Article(id=1146828036223144447, tenantId=1146029695717560320, journalId=1146031654075715584, issueId=1146828028623066093, articleNumber=null, orderNo=null, doi=10.13234/j.issn.2095-2805.2025.1.209, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1654790400000, receivedDateStr=2022-06-10, revisedDate=1663084800000, revisedDateStr=2022-09-14, acceptedDate=1665244800000, acceptedDateStr=2022-10-09, onlineDate=1751354710870, onlineDateStr=2025-07-01, pubDate=1738166400000, pubDateStr=2025-01-30, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1751354710870, onlineIssueDateStr=2025-07-01, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=1752073883407, onlineFirstDateStr=2025-07-09, sourceXml=null, magXml=null, createTime=1751354710870, creator=13701087609, updateTime=1751354710870, updator=13701087609, issue=Issue{id=1146828028623066093, tenantId=1146029695717560320, journalId=1146031654075715584, year='2025', volume='23', issue='1', pageStart='1', pageEnd='258', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=0, createTime=1751354709057, creator=13701087609, updateTime=1765499536223, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1206155733847044492, tenantId=1146029695717560320, journalId=1146031654075715584, issueId=1146828028623066093, language=EN, specialIssueTitle=, coverIllustrator=, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1206155733847044493, tenantId=1146029695717560320, journalId=1146031654075715584, issueId=1146828028623066093, language=CN, specialIssueTitle=, coverIllustrator=, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=209, endPage=218, ext={EN=ArticleExt(id=1149844465143214397, articleId=1146828036223144447, tenantId=1146029695717560320, journalId=1146031654075715584, language=EN, title=Research on Driving Optimization for Improving Oscillation Stability of GaN-based Circuits, columnId=1153024086025429058, journalTitle=Journal of Power Supply, columnName=Power Semiconductor Devices, runingTitle=null, highlight=null, articleAbstract=

Compared with the traditional silicon(Si) devices, the gallium nitride(GaN) devices have lower parasitic parameters, a faster switching speed and a smaller on-resistance, which will easily lead to the phenomenon of continuous oscillation during their switching-on process and further result in the circuit instability. Therefore, it is necessary to suppress this phenomenon in practical circuits. Under this background, a negative conductance model of a bridge circuit under the conventional driving scheme is established at first, and the oscillation stability of the circuit is analyzed. Then, by adding optimization to the conventional driving scheme, the corresponding negative conductance model is established. The optimization schemes of series damping represented by changing the resistance and adding ferrite beads and those of parallel low impedance represented by adding RC snubber are selected, respectively. With this model, the influence of adding the driving optimization schemes on the oscillation stability of the circuit can be identified, and the changes in the stability before and after the addition were verified by experimental results, providing a reference for the driving circuit to select its appropriate driving optimization scheme.

, correspAuthors=Yan LI, authorNote=null, correspAuthorsNote=null, copyrightStatement=null, copyrightOwner=null, extLink=null, articleAbsUrl=null, sourceXml=null, magXml=null, pdfUrl=null, pdf=null, pdfFileSize=null, pdfExtLink=null, richHtmlUrl=null, mobilePdfUrl=null, reviewReport=null, pdfFirstPage=null, abstractGraph=null, abstractGraphContent=null, abstractVideo=null, citation=null, cebUrl=null, magXmlContent=null, mapNumber=null, authorCompany=null, fund=null, authors=null, authorsList=Nan ZHANG, Yan LI, Fangwei ZHAO), CN=ArticleExt(id=1146828043424764164, articleId=1146828036223144447, tenantId=1146029695717560320, journalId=1146031654075715584, language=CN, title=用于提高GaN基电路振荡稳定性的驱动优化研究, columnId=1153024086184812611, journalTitle=电源学报, columnName=功率半导体器件, runingTitle=null, highlight=null, articleAbstract=

相比传统的硅Si(silicon)器件,氮化镓GaN(gallium nitride)器件具有更低的寄生参数、更快的开关速度和更小的导通电阻,但也导致器件在开通过程中更容易发生持续振荡现象,带来电路的不稳定问题。为了抑制这种现象,建立常规驱动方式下桥式电路的负电导模型,分析电路的振荡稳定性,建立在常规驱动方式基础上增加优化方式的负电导模型,分别选择以改变关断电阻、增加磁珠为代表的串联阻尼和以RC(resistor-capacitance)阻尼器为代表的并联低阻抗的优化方式。通过此模型可以判断出驱动优化方式的加入对电路振荡稳定性产生的影响,并通过实验结果验证了加入优化方式前、后电路的振荡稳定性变化,为驱动回路选择合适的驱动优化方式提供了参考。

, correspAuthors=李艳, authorNote=null, correspAuthorsNote=
李艳(1977— ),女,中国电源学会会员,博士,教授。研究方向:电力电子高频变换器、宽禁带半导体器件应用。E-mail:
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张楠(1997— ),男,硕士研究生。研究方向:GaN器件测试。E-mail:

赵方玮(1995— ),女,博士研究生。研究方向:GaN器件测试及应用。 E-mail:

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赵方玮(1995— ),女,博士研究生。研究方向:GaN器件测试及应用。 E-mail:

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赵方玮(1995— ),女,博士研究生。研究方向:GaN器件测试及应用。 E-mail:

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articleId=1146828036223144447, language=EN, label=Tab. 1, caption=

Oscillation stability criterion for negative conductance

, figureFileSmall=null, figureFileBig=null, tableContent=
判定条件 振荡稳定性
GP(ω)+GN(I,ω)> 0 ω0Gloop > 0,振荡自熄。
GP(ω0)+GN(I0,ω0)= 0
BP(ω0)+BN(I0,ω0)=0
ω0Gloop= 0,持续振荡。
GP(ω)+GN(I,ω)<0 ω0Gloop < 0,振荡发散。
), ArticleFig(id=1205931311999546069, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1146828036223144447, language=CN, label=表1, caption=

负电导振荡稳定性判据

, figureFileSmall=null, figureFileBig=null, tableContent=
判定条件 振荡稳定性
GP(ω)+GN(I,ω)> 0 ω0Gloop > 0,振荡自熄。
GP(ω0)+GN(I0,ω0)= 0
BP(ω0)+BN(I0,ω0)=0
ω0Gloop= 0,持续振荡。
GP(ω)+GN(I,ω)<0 ω0Gloop < 0,振荡发散。
), ArticleFig(id=1205931312188289756, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1146828036223144447, language=EN, label=Tab. 2, caption=

Values of parameters

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参数 数值
Rp 0.135
Ls1/nH 0.65
Lp/nH 12.13
Rg1_off 1
L/μH 326
Lg1/nH 4.17
), ArticleFig(id=1205931312284758756, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1146828036223144447, language=CN, label=表2, caption=

参数的取值

, figureFileSmall=null, figureFileBig=null, tableContent=
参数 数值
Rp 0.135
Ls1/nH 0.65
Lp/nH 12.13
Rg1_off 1
L/μH 326
Lg1/nH 4.17
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用于提高GaN基电路振荡稳定性的驱动优化研究
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张楠 , 李艳 , 赵方玮
电源学报 | 功率半导体器件 2025,23(1): 209-218
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电源学报 | 功率半导体器件 2025, 23(1): 209-218
用于提高GaN基电路振荡稳定性的驱动优化研究
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张楠 , 李艳 , 赵方玮
作者信息
  • 北京交通大学电气工程学院,北京 100044
  • 张楠(1997— ),男,硕士研究生。研究方向:GaN器件测试。E-mail:

    赵方玮(1995— ),女,博士研究生。研究方向:GaN器件测试及应用。 E-mail:

通讯作者:

李艳(1977— ),女,中国电源学会会员,博士,教授。研究方向:电力电子高频变换器、宽禁带半导体器件应用。E-mail:
Research on Driving Optimization for Improving Oscillation Stability of GaN-based Circuits
Nan ZHANG , Yan LI , Fangwei ZHAO
Affiliations
  • School of Electrical Engineering, Beijing Jiaotong University, Beijing 100044, China
出版时间: 2025-01-30 doi: 10.13234/j.issn.2095-2805.2025.1.209
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相比传统的硅Si(silicon)器件,氮化镓GaN(gallium nitride)器件具有更低的寄生参数、更快的开关速度和更小的导通电阻,但也导致器件在开通过程中更容易发生持续振荡现象,带来电路的不稳定问题。为了抑制这种现象,建立常规驱动方式下桥式电路的负电导模型,分析电路的振荡稳定性,建立在常规驱动方式基础上增加优化方式的负电导模型,分别选择以改变关断电阻、增加磁珠为代表的串联阻尼和以RC(resistor-capacitance)阻尼器为代表的并联低阻抗的优化方式。通过此模型可以判断出驱动优化方式的加入对电路振荡稳定性产生的影响,并通过实验结果验证了加入优化方式前、后电路的振荡稳定性变化,为驱动回路选择合适的驱动优化方式提供了参考。

GaN  /  负电导模型  /  振荡  /  稳定性  /  驱动优化

Compared with the traditional silicon(Si) devices, the gallium nitride(GaN) devices have lower parasitic parameters, a faster switching speed and a smaller on-resistance, which will easily lead to the phenomenon of continuous oscillation during their switching-on process and further result in the circuit instability. Therefore, it is necessary to suppress this phenomenon in practical circuits. Under this background, a negative conductance model of a bridge circuit under the conventional driving scheme is established at first, and the oscillation stability of the circuit is analyzed. Then, by adding optimization to the conventional driving scheme, the corresponding negative conductance model is established. The optimization schemes of series damping represented by changing the resistance and adding ferrite beads and those of parallel low impedance represented by adding RC snubber are selected, respectively. With this model, the influence of adding the driving optimization schemes on the oscillation stability of the circuit can be identified, and the changes in the stability before and after the addition were verified by experimental results, providing a reference for the driving circuit to select its appropriate driving optimization scheme.

GaN  /  negative conductance model  /  oscillation  /  stability  /  driving optimization
张楠, 李艳, 赵方玮. 用于提高GaN基电路振荡稳定性的驱动优化研究. 电源学报, 2025 , 23 (1) : 209 -218 . DOI: 10.13234/j.issn.2095-2805.2025.1.209
Nan ZHANG, Yan LI, Fangwei ZHAO. Research on Driving Optimization for Improving Oscillation Stability of GaN-based Circuits[J]. Journal of Power Supply, 2025 , 23 (1) : 209 -218 . DOI: 10.13234/j.issn.2095-2805.2025.1.209
近年来,氮化镓GaN(gallium nitride)器件由于具有较低的寄生参数、较高的开关速率、较低损耗和较小封装尺寸等优点在诸多领域被广泛应用[1],然而高dv/dt、di/dt和较低的阈值电压使GaN器件容易在开通过程出现持续振荡现象,这将导致电路中容易出现电压和电流过冲现象,在同一桥臂的上下2只开关管出现直通现象,产生严重的电磁干扰EMI(electromagnetic interference)问题,甚至导致器件损坏[2-4]。GaN器件出现持续振荡问题的主要原因有2个:一是由于高dv/dt在器件栅漏极电容CGD上产生位移电流注入到栅极回路中;二是由于高di/dt在器件共源电感上产生感应电压,导致栅源极电压升高。这都将导致栅源极电压可能超过器件的阈值电压,引发器件的误开通,最终导致GaN器件出现持续振荡问题[5]
当前有2种方法解决GaN器件的持续振荡现象,第1种方法是在主功率回路采取措施[6-8]。文献[6]运用反馈理论对主动管在关断过程存在的持续振荡现象进行了研究,分析了主功率回路的寄生参数对振荡稳定性的影响,但是未考虑被动管关断电阻对振荡的影响;文献[7]对主动管漏源极并联RC(resistor-capacitance)阻尼器的抑制方式进行了研究,分析了不同取值的RC阻尼器对关断过程振荡稳定性的影响,但是未考虑被动管关断电阻对振荡的影响;文献[8]运用负阻振荡器理论对主动管在开通过程存在的持续振荡现象进行了研究,通过模型分析了主功率回路寄生参数对振荡稳定性的影响,并对在主功率回路增加磁珠和在被动管漏源极并联RC阻尼器的抑制方式进行了分析,但是未考虑被动管关断电阻对振荡的影响。第2种方法是在驱动回路采取措施[9-10]。文献[9]通过仿真和实验分析了主动管驱动回路中开通电阻、关断电阻和寄生电感等参数对电路振荡的影响;文献[10]对在主动管栅源极并联RC阻尼器的抑制方式进行了研究,分析了不同取值的RC阻尼器对关断过程振荡稳定性的影响,但是未考虑被动管关断电阻对振荡的影响。
GaN器件出现持续振荡现象是采用常规驱动方式可能出现的一个大问题。由于优化印制电路板PCB(printed circuit board)布局需要对各个参数进行详细分析,过程较为繁琐,本文希望在驱动回路采用合适的优化方式来解决这一问题。基于此,本文在保证上下2只开关管驱动回路参数相同的情况下对常规驱动方式的桥式电路建立了负电导模型,分析电路的振荡稳定性,并对加入驱动优化方式的电路进行了建模,分析驱动优化方式的加入对电路振荡稳定性产生的影响。通过实验验证加入驱动优化方式前后电路的振荡稳定性变化,以期为选择合适的驱动优化方式提供参考。
GaN器件在开通过程中存在持续振荡现象,随着母线电压Vbus的升高,持续振荡现象逐渐加剧,甚至会导致器件损坏。图1(a)(b)分别给出了Vbus=100 V和Vbus=120 V时GaN器件出现振荡的实验波形。
为了避免电路出现持续振荡现象,本文在常规驱动的基础上加入优化方式来解决此问题。双脉冲测试电路和开通过程主要波形如图2所示。其中,图2(a)为常规驱动下的双脉冲电路,图2(b)为在驱动回路加入串联阻尼支路和并联低阻抗支路2种优化方式的双脉冲测试电路,图中:Rloop为主功率回路寄生电阻;Ls11Ls22为主功率回路共源电感;Lloop1Lloop2Lloop3Lloop4为主功率回路寄生电感;Rg1_off为关断电阻;Rg2_on为开通电阻;L为建流电感;Lg1为驱动回路寄生电感;Rg0为器件内部栅极寄生电阻;Ls0为器件内部源极寄生电感;Ld0为器件内部漏极寄生电感。
为建立开通过程的振荡小信号模型,对图2(c)中[t4,t6]时刻的开通过程作如下假设:①主动管S2完全打开,等效为导通电阻Rds_on,将器件本体在漏极和源极的寄生电感串联到功率回路中;②由于被动管发生了误开通,存在沟道电流,电流方向默认为由源极流向漏极;③输入电源和输入侧支撑电容作短路处理,电感电流此时已达到给定值,等效为电流源,作开路处理。
由于米勒电容CGD和共源电感的存在,被动管两端漏源极电压和漏极电流的振荡会导致栅源极电压超过其阈值,这与振荡理论中的自激现象类似,因此利用振荡器理论来分析GaN器件的持续振荡现象。负阻振荡器理论中存在有源晶体管,可类比GaN器件。假设有源器件为电路中的无源器件提供等效消耗的能量,此时电路发生自激振荡,将该有源器件等效为二端口网络,联结2条支路,连接有源器件的支路称为终端匹配支路,连接无源器件的支路称为无源支路,其表达式分别为
${Z}_{\text{N}}(I,\omega )={R}_{\text{N}}(I,\omega )+\text{j}{X}_{\text{N}}(I,\omega )$
${Z}_{\text{P}}(\omega )={R}_{\text{P}}(\omega )+\text{j}{X}_{\text{P}}(\omega )$
式中:${Z}_{\text{N}}(I,\omega )$${R}_{\text{N}}(I,\omega )$${X}_{\text{N}}(I,\omega )$分别为终端匹配支路的阻抗、电阻、电抗;${Z}_{\text{P}}(\omega )$${R}_{\text{P}}(\omega )$${X}_{\text{P}}(\omega )$分别为无源支路的阻抗、电阻、电抗;I为电流i(t)的幅值;ω为角频率。
负阻模型[8]图3(a)所示,然而在某些电路中构建负阻模型的步骤相对复杂,使用如图3(b)所示的负电导模型更加简洁。在负电导模型中,有源器件同样等效为1个二端口,连接有源器件与无源器件,终端匹配支路和无源支路的表达式分别为
${Y}_{\text{N}}(I,\omega )={G}_{\text{N}}(I,\omega )+\text{j}{B}_{\text{N}}(I,\omega )$
${Y}_{\text{P}}(\omega )={G}_{\text{P}}(\omega )+\text{j}{B}_{\text{P}}(\omega )$
式中:YN(I,ω)、GN(I,ω)、BN(I,ω)分别为终端匹配支路的导纳、电导、电纳;YP(ω)、GP(ω)、BP(ω)分别为无源支路的导纳、电导、电纳。
根据负电导模型判断电路的振荡稳定性,判断方式见表1,其中:ω0为振荡频率,I0为振荡频率ω0处的电流幅值,环路电导Gloop=GP(ω)+GN(I,ω)
本文对常规驱动的双脉冲电路建立负电导模型,分析不同母线电压下电路的振荡稳定性。图4(a)为常规驱动下开通过程的小信号模型,端口1、2的右侧因为存在有源器件,等效为负电导模型的终端匹配支路(简称有源支路),端口左侧由于仅有电阻,不存在有源器件,可看作损耗匹配支路(无源支路)。由于驱动回路表达较为复杂,用Z1 等效替代驱动回路的相关参数,表达式为
${Z}_{1}={R}_{\text{g1_off}}+{R}_{\text{g_in}}+\text{j}\omega {L}_{\text{g1}}$
利用星三角变换等方式对端口右侧中的有源支路进行化简,图4(b)(c)给出了简化后的等效电路。为求解图4(c)端口右侧的等效导纳,将端口电压定义为vDS1,将流入端口1、2的电流定义为i,对端口右侧列写基尔霍夫定律,得到导纳YN和无源支路的等效导纳YP分别为
${Y}_{\text{N}}=\frac{1-{g}_{\text{m}}{Z}_{8}}{({Z}_{7}+{Z}_{8})}+\frac{1}{{Z}_{9}}$
${Y}_{\text{P}}={G}_{\text{p}}$
式中,${g}_{\text{m}}$为跨导系数。
根据表1中的稳定性判据可以看出电路的稳定性情况。
为了抑制持续振荡现象的发生,本文在上、下2只开关管的驱动回路中加入串联驱动优化方式。图5(a)给出了增加串联阻尼支路的小信号模型,串联阻尼支路以增加磁珠和改变关断电阻为例。与图4(a)的模型相比,图5(a)Z1的表达式有所不同,即
${Z}_{1}={R}_{\text{g1_off}}+{R}_{\text{g_in}}+\text{j}\omega {L}_{\text{g1}}+Z$
其余公式相同,电路的稳定性判断条件相同。
为了抑制持续振荡现象的发生,本文在上下2只开关管的驱动回路中加入并联驱动优化方式。 图5(b)给出了在驱动回路增加并联低阻抗支路的小信号模型,低阻抗支路以并联RC阻尼器为例。 与图4(a)的模型相比,图5(b)Z1的表达有所不同,即
${Z}_{1}={R}_{\text{g_in}}+\left({R}_{\text{s}}-\frac{\text{j}}{\omega {C}_{\text{s}}}\right)\left|\right|({R}_{\text{g1_off}}+\text{j}\omega {L}_{\text{g1}})$
式中:Rs为RC阻尼器的电阻;Cs为RC阻尼器的电容。
其余公式相同,电路的稳定性判断条件相同。
为验证不同驱动优化方式对电路振荡稳定性的影响,通过Ansys Q3D提取驱动回路和主功率回路的寄生参数;选择的开关管为GaN Systems公司的GS66508T,门极寄生电阻为1.1 Ω,源极和漏极寄生电感为0.2 nH;同轴分流器型号为SBNC-1-05,内部存在50 mΩ的寄生电阻,寄生电感极小可忽略;总参数见表2,其中主功率回路中总的寄生电感Lp=Lloop1+Lloop2+Lloop3+Lloop4+Lsens+2Ld0,主功率回路总的寄生电阻Rp=Rloop+Rsens+Rdson,总共源电感Ls1=Ls11+Ls0
本文根据表1中的判断条件和表2中的相关参数,利用负电导模型分析电路在不同母线电压下的振荡稳定性。图6给出了常规驱动下Gloop随母线电压的变化趋势,可以看出,从Vbus=62 V处开始Gloop<0,此时电路的vDS2应为持续振荡波形,当电路出现持续振荡后,随着母线电压的提高,振荡稳定性会变差,与图1相符。
由于电路在Vbus=62 V时起振,为防止电路的稳定性继续恶化,首先分析在起振电压下添加不同Rg1_off后的电路稳定性;接下来对采用不同Rg1_off的电路进行升压,分析不同母线电压下的电路稳定性。图7给出了Gloop在不同Vbus和不同Rg1_off下的变化趋势,可以看出:在同一Vbus下,随着Rg1_off 的增加,Gloop 逐渐增大,电路稳定性提高;随着Vbus的提高,在同一Rg1_off下,Gloop逐渐减小,电路的稳定性降低。
本文将磁珠用电阻、电感等无源器件进行等效,磁珠等效模型与特性曲线如图8所示。图8(a)中,在选择磁珠时首先应保证磁珠的加入对振荡起抑制作用。由图7可以看出,在起振电压处,当 Rg1_off>3 Ω时电路处于稳定状态,因此可以参考Rg1_off的取值来确定振荡频率60 MHz处阻抗的下限。在满足阻抗大于其下限的条件下选择MH2029-070Y和BLM21SP700SH1D这2款磁珠进行比较,图8(b)为磁珠MH2029-070Y的特性曲线。 将图8(b)中振荡频率处的阻抗代入式(10),求得La,等效模型的参数为:La = 10.35 nH,Ra = 20.7 Ω,Rd = 0.03 Ω。图8(c)为磁珠BLM21SP700SH1D的特性曲线,等效模型的参数为:La = 359 nH,Ra = 65.7 Ω,Rd = 0.09 Ω。
${L}_{\text{a}}=\frac{\left|Z\right|}{2\text{π}f}$
图9Vbus = 62 V时加入磁珠MH2029-070Y和BLM 21SP700SH1D后vGS2vDS2的仿真波形,可以看出:添加2种磁珠后,vDS2波形均为衰减振荡波形;但图9(b)vGS2波形上叠加了8.4 MHz的低频振荡分量,这是由于磁珠BLM21SP700SH1D在振荡频率处的阻抗比磁珠MH2029-070Y大,根据式(10)求得的La比磁珠MH2029-070Y的La大得多,过大的La会与CGS发生谐振,在vGS2波形上叠加低频振荡分量。因此阻抗的上限应保证等效的La不会在vGS2波形上引入额外的低频振荡分量。综上分析,本文选择磁珠MH2029-070Y。
将拟合的磁珠参数代入负电导模型中进行验证,图10给出了添加磁珠后的Gloop随母线电压的变化趋势,可以看出,随着电压的升高,Gloop减小,电路的稳定性降低,但仍处于稳定状态。
由于电路在Vbus = 62 V时出现持续振荡问题,本文首先分析了起振电压下加入RC阻尼器对电路振荡稳定性的影响,GloopRsCs变化曲线如图11所示。图11(a)给出了在Rs = 5.1 Ω、Cs = 390 pF;Rs = 5.1 Ω、Cs = 820 pF;Rs = 10 Ω、Cs = 270 pF这3种条件下Gloop随母线电压的变化情况,可以看出:在相同Rs下,随着Cs的增加,Gloop逐渐增加;在同一母线电压下,对于不同的RsCs取值,该方法均能给出稳定性好坏的判断;不同母线电压下Gloop的变化情况,同一RsCs取值下,随着母线电压的升高,Gloop逐渐减小。由图11(b)可以看出,在起振电压下添加不同取值的RC阻尼器后,稳定性的变化趋势是Rs越小,Cs越大,Gloop越大,电路越稳定。
图11(c)给出了Vbus=200 V时电路的稳定性变化趋势,可以看出:在Vbus=200 V时,电路的稳定性变化趋势与图11(b)中的变化趋势相同。
为了验证理论分析的准确性,本文搭建了双脉冲实验平台,如图12所示。电压探头型号为Tek-tronix TPP0101,带宽100 MHz,电压等级300 V;同轴分流器型号为SBNC-1-05;示波器型号为Tektronix MDO3034,带宽350 MHz。
本文基于双脉冲实验平台测试了在常规驱动方式下电路的振荡稳定性。随着母线电压的升高,实验过程中在Vbus=62 V时电路首次出现如图13所示的持续振荡现象,电路处于不稳定状态,这与 图6所示的理论分析相符。
为了验证加入串联驱动优化方式对电路振荡稳定性的影响,实验过程中同时改变上、下2只开关管的关断电阻,电路的实验波形如图14所示。图14(a)(b)分别给出在Vbus = 62 V、Rg1_off = 5.1 Ω和Rg1_off = 10.0 Ω时的实验波形,可见,在起振电压处,Rg1_off = 10.0 Ω时vDS2波形的振荡幅值为4.795 V,小于Rg1_off = 5.1 Ω时的振荡幅值6.000 V;同一母线电压下,随着关断电阻的增大,vDS2波形的振荡幅值减小。图14(c)给出Vbus = 200 V、Rg1_off = 10 Ω时的实验波形。由图14(b)(c)可见,在Vbus = 62 V、Rg1_off = 10.0 Ω时,vDS2波形的振荡幅值为4.795 V,小于Vbus = 200 V时的振荡幅值27.980 V;同一关断电阻下,随着母线电压升高,vDS2波形的振荡幅值增加,与图7中的理论分析相符。
实验过程中,在上、下2只开关管的驱动回路串联磁珠,图15(a)(b)分别给出了Vbus = 100 V和Vbus = 200 V时的实验波形,可以看出,vDS2波形的振荡幅值由9.992 V变为32.000 V,与图10中的理论推导相符。
为了验证加入并联驱动优化方式对电路振荡稳定性的影响,实验过程中在上、下2只开关管的驱动回路加入不同取值的RC阻尼器,采用并联优化方式的桥式电路实验波形如图16所示。首先分析在起振电压62 V处电路的振荡稳定性。图16(a)Rs = 5.1 Ω、Cs = 390 pF时的波形,图16(b)Rs = 5.1 Ω、Cs = 820 pF时的波形,图16(c)Rs = 10.0 Ω、Cs = 270 pF时的波形。由图16(a)(b)可见,图16(b)vDS2 = 3.998 V,小于图16(a)vDS2 = 4.800 V;由图16(b)(c)可见,图16(b)vDS2 =3.998 V,小于图16(c)vDS2 = 6.394 V。这与图11中的理论分析相符。
Vbus = 200 V时添加不同取值的RC阻尼器,分析电路的振荡稳定性。图16(d)Rs = 5.1 Ω、Cs = 390 pF时的波形,图16(e)Rs = 5.1 Ω、Cs = 820 pF时的波形,图16(f)Rs = 10.0 Ω、Cs = 270 pF时的波形。由图16(d)(e)可见,图16(e)vDS2 = 7.984 V,小于图16(d)vDS2 = 8.000 V;由图16(e)(f)可见,图16(e)vDS2 = 7.984 V,小于图16(f)vDS2 = 10.000 V。这也与图11中的理论分析相符。
由于同时改变上、下2只开关管的驱动回路,2种优化方式对关断速率的影响是不同的。图17(a)Vbus = 200 V、Rg1_off = 10.0 Ω时的实验波形,图17(b)Vbus = 200 V、增加磁珠时的实验波形,图17(c)Vbus = 200 V、Rs = 5.1 Ω、Cs = 820 pF时的实验波形。由图17可见:图17(a)的关断速率3.78 V/ns小于图17(b)的关断速率5.20 V/ns;图17(b)的关断速率5.20 V/ns小于图17(c)的关断速率7.33 V/ns。因此,在同时考虑振荡幅值与关断速率的情况下,增加RC阻尼器的并联优化方式较串联优化方式更优。
本文以双脉冲电路为例建立了常规驱动下的负电导模型,分析了GaN器件在开通过程中的振荡稳定性,分别建立了在驱动回路添加串联形式和并联形式优化方式的负电导模型,通过比较模型中Gloop的大小判断出加入不同优化方式后电路的稳定性差异。结果表明:①在驱动回路采用串联形式的优化方式下,可以通过改变关断电阻或加入磁珠等优化方式,使电路更加稳定;②在采用并联形式的优化方式(RC阻尼器)的情况下,可以判断RC阻尼器中不同参数取值对电路振荡稳定性的影响。
  • 国家自然科学基金面上资助项目(51877007)
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2025年第23卷第1期
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doi: 10.13234/j.issn.2095-2805.2025.1.209
  • 接收时间:2022-06-10
  • 首发时间:2025-07-01
  • 出版时间:2025-01-30
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  • 收稿日期:2022-06-10
  • 修回日期:2022-09-14
  • 录用日期:2022-10-09
基金
National Natural Science Foundation of China(51877007)
国家自然科学基金面上资助项目(51877007)
作者信息
    北京交通大学电气工程学院,北京 100044

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李艳(1977— ),女,中国电源学会会员,博士,教授。研究方向:电力电子高频变换器、宽禁带半导体器件应用。E-mail:
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