Article(id=1319973118957957278, tenantId=1146029695717560320, journalId=1263187385517883426, issueId=1319973069423231598, articleNumber=null, orderNo=null, doi=10.14062/j.issn.0454-5648.20230623, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=null, receivedDate=1692547200000, receivedDateStr=2023-08-21, revisedDate=1695830400000, revisedDateStr=2023-09-28, acceptedDate=null, acceptedDateStr=null, onlineDate=1792635715473, onlineDateStr=2026-10-22, pubDate=1716134400000, pubDateStr=2024-05-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1792635715473, onlineIssueDateStr=2026-10-22, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1792635715473, creator=13701087609, updateTime=1792635715473, updator=13701087609, issue=Issue{id=1319973069423231598, tenantId=1146029695717560320, journalId=1263187385517883426, year='2024', volume='52', issue='5', pageStart='1477', pageEnd='1788', issueExtLink='null', onlineDate='null', pubDate='1716134400000', pubDateStr='2024-05-20', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1792635703664, creator='13701087609', updateTime=1792641791199, updator='13701087609', preIssue=null, nextIssue=null, articleTotal=null, ext={EN=IssueExt(id=1319998602462741464, tenantId=1146029695717560320, journalId=1263187385517883426, issueId=1319973069423231598, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1319998602462741465, tenantId=1146029695717560320, journalId=1263187385517883426, issueId=1319973069423231598, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null, downloadFileDto=null}, startPage=1597, endPage=1607, ext={EN=ArticleExt(id=1319973119889092768, articleId=1319973118957957278, tenantId=1146029695717560320, journalId=1263187385517883426, language=EN, title=Effect of Low-Temperature Annealing of Electrodes on Electrical Performance of Cd
0.9Mn
0.1Te:In/V Single Crystals Detectors, columnId=1319726165087077079, journalTitle=Journal of the Chinese Ceramic Society, columnName=Research Article, runingTitle=null, highlight=null, articleAbstract=
Introduction Cadmium manganese telluride (Cd1-xMnxTe, CMT) is an ideal material for room-temperature radiation detectors, which can be widely used in the fields of medical tests, radiation detection, and astrophysics. The higher partial pressure of Cd during the growth of CMT single crystals by the Bridgman method leads to severe volatilization of Cd, which in turn produces a high density of intrinsic point defects, such as Cd vacancies. This reduces the resistivity of the crystal and alters the conductive type of the crystal, making it difficult for the crystal to meet the requirements for device preparation. In this paper, CMT crystals were grown by a vertical Bridgman method with Te solution. The compositions were co-doped with In/V at 1017 atom/cm3 to compensate for the Cd vacancies and increase the crystal resistivity.
In addition, the electrical properties of Au, Ag, Al and In electrodes in contact with CMT semiconductors were also investigated.
Methods Te (9N), Cd (9N), In (9N), Mn (5N), and V (5N) were used as raw materials in a pellet form (Sichuan Ehalf High Purity Materials Co., China). Cd0.9Mn0.1Te single crystals co-doped with In and V (doping concentrations of 2×1017 atom/cm3 and 3×1017 atom/cm3, respectively) were grown by a vertical Bridgman method with Te solution. The grown ingots were 95 mm in length and 30 mm in diameter, and a diamond wire cutting machine was used to cut wafers with a thickness of 2 mm at the head, middle and tail of Cd0.9Mn0.1Te:In/V ingots, and further cut single crystals of 10 mm×10 mm×2 mm. The head, middle and tail single crystals of Cd0.9Mn0.1Te:In/V ingots were tested for the crystal structure by a model D/M-2500 X-ray diffractometer, respectively. The optical properties of crystals were determined by Fourier transform infrared spectroscopy and UV-visible-near-infrared spectroscopy.
Four single-crystal samples in the middle of Cd0.9Mn0.1Te:In/V ingot were selected as CMT detector materials. Au, Ag, Al and In metal electrodes were deposited on the surface of the crystals by a model KYKY-SBC-21 vacuum evaporation machine. The four metals were deposited by using 4N-grade high-purity evaporation wires with a diameter of 0.5 mm and a length of 80 mm. In order to ensure a low background noise in the detector, a low leakage current of the crystal was required and the electrodes were passivated with hydrogen peroxide after preparation. Au and In electrode CMT detectors were annealed in a model OTF-1200X tubular annealing furnace at different temperatures (i.e., 350, 370, 390, 410 K and 430 K) for 1 h, respectively. The electrical performance of CMT detectors with different electrodes was tested by a model agilent model 4155c semiconductor parameter analyzer.
Results and discussion Cd0.9Mn0.1Te:In/V single crystal is a crystal structure of sphalerite, in which the diffraction peak (111) has the maximum intensity, indicating that the preferred crystal growth direction is the direction (111). The average IR transmittance of the single crystal in the middle of the ingot is 67.3%, which is the maximum value reported in the literature. The high IR transmittance of In and V co-doped Cd0.9Mn0.1Te crystals is attributed to the fact that the double dopant adequately compensates for the acceptor defect Cd vacancies and reduces the vacancy defect concentration.
The average roughness of Ag, Ag, Al and In electrodes deposited on the surface of CMT crystals are all below 20 nm. Based on the results of electrical performance tests, the ohmic coefficient of Au electrode is close to 1, and the ohmic contact performance of Al and Ag electrodes is poorer. The adaptability of different materials to the annealing temperature is different, the leakage current of Au electrode decreases as the annealing temperature increases to 390 K. The leakage current of In electrode decreases only slightly after annealing at 350 K, and the leakage current of In electrode is greater than that of the unannealed one after annealing at >370 K, indicating that there is a limitation of annealing on the improvement of the electrical properties of the In electrode.
Conclusions The forbidden band width of Cd0.9Mn0.1Te:In/V single crystal was 1.52 eV, and the IR transmittance of the middle crystal was 67.3%, indicating that the middle crystal had superior optical properties. Al, Ag, In and Au electrode materials all formed ohmic contacts with the CMT, with the optimum electrical performance of Au and In electrodes. The optimum annealing temperatures for Au and In electrodes were 390 K and 350 K. Au and In electrodes were annealed at 390 K and 350 K, respectively. Au could be the most suitable electrode material for Cd0.9Mn0.1Te:In/V single-crystal radiation detectors.
, authors=Lijun LUAN, Long LI, Di ZHANG, Guohai LI, Pengfei YU, Li DUAN, authorsList=Lijun LUAN, Long LI, Di ZHANG, Guohai LI, Pengfei YU, Li DUAN, authorCompany=null, correspAuthors=null, authorNote=
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0.9Mn
0.1Te：In/V单晶探测器电学性能的影响, columnId=1263922770220560512, journalTitle=硅酸盐学报, columnName=研究论文, runingTitle=null, highlight=null, articleAbstract=
碲锰镉（Cd1-xMnxTe, CMT）是性能优异的室温核辐射探测材料。目前，熔体法生长的CMT单晶内部存在大量本征缺陷导致其光电性能较差且CMT探测器对γ射线和α粒子的探测效率较低。本工作采用Te溶液垂直Bridgman法生长In/V共掺杂的Cd0.9Mn0.1Te单晶体，晶体禁带宽度为1.524 eV，红外透过率达67.3%。为提高CMT探测器效率，制备了Au、Al、Ag和In 4种不同金属电极的MSM型CMT探测器，并测试了不同电极的I-V特性。结果表明Au和In电极表现出最佳电学性能：欧姆系数分别为1.043和0.969，电阻率分别为4.783×1010 Ω·cm和4.119×1010 Ω·cm，百伏漏电流分别为5.958 nA和6.758 nA。为进一步提高Au和In电极CMT探测器的电学性能，在430 K以下的低温段进行电极退火实验，结果表明：Au电极在390 K温度下退火1 h百伏漏电流降至2.31 nA，α粒子（5.48 MeV）辐射下CMT探测器能量分辨率从26.7%提升至17.4%；In电极在350 K温度下退火1 h后百伏漏电流减小至6.18 nA，能量分辨率从27.4%提升至21.8%。
, authors=栾丽君, 李龙, 张頔, 李国海, 俞鹏飞, 段理, authorsList=栾丽君, 李龙, 张頔, 李国海, 俞鹏飞, 段理, authorCompany=null, correspAuthors=null, authorNote=
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栾丽君（1976—），女，博士，副教授。
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栾丽君（1976—），女，博士，副教授。
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