Article(id=1251457069933609859, tenantId=1146029695717560320, journalId=1251194703438200922, issueId=1251457062706820082, articleNumber=null, orderNo=null, doi=10.14106/j.cnki.1001-2028.2025.0046, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=null, receivedDate=1738857600000, receivedDateStr=2025-02-07, revisedDate=null, revisedDateStr=null, acceptedDate=null, acceptedDateStr=null, onlineDate=1776300216420, onlineDateStr=2026-04-16, pubDate=1759593600000, pubDateStr=2025-10-05, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1776300216420, onlineIssueDateStr=2026-04-16, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1776300216420, creator=13041195026, updateTime=1776300216420, updator=13041195026, issue=Issue{id=1251457062706820082, tenantId=1146029695717560320, journalId=1251194703438200922, year='2025', volume='44', issue='10', pageStart='1119', pageEnd='1244', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=1, specialIssue=null, createTime=1776300214696, creator=13041195026, updateTime=1776300327814, updator=13041195026, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1251457537212629591, tenantId=1146029695717560320, journalId=1251194703438200922, issueId=1251457062706820082, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1251457537212629592, tenantId=1146029695717560320, journalId=1251194703438200922, issueId=1251457062706820082, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=1169, endPage=1175, ext={EN=ArticleExt(id=1251457070223016841, articleId=1251457069933609859, tenantId=1146029695717560320, journalId=1251194703438200922, language=EN, title=Design and process study of high-inductance MEMS arch inductor, columnId=1251457065399563262, journalTitle=Electronic Components and Materials, columnName=Research & Development, runingTitle=null, highlight=null, articleAbstract=

Three-dimensional inductors,owing to their small footprint,low loss,and high inductance,are widely applied in MEMS sensors,RF MEMS,and energy storage systems. Traditional three-dimensional MEMS inductors rely on high aspect ratio pillars for support and are typically fabricated by UV-LIGA lithography or through-silicon-via(TSV)technology,resulting in a complex process. To simplify the fabrication,this paper presented a MEMS-based method for three-dimensional arch inductor supported by a non-photosensitive polyimide layer. The inductor employed a high-permeability,Co-based amorphous alloy wire as the magnetic core,significantly enhancing its electrical performance. By optimizing development time to improve the smoothness of polyimide sidewalls,an arch coil was fabricated without high aspect ratio pillars,thus simplifying the process and enhancing device stability. The fabricated MEMS arch inductor achieves an inductance of 1881nH at 78.5MHz,with its electrical performance variation within 3% over the temperature range from 20℃ to 120 ℃.

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三维电感器凭借小体积、低损耗和高电感值等优势在MEMS传感器、射频MEMS及储能器件等领域得到广泛应用。传统三维MEMS电感器的支撑结构为高深宽比立柱,通常依赖UV-LIGA光刻或硅通孔(TSV)技术制备,工艺流程复杂。为简化制备流程,该文基于MEMS工艺设计并制作了一种以非光敏聚酰亚胺为支撑层的三维MEMS拱形电感器。该器件采用高磁导率Co基非晶合金丝作为磁芯,显著提升了电性能;通过优化显影时间提高聚酰亚胺侧壁平整度,在无需高深宽比立柱支撑的情况下制备了拱形线圈,简化工艺流程的同时提高了器件的稳定性。制备出的MEMS拱形电感器在78.5MHz的激励频率下电感值达到1881nH。在20~120℃温度范围内,电性能的变化不超过3%。

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通信作者:李建华,教授,博士,主要从事磁传感器、MEMS工艺的研究。E-mail:
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frequency range at 120 ℃, figureFileSmall=XvAUm+iv1tbnsUHUurDa5g==, figureFileBig=KhpJ+RVp68Y5EHOijDHriQ==, tableContent=null), ArticleFig(id=1251457082453606720, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=图10, caption=120 ℃下电感器在(a)1MHz;(b)10MHz;(c)20MHz;(d)30MHz;(e)40MHz;(f)50MHz激励频率范围内品质因数的实时变化趋势, figureFileSmall=XvAUm+iv1tbnsUHUurDa5g==, figureFileBig=KhpJ+RVp68Y5EHOijDHriQ==, tableContent=null), ArticleFig(id=1251457082554270023, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Tab. 1, caption=

Design parameters of the MEMS arch inductor

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电感器结构参数数值
固定焊盘边长(μm)800
聚酰亚胺厚度(μm)60
线圈焊盘边长(μm)400
线圈线条宽度(μm)30
线圈线条间距(μm)50
电镀铜层厚度(μm)10
), ArticleFig(id=1251457082650739020, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=表1, caption=

MEMS拱形电感器设计参数

, figureFileSmall=null, figureFileBig=null, tableContent=
电感器结构参数数值
固定焊盘边长(μm)800
聚酰亚胺厚度(μm)60
线圈焊盘边长(μm)400
线圈线条宽度(μm)30
线圈线条间距(μm)50
电镀铜层厚度(μm)10
), ArticleFig(id=1251457082747208018, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=EN, label=Tab. 2, caption=

Comparison of Performance with MEMS Inductors in Other Literature

, figureFileSmall=null, figureFileBig=null, tableContent=
文献年份电感值/电感密度线圈支撑结构磁芯材料
[7]20191063nH硅通孔(TSV)技术硅钢
[15]2016367nH电镀铜立柱Ni-Cu-Zn铁氧体
[16]20233~5nHSU-8负型光刻胶
[17]2024340nH硅通孔(TSV)技术铁氧体
[18]20223.61nH/mm2聚酰亚胺/苯并环丁烯CoZrTab薄膜
[19]2019112nH电镀铜立柱Ni-Zn铁氧体
本研究20251881nH聚酰亚胺非晶合金丝(CoFeSiBCr)
), ArticleFig(id=1251457082856259926, tenantId=1146029695717560320, journalId=1251194703438200922, articleId=1251457069933609859, language=CN, label=表2, caption=

与其他文献MEMS电感器的性能对比

, figureFileSmall=null, figureFileBig=null, tableContent=
文献年份电感值/电感密度线圈支撑结构磁芯材料
[7]20191063nH硅通孔(TSV)技术硅钢
[15]2016367nH电镀铜立柱Ni-Cu-Zn铁氧体
[16]20233~5nHSU-8负型光刻胶
[17]2024340nH硅通孔(TSV)技术铁氧体
[18]20223.61nH/mm2聚酰亚胺/苯并环丁烯CoZrTab薄膜
[19]2019112nH电镀铜立柱Ni-Zn铁氧体
本研究20251881nH聚酰亚胺非晶合金丝(CoFeSiBCr)
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高电感值MEMS拱形电感器的设计与工艺研究
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张波 1, 2 , 闻小龙 1, 2 , 万亚东 1, 2 , 张超 2 , 李建华 1, 2
电子元件与材料 | 研究与试制 2025,44(10): 1169-1175
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电子元件与材料 | 研究与试制 2025, 44(10): 1169-1175
高电感值MEMS拱形电感器的设计与工艺研究
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张波1, 2, 闻小龙1, 2, 万亚东1, 2, 张超2, 李建华1, 2
作者信息
  • 1北京科技大学 数理学院,北京 100083
  • 2北京市弱磁检测及应用工程技术研究中心,北京 100083

通讯作者:

通信作者:李建华,教授,博士,主要从事磁传感器、MEMS工艺的研究。E-mail:
Design and process study of high-inductance MEMS arch inductor
Bo ZHANG1, 2, Xiaolong WEN1, 2, Yadong WAN1, 2, Chao ZHANG2, Jianhua LI1, 2
Affiliations
  • 1Department of Physics, University of Science and Technology Beijing, Beijing 100083, China
  • 2Beijing Engineering Research Center of Detection and Application for Weak Magnetic Field, Beijing 100083, China
出版时间: 2025-10-05 doi: 10.14106/j.cnki.1001-2028.2025.0046
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三维电感器凭借小体积、低损耗和高电感值等优势在MEMS传感器、射频MEMS及储能器件等领域得到广泛应用。传统三维MEMS电感器的支撑结构为高深宽比立柱,通常依赖UV-LIGA光刻或硅通孔(TSV)技术制备,工艺流程复杂。为简化制备流程,该文基于MEMS工艺设计并制作了一种以非光敏聚酰亚胺为支撑层的三维MEMS拱形电感器。该器件采用高磁导率Co基非晶合金丝作为磁芯,显著提升了电性能;通过优化显影时间提高聚酰亚胺侧壁平整度,在无需高深宽比立柱支撑的情况下制备了拱形线圈,简化工艺流程的同时提高了器件的稳定性。制备出的MEMS拱形电感器在78.5MHz的激励频率下电感值达到1881nH。在20~120℃温度范围内,电性能的变化不超过3%。

电感器  /  拱形线圈  /  聚酰亚胺  /  非晶合金丝

Three-dimensional inductors,owing to their small footprint,low loss,and high inductance,are widely applied in MEMS sensors,RF MEMS,and energy storage systems. Traditional three-dimensional MEMS inductors rely on high aspect ratio pillars for support and are typically fabricated by UV-LIGA lithography or through-silicon-via(TSV)technology,resulting in a complex process. To simplify the fabrication,this paper presented a MEMS-based method for three-dimensional arch inductor supported by a non-photosensitive polyimide layer. The inductor employed a high-permeability,Co-based amorphous alloy wire as the magnetic core,significantly enhancing its electrical performance. By optimizing development time to improve the smoothness of polyimide sidewalls,an arch coil was fabricated without high aspect ratio pillars,thus simplifying the process and enhancing device stability. The fabricated MEMS arch inductor achieves an inductance of 1881nH at 78.5MHz,with its electrical performance variation within 3% over the temperature range from 20℃ to 120 ℃.

inductor  /  arch coils  /  polyimide  /  amorphous alloy wire
张波, 闻小龙, 万亚东, 张超, 李建华. 高电感值MEMS拱形电感器的设计与工艺研究. 电子元件与材料, 2025 , 44 (10) : 1169 -1175 . DOI: 10.14106/j.cnki.1001-2028.2025.0046
Bo ZHANG, Xiaolong WEN, Yadong WAN, Chao ZHANG, Jianhua LI. Design and process study of high-inductance MEMS arch inductor[J]. Electronic Components and Materials, 2025 , 44 (10) : 1169 -1175 . DOI: 10.14106/j.cnki.1001-2028.2025.0046
微型电感器作为集成电路的重要组成部分,凭借其小体积、高电感值、低损耗[1-3]等优势,广泛应用于MEMS传感器[4]、RF MEMS[5]和储能元件[6]中。随着电子设备向小型化和高性能的方向发展,微型电感器的需求日益增长,尤其在高频电子、功率电子及高密度集成电路领域应用前景广阔[7]。按结构布局可将微型电感器分为平面电感和三维电感[8]。平面电感器将线圈平面布置于衬底上,但由于几何结构受限,其电感值较低且衬底耦合损耗显著[9]。与之相比,三维电感器通过多层叠层或立体绕线的方式闭合电感回路,具备更高的电感值和更低的损耗,尤为适合高频及高集成度的应用场景。
在三维电感器的设计中,磁芯材料对器件性能具有关键影响作用。引入磁芯可提高电感器的磁导率,从而提升电感值。合适的磁芯材料不仅可抑制涡流损耗,还能提高电感器在高频激励下的品质因数[10]。现有研究表明,Ni-Zn铁氧体和硅钢常用作磁芯材料,其磁导率μ(200和800)和居里温度Tc(120和300 ℃)可满足常规需求;但在高频激励下易因涡流损耗导致Q值下降。相比之下,Co基非晶合金丝具备良好的高频磁特性,由于其丝状形态难以实现精准定位与固定,限制了其在MEMS器件中的应用。
三维电感器的闭合电感回路需通过高深宽比立柱连接底部与顶部线圈。高深宽比结构的制造需采用UV-LIGA、深反应离子刻蚀(DRIE)或硅通孔(TSV)等技术[11-13],并搭配特定光刻胶(如SU-8负型光刻胶)来实现,工艺步骤繁琐且成本较高。热回流工艺可简化三维电感器的制备流程,通过加热使衬底表面光刻胶软化回流,提高支撑层平整度,从而在无需立柱的情况下实现三维电感回路闭合。然而热回流法对胶体厚度、热稳定性和流动性等物理特性要求严格,且在牺牲层被去除时产生的应力可能导致线圈破裂。
可见,提高支撑层平整度与三维结构表面光刻胶均匀性是优化三维电感器制造工艺的关键。通常采用喷涂技术来实现光刻胶在非平整结构表面的均匀覆盖。然而,喷涂所用的光刻胶黏度较低(<10mPa·s)[14],胶体在覆盖三维结构表面时受重力作用会产生微湍流,将导致膜厚不均匀,表现为顶部边缘处胶体较薄,而在台阶附近较厚。显影作为一种成熟的MEMS工艺,其各向同性去除光刻胶的特性有助于提升支撑层平整度,可实现光刻胶的均匀分布,从而优化了三维电感器的结构设计并降低制造难度。
现有工艺难以兼顾三维电感器的结构简化与性能提升。传统磁芯材料的高频损耗限制了电感值增长,而复杂支撑结构制备流程则增加了制造成本。为此本文设计并制备了一种MEMS拱形电感器。该电感器采用Co基非晶合金丝作为磁芯,显著提升了电感值;利用非光敏聚酰亚胺作为线圈支撑层,并结合AZ4620正型光刻胶进行图形化。通过精确地控制显影时间,聚酰亚胺侧壁可形成拱形结构,从而无需高深宽比立柱即可完成三维线圈的制备。
本研究通过优化支撑层的结构和材料,简化了三维电感器的制造流程;以高磁导率的非晶合金丝作为磁芯提升了其电感性能。本文的研究成果为三维电感器、MEMS变压器、射频滤波器等三维器件的设计与制造提供了新的思路,为高密度集成电路的片上无源元件集成提供了新范式。
主要设备如下:南光H94-25C光刻机(四川南光真空);GM-60D高温无氧烘箱(苏州三清仪器);YNS 800金属磁控溅射镀膜机(长沙元戎科技);ZKPI-3022H非光敏聚酰亚胺(中国波米科技);AZ4620正型光刻胶(德国Merck);OLS5000-SAF共聚焦激光显微镜(日本奥林巴斯);日立Regulus8100冷场发射扫描电镜(日本日立);Tencor P7台阶仪(美国科磊);Keysight E4990A阻抗分析仪(美国Keysight Technologies);CPBT-W7磁屏蔽装置(北京住信通光电)。
本研究所用的非晶合金丝采用玻璃包覆法制备而成。在1100 ℃高温下熔融金属拉制制成,合金成分为CoFeSiBCr。图1为非晶合金丝的SEM图像,合金丝直径为25 μm,外层包裹有玻璃层。
基于非光敏聚酰亚胺的MEMS拱形电感器结构如图2所示。该电感器由玻璃衬底、铜焊盘、拱形线圈、聚酰亚胺和非晶合金丝构成。其中,非晶合金丝作为磁芯,焊盘分别作为检测端口和磁芯固定端口,聚酰亚胺作为支撑层。表1给出了MEMS拱形电感器的设计参数。
本文设计的拱形电感器通过电镀工艺完成。通过在玻璃衬底表面完成底部线圈与焊盘的电镀,将非晶合金丝固定在线圈中央,再实现聚酰亚胺图形化,最后电镀顶部线圈完成电感闭合。具体的加工工艺步骤如下:a. 选用厚度为500 μm的BF33玻璃进行晶圆清洗;b. 磁控溅射Ti(60nm)/Cu(200nm)金属层后光刻,显影得到底部线圈与焊盘掩膜;c. 电镀底层铜线圈与焊盘;d. 使用丙酮去除残余光刻胶,Ti/Cu腐蚀液去除金属层;e. 将非晶合金丝固定在线圈中央;f.依次旋涂60 μm非光敏聚酰亚胺和10 μm AZ4620正型光刻胶,然后光刻、显影,使聚酰亚胺侧壁呈现斜坡状,随后去胶;g. 磁控溅射Cu(50nm)金属层后光刻得到拱形掩膜,电镀制备拱形线圈,随后湿法去胶并去除种子层;h. 划片切割得到单个器件。工艺流程如图3所示。
非晶合金丝在晶圆表面的准确定位与固定是制备MEMS电感器的关键。如图4所示,在铜焊盘两侧电镀锡焊盘,采用超声焊接的方式将合金丝逐点固定在电镀制备的锡焊盘上,使得合金丝位于底部线圈中央。为避免焊接过程对磁芯材料及器件性能产生不利影响,焊接区域布置于MEMS电感器功能区之外。
拱形电感器制备的关键在于对显影时间的精确控制。较厚或黏度过高的胶层都会减慢显影液的扩散速度,从而导致侧壁更易形成斜面。本文选用ZKPI-3022H非光敏聚酰亚胺作为支撑层,其高黏度(14000~15000mPa·s)扩展了显影时间窗口并降低了显影难度。图5展示了不同显影时间下聚酰亚胺显影结果图。图5(a~c)为台阶仪测量的聚酰亚胺轮廓图。图5(d~f)为共聚焦激光显微镜下聚酰亚胺侧壁形貌。随着显影时间的延长,聚酰亚胺侧壁坡度逐渐增大,线圈端口上方的残余胶层厚度逐步减小。当显影时间为3min 40s时,侧壁坡度较小,但线圈端口仍被聚酰亚胺覆盖,这将影响后续电气连接;当显影时间为5min时,聚酰亚胺侧壁垂直,不利于光刻胶的均匀分布;当显影时间为4min 20s时,侧壁坡度适中,线圈端口表面聚酰亚胺被部分去除,有利于后续拱形线圈的制备。
图6为制备出的MEMS拱形电感器的显微镜图片。图6(a)为电感器在光学显微镜下整体结构图,图6(b)为在SEM显微镜下局部电感线圈的细节展示。从图中可以看出,制备出的MEMS拱形电感器形貌良好,磁芯被包裹完全,且在无立柱的支撑下实现了线圈闭合。
本研究使用Keysight E4990A阻抗分析仪对MEMS拱形电感器进行测试。将制备好的MEMS拱形电感器通过超声引线仪与PCB板相连。为避免外界磁场影响测试结果,将电感器置于CPBT-W7磁屏蔽装置中。设置激励电流幅值为20mA,激励频率范围为1MHz至120MHz,激励间隔为0.6MHz。图7为电感器电性能测试结果图。由图可知电感值峰值在78.5MHz时为1881nH;品质因数峰值在42.2MHz时为10.1。在达到自谐振频率(SRF)84.5MHz前,电感值随激励频率的升高逐渐增大,在谐振点前达到峰值。同时,随着激励频率接近自谐振频率,品质因数先增大后减小。在84.5MHz时,电感和质量因数均降至零。当激励频率超过84.5MHz时,电感器的电感特性转变为电容特性。
表2为本研究的MEMS拱形电感器与其他文献中的电感器的性能对比。从表2的对比中看出,本研究所制备的MEMS电感器具有高电感值和结构简单的优点。
为了评估电感器在高温环境下的稳定性,使用热板模拟高温环境。将电感器固定在热板表面,然后将测试端口连接Keysight E4990A阻抗分析仪。测试温度范围为20~120 ℃,温度间隔为10 ℃;激励频率从1MHz到50MHz递增,频率间隔为10MHz。
图8展示了电感器在不同温度下的电感值与品质因数变化趋势。其中,图8(a)和(b)分别为20~120℃范围内,不同激励频率下电感值和品质因数的变化曲线。从图中可知,随着温度升高,磁芯磁导率下降且导体电阻增加,导致损耗增大,从而使电感值和品质因数略有下降。在20~120 ℃之间,10MHz处电感值降幅最大,由500.64nH降至491.06nH,减小了1.91%。品质因数在30MHz时下降幅度最大,从9.7下降到9.47,减小了2.38%。图9展示了MEMS电感器在120℃环境下100s内的电性能实时变化趋势,图9(a~f)为不同激励频率下的电感值实时波动,图10(a~f)为相应的品质因数实时变化曲线。在100s内,20MHz处电感值波动最剧烈,范围为524.66~535.52nH,极差为10.86nH;50MHz处品质因数波动最大,范围为8.27~8.54,极差为0.27。低热导率的聚酰亚胺减缓了温度变化速率,延长了器件在高温下的稳定时间,有效地保护了MEMS电感器免受热冲击影响。此外,Co基非晶丝作为磁芯材料,具有稳定的温度系数和更宽的温度适用范围,进一步保证了电感器在宽温度范围内的性能稳定性。
针对传统三维电感器因高深宽比支撑结构导致的工艺复杂的问题,本研究设计并制造了一种基于非光敏聚酰亚胺的MEMS拱形电感器。该电感器将传统三维线圈优化为拱形线圈,使用聚酰亚胺作为线圈支撑层,提高了电感器的稳定性;工艺上通过控制聚酰亚胺的显影时间提高了支撑层的平整度,在无高深宽比立柱的支撑下完成了三维拱形线圈的制备。对制作的MEMS拱形电感器进行电性能和温度可靠性测试,结果显示在78.5MHz的激励频率下电感值高达1881nH;在20~120℃的温度范围内,电性能的变化不超过3%。
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2025年第44卷第10期
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doi: 10.14106/j.cnki.1001-2028.2025.0046
  • 接收时间:2025-02-07
  • 首发时间:2026-04-16
  • 出版时间:2025-10-05
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  • 收稿日期:2025-02-07
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    1北京科技大学 数理学院,北京 100083
    2北京市弱磁检测及应用工程技术研究中心,北京 100083

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通信作者:李建华,教授,博士,主要从事磁传感器、MEMS工艺的研究。E-mail:
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鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
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红菇属 Russula 17 8.13
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