Article(id=1322531659988186052, tenantId=1146029695717560320, journalId=1146031654075715584, issueId=1322531607177707705, articleNumber=null, orderNo=null, doi=10.13234/j.issn.2095-2805.2026.5.339, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=null, receivedDate=1739030400000, receivedDateStr=2025-02-09, revisedDate=1742659200000, revisedDateStr=2025-03-23, acceptedDate=1744041600000, acceptedDateStr=2025-04-08, onlineDate=1793245719190, onlineDateStr=2026-10-29, pubDate=1780070400000, pubDateStr=2026-05-30, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1793245719190, onlineIssueDateStr=2026-10-29, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1793245719190, creator=13701087609, updateTime=1793245719190, updator=13701087609, issue=Issue{id=1322531607177707705, tenantId=1146029695717560320, journalId=1146031654075715584, year='2026', volume='24', issue='5', pageStart='1', pageEnd='348', issueExtLink='null', onlineDate='null', pubDate='1780070400000', pubDateStr='2026-05-30', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1793245706600, creator='13701087609', updateTime=1793245706600, updator='13701087609', preIssue=null, nextIssue=null, articleTotal=null, ext=null, issueFiles=null, downloadFileDto=null}, startPage=339, endPage=348, ext={EN=ArticleExt(id=1322531660227261381, articleId=1322531659988186052, tenantId=1146029695717560320, journalId=1146031654075715584, language=EN, title=Effect of Aging Time on Insulation Deterioration of Power Electronic Transformers, columnId=1321491668864455519, journalTitle=Journal of Power Supply, columnName=Fault Diagnosis and Reliability, runingTitle=null, highlight=null, articleAbstract=

Power electronic transformer (PET) insulation system continue to deteriorate in high frequency, high voltage, short rise time pulse electrical stress and high temperature and other harsh environments; insulation discharge and breakdown risks are increasing significantly. In order to study the effect of high temperature thermal aging for PET on insulation deterioration under real operating conditions, the typical insulation polyimide (PI) of PET was aged at 250 ℃ for 3, 6, 9, 12 days, and then 20 kHz, 4 kV, 300 ns pulsed voltage was used to simulate PET operating conditions. The partial discharge and breakdown voltage of insulation were tested, and time-resolved partial discharge spectrum (TRPD), discharge times, average discharge amplitude, and maximum discharge amplitude were used to characterize the degree of insulation deterioration. The results show that after aging, the TRPD pattern of PI films changes from single peak to multiple peaks, showing a phenomenon of clustering. At the same time, with the increase of aging time, the number of partial discharges, average discharge amplitude and maximum discharge amplitude increase by 47.3%, 61.1% and 41.9%, respectively, and the degree of insulation deterioration was significantly deepened. The breakdown voltage distribution of PI film conforms to Weibull distribution and decreases with aging time, from the initial 4 667 V to 4 457 V, a decrease of 4.5%. Therefore, the effect of aging time on the deterioration of PET insulation is obtained, which has certain guiding significance for the reliability analysis and optimal design of PET insulation.

, authors=Jianfu CHEN1, Xu CHENG1, 2, Yong CHEN1, 2, Xiaoyan ZHAO1, Wu CHEN3, Zhan SHEN3, authorsList=Jianfu CHEN, Xu CHENG, Yong CHEN, Xiaoyan ZHAO, Wu CHEN, Zhan SHEN, authorCompany=null, correspAuthors=Zhan SHEN, authorNote=null, correspAuthorsNote=null, copyrightStatement=null, copyrightOwner=null, extLink=null, articleAbsUrl=null, sourceXml=null, magXml=null, pdfUrl=null, pdf=null, pdfFileSize=null, pdfExtLink=null, richHtmlUrl=null, mobilePdfUrl=null, reviewReport=null, pdfFirstPage=null, abstractGraph=null, abstractGraphContent=null, abstractVideo=null, citation=null, cebUrl=null, magXmlContent=null, mapNumber=null, fund=null), CN=ArticleExt(id=1322531660839629768, articleId=1322531659988186052, tenantId=1146029695717560320, journalId=1146031654075715584, language=CN, title=老化时间对电力电子变压器绝缘劣化的影响, columnId=1321491668998673249, journalTitle=电源学报, columnName=故障诊断与可靠性, runingTitle=null, highlight=null, articleAbstract=

电力电子变压器PET(power electronic transformer)绝缘系统在高频、高压、低上升时间脉冲电应力及高温等恶劣环境中不断劣化,绝缘放电和击穿风险与日俱增。为了研究真实工况下PET绝缘高温热老化对绝缘劣化的影响,将变压器典型绝缘聚酰亚胺PI(polyimide)在250 ℃下分别老化3、6、9、12天,然后采用20 kHz、4 kV、300 ns的脉冲电压模拟PET运行工况,测试绝缘局部放电和击穿电压,并使用时间分辨放电谱图TRPD(time-resolved partial discharge)及放电次数、平均放电幅值、最大放电幅值来表征绝缘的劣化程度。结果表明,老化后PI薄膜的TRPD谱图放电形状从单峰变为多峰,呈现出分簇的现象;同时,随着老化时间的增加,局部放电次数、平均放电幅值、最大放电幅值分别提高了47.3%、61.1%和41.9%,绝缘劣化程度显著加深。PI薄膜的击穿电压分布符合Weibull分布,随老化时间的增加而减小,从初始的4 667 V降到4 457 V,下降了4.5%。因此,得到了老化时间对PET绝缘劣化的影响规律,对PET绝缘可靠性分析和优化设计具有重要指导意义。

, authors=陈建福1, 程旭1, 2, 陈勇1, 2, 赵晓燕1, 陈武中国电源学会高级会员3, 沈湛中国电源学会会员3, authorsList=陈建福, 程旭, 陈勇, 赵晓燕, 陈武中国电源学会高级会员, 沈湛中国电源学会会员, authorCompany=null, correspAuthors=沈湛中国电源学会会员, authorNote=

陈建福(1965— ),男,博士,教授级高级工程师。研究方向:直流配用电技术。E-mail:。

程旭(1994— ),男,硕士研究生,工程师。研究方向:直流配用电技术。E-mail:。

陈勇(1982— ),男,硕士,高级工程师。研究方向:直流配用电技术。E-mail:。

赵晓燕(1991— ),女,学士,工程师。研究方向:电网规划技术。E-mail:。

陈武(1981— ),男,中国电源学会高级会员,博士,教授。研究方向:电力电子功率变换,交直流配电网,新能源发电。E-mail:。

, correspAuthorsNote=
沈湛(1991— ),男,中国电源学会会员,通信作者,博士,副研究员。研究方向:高频电力电子及其磁元件。E-mail:,。
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陈建福(1965— ),男,博士,教授级高级工程师。研究方向:直流配用电技术。E-mail:。

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陈建福(1965— ),男,博士,教授级高级工程师。研究方向:直流配用电技术。E-mail:。

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程旭(1994— ),男,硕士研究生,工程师。研究方向:直流配用电技术。E-mail:。

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陈勇(1982— ),男,硕士,高级工程师。研究方向:直流配用电技术。E-mail:。

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陈勇(1982— ),男,硕士,高级工程师。研究方向:直流配用电技术。E-mail:。

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赵晓燕(1991— ),女,学士,工程师。研究方向:电网规划技术。E-mail:。

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赵晓燕(1991— ),女,学士,工程师。研究方向:电网规划技术。E-mail:。

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陈武(1981— ),男,中国电源学会高级会员,博士,教授。研究方向:电力电子功率变换,交直流配电网,新能源发电。E-mail:。

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陈武(1981— ),男,中国电源学会高级会员,博士,教授。研究方向:电力电子功率变换,交直流配电网,新能源发电。E-mail:。

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老化时间对电力电子变压器绝缘劣化的影响
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陈建福 1 , 程旭 1, 2 , 陈勇 1, 2 , 赵晓燕 1 , 陈武中国电源学会高级会员 3 , 沈湛中国电源学会会员 3
电源学报 | 故障诊断与可靠性 2026,24(5): 339-348
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电源学报 |故障诊断与可靠性 2026 , 24 (5) : 339 -348
老化时间对电力电子变压器绝缘劣化的影响
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陈建福1 , 程旭1, 2 , 陈勇1, 2 , 赵晓燕1 , 陈武中国电源学会高级会员3 , 沈湛中国电源学会会员3
作者信息
  • 1.广东电网有限责任公司珠海供电局,珠海 519000
  • 2.广东电网有限责任公司直流配用电研究中心,珠海 519000
  • 3.东南大学电气工程学院,南京 210096
通讯作者:
沈湛(1991— ),男,中国电源学会会员,通信作者,博士,副研究员。研究方向:高频电力电子及其磁元件。E-mail:,。
作者简介:

陈建福(1965— ),男,博士,教授级高级工程师。研究方向:直流配用电技术。E-mail:。

程旭(1994— ),男,硕士研究生,工程师。研究方向:直流配用电技术。E-mail:。

陈勇(1982— ),男,硕士,高级工程师。研究方向:直流配用电技术。E-mail:。

赵晓燕(1991— ),女,学士,工程师。研究方向:电网规划技术。E-mail:。

陈武(1981— ),男,中国电源学会高级会员,博士,教授。研究方向:电力电子功率变换,交直流配电网,新能源发电。E-mail:。

Effect of Aging Time on Insulation Deterioration of Power Electronic Transformers
Jianfu CHEN1 , Xu CHENG1, 2 , Yong CHEN1, 2 , Xiaoyan ZHAO1 , Wu CHEN Senior Member, CPSS3 , Zhan SHEN Member, CPSS3
Affiliations
  • 1.Zhuhai Power Supply Bureau of Guangdong Power Grid Co., Ltd., Zhuhai 519000, China
  • 2.DC Power Distribution and Consumption Technology Research Center of Guangdong Power Grid Co., Ltd., Zhuhai 519000, China
  • 3.School of Electrical Engineering, Southeast University, Nanjing 210096, China
出版时间: 2026-05-30 doi: 10.13234/j.issn.2095-2805.2026.5.339
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电力电子变压器PET(power electronic transformer)绝缘系统在高频、高压、低上升时间脉冲电应力及高温等恶劣环境中不断劣化,绝缘放电和击穿风险与日俱增。为了研究真实工况下PET绝缘高温热老化对绝缘劣化的影响,将变压器典型绝缘聚酰亚胺PI(polyimide)在250 ℃下分别老化3、6、9、12天,然后采用20 kHz、4 kV、300 ns的脉冲电压模拟PET运行工况,测试绝缘局部放电和击穿电压,并使用时间分辨放电谱图TRPD(time-resolved partial discharge)及放电次数、平均放电幅值、最大放电幅值来表征绝缘的劣化程度。结果表明,老化后PI薄膜的TRPD谱图放电形状从单峰变为多峰,呈现出分簇的现象;同时,随着老化时间的增加,局部放电次数、平均放电幅值、最大放电幅值分别提高了47.3%、61.1%和41.9%,绝缘劣化程度显著加深。PI薄膜的击穿电压分布符合Weibull分布,随老化时间的增加而减小,从初始的4 667 V降到4 457 V,下降了4.5%。因此,得到了老化时间对PET绝缘劣化的影响规律,对PET绝缘可靠性分析和优化设计具有重要指导意义。

电力电子变压器  /  脉冲电应力  /  高温劣化  /  局部放电  /  击穿电压

Power electronic transformer (PET) insulation system continue to deteriorate in high frequency, high voltage, short rise time pulse electrical stress and high temperature and other harsh environments; insulation discharge and breakdown risks are increasing significantly. In order to study the effect of high temperature thermal aging for PET on insulation deterioration under real operating conditions, the typical insulation polyimide (PI) of PET was aged at 250 ℃ for 3, 6, 9, 12 days, and then 20 kHz, 4 kV, 300 ns pulsed voltage was used to simulate PET operating conditions. The partial discharge and breakdown voltage of insulation were tested, and time-resolved partial discharge spectrum (TRPD), discharge times, average discharge amplitude, and maximum discharge amplitude were used to characterize the degree of insulation deterioration. The results show that after aging, the TRPD pattern of PI films changes from single peak to multiple peaks, showing a phenomenon of clustering. At the same time, with the increase of aging time, the number of partial discharges, average discharge amplitude and maximum discharge amplitude increase by 47.3%, 61.1% and 41.9%, respectively, and the degree of insulation deterioration was significantly deepened. The breakdown voltage distribution of PI film conforms to Weibull distribution and decreases with aging time, from the initial 4 667 V to 4 457 V, a decrease of 4.5%. Therefore, the effect of aging time on the deterioration of PET insulation is obtained, which has certain guiding significance for the reliability analysis and optimal design of PET insulation.

Power electronic transformer  /  pulsed electrical stress  /  high temperature deterioration  /  partial discharges  /  breakdown voltage
陈建福, 程旭, 陈勇, 赵晓燕, 陈武中国电源学会高级会员, 沈湛中国电源学会会员. 老化时间对电力电子变压器绝缘劣化的影响. 电源学报, 2026 , 24 (5) : 339 -348 . DOI: 10.13234/j.issn.2095-2805.2026.5.339
Jianfu CHEN, Xu CHENG, Yong CHEN, Xiaoyan ZHAO, Wu CHEN, Zhan SHEN. Effect of Aging Time on Insulation Deterioration of Power Electronic Transformers[J]. Journal of Power Supply, 2026 , 24 (5) : 339 -348 . DOI: 10.13234/j.issn.2095-2805.2026.5.339
  • 国家自然科学基金资助项目(52207191)
  • 南方电网科技资助项目(030400KK52222021)
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2026年第24卷第5期
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doi: 10.13234/j.issn.2095-2805.2026.5.339
  • 接收时间:2025-02-09
  • 首发时间:2026-10-29
  • 出版时间:2026-05-30
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  • 收稿日期:2025-02-09
  • 修回日期:2025-03-23
  • 录用日期:2025-04-08
基金
National Natural Science Foundation of China(52207191)
国家自然科学基金资助项目(52207191)
China Southern Power Grid Company Technology Project(030400KK52222021)
南方电网科技资助项目(030400KK52222021)
作者信息
    1.广东电网有限责任公司珠海供电局,珠海 519000
    2.广东电网有限责任公司直流配用电研究中心,珠海 519000
    3.东南大学电气工程学院,南京 210096

通讯作者:

沈湛(1991— ),男,中国电源学会会员,通信作者,博士,副研究员。研究方向:高频电力电子及其磁元件。E-mail:,。
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2种不同金属材料的力学参数
科
Family
属数
Number of
genus
种数
Number of
species
占总种数比例
Percentage of
total species (%)
属
Genus
种数
Number of
species
占总种数比例
Percentage of total
species (%)
鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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