Article(id=1153375935022748050, tenantId=1146029695717560320, journalId=1146031654075715584, issueId=1153375932170621317, articleNumber=null, orderNo=null, doi=10.13234/j.issn.2095-2805.2024.6.295, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=null, receivedDate=1640707200000, receivedDateStr=2021-12-29, revisedDate=1647532800000, revisedDateStr=2022-03-18, acceptedDate=1647792000000, acceptedDateStr=2022-03-21, onlineDate=1752915851597, onlineDateStr=2025-07-19, pubDate=1732896000000, pubDateStr=2024-11-30, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1752915851597, onlineIssueDateStr=2025-07-19, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1752915851597, creator=13701087609, updateTime=1752915851597, updator=13701087609, issue=Issue{id=1153375932170621317, tenantId=1146029695717560320, journalId=1146031654075715584, year='2024', volume='22', issue='6', pageStart='1', pageEnd='326', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=0, createTime=1752915850917, creator=13701087609, updateTime=1753780959263, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1157004459600597839, tenantId=1146029695717560320, journalId=1146031654075715584, issueId=1153375932170621317, language=EN, specialIssueTitle=, coverIllustrator=, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1157004459600597840, tenantId=1146029695717560320, journalId=1146031654075715584, issueId=1153375932170621317, language=CN, specialIssueTitle=, coverIllustrator=, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=295, endPage=303, ext={EN=ArticleExt(id=1153375935417012627, articleId=1153375935022748050, tenantId=1146029695717560320, journalId=1146031654075715584, language=EN, title=Online Monitoring Method for IGBT Device Junction Temperature Based on Novel On-state Voltage Drop Sampling Circuit, columnId=1153024086025429058, journalTitle=Journal of Power Supply, columnName=Power Semiconductor Devices, runingTitle=null, highlight=null, articleAbstract=

Temperature sensitive electrical parameter method has characteristics such as strong online capacity, non-invasiveness, and rapid response, so it has become a research hotspot at present. The on-state voltage drop is taken as a temperature sensitive electrical parameter, and an online monitoring method for IGBT junction temperature is studied based on the on-state voltage drop. First, the data of on-state voltage drop, collector current, and junction temperature of IGBT is obtained through the double-pulse test circuit. Then, based on the measured data, a three-dimensional mapping representation model of IGBT collector current, junction temperature, and on-state voltage drop is constructed. Finally, a novel on-state voltage drop sampling circuit was designed, and an online monitoring experimental of IGBT junction temperature was conducted. Experimental results verified the accuracy and validity of the obtained three-dimensional junction temperature representation model.

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热敏感电参数法具有在线能力强、非侵入和快响应等特点,成为了当前的研究热点。因此以导通压降为热敏感电参数,重点研究了1种基于导通压降的 IGBT 结温在线监测方法。首先,通过双脉冲测试电路获取IGBT 导通压降、集电极电流和结温数据;然后,基于所测数据构建了 IGBT集电极电流、结温与导通压降的三维映射表征模型;最后,设计了1种新型导通压降采样电路,并开展 IGBT 结温的在线监测实验研究,实验结果验证了所得三维结温表征模型的准确性和有效性。

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赵蕤(1997-),男,硕士研究生。研究方向:电力电子与电力传动。E-mail: 592685843@qq.com。

杨柯欣(1994-),男,中国电源学会学生会员,博士研究生。研究方向:电力电子与电力传动。E-mail:1083226411@qq.com。

唐涛(1999-),男,硕士研究生。研究方向:电力电子与电力传动。E-mail: 1194312775@qq.com。

宋文胜(1985-),男,中国电源学会高级会员,通信作者,博士,教授。研究方向:电力牵引传动与控制、功率器件健康状态监测。E-mail: songwsh@swjtu.edu.cn。

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赵蕤(1997-),男,硕士研究生。研究方向:电力电子与电力传动。E-mail: 592685843@qq.com。

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赵蕤(1997-),男,硕士研究生。研究方向:电力电子与电力传动。E-mail: 592685843@qq.com。

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杨柯欣(1994-),男,中国电源学会学生会员,博士研究生。研究方向:电力电子与电力传动。E-mail:1083226411@qq.com。

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杨柯欣(1994-),男,中国电源学会学生会员,博士研究生。研究方向:电力电子与电力传动。E-mail:1083226411@qq.com。

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唐涛(1999-),男,硕士研究生。研究方向:电力电子与电力传动。E-mail: 1194312775@qq.com。

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唐涛(1999-),男,硕士研究生。研究方向:电力电子与电力传动。E-mail: 1194312775@qq.com。

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宋文胜(1985-),男,中国电源学会高级会员,通信作者,博士,教授。研究方向:电力牵引传动与控制、功率器件健康状态监测。E-mail: songwsh@swjtu.edu.cn。

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宋文胜(1985-),男,中国电源学会高级会员,通信作者,博士,教授。研究方向:电力牵引传动与控制、功率器件健康状态监测。E-mail: songwsh@swjtu.edu.cn。

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Proceedings of the CSEE, 2022. 42(12): 4547-4561 (in Chinese)., articleTitle=An online monitoring circuit for IGBT conduction voltage drop based on reverse series Zener diodes clamping, refAbstract=null)], funds=[Fund(id=1154032472963670375, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, awardId=52022084, language=EN, fundingSource=National Natural Science Foundation of China(52022084), fundOrder=null, country=null), Fund(id=1154032473014002024, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, awardId=52022084, language=CN, fundingSource=国家自然科学基金资助项目(52022084), fundOrder=null, country=null), Fund(id=1154032473072722282, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, awardId=22CXTD0055, language=EN, fundingSource=Youth Science and Technology Innovation Research Team of Sichuan(22CXTD0055), fundOrder=null, country=null), Fund(id=1154032473135636842, 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remark=西南交通大学 电气工程学院 成都 611756)])], figs=[ArticleFig(id=1154032470799409428, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Fig. 1, caption=Simplified model and internal structure of IGBT, figureFileSmall=gm6i8H8bOLLFa6l4mQMqmw==, figureFileBig=CpXF9h2/0gx61Vzb1iEwgg==, tableContent=null), ArticleFig(id=1154032470870712599, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=图1, caption=IGBT 简化模型和内部结构, figureFileSmall=gm6i8H8bOLLFa6l4mQMqmw==, figureFileBig=CpXF9h2/0gx61Vzb1iEwgg==, tableContent=null), ArticleFig(id=1154032470946210076, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Fig. 2, caption=Output characteristic curves of FF100R12KS4, figureFileSmall=Re/FNHOWmwOohuYrCVbqRQ==, figureFileBig=qECDblrlnTE9J8MKqPTUJA==, tableContent=null), ArticleFig(id=1154032470996541727, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=图2, caption=FF100R12KS4 的 $V - I$ 特性曲线, figureFileSmall=Re/FNHOWmwOohuYrCVbqRQ==, figureFileBig=qECDblrlnTE9J8MKqPTUJA==, tableContent=null), ArticleFig(id=1154032471072039201, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Fig. 3, caption=High-current on-state voltage drop junction temperature calibration circuit, figureFileSmall=wePVK++4KCaG59/C7l6Prg==, figureFileBig=VJWQApBR0Cn0QLR6MDaegw==, tableContent=null), ArticleFig(id=1154032471139148070, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=图3, caption=大电流导通压降结温校准电路, figureFileSmall=wePVK++4KCaG59/C7l6Prg==, figureFileBig=VJWQApBR0Cn0QLR6MDaegw==, tableContent=null), ArticleFig(id=1154032471189479721, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Fig. 4, caption=Three-dimensional mapping representation model of junction temperature and collector current and on-state voltage drop, figureFileSmall=VH8AYFAtn42ki5rJC+kK+g==, figureFileBig=eODP5AQx9G4QBUVvyfFvUQ==, tableContent=null), ArticleFig(id=1154032471256588589, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=图4, caption=结温和集电极电流、导通压降的三维映射表征模型, figureFileSmall=VH8AYFAtn42ki5rJC+kK+g==, figureFileBig=eODP5AQx9G4QBUVvyfFvUQ==, tableContent=null), ArticleFig(id=1154032471315308847, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Fig. 5, caption=Comparison among different on-state voltage drop sampling circuits, figureFileSmall=XghWZerHbfAcOQnh3foAhA==, figureFileBig=iVO06CXRy6Zsvn5K46ckyQ==, tableContent=null), ArticleFig(id=1154032471399194930, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=图5, caption=不同导通压降采样电路对比, figureFileSmall=XghWZerHbfAcOQnh3foAhA==, figureFileBig=iVO06CXRy6Zsvn5K46ckyQ==, tableContent=null), ArticleFig(id=1154032471453720885, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Fig. 6, caption=Transition process when charging a capacitor, figureFileSmall=yVn2L2Cqz9JQLnMFICnadA==, figureFileBig=47wWC6jwBsHIn1Rkkz1tiw==, tableContent=null), ArticleFig(id=1154032471516635449, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=图6, caption=电容充电时的过渡过程, figureFileSmall=yVn2L2Cqz9JQLnMFICnadA==, figureFileBig=47wWC6jwBsHIn1Rkkz1tiw==, tableContent=null), ArticleFig(id=1154032471583744316, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Fig. 7, caption=Experimental platform for monitoring junction temperature based on on-state volage drop, figureFileSmall=K/d/t9UMfRZo6rwG5J+UPA==, figureFileBig=crf9gudLgZvbQ8NvICUATA==, tableContent=null), ArticleFig(id=1154032471638270270, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=图7, caption=基于导通压降的结温监测实验平台, figureFileSmall=K/d/t9UMfRZo6rwG5J+UPA==, figureFileBig=crf9gudLgZvbQ8NvICUATA==, tableContent=null), ArticleFig(id=1154032471738933568, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Fig. 8, caption=On-state voltage drop sampling results when collector current is ${25}\mathrm{\;A}$, figureFileSmall=xD63lLnLCRmz+a4u7IAz7w==, figureFileBig=wgusK/bK6WMLpRx98OJ4Cg==, tableContent=null), ArticleFig(id=1154032471806042434, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=图8, caption=集电极电流为 ${25}\mathrm{\;A}$ 下的导通压降结果, figureFileSmall=xD63lLnLCRmz+a4u7IAz7w==, figureFileBig=wgusK/bK6WMLpRx98OJ4Cg==, tableContent=null), ArticleFig(id=1154032471868956996, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Fig. 9, caption=Junction temperature curve based on three-dimensional mapping representation model, figureFileSmall=WfGm1kFLdRlCwykYPU08YA==, figureFileBig=tVcMdC93ErHOfG6i56oISw==, tableContent=null), ArticleFig(id=1154032471940260167, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=图9, caption=基于三维映射表征模型的结温计算曲线, figureFileSmall=WfGm1kFLdRlCwykYPU08YA==, figureFileBig=tVcMdC93ErHOfG6i56oISw==, tableContent=null), ArticleFig(id=1154032471994786121, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Fig. 10, caption=Thermal imaging temperature of the device under test, figureFileSmall=KHor1B//tTP+rLGN89z7pA==, figureFileBig=bHCthWhYz2flyz54600D2g==, tableContent=null), ArticleFig(id=1154032472053506379, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=图10, caption=所测器件的热成像温度, figureFileSmall=KHor1B//tTP+rLGN89z7pA==, figureFileBig=bHCthWhYz2flyz54600D2g==, tableContent=null), ArticleFig(id=1154032472170946895, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Tab. 1, caption=Constant results of linear relationship polynomial, figureFileSmall=null, figureFileBig=null, tableContent=
拟合 参数 结果 拟合 参数 结果 拟合 参数 结果
${a}_{11}$ $-{1.784}\times {10}^{-9}$ ${a}_{15}$ $-{9.935}\times {10}^{-4}$ ${a}_{24}$ ${4.534}\times {10}^{-3}$
${a}_{12}$ ${2.470}\times {10}^{-7}$ ${a}_{21}$ ${2.138}\times {10}^{-8}$ ${a}_{25}$ 0.06755
${a}_{13}$ $-{1.198}\times {10}^{-5}$ ${a}_{22}$ $-{3.200}\times {10}^{-6}$ ${a}_{26}$ 0.26650
${a}_{14}$ ${2.674}\times {10}^{-4}$ ${a}_{23}$ ${1.772}\times {10}^{-4}$
), ArticleFig(id=1154032472233861458, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=表1, caption=线性关系多项式常数项结果, figureFileSmall=null, figureFileBig=null, tableContent=
拟合 参数 结果 拟合 参数 结果 拟合 参数 结果
${a}_{11}$ $-{1.784}\times {10}^{-9}$ ${a}_{15}$ $-{9.935}\times {10}^{-4}$ ${a}_{24}$ ${4.534}\times {10}^{-3}$
${a}_{12}$ ${2.470}\times {10}^{-7}$ ${a}_{21}$ ${2.138}\times {10}^{-8}$ ${a}_{25}$ 0.06755
${a}_{13}$ $-{1.198}\times {10}^{-5}$ ${a}_{22}$ $-{3.200}\times {10}^{-6}$ ${a}_{26}$ 0.26650
${a}_{14}$ ${2.674}\times {10}^{-4}$ ${a}_{23}$ ${1.772}\times {10}^{-4}$
), ArticleFig(id=1154032472317747540, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Tab. 2, caption=Constant results of quadratic relationship polynomial, figureFileSmall=null, figureFileBig=null, tableContent=
拟合 参数 结果 拟合 参数 结果 拟合 参数 结果
${b}_{11}$ $-{4.785}\times {10}^{-{10}}$ ${b}_{22}$ ${3.212}\times {10}^{-7}$ ${b}_{32}$ $-{3.205}\times {10}^{-6}$
${b}_{12}$ ${3.946}\times {10}^{-8}$ ${b}_{23}$ $-{1.813}\times {10}^{-5}$ ${b}_{33}$ ${1.750}\times {10}^{-4}$
${b}_{13}$ $-{1.054}\times {10}^{-6}$ ${b}_{24}$ ${4.316}\times {10}^{-4}$ ${b}_{34}$ $-{0.004}\;3$
${b}_{14}$ $-{4.125}\times {10}^{-6}$ ${b}_{25}$ $-{3.536}\times {10}^{-4}$ ${b}_{35}$ 0.0623
${b}_{21}$ $-{1.780}\times {10}^{-9}$ ${b}_{31}$ ${2.141}\times {10}^{-8}$ ${b}_{36}$ 0.2461
), ArticleFig(id=1154032472372273493, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=表2, caption=二次关系多项式常数项结果, figureFileSmall=null, figureFileBig=null, tableContent=
拟合 参数 结果 拟合 参数 结果 拟合 参数 结果
${b}_{11}$ $-{4.785}\times {10}^{-{10}}$ ${b}_{22}$ ${3.212}\times {10}^{-7}$ ${b}_{32}$ $-{3.205}\times {10}^{-6}$
${b}_{12}$ ${3.946}\times {10}^{-8}$ ${b}_{23}$ $-{1.813}\times {10}^{-5}$ ${b}_{33}$ ${1.750}\times {10}^{-4}$
${b}_{13}$ $-{1.054}\times {10}^{-6}$ ${b}_{24}$ ${4.316}\times {10}^{-4}$ ${b}_{34}$ $-{0.004}\;3$
${b}_{14}$ $-{4.125}\times {10}^{-6}$ ${b}_{25}$ $-{3.536}\times {10}^{-4}$ ${b}_{35}$ 0.0623
${b}_{21}$ $-{1.780}\times {10}^{-9}$ ${b}_{31}$ ${2.141}\times {10}^{-8}$ ${b}_{36}$ 0.2461
), ArticleFig(id=1154032472430993751, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Tab. 3, caption=Polynomial fitting effect, figureFileSmall=null, figureFileBig=null, tableContent=
拟合性能指标 线性关系拟合 二次关系拟合
SSE 0.1141 0.0961
$R$ -square 0.9963 0.9969
Adjusted$R$ -square 0.9962 0.9967
RMSE 0.0219 0.0203
), ArticleFig(id=1154032472485519705, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=表3, caption=多项式拟合效果, figureFileSmall=null, figureFileBig=null, tableContent=
拟合性能指标 线性关系拟合 二次关系拟合
SSE 0.1141 0.0961
$R$ -square 0.9963 0.9969
Adjusted$R$ -square 0.9962 0.9967
RMSE 0.0219 0.0203
), ArticleFig(id=1154032472540045659, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Tab. 4, caption=Main parameters of experimental platform, figureFileSmall=null, figureFileBig=null, tableContent=
参数 数值或型号
直流母线电压/V 50
电流/A 2~54
开关频率/kHz 10
占空比 50%
IGBT 器件 FF100R12KS4
母线电容/mF 1.0
储能电感/mH 0.2
输出电容/mF 1.0
负载电阻/Ω 0.83
), ArticleFig(id=1154032472607154524, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=表4, caption=实验平台的主要参数, figureFileSmall=null, figureFileBig=null, tableContent=
参数 数值或型号
直流母线电压/V 50
电流/A 2~54
开关频率/kHz 10
占空比 50%
IGBT 器件 FF100R12KS4
母线电容/mF 1.0
储能电感/mH 0.2
输出电容/mF 1.0
负载电阻/Ω 0.83
), ArticleFig(id=1154032472699429214, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=EN, label=Tab. 5, caption=Monitoring results of junction temperature based on on-state voltage drop, figureFileSmall=null, figureFileBig=null, tableContent=
集电极 电流/A 实际温 度/℃ 采样电路 输出电压/V 导通压降 计算值/V 计算温 度/℃ 误差/%
16 36.0 0.774 1.733 36.6750 1.875
68.0 0.814 1.811 68.9110 1.340
74.2 0.823 1.831 76.1000 2.560
24 36.0 0.904 2.011 37.4548 4.040
68.0 0.934 2.121 69.2661 1.860
74.2 0.952 2.141 77.8358 4.900
28 36.0 0.962 2.138 37.7930 4.980
68.0 1.004 2.243 69.0418 1.530
74.2 1.018 2.276 77.9420 5.040
), ArticleFig(id=1154032472770732385, tenantId=1146029695717560320, journalId=1146031654075715584, articleId=1153375935022748050, language=CN, label=表5, caption=基于导通压降监测结温结果, figureFileSmall=null, figureFileBig=null, tableContent=
集电极 电流/A 实际温 度/℃ 采样电路 输出电压/V 导通压降 计算值/V 计算温 度/℃ 误差/%
16 36.0 0.774 1.733 36.6750 1.875
68.0 0.814 1.811 68.9110 1.340
74.2 0.823 1.831 76.1000 2.560
24 36.0 0.904 2.011 37.4548 4.040
68.0 0.934 2.121 69.2661 1.860
74.2 0.952 2.141 77.8358 4.900
28 36.0 0.962 2.138 37.7930 4.980
68.0 1.004 2.243 69.0418 1.530
74.2 1.018 2.276 77.9420 5.040
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基于一种新型导通压降采样电路的IGBT器件结温在线监测方法
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赵蕤 1 , 杨柯欣 1 , 唐涛 1 , 宋文胜 1
电源学报 | 功率半导体器件 2024,22(6): 295-303
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电源学报 | 功率半导体器件 2024, 22(6): 295-303
基于一种新型导通压降采样电路的IGBT器件结温在线监测方法
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赵蕤1 , 杨柯欣1 , 唐涛1 , 宋文胜1
作者信息
  • 西南交通大学 电气工程学院 成都 611756
  • 赵蕤(1997-),男,硕士研究生。研究方向:电力电子与电力传动。E-mail: 592685843@qq.com。

    杨柯欣(1994-),男,中国电源学会学生会员,博士研究生。研究方向:电力电子与电力传动。E-mail:1083226411@qq.com。

    唐涛(1999-),男,硕士研究生。研究方向:电力电子与电力传动。E-mail: 1194312775@qq.com。

    宋文胜(1985-),男,中国电源学会高级会员,通信作者,博士,教授。研究方向:电力牵引传动与控制、功率器件健康状态监测。E-mail: songwsh@swjtu.edu.cn。

Online Monitoring Method for IGBT Device Junction Temperature Based on Novel On-state Voltage Drop Sampling Circuit
Rui ZHAO1 , Kexin YANG1 , Tao TANG1 , Wensheng SONG1
Affiliations
  • School of Electrical Engineering Southwest Jiaotong University Chengdu 611756 China
出版时间: 2024-11-30 doi: 10.13234/j.issn.2095-2805.2024.6.295
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热敏感电参数法具有在线能力强、非侵入和快响应等特点,成为了当前的研究热点。因此以导通压降为热敏感电参数,重点研究了1种基于导通压降的 IGBT 结温在线监测方法。首先,通过双脉冲测试电路获取IGBT 导通压降、集电极电流和结温数据;然后,基于所测数据构建了 IGBT集电极电流、结温与导通压降的三维映射表征模型;最后,设计了1种新型导通压降采样电路,并开展 IGBT 结温的在线监测实验研究,实验结果验证了所得三维结温表征模型的准确性和有效性。

绝缘栅双极晶体管  /  结温在线监测  /  热敏感电参数  /  导通压降  /  双脉冲测试  /  三维映射表征模型  /  采样电路

Temperature sensitive electrical parameter method has characteristics such as strong online capacity, non-invasiveness, and rapid response, so it has become a research hotspot at present. The on-state voltage drop is taken as a temperature sensitive electrical parameter, and an online monitoring method for IGBT junction temperature is studied based on the on-state voltage drop. First, the data of on-state voltage drop, collector current, and junction temperature of IGBT is obtained through the double-pulse test circuit. Then, based on the measured data, a three-dimensional mapping representation model of IGBT collector current, junction temperature, and on-state voltage drop is constructed. Finally, a novel on-state voltage drop sampling circuit was designed, and an online monitoring experimental of IGBT junction temperature was conducted. Experimental results verified the accuracy and validity of the obtained three-dimensional junction temperature representation model.

Insulated gate bipolar transistor (IGBT)  /  junction temperature on-line monitoring  /  temperature sensitive electrical parameter  /  on-state voltage drop  /  double-pulse test  /  three-dimensional mapping representation model  /  sampling circuit
赵蕤, 杨柯欣, 唐涛, 宋文胜. 基于一种新型导通压降采样电路的IGBT器件结温在线监测方法. 电源学报, 2024 , 22 (6) : 295 -303 . DOI: 10.13234/j.issn.2095-2805.2024.6.295
Rui ZHAO, Kexin YANG, Tao TANG, Wensheng SONG. Online Monitoring Method for IGBT Device Junction Temperature Based on Novel On-state Voltage Drop Sampling Circuit[J]. Journal of Power Supply, 2024 , 22 (6) : 295 -303 . DOI: 10.13234/j.issn.2095-2805.2024.6.295
近十年我国高速铁路里程增长迅速, 截至 2020 年底, 高速铁路里程已达 3.9 万千米, 每天在线运营的高速列车达 5000 余列[1]。同时,近年来新能源汽车也发展火热, 截至 2020 年 12 月, 我国新能源汽车销售量已超 550 万辆, 且仍保持快速上涨的趋势[2]。无论是高速列车牵引变流器还是新能源汽车变流器, 其功率器件的可靠性都是不可忽视的重要因素。有调查[3] 表明,功率器件是变流器中失效概率最高的元件, 而导致功率器件失效的主要因素有温度、湿度、振动冲击及污染物等, 其中约有 55%的功率器件失效由温度因素引起。因此, 对功率器件结温的精确监测是其寿命预测、健康管理及可靠性评估的基础[4]
现有的功率器件结温监测方法主要分为 4 类: 物理接触式测量法[5] 、光学非接触测量法[6-7] 、热阻抗模型预测法[8] 和热敏感电参数 TSEP(temperature sensitive electrical parameter)提取法[9]。其中,物理接触式测量法侵入性强且热响应时间慢; 光学非接触测量法同样需要破坏待测器件封装, 还需特殊手段去除芯片表面硅胶,导致其绝缘性能变差。因此, 这 2 种方法均不适合在线应用。热阻抗模型预测法基于热网络模型实现结温估算, 但其模型较为复杂, 所需参数较多, 且受 IGBT 老化和散热回路变化影响。而热敏感电参数提取法通过将待测器件自身作为温度传感部件, 将其芯片温度信息映射在外部的电气变量上, 不仅能获取待测器件内部芯片的平均结温且成本低、响应快、易于在线监测。因此, 本文选择通过热敏感电参数提取法进行结温在线监测。
热敏感电参数提取法又分为静态热敏感电参数法[10-14] 和动态热敏感电参数法[15-20]。静态热敏感电参数是指待测器件处于完全导通或完全关断状态下与结温相关的电气参数, 具有代表性的静态热敏感电参数结温提取法包括小电流导通压降法、大电流注入法、集电极开启电压法和短路电流法等; 动态热敏感电参数是指待测器件在开通或关断的瞬态切换过程中与结温相关的电气参数, 具有代表性的动态热敏感电参数结温提取法包括阈值电压法、内置驱动温敏电阻法等。其中, 小电流导通压降法[21] 是经典的芯片结温预测方法,但是小电流的选取对测量线性度和灵敏度均有较大影响, 并且需要特定的小电流辅助电路提供恒定的测量激励源, 不仅提高了测量成本, 增加了测量复杂度, 而且不能实现 IGBT 结温的在线监测; 集电极开启电压法[22] 灵敏度较低,而较低的灵敏度会导致更多的测量误差;短路电流法[23] 需要额外设计短路测试环节, 侵入性强, 对待测器件的安全性存在潜在威胁, 难以在线提取; 此外, 动态热敏感电参数法需要在极短开关时间内进行低成本精准测量。
本文致力于实现 IGBT 器件结温在线监测, 采用大电流注入法, 利用流过负载电流时器件本身的导通压降作为热敏感电参数。首先对 IGBT 导通压降及其影响因素进行理论分析; 然后对集电极电流、结温及导通压降三者间的关系进行多项式拟合;最后提出 1 种新型的 IGBT 导通压降采样电路, 结合三维映射表征模型查表获取结温, 完成实验验证。
IGBT 简化模型和内部结构如图1所示。当栅极电压大于阈值电压时 IGBT 导通, 集电极-发射极之间的电流流通路径如图1(b)中红色曲线所示。 此时的 IGBT 可以看作 1 个 P-i-N 二极管和 1 个工作在线性区的 MOSFET 串联, 导通压降表示为两者的压降之和[24],即
${V}_{\mathrm{{CE}}}= {V}_{\mathrm{{PiN}}}+ {V}_{\text{MOSFET }}$
其中,$\mathrm{P}- \mathrm{i}- \mathrm{N}$ 整流器的电压可以表示为
${V}_{\mathrm{{PiN}}}= \frac{nkT}{q}\ln \left({\frac{{I}_{\mathrm{C}}}{{I}_{\mathrm{S}}}+ 1}\right)+ {I}_{\mathrm{C}}{R}_{\mathrm{n}}$
式中:$n$ 为注入系数,小电流注入时为 1,大电流注入时为 2 ;$k$ 为波尔兹曼常数(Boltzmann’s constant);$T$$\mathrm{{PN}}$ 结绝对温度;$q$ 为电子电荷;${I}_{\mathrm{C}}$ 为集电极电流;${I}_{\mathrm{S}}$ 为反向饱和电流;${R}_{\mathrm{n}}$ 为基区电阻。
此外, MOSFET 工作在线性区时相当于 1 个电阻, 导通压降主要在沟道电阻上产生, 可以表示为
${V}_{\mathrm{{MOSFET}}}= {I}_{\mathrm{C}}{R}_{\mathrm{{CH}}}= \frac{{I}_{\mathrm{C}}{L}_{\mathrm{{CH}}}}{Z{\mu }_{\mathrm{{ni}}}{C}_{\mathrm{{ox}}}\left({{V}_{\mathrm{G}}- {V}_{\mathrm{{TH}}}}\right)} $
式中:${L}_{\mathrm{{CH}}}$ 为沟道长度;$Z$ 为元胞长度;${\mu }_{\mathrm{{ni}}}$ 为反型层内的电子迁移率;${C}_{\mathrm{{ox}}}$ 为栅氧层电容;${V}_{\mathrm{G}}$ 为栅极驱动电压;${V}_{\mathrm{{TH}}}$ 为阈值电压。
因此, IGBT 导通压降可以表示为
${V}_{\mathrm{{CE}}}= \frac{n\mathrm{k}T}{q}\ln \left({\frac{{I}_{\mathrm{C}}}{{I}_{\mathrm{S}}}+ 1}\right)+ {I}_{\mathrm{C}}{R}_{\mathrm{n}}+ \frac{{I}_{\mathrm{C}}{L}_{\mathrm{{CH}}}}{Z{\mu }_{\mathrm{{ni}}}{C}_{\mathrm{{ox}}}\left({{V}_{\mathrm{G}}- {V}_{\mathrm{{TH}}}}\right)} $
本文采用型号为 FF100R12KS4 的 IGBT 为例, 从其数据手册中的$V$ -$I$ 特性曲线(图2)可以看出, IGBT 的导通压降由穿过 P-i-N 部分的压降与 MOSFET 部分的压降竞争所决定,当集电极电流较大时,${I}_{\mathrm{C}}$${V}_{\mathrm{{CE}}}$ 可以近似为线性关系,即 MOSFET 和基区的导通压降占主导;当集电极电流较小时,${I}_{\mathrm{C}}$${V}_{\mathrm{{CE}}}$ 为非线性关系,即 PN 结的导通压降占主导[25]
图2还可以看出,不同温度对应的$V - I$ 特性曲线相交于一点, 称其为交点。当集电极电流一定时, 导通压降在交点以上部分具有正温度系数, 在交点以下具有负温度系数。交点处集电极电流对应的导通压降不受温度影响,因此也可以称为盲点。 对于 IGBT 器件而言, 盲点之上的电流均可以作为大电流。
典型的静态热敏感电参数包括小电流导通压降和大电流导通压降。由于小电流导通压降仅能用于结温离线监测, 因此本文选择大电流导通压降法来监测结温。大电流导通压降为正温度系数, 应用该方法测量结温前, 首先需要使用多项式拟合法来对大电流导通压降法的三维映射表征模型求解。
图2可以看出, IGBT 导通压降${V}_{\mathrm{{CE}}}$ 与导通电流${I}_{\mathrm{C}}$ 、结温${T}_{\mathrm{j}}$ 有关,并且栅极驱动电压${V}_{\mathrm{G}}$ 在固定驱动电路中通常为恒定值,因此设 IGBT 导通压降${V}_{\mathrm{{CE}}}$ 的数学表达式为
${V}_{\mathrm{{CE}}}= f\left({{I}_{\mathrm{C}},{T}_{\mathrm{j}}}\right)$
本文所提 IGBT 结温在线监测实验台电路如图3所示,其中${U}_{\mathrm{{dc}}}$ 为可调直流电压源;${C}_{1}$ 为母线电容; 上桥臂${\mathrm{S}}_{1}$ 恒关断; 下桥臂${\mathrm{S}}_{2}$ 为待测功率器件 DUT(device under test),恒导通;${L}_{1}$ 为储能电感;${C}_{2}$ 为输出电容;${R}_{1}$ 为负载电阻。该主电路可以通过调整上下管的驱动信号使主电路充当 Buck 电路或者 IGBT 双脉冲测试电路。当其作为 Buck 电路时,其上桥臂${\mathrm{S}}_{1}$ 的反并联二极管充当$\mathrm{{Buck}}$ 电路中的二极管,下桥臂${\mathrm{S}}_{2}$ 充当 Buck 电路中的开关管。 当${\mathrm{S}}_{2}$ 导通时,电流回路为回路 1 ; 当${\mathrm{S}}_{2}$ 关断时, 电流回路为回路 2, 以此来实现 Buck 电路的降压功能。
高压大功率 IGBT 器件中 P-i-N 结的导通压降是非线性的, 因此必须在全工作温度范围内进行数据采集。由于多项式可以连续求导且容易收敛, 本文选择多项式拟合法对式(5)进行求解。通过多项式拟合法分别将导通压降与结温按照线性关系、二次关系进行拟合, 拟合公式为
${V}_{\mathrm{{CE}}}= \left({{a}_{11}{I}_{\mathrm{C}}^{4}+ {a}_{12}{I}_{\mathrm{C}}^{3}+ {a}_{13}{I}_{\mathrm{C}}^{2}+ {a}_{14}{I}_{\mathrm{C}}+ {a}_{15}}\right){T}_{\mathrm{j}}+ \\{a}_{21}{I}_{\mathrm{C}}^{5}+ {a}_{22}{I}_{\mathrm{C}}^{4}+ {a}_{23}{I}_{\mathrm{C}}^{3}+ {a}_{24}{I}_{\mathrm{C}}^{2}+ {a}_{25}{I}_{\mathrm{C}}+ {a}_{26}\\{V}_{\mathrm{{CE}}}= \left({{b}_{11}{I}_{\mathrm{C}}^{3}+ {b}_{12}{I}_{\mathrm{C}}^{2}+ {b}_{13}{I}_{\mathrm{C}}+ {b}_{14}}\right){T}_{\mathrm{j}}^{2}+ \\\left({{b}_{21}{I}_{\mathrm{C}}^{4}+ {b}_{22}{I}_{\mathrm{C}}^{3}+ {b}_{23}{I}_{\mathrm{C}}^{2}+ {b}_{24}{I}_{\mathrm{C}}+ {b}_{25}}\right){T}_{\mathrm{j}}+ \\{b}_{31}{I}_{\mathrm{C}}^{5}+ {b}_{32}{I}_{\mathrm{C}}^{4}+ {b}_{33}{I}_{\mathrm{C}}^{3}+ {b}_{34}{I}_{\mathrm{C}}^{2}+ {b}_{35}{I}_{\mathrm{C}}+ {b}_{36}$
线性关系式中的常数如表1所示, 二次关系式中常数如表2所示, 线性关系式与二次关系式的拟合效果如表3所示。其中: SSE(sum of squares due to error)为和方差, 代表拟合数据和原始数据对应点的误差的平方和, 越接近 0, 说明模型选择和拟合越好,数据预测越准确;$R$ -square(coefficient of determination) 为决定系数, 也叫多重测定系数, 越接近 1,表明方程的变量对因变量的解释能力越强; Adjusted$R$ -square(degree-of-freedom adjusted coefficient of determination)为校正决定系数, 越接近 1 的值表示匹配越好, 通常是拟合效果的最佳指标; RMSE(root mean squared error)为均方根, 和 SSE 一样,越接近 0,表明拟合效果越好[26]。综合各指标来看, 二次关系拟合效果要优于线性关系, 因此可以认为${V}_{\mathrm{{CE}}}$${T}_{\mathrm{j}}$ 的关系更近似于 1 个二次函数对称轴一侧的单调函数。因此, 式(7)为所求大电流导通压降的数学表达式, 其三维映射表征模型如图4所示。
式(7)为${V}_{\mathrm{{CE}}}= f\left({I}_{\mathrm{C}}\right){T}_{\mathrm{j}}^{2}+ g\left({I}_{\mathrm{C}}\right){T}_{\mathrm{j}}+ h\left({I}_{\mathrm{C}}\right)$ 的形式,通过导通压降${V}_{\mathrm{{CE}}}$ 的数学表达式求解结温${T}_{\mathrm{j}}$
${T}_{\mathrm{j}}= \left\{\begin{array}{l}- \frac{{\sigma }_{1}- {\beta }_{1}}{{\sigma }_{2}}\\\frac{{\sigma }_{1}+ {\beta }_{1}}{{\sigma }_{2}}\end{array}\right.$
${\sigma }_{1}= {1.511}\times {10}^{-{23}}\sqrt{{\gamma }_{1}}$
${\gamma }_{1}= {1.76}\times {10}^{-6}{I}_{\mathrm{C}}- {1.65}\times {10}^{-5}{V}_{\mathrm{{CE}}}- {4.216}\times {10}^{-6}{V}_{\mathrm{{CE}}}\\{I}_{\mathrm{C}}+ {1.578}\times {10}^{-7}{V}_{\mathrm{{CE}}}{I}_{\mathrm{C}}^{2}- {1.914}\times {10}^{-9}{V}_{\mathrm{{CE}}}{I}_{\mathrm{C}}^{3}+ \\{3.513}\times {10}^{-7}{I}_{\mathrm{C}}^{2}- {4.066}\times {10}^{-8}{I}_{\mathrm{C}}^{3}+ {2.097}\times {10}^{-9}\\{I}_{\mathrm{C}}^{4}+ {6.227}\times {10}^{-{11}}{I}_{\mathrm{C}}^{5}+ {1.1}\times {10}^{-{13}}{I}_{\mathrm{C}}^{6}- {1.066}\times \\{10}^{-{14}}{I}_{\mathrm{C}}^{7}+ {4.415}\times {10}^{-{17}}{I}_{\mathrm{C}}^{8}+ {4.186}\times {10}^{-6}\\{\beta }_{1}= {6.522}\times {10}^{18}{I}_{\mathrm{C}}- {2.74}\times {10}^{15}{I}_{\mathrm{C}}^{2}+ {4.854}\times \\{10}^{16}{I}_{\mathrm{C}}^{3}- {2.69}\times {10}^{14}{I}_{\mathrm{C}}^{4}- {5.343}\times {10}^{19}\\{\sigma }_{2}= {1.446}\times {10}^{14}{I}_{\mathrm{C}}^{3}- {1.193}\times {10}^{16}{I}_{\mathrm{C}}^{2}+ \\{3.186}\times {10}^{17}{I}_{\mathrm{C}}+ {1.247}\times {10}^{18}$
由于此处二次函数开口向下, 因此选取对称轴左边的解作为求得的结温值,进而得到结温${T}_{\mathrm{j}}$ 关于集电极电流${I}_{\mathrm{C}}$ 与器件导通压降${V}_{\mathrm{{CE}}}$ 的数学表达式为
${T}_{\mathrm{j}}= f\left({{I}_{\mathrm{C}},{V}_{\mathrm{{CE}}}}\right)= -\frac{{\sigma }_{1}- {\beta }_{1}}{{\sigma }_{2}}$
式中,集电极电流${I}_{\mathrm{C}}$ 通过电流检测放大电路获取, 导通压降${V}_{\mathrm{{CE}}}$ 通过采样电路获取。
传统的导通压降采样电路有 2 种, 分别如图5(a)与(b)所示[27],本文提出的导通压降采样电路如图5(c)所示。文献[27]指出, 第 1 种传统采样电路在对导通压降进行测量时,需要保证${I}_{{\mathrm{D}}_{1}}= {I}_{{\mathrm{D}}_{2}}$, 进而通过基尔霍夫电压定律对回路进行计算得到待测器件的导通压降。但在实际测量中,由于${\mathrm{D}}_{3}$${\mathrm{D}}_{4}$ 支路与${\mathrm{D}}_{2}$ 、DUT 支路的阻抗均存在欧姆等级, 电流源${I}_{\mathrm{a}}$ 的电流会流过${\mathrm{D}}_{3}$ 支路,导致${I}_{{\mathrm{D}}_{1}}\neq {I}_{{\mathrm{D}}_{2}}$, 因此在前提条件破坏的情况下会存在一定误差, 且当待测器件导通压降${V}_{\mathrm{{CE}}}$ 逐渐上升时,二极管${\mathrm{D}}_{2}$ 所分电压逐渐减小,流过${\mathrm{D}}_{3}\text{、}{\mathrm{D}}_{4}$ 支路的电流逐渐增大, 误差也会随之逐渐增大。因此文献[27]提出 1 种基于传统采样电路的改进采样电路,将${\mathrm{D}}_{3}$ 替换为稳压二极管, 如图5(b)所示。由于稳压二极管的反向击穿电压约为${3.16}\mathrm{\;V}$,其反向电阻为$\mathrm{M}\Omega$ 级别,因此漏电流较小,可实现${I}_{{\mathrm{D}}_{1}}\approx {I}_{{\mathrm{D}}_{2}}$。但是,这 2 种传统采样电路均会因 IGBT 器件关断尖峰电压与负压过冲现象出现异常情况, 同时由于电流源由线性电源构成, 会导致主电路的效率降低, 并且存在严重的发热现象, 影响待测器件本身的温度状态。
本文提出的采样电路较传统采样电路有着电路阻抗小、组成简单和成本低的优点, 且不需要额外引入电流源,因此不会影响主电路的正常工作。在图5(c)中, MOSFET 管${\mathrm{Q}}_{1}$ 型号为$\mathrm{{HCl}}{60}\mathrm{N}{10}\mathrm{{LS}}$,其驱动信号与待测器件保持一致。当待测器件导通时,导通压降经过${\mathrm{Q}}_{1}$ 进入采样电路支路; 当待测器件关断时,支路输出为 0。在${R}_{4}$ 两端并联由${R}_{5}$${C}_{1}$ 所组成的串联回路并不会影响${V}_{\mathrm{a}},{V}_{\mathrm{a}}$ 通过${RC}$ 电路后,由方波形式变为其平均值${V}_{\mathrm{b}}$ 进入运放, 通过调节${R}_{6}$${R}_{7}$ 的值使电压平均值以固定倍数输出,即
${V}_{\mathrm{{CE}}\_ \text{on }}= {V}_{\mathrm{b}}\left({1 +\frac{{R}_{7}}{{R}_{6}}}\right)$
图5(c)所示采样电路中的${R}_{5}$${C}_{1}$ 串联回路进行分析。由于电容两端电压无法突变, 因此在电容刚开始充电时,认为电容两端电压${U}_{{C}_{1}}= 0$,此时流过串联回路的电流${I}_{{C}_{1}}= {V}_{\mathrm{{CE}}}/{R}_{5}$,之后电压以指数规律上升, 直到进入稳态相当于断路, 如图6所示, 放电则相反。可以看出: 该回路流过的最大电流为${V}_{\mathrm{{CE}}}/{R}_{5}$,当${V}_{\mathrm{{CE}}}= 2\mathrm{\;V}\text{、}{R}_{5}= 1\mathrm{k}\Omega$ 时,电流最大值为$2\mathrm{\;{mA}}$,而在实际应用中${R}_{5}$ 的选值会比$1\mathrm{k}\Omega$ 更大,对应的电流及损耗也会更小; 对于${R}_{4}$ 支路而言,电流为${V}_{\mathrm{{CE}}}/{R}_{4}$,当${V}_{\mathrm{{CE}}}= 2\mathrm{\;V}\text{、}{R}_{4}= 1\mathrm{k}\Omega$ 时, 电流为$2\mathrm{\;{mA}}$。而文献[27]中的电流源${I}_{\mathrm{a}}$ 输出电流为${83}\mathrm{\;{mA}}$,因此本文提出的采样电路对主电路的影响要远小于传统采样电路, 可以忽略不计。
英飞凌定义了 IGBT 所需最大驱动电流计算公式为
${I}_{\text{Gpeak }}= {0.74}\frac{{V}_{\mathrm{{GE}},\max }- {V}_{\mathrm{{GE}},\min }}{{R}_{\mathrm{G},\text{ ext }}+ {R}_{\mathrm{G},\text{ int }}}$
式中:${I}_{\text{Gpeak }}$ 为 IGBT 所需最大驱动电流;${V}_{\mathrm{{GE}},\max }$ 为栅极驱动电压最大值;${V}_{\mathrm{{GE}},\min }$ 为栅极驱动电压最小值;${R}_{\mathrm{G},\text{ ext }}$ 为外部栅极驱动电阻;${R}_{\mathrm{G},\text{ int }}$ 为器件内部栅极电阻。
本文提出的导通压降采样电路中,${V}_{\mathrm{{GE}},\max }=$ ${15}\mathrm{\;V},{V}_{\mathrm{{GE}},\min }= - 8\mathrm{\;V},{R}_{\mathrm{G},\text{ ext }}= {0\Omega },{R}_{\mathrm{G},\text{ int }}= {2.5\Omega }$,通过式(15)计算可得${I}_{\text{Gpeak }}= {1.36}\mathrm{\;A}$。本文所选驱动芯片型号为 1EDI20I12AF,其栅极电流输出为$\pm 2\mathrm{\;A}$,而 MOS 管${\mathrm{Q}}_{1}$ 的栅极驱动最大电流为${154}\mathrm{\;{mA}}$,因此该采样电路不会对主电路中的 IGBT 驱动电流产生影响。
本文采用的主电路如图3所示, 导通压降采样电路如图5(c)所示, 电路实验平台如图7所示, 实验主要参数如表4所示。实验平台包括直流电源、 主电路板、恒温加热台、数字信号处理器 DSP (digital signal processor)、示波器、红外成像仪和负载等。
首先通过选取离散点的方式验证三维映射表征模型。在不同温度条件下, 设定占空比为 50%, 将通过采样电路获取的导通压降${V}_{\mathrm{{CE}}}$ 代入式(14)得到导通压降计算值并将该值代入式(5), 得到计算温度, 结果如表5所示。可以看出, 计算得到的结温与设定温度的误差在 5%以内, 证明了大电流导通压降的三维映射表征模型的准确性。
此外,将集电极电流固定在${25}\mathrm{\;A}$,占空比固定在 50%进行测量, 得到导通压降计算结果如图8所示;根据式 (13), 可得图8中所测导通压降对应的结温曲线如图9所示; 由于待测器件在实验前已拆除外部封装, 因此可通过红外热成像仪对图7中标示位置的温度进行测量, 并认定为器件芯片温度, 结果如图10所示。由图9可知, 根据三维映射表征模型可得在${150}\mathrm{\;s}$${343}\mathrm{\;s}$ 时,器件结温分别为32.6786和${94.4152}{}^{\circ }\mathrm{C}$,通过红外热成像仪所测温度分别为 31.7 与${95.2}^{\circ }\mathrm{C}$,与图9中的理论计算值误差约保持在 3%,因此也验证了模型的正确性。由图9可以看出, 整体结温呈线性上升趋势, 符合实际设定温度的变化范围; 导通压降采样电路的实用性, 能满足结温在线监测的要求。
本文以实现 IGBT 器件精确在线结温监测为目标,研究了基于大电流导通压降为静态热敏感电参数的结温监测方法。重点开展了以多项式拟合法构建导通压降、集电极电流和结温之间的三维映射表征模型, 设计了大电流下导通压降在线监测电路, 开展了基于三维映射表征模型的 IGBT 器件结温计算与红外热线仪实测对比实验。实验结果表明, 所提方法具有良好的在线监测精度, 误差低于 5%。因此, 大电流导通压降法可有效实现 IGBT 结温的精确在线监测,可为开展器件热保护和主动热控制奠定基础。
  • 国家自然科学基金资助项目(52022084)
  • 四川省青年科技创新研究团队项目(22CXTD0055)
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2024年第22卷第6期
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doi: 10.13234/j.issn.2095-2805.2024.6.295
  • 接收时间:2021-12-29
  • 首发时间:2025-07-19
  • 出版时间:2024-11-30
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  • 收稿日期:2021-12-29
  • 修回日期:2022-03-18
  • 录用日期:2022-03-21
基金
National Natural Science Foundation of China(52022084)
国家自然科学基金资助项目(52022084)
Youth Science and Technology Innovation Research Team of Sichuan(22CXTD0055)
四川省青年科技创新研究团队项目(22CXTD0055)
作者信息
    西南交通大学 电气工程学院 成都 611756
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https://castjournals.cast.org.cn/joweb/dyxb/CN/10.13234/j.issn.2095-2805.2024.6.295
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2种不同金属材料的力学参数

Family
属数
Number of
genus
种数
Number of
species
占总种数比例
Percentage of
total species (%)

Genus
种数
Number of
species
占总种数比例
Percentage of total
species (%)
鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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