Article(id=1322557081450823986, tenantId=1146029695717560320, journalId=1146031654075715584, issueId=1322557042389275039, articleNumber=null, orderNo=null, doi=10.13234/j.issn.2095-2805.2026.8.339, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=null, receivedDate=1733241600000, receivedDateStr=2024-12-04, revisedDate=1735833600000, revisedDateStr=2025-01-03, acceptedDate=1736352000000, acceptedDateStr=2025-01-09, onlineDate=1793251780140, onlineDateStr=2026-10-29, pubDate=1788019200000, pubDateStr=2026-08-30, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1793251780140, onlineIssueDateStr=2026-10-29, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1793251780140, creator=13701087609, updateTime=1793251780140, updator=13701087609, issue=Issue{id=1322557042389275039, tenantId=1146029695717560320, journalId=1146031654075715584, year='2026', volume='24', issue='8', pageStart='1', pageEnd='354', issueExtLink='null', onlineDate='null', pubDate='1788019200000', pubDateStr='2026-08-30', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1793251770826, creator='13701087609', updateTime=1793251770826, updator='13701087609', preIssue=null, nextIssue=null, articleTotal=null, ext=null, issueFiles=null, downloadFileDto=null}, startPage=339, endPage=346, ext={EN=ArticleExt(id=1322557082948190515, articleId=1322557081450823986, tenantId=1146029695717560320, journalId=1146031654075715584, language=EN, title=Life Evaluation of DC-DC Power Supply Considering Coupling Effect of Space Radiation and Temperature, columnId=1321491668864455519, journalTitle=Journal of Power Supply, columnName=Fault Diagnosis and Reliability, runingTitle=null, highlight=null, articleAbstract=

DC-DC power supplies are simultaneously affected by long-term low-dose-rate radiation and temperature in a space environment. At present, there is no space radiation-temperature coupling effect acceleration model, and how to evaluate the life of DC-DC power supplies under the coupling effect is a challenge. A life evaluation method based on a generalized coupled acceleration model and a response surface acceleration model is proposed. First, the particle swarm optimization algorithm is used to select the optimal acceleration model and estimate its parameters. Then, the final coupling effect acceleration model is established through model averaging. Finally, a certain type of DC-DC power supply is taken as the object, the coupling relationship analysis of acceleration performance degradation data obtained under different stress combinations is carried out, and the proposed method is used to evaluate the life of DC-DC power supply under the coupling effect, thus verifying the effectiveness of the novel method.

, authors=Yiming ZONG^{1, 2}, Yanhong FANG^{1, 2}, Bin SUO^{1, 2}, authorsList=Yiming ZONG, Yanhong FANG, Bin SUO, authorCompany=null, correspAuthors=Yanhong FANG, authorNote=null, correspAuthorsNote=null, copyrightStatement=null, copyrightOwner=null, extLink=null, articleAbsUrl=null, sourceXml=null, magXml=null, pdfUrl=null, pdf=null, pdfFileSize=null, pdfExtLink=null, richHtmlUrl=null, mobilePdfUrl=null, reviewReport=null, pdfFirstPage=null, abstractGraph=null, abstractGraphContent=null, abstractVideo=null, citation=null, cebUrl=null, magXmlContent=null, mapNumber=null, fund=null), CN=ArticleExt(id=1322557083430535478, articleId=1322557081450823986, tenantId=1146029695717560320, journalId=1146031654075715584, language=CN, title=考虑空间辐射-温度耦合效应的DC-DC电源寿命评估, columnId=1321491668998673249, journalTitle=电源学报, columnName=故障诊断与可靠性, runingTitle=null, highlight=null, articleAbstract=

DC-DC电源在空间环境中同时受到长期低剂量率辐射和温度的共同影响，当前尚无空间辐射-温度耦合效应加速模型，因此如何评估DC-DC电源在耦合效应下的寿命是目前面临的一项重要挑战。基于此，提出了一种基于广义耦合加速模型和响应面加速模型的寿命评估方法。该方法以广义耦合加速模型和响应面加速模型为基础，首先通过粒子群算法进行最优加速模型的选择和参数估计；然后通过模型平均的方法建立最终的耦合效应加速模型；最后以某型DC-DC电源为对象，对不同应力组合下获得的加速性能退化数据进行耦合关系分析，并使用所提方法开展DC-DC耦合效应下的寿命评估，验证了新方法的有效性。

, authors=宗怡明中国电源学会学生会员^{1, 2}, 方艳红^{1, 2}, 锁斌^{1, 2}, authorsList=宗怡明中国电源学会学生会员, 方艳红, 锁斌, authorCompany=null, correspAuthors=方艳红, authorNote=, correspAuthorsNote=, copyrightStatement=null, copyrightOwner=null, extLink=null, articleAbsUrl=null, sourceXml=OQWEC6OmA5BIzc1BxfRHjQ==, magXml=Jg/z/SBdIP+/H4ru51oFEw==, pdfUrl=null, pdf=q+Ny2TfPUuZC/hPOSV7QIA==, pdfFileSize=2021777, pdfExtLink=null, richHtmlUrl=null, mobilePdfUrl=null, reviewReport=null, pdfFirstPage=null, abstractGraph=null, abstractGraphContent=null, abstractVideo=null, citation=null, cebUrl=null, magXmlContent=ub83piwYajis1DcTChmQsw==, mapNumber=null, fund=null)}, authors=[Author(id=1322557083946434878, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1322557081450823986, orderNo=0, firstName=null, middleName=null, lastName=null, nameCn=null, orcid=null, stid=null, country=null, authorPic=null, dead=0, email=2878103310@qq.com, emailSecond=null, emailThird=null, correspondingAuthor=0, authorType=1, ext={EN=AuthorExt(id=1322557084051292481, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1322557081450823986, authorId=1322557083946434878, language=EN, stringName=Yiming ZONG, firstName=Yiming, middleName=null, lastName=ZONG, prefix=null, suffix=Student Member, CPSS, authorComment=null, nameInitials=null, affiliation=null, department=null, xref=^{1, 2}, address=^1.School of Information Engineering, Southwest University of Science and Technology, Mianyang 621010, China
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宗怡明（2000—　），女，中国电源学会学生会员，硕士研究生。研究方向：可靠性评估。E-mail：2878103310@qq.com。

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宗怡明（2000—　），女，中国电源学会学生会员，硕士研究生。研究方向：可靠性评估。E-mail：2878103310@qq.com。

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锁斌（1979—　），男，博士，教授。研究方向：可靠性设计分析，不确定信息处理。E-mail：suo.y.y@163.com。

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锁斌（1979—　），男，博士，教授。研究方向：可靠性设计分析，不确定信息处理。E-mail：suo.y.y@163.com。

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