=1146031654075715584, websiteList=[Website(id=1146832214672683008, webName=null, webTitle=null, webDomain=null, webCopyrigh=null, webIpcNo=null, seoTitle=null, seoKeywords=null, seoDescription=null, tenantJournalId=null, journalId=1146031654075715584, journalNameCn=null, journalNameEn=null, grayFlag=null, tenantId=1146029695717560320, platformId=null, journalGroupId=null, journalGroupNameCn=null, journalGroupNameEn=null, type=1, domain=https://castjournals.cast.org.cn/joweb/dyxb/EN, language=EN, createTime=1751355707101, createBy=18614031015, updateTime=1753435268747, updateBy=18614031015, name=电源学报-英文站点, tplId=1146101810881728533, title=电源学报, delFlag=0, indexPage=/home, props=[WebsiteProps(id=1155559379819679852, tenantId=1146029695717560320, journalId=null, journalGroupId=null, siteId=1146832214672683008, code=articleTextType, value=kx, createTime=1753436425404, updateTime=1753436425404, creator=18614031015, updator=18614031015), WebsiteProps(id=1155559379798708329, tenantId=1146029695717560320, journalId=null, journalGroupId=null, siteId=1146832214672683008, code=banner, value=null, createTime=1753436425399, updateTime=1753436425399, creator=18614031015, updator=18614031015), WebsiteProps(id=1155559379781931112, tenantId=1146029695717560320, journalId=null, journalGroupId=null, siteId=1146832214672683008, code=logo, value=https://castjournals.cast.org.cn/joweb/kjdb/CN/file/pic?fileId=efYTu4aDDzS8GgTA1MjEKw==, createTime=1753436425396, updateTime=1753436425396, creator=18614031015, updator=18614031015), WebsiteProps(id=1155559379811291243, tenantId=1146029695717560320, journalId=null, journalGroupId=null, siteId=1146832214672683008, code=picServerUrl, value=https://castjournals.cast.org.cn/joweb/kjdb/CN/file/pic, createTime=1753436425402, updateTime=1753436425402, creator=18614031015, updator=18614031015), WebsiteProps(id=1155559379802902634, tenantId=1146029695717560320, journalId=null, journalGroupId=null, siteId=1146832214672683008, code=staticResourcePath, value=https://castjournals.cast.org.cn/joweb/cast_kjdb_cn_619/, createTime=1753436425400, updateTime=1753436425400, creator=18614031015, updator=18614031015)]), Website(id=1148243202240405915, webName=null, webTitle=null, webDomain=null, webCopyrigh=null, webIpcNo=null, seoTitle=null, seoKeywords=null, seoDescription=null, tenantJournalId=null, journalId=1146031654075715584, journalNameCn=null, journalNameEn=null, grayFlag=null, tenantId=1146029695717560320, platformId=null, journalGroupId=null, journalGroupNameCn=null, journalGroupNameEn=null, type=1, domain=https://castjournals.cast.org.cn/joweb/dyxb/CN, language=CN, createTime=1751692112741, createBy=18614031015, updateTime=1753435242839, updateBy=18614031015, name=电源学报-中文站点, tplId=1146099689490845704, title=电源学报, delFlag=0, indexPage=/home, props=[WebsiteProps(id=1148618015060553758, tenantId=1146029695717560320, journalId=null, journalGroupId=null, siteId=1148243202240405915, code=articleTextType, value=kx, createTime=1751781475081, updateTime=1751781475081, creator=18614031015, updator=18614031015), WebsiteProps(id=1148618015035387931, tenantId=1146029695717560320, journalId=null, journalGroupId=null, siteId=1148243202240405915, code=banner, value=null, createTime=1751781475075, updateTime=1751781475075, creator=18614031015, updator=18614031015), WebsiteProps(id=1148618015022805018, tenantId=1146029695717560320, journalId=null, journalGroupId=null, siteId=1148243202240405915, code=logo, value=https://castjournals.cast.org.cn/joweb/kjdb/CN/file/pic?fileId=efYTu4aDDzS8GgTA1MjEKw==, createTime=1751781475072, updateTime=1751781475072, creator=18614031015, updator=18614031015), WebsiteProps(id=1148618015052165149, tenantId=1146029695717560320, journalId=null, journalGroupId=null, siteId=1148243202240405915, code=picServerUrl, value=https://castjournals.cast.org.cn/joweb/kjdb/CN/file/pic, createTime=1751781475079, updateTime=1751781475079, creator=18614031015, updator=18614031015), WebsiteProps(id=1148618015043776540, tenantId=1146029695717560320, journalId=null, journalGroupId=null, siteId=1148243202240405915, code=staticResourcePath, value=https://castjournals.cast.org.cn/joweb/cast_kjdb_cn_619/, createTime=1751781475077, updateTime=1751781475077, creator=18614031015, updator=18614031015)])], journalTitle=电源学报, weixinUrl=null, journalUrl=http://www.jops.cn/CN/home, iacademicId=null, status=0, seqNo=null, journalTitleEn=Journal of Power Supply, journalPhotoCn=Mx+A2dn+ULnPHuEAI1LruQ==, journalPhotoEn=yHt2vwjzkDgqh+JDCfJKoQ==, journalFirstLetter=J, journalRecommend=null, journalNew=null, journalCollection=null, jcrJf=null, cjcrJf=null, jcrJfStr=null, cjcrJfStr=null, submissionFirstDecision=null, sciSubjectClassification=null, casSubjectClassification=null, citeScore=null, totalCitationFrequency=null, icpCode=null, psCode=null, advertisingLicenseCode=null, copyrightInformation=null, country=null, option=null, provinceCode=null, provinceName=null, collectFlag=false), detailUrlCn=https://castjournals.cast.org.cn/joweb/dyxb/CN/10.13234/j.issn.2095-2805.2024.3.78, detailUrlEn=https://castjournals.cast.org.cn/joweb/dyxb/EN/10.13234/j.issn.2095-2805.2024.3.78, pdfUrlCn=https://castjournals.cast.org.cn/joweb/dyxb/CN/PDF/10.13234/j.issn.2095-2805.2024.3.78, pdfUrlEn=https://castjournals.cast.org.cn/joweb/dyxb/EN/PDF/10.13234/j.issn.2095-2805.2024.3.78, aliStartDate=null, aliEndDate=null, collectionFlag=false, citedCount=null, citedUrl=null, reference=null)