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Three-dimensional inductors,owing to their small footprint,low loss,and high inductance,are widely applied in MEMS sensors,RF MEMS,and energy storage systems. Traditional three-dimensional MEMS inductors rely on high aspect ratio pillars for support and are typically fabricated by UV-LIGA lithography or through-silicon-via(TSV)technology,resulting in a complex process. To simplify the fabrication,this paper presented a MEMS-based method for three-dimensional arch inductor supported by a non-photosensitive polyimide layer. The inductor employed a high-permeability,Co-based amorphous alloy wire as the magnetic core,significantly enhancing its electrical performance. By optimizing development time to improve the smoothness of polyimide sidewalls,an arch coil was fabricated without high aspect ratio pillars,thus simplifying the process and enhancing device stability. The fabricated MEMS arch inductor achieves an inductance of 1881nH at 78.5MHz,with its electrical performance variation within 3% over the temperature range from 20℃ to 120 ℃.
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三维电感器凭借小体积、低损耗和高电感值等优势在MEMS传感器、射频MEMS及储能器件等领域得到广泛应用。传统三维MEMS电感器的支撑结构为高深宽比立柱,通常依赖UV-LIGA光刻或硅通孔(TSV)技术制备,工艺流程复杂。为简化制备流程,该文基于MEMS工艺设计并制作了一种以非光敏聚酰亚胺为支撑层的三维MEMS拱形电感器。该器件采用高磁导率Co基非晶合金丝作为磁芯,显著提升了电性能;通过优化显影时间提高聚酰亚胺侧壁平整度,在无需高深宽比立柱支撑的情况下制备了拱形线圈,简化工艺流程的同时提高了器件的稳定性。制备出的MEMS拱形电感器在78.5MHz的激励频率下电感值达到1881nH。在20~120℃温度范围内,电性能的变化不超过3%。
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1Department of Physics, University of Science and Technology Beijing, Beijing 100083, China
2Beijing Engineering Research Center of Detection and Application for Weak Magnetic Field, Beijing 100083, China, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null), CN=AuthorExt(id=1251457075306512439, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, authorId=1251457075117768747, language=CN, stringName=张波, firstName=null, middleName=null, lastName=null, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
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1北京科技大学 数理学院,北京 100083
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1Department of Physics, University of Science and Technology Beijing, Beijing 100083, China
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1北京科技大学 数理学院,北京 100083
2北京市弱磁检测及应用工程技术研究中心,北京 100083, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null)}, companyList=[AuthorCompany(id=1251457074933219357, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, xref=1, ext=[AuthorCompanyExt(id=1251457074937413662, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, companyId=1251457074933219357, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
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1Department of Physics, University of Science and Technology Beijing, Beijing 100083, China
2Beijing Engineering Research Center of Detection and Application for Weak Magnetic Field, Beijing 100083, China, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null), CN=AuthorExt(id=1251457075872743517, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, authorId=1251457075642056784, language=CN, stringName=万亚东, firstName=null, middleName=null, lastName=null, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
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1北京科技大学 数理学院,北京 100083
2北京市弱磁检测及应用工程技术研究中心,北京 100083, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null)}, companyList=[AuthorCompany(id=1251457074933219357, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, xref=1, ext=[AuthorCompanyExt(id=1251457074937413662, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, companyId=1251457074933219357, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
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2Beijing Engineering Research Center of Detection and Application for Weak Magnetic Field, Beijing 100083, China, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null), CN=AuthorExt(id=1251457077735014515, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, authorId=1251457076023738471, language=CN, stringName=张超, firstName=null, middleName=null, lastName=null, prefix=null, suffix=null, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=
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2北京市弱磁检测及应用工程技术研究中心,北京 100083, bio=null, bioImg=null, bioContent=null, aboutCorrespAuthor=null)}, companyList=[AuthorCompany(id=1251457075012911140, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, xref=2, ext=[AuthorCompanyExt(id=1251457075021299749, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, companyId=1251457075012911140, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
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1, 2, address=
1Department of Physics, University of Science and Technology Beijing, Beijing 100083, China
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1北京科技大学 数理学院,北京 100083
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1Department of Physics, University of Science and Technology Beijing, Beijing 100083, China), AuthorCompanyExt(id=1251457074941607967, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, companyId=1251457074933219357, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
1北京科技大学 数理学院,北京 100083)]), AuthorCompany(id=1251457075012911140, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, xref=2, ext=[AuthorCompanyExt(id=1251457075021299749, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, companyId=1251457075012911140, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
2Beijing Engineering Research Center of Detection and Application for Weak Magnetic Field, Beijing 100083, China), AuthorCompanyExt(id=1251457075025494054, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, companyId=1251457075012911140, language=CN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=
2北京市弱磁检测及应用工程技术研究中心,北京 100083)])], figs=[ArticleFig(id=1251457079022665922, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Fig. 1, caption=
SEM image of amorphous alloy wire, figureFileSmall=tuGo/El27NlS6q/JcI+ZIQ==, figureFileBig=W4idW2E48AHJd2Fvxz3guw==, tableContent=null), ArticleFig(id=1251457079127523527, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=图1, caption=
非晶合金丝SEM图像, figureFileSmall=tuGo/El27NlS6q/JcI+ZIQ==, figureFileBig=W4idW2E48AHJd2Fvxz3guw==, tableContent=null), ArticleFig(id=1251457079299490005, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Fig. 2, caption=
Structural diagram of MEMS arch inductor, figureFileSmall=VDQ0lEcRbFMxRIofpJ+BLg==, figureFileBig=JGx7O2L9jmrgv8o2rua+jg==, tableContent=null), ArticleFig(id=1251457079374987484, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=图2, caption=
MEMS拱形电感器结构图, figureFileSmall=VDQ0lEcRbFMxRIofpJ+BLg==, figureFileBig=JGx7O2L9jmrgv8o2rua+jg==, tableContent=null), ArticleFig(id=1251457079471456484, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Fig. 3, caption=
Fabrication flow of the MEMS arch inductor, figureFileSmall=4A9pnVZf7N2gr6snBvCEyA==, figureFileBig=su96tcCW0dqPqMnFiadnUQ==, tableContent=null), ArticleFig(id=1251457079588897004, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=图3, caption=
MEMS拱形电感器工艺流程图, figureFileSmall=4A9pnVZf7N2gr6snBvCEyA==, figureFileBig=su96tcCW0dqPqMnFiadnUQ==, tableContent=null), ArticleFig(id=1251457079693754612, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Fig. 4, caption=
Precise positioning and fixation of the amorphous alloy wire on the wafer surface, figureFileSmall=FM55+9RzR/ngFGdm5KY5Sw==, figureFileBig=AGgwrA+vNPx6rNXJe8VjHg==, tableContent=null), ArticleFig(id=1251457079769252088, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=图4, caption=
非晶合金丝在晶圆表面的定位与固定, figureFileSmall=FM55+9RzR/ngFGdm5KY5Sw==, figureFileBig=AGgwrA+vNPx6rNXJe8VjHg==, tableContent=null), ArticleFig(id=1251457079853138170, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Fig. 5, caption=
Polyimide profiles and sidewall morphologies under different development time.(a,d)3min 40s;(b,e)4min 20s;(c,f)5min, figureFileSmall=a3Y8/yYclWa+ks7fuhvphg==, figureFileBig=6Dz5AeW1f66ljg+noC4T+A==, tableContent=null), ArticleFig(id=1251457079937024258, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=图5, caption=
不同显影时间下聚酰亚胺的轮廓和侧壁形貌。(a,d)3min 40s;(b,e)4min 20s;(c,f)5min, figureFileSmall=a3Y8/yYclWa+ks7fuhvphg==, figureFileBig=6Dz5AeW1f66ljg+noC4T+A==, tableContent=null), ArticleFig(id=1251457080012521733, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Fig. 6, caption=
Images of the MEMS arch inductor.(a)Optical diagram;(b)SEM diagram, figureFileSmall=afvl1BgDXO4WKVOpB6YvGw==, figureFileBig=aNUfjdKRQQvcq5R1gr0s3w==, tableContent=null), ArticleFig(id=1251457080150933774, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=图6, caption=
MEMS拱形电感器。(a)光学图像;(b)SEM图像, figureFileSmall=afvl1BgDXO4WKVOpB6YvGw==, figureFileBig=aNUfjdKRQQvcq5R1gr0s3w==, tableContent=null), ArticleFig(id=1251457080276762898, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Fig. 7, caption=
Electrical performance testing results of the inductor, figureFileSmall=9D11GV3g+P9s5dwRUP1gzg==, figureFileBig=KaAmuOMAYtnSsnE5SQUSuw==, tableContent=null), ArticleFig(id=1251457080385814809, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=图7, caption=
电感器电性能测试结果, figureFileSmall=9D11GV3g+P9s5dwRUP1gzg==, figureFileBig=KaAmuOMAYtnSsnE5SQUSuw==, tableContent=null), ArticleFig(id=1251457080478089502, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Fig. 8, caption=
Temperature dependence of the inductor's siductance and quality factor from 20 ℃ to 120 ℃.(a)Inductance;(b)Quality factor, figureFileSmall=nWhf15pR9aoxVdesiCkSQA==, figureFileBig=kMkhLIaapKXodsSp5zu0rA==, tableContent=null), ArticleFig(id=1251457080587141415, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=图8, caption=
20~120 ℃下电感器(a)电感值与(b)品质因数变化曲线, figureFileSmall=nWhf15pR9aoxVdesiCkSQA==, figureFileBig=kMkhLIaapKXodsSp5zu0rA==, tableContent=null), ArticleFig(id=1251457082160005421, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Fig.9, caption=
Real-time inductance variation of inductors over the(a)1MHz;(b)10MHz;(c)20MHz;(d)30MHz;(e)40MHz;(f)50MHz excitation frequency range at 120 ℃, figureFileSmall=8nItUKzAz69FliAX5nxEXw==, figureFileBig=F80KBFGIXgeuv6lnxE/zpA==, tableContent=null), ArticleFig(id=1251457082264863030, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=图9, caption=
120 ℃下电感器在(a)1MHz;(b)10MHz;(c)20MHz;(d)30MHz;(e)40MHz;(f)50MHz激励频率范围内电感值的实时变化趋势, figureFileSmall=8nItUKzAz69FliAX5nxEXw==, figureFileBig=F80KBFGIXgeuv6lnxE/zpA==, tableContent=null), ArticleFig(id=1251457082348749116, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Fig.10, caption=
Real-time variation of the quality factor for inductors over the(a)1MHz;(b)10MHz;(c)20MHz;(d)30MHz;(e)40MHz;(f)50MHz excitation frequency range at 120 ℃, figureFileSmall=XvAUm+iv1tbnsUHUurDa5g==, figureFileBig=KhpJ+RVp68Y5EHOijDHriQ==, tableContent=null), ArticleFig(id=1251457082453606720, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=图10, caption=
120 ℃下电感器在(a)1MHz;(b)10MHz;(c)20MHz;(d)30MHz;(e)40MHz;(f)50MHz激励频率范围内品质因数的实时变化趋势, figureFileSmall=XvAUm+iv1tbnsUHUurDa5g==, figureFileBig=KhpJ+RVp68Y5EHOijDHriQ==, tableContent=null), ArticleFig(id=1251457082554270023, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Tab. 1, caption=
Design parameters of the MEMS arch inductor
, figureFileSmall=null, figureFileBig=null, tableContent=
| 电感器结构参数 | 数值 |
|---|
| 固定焊盘边长(μm) | 800 |
| 聚酰亚胺厚度(μm) | 60 |
| 线圈焊盘边长(μm) | 400 |
| 线圈线条宽度(μm) | 30 |
| 线圈线条间距(μm) | 50 |
| 电镀铜层厚度(μm) | 10 |
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MEMS拱形电感器设计参数
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| 电感器结构参数 | 数值 |
|---|
| 固定焊盘边长(μm) | 800 |
| 聚酰亚胺厚度(μm) | 60 |
| 线圈焊盘边长(μm) | 400 |
| 线圈线条宽度(μm) | 30 |
| 线圈线条间距(μm) | 50 |
| 电镀铜层厚度(μm) | 10 |
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Comparison of Performance with MEMS Inductors in Other Literature
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| 文献 | 年份 | 电感值/电感密度 | 线圈支撑结构 | 磁芯材料 |
|---|
| [7] | 2019 | 1063nH | 硅通孔(TSV)技术 | 硅钢 |
| [15] | 2016 | 367nH | 电镀铜立柱 | Ni-Cu-Zn铁氧体 |
| [16] | 2023 | 3~5nH | SU-8负型光刻胶 | 无 |
| [17] | 2024 | 340nH | 硅通孔(TSV)技术 | 铁氧体 |
| [18] | 2022 | 3.61nH/mm2 | 聚酰亚胺/苯并环丁烯 | CoZrTab薄膜 |
| [19] | 2019 | 112nH | 电镀铜立柱 | Ni-Zn铁氧体 |
| 本研究 | 2025 | 1881nH | 聚酰亚胺 | 非晶合金丝(CoFeSiBCr) |
), ArticleFig(id=1251457082856259926, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=表2, caption=
与其他文献MEMS电感器的性能对比
, figureFileSmall=null, figureFileBig=null, tableContent=
| 文献 | 年份 | 电感值/电感密度 | 线圈支撑结构 | 磁芯材料 |
|---|
| [7] | 2019 | 1063nH | 硅通孔(TSV)技术 | 硅钢 |
| [15] | 2016 | 367nH | 电镀铜立柱 | Ni-Cu-Zn铁氧体 |
| [16] | 2023 | 3~5nH | SU-8负型光刻胶 | 无 |
| [17] | 2024 | 340nH | 硅通孔(TSV)技术 | 铁氧体 |
| [18] | 2022 | 3.61nH/mm2 | 聚酰亚胺/苯并环丁烯 | CoZrTab薄膜 |
| [19] | 2019 | 112nH | 电镀铜立柱 | Ni-Zn铁氧体 |
| 本研究 | 2025 | 1881nH | 聚酰亚胺 | 非晶合金丝(CoFeSiBCr) |
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