Article(id=1195748953930117617, tenantId=1146029695717560320, journalId=1189987059142926344, issueId=1195748950557901709, articleNumber=null, orderNo=null, doi=10.19457/j.1001-2095.dqcd25239, pmid=null, cstr=null, oa=null, hot=null, price=null, onlineType=0, articleFormat=0, articleType=null, articleTypeStr=research-article, receivedDate=1689091200000, receivedDateStr=2023-07-12, revisedDate=1692547200000, revisedDateStr=2023-08-21, acceptedDate=null, acceptedDateStr=null, onlineDate=1763018366558, onlineDateStr=2025-11-13, pubDate=1705680000000, pubDateStr=2024-01-20, doiRegisterDate=null, doiRegisterDateStr=null, onlineIssueDate=1763018366558, onlineIssueDateStr=2025-11-13, onlineJustAcceptDate=null, onlineJustAcceptDateStr=null, onlineFirstDate=null, onlineFirstDateStr=null, sourceXml=null, magXml=null, createTime=1763018366558, creator=13701087609, updateTime=1763018366558, updator=13701087609, issue=Issue{id=1195748950557901709, tenantId=1146029695717560320, journalId=1189987059142926344, year='2024', volume='54', issue='1', pageStart='3', pageEnd='96', issueExtLink='null', onlineDate='null', pubDate='null', beforeIssueId=null, nextIssueId=null, price=null, status=1, issueComplete=1, articleOrder=1, issueType=-1, specialIssue=null, createTime=1763018365754, creator=13701087609, updateTime=1763022843823, updator=13701087609, preIssue=null, nextIssue=null, ext={EN=IssueExt(id=1195767733011923850, tenantId=1146029695717560320, journalId=1189987059142926344, issueId=1195748950557901709, language=EN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=), CN=IssueExt(id=1195767733011923851, tenantId=1146029695717560320, journalId=1189987059142926344, issueId=1195748950557901709, language=CN, specialIssueTitle=, coverIllustrator=null, specialIssueEditor=, specialIssueAbout=)}, issueFiles=null}, startPage=48, endPage=52, ext={EN=ArticleExt(id=1195748954110472692, articleId=1195748953930117617, tenantId=1146029695717560320, journalId=1189987059142926344, language=EN, title=A Design of Flexible and Reliable IGBT Driver Circuit, columnId=null, journalTitle=Electric Drive, columnName=null, runingTitle=null, highlight=null, articleAbstract=

Under the background of carbon emission reduction,fully controlled power device IGBT is widely used in various of converters with its excellent performance,effective and reliable drive circuit is crucial to the safe operation of IGBT,especially for high-power applications. Aiming at the requirement of flexible and reliable of IGBT drive circuit in high-power applications,an IGBT drive and protection circuit based on intelligent integrated optocoupler driver ACPL-332J was designed,the parameters of ACPL-332J were analyzed,and the driving circuit was designed with ACPL-332J as the core. With Infineon FF600R12ME4 as the application IGBT,the effectiveness of the designed drive and protect circuit was verified by double pulse test and short circuit test.

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在当今减碳排放背景下,全控型功率器件IGBT以优异的性能广泛用于各种变流器中,有效可靠的驱动电路对IGBT的安全工作至关重要,特别是大功率应用场合。针对大功率IGBT应用中对驱动电路灵活可靠的要求,设计了一种基于智能集成光耦驱动器ACPL-332J的IGBT驱动保护电路,分析了ACPL-332J的各项参数,并以ACPL-332J为核心设计了驱动电路。以英飞凌FF600R12ME4为应用IGBT,通过双脉冲试验、短路试验验证了设计电路驱动及保护的有效性。

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韩松(1988-),男,硕士研究生,工程师,Email:

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韩松(1988-),男,硕士研究生,工程师,Email:

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Electrical Switches, 2008, 46(4):1-4., articleTitle=Analysis of large-capacity IGBT reliability, refAbstract=null), Reference(id=1197108573412045368, tenantId=1146029695717560320, journalId=1189987059142926344, articleId=1195748953930117617, doi=null, pmid=null, pmcid=null, year=2020, volume=50, issue=3, pageStart=80, pageEnd=82, url=null, language=null, rfNumber=[3], rfOrder=4, authorNames=张振亚, 姜红, journalName=电气传动, refType=null, unstructuredReference=张振亚, 姜红. 6SE70 逆变器 IGBT 故障分析与对策[J]. 电气传动, 2020, 50(3):80-82., articleTitle=6SE70 逆变器 IGBT 故障分析与对策, refAbstract=null), Reference(id=1197108573508514361, tenantId=1146029695717560320, journalId=1189987059142926344, articleId=1195748953930117617, doi=null, pmid=null, pmcid=null, year=2020, volume=50, issue=3, pageStart=80, pageEnd=82, url=null, language=null, rfNumber=[3], rfOrder=5, authorNames=ZHANG Zhenya, JIANG Hong, journalName=Electric Drive, refType=null, unstructuredReference=ZHANG Zhenya, JIANG Hong. Analysis and countermeasures for IGBT failure of 6SE70 inverter[J]. Electric Drive, 2020, 50(3):80-82., articleTitle=Analysis and countermeasures for IGBT failure of 6SE70 inverter, refAbstract=null), Reference(id=1197108573575623226, tenantId=1146029695717560320, journalId=1189987059142926344, articleId=1195748953930117617, doi=null, pmid=null, pmcid=null, year=2010, volume=40, issue=10, pageStart=13, pageEnd=17, url=null, language=null, rfNumber=[4], rfOrder=6, authorNames=伍小杰, 曹兴, 夏帅, journalName=电气传动, refType=null, unstructuredReference=伍小杰, 曹兴, 夏帅, 等. IGBT驱动保护电路研究[J]. 电气传动, 2010, 40(10):13-17., articleTitle=IGBT驱动保护电路研究, refAbstract=null), Reference(id=1197108573693063739, tenantId=1146029695717560320, journalId=1189987059142926344, articleId=1195748953930117617, doi=null, pmid=null, pmcid=null, year=2010, volume=40, issue=10, pageStart=13, pageEnd=17, url=null, language=null, rfNumber=[4], rfOrder=7, authorNames=WU XiaoJie, CAO Xing, XIA Shuai, journalName=Electric Drive, refType=null, unstructuredReference=WU XiaoJie, CAO Xing, XIA Shuai, et al. Research on IGBT drive protection circuit[J]. 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ACPL-332J,2.5 Amp output current IGBT gate driver optocoupler,integrated (VCE) desaturation detection,UVLO,fault status feedback[EB/OL].(2015-11-20) https://docs.broadcom.com/doc/AV02-0120EN., articleTitle=ACPL-332J,2.5 Amp output current IGBT gate driver optocoupler,integrated (VCE) desaturation detection,UVLO,fault status feedback, refAbstract=null), Reference(id=1197108573814698557, tenantId=1146029695717560320, journalId=1189987059142926344, articleId=1195748953930117617, doi=null, pmid=null, pmcid=null, year=null, volume=null, issue=null, pageStart=null, pageEnd=null, url=https://docs.broadcom.com/doc/AV02-0421EN, language=null, rfNumber=[6], rfOrder=9, authorNames=Avago Technologies, journalName=null, refType=null, unstructuredReference=Avago Technologies. AN 5336:Gate drive optocoupler basic design for IGBT/MOSFET applicable to all gate drive optocouplers[EB/OL].( 2014-02-25)https://docs.broadcom.com/doc/AV02-0421EN., articleTitle=AN 5336:Gate drive optocoupler basic design for IGBT/MOSFET applicable to all gate drive optocouplers, refAbstract=null)], funds=[Fund(id=1197108571960816179, tenantId=1146029695717560320, journalId=1189987059142926344, articleId=1195748953930117617, awardId=YF2023ZL009, language=CN, fundingSource=天津电气科学研究院有限公司科研基金(YF2023ZL009), fundOrder=null, country=null)], companyList=[AuthorCompany(id=1197108565417701875, tenantId=1146029695717560320, journalId=1189987059142926344, articleId=1195748953930117617, xref=1, ext=[AuthorCompanyExt(id=1197108565426090484, tenantId=1146029695717560320, journalId=1189987059142926344, articleId=1195748953930117617, companyId=1197108565417701875, language=EN, country=null, province=null, city=null, postcode=null, companyName=null, departmentName=null, remark=1 Tianjin Research 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tenantId=1146029695717560320, journalId=1189987059142926344, articleId=1195748953930117617, language=EN, label=Tab.1, caption=

Table of output status

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IF UVLO DESAT Function FAULT Output VOUT
ON Active Not Active High(no fault) Low
ON Not Active Active
(with DESAT fault)
Low(fault) Low
ON Not Active Active
(no DESAT fault)
High High
OFF Active Not Active High Low
OFF Not Active Not Active High Low
), ArticleFig(id=1197108571683992114, tenantId=1146029695717560320, journalId=1189987059142926344, articleId=1195748953930117617, language=CN, label=表1, caption=

输出状态表

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IF UVLO DESAT Function FAULT Output VOUT
ON Active Not Active High(no fault) Low
ON Not Active Active
(with DESAT fault)
Low(fault) Low
ON Not Active Active
(no DESAT fault)
High High
OFF Active Not Active High Low
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一种灵活可靠的IGBT驱动电路设计
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韩松 1, 2 , 于志强 1, 2 , 王明玥 1, 2 , 于洪泽 1, 2 , 贾鹏飞 1, 2
电气传动 | 电力电子 2024,54(1): 48-52
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电气传动 | 电力电子 2024, 54(1): 48-52
一种灵活可靠的IGBT驱动电路设计
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韩松1, 2 , 于志强1, 2, 王明玥1, 2, 于洪泽1, 2, 贾鹏飞1, 2
作者信息
  • 1 天津电气科学研究院有限公司,天津 300180
  • 2 电气传动国家工程研究中心,天津 300180
  • 韩松(1988-),男,硕士研究生,工程师,Email:

A Design of Flexible and Reliable IGBT Driver Circuit
HAN Song1, 2 , YU Zhiqiang1, 2, WANG Mingyue1, 2, YU Hongze1, 2, JIA Pengfei1, 2
Affiliations
  • 1 Tianjin Research Institute of Electric Science Co.,Ltd.,Tianjin 300180,China
  • 2 National Engineering Research Center for Electrical Transmission,Tianjin 300180,China
出版时间: 2024-01-20 doi: 10.19457/j.1001-2095.dqcd25239
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在当今减碳排放背景下,全控型功率器件IGBT以优异的性能广泛用于各种变流器中,有效可靠的驱动电路对IGBT的安全工作至关重要,特别是大功率应用场合。针对大功率IGBT应用中对驱动电路灵活可靠的要求,设计了一种基于智能集成光耦驱动器ACPL-332J的IGBT驱动保护电路,分析了ACPL-332J的各项参数,并以ACPL-332J为核心设计了驱动电路。以英飞凌FF600R12ME4为应用IGBT,通过双脉冲试验、短路试验验证了设计电路驱动及保护的有效性。

智能集成光耦驱动器ACPL-332J  /  光耦驱动器  /  驱动保护电路  /  灵活可靠

Under the background of carbon emission reduction,fully controlled power device IGBT is widely used in various of converters with its excellent performance,effective and reliable drive circuit is crucial to the safe operation of IGBT,especially for high-power applications. Aiming at the requirement of flexible and reliable of IGBT drive circuit in high-power applications,an IGBT drive and protection circuit based on intelligent integrated optocoupler driver ACPL-332J was designed,the parameters of ACPL-332J were analyzed,and the driving circuit was designed with ACPL-332J as the core. With Infineon FF600R12ME4 as the application IGBT,the effectiveness of the designed drive and protect circuit was verified by double pulse test and short circuit test.

intelligent integrated optocoupler driver ACPL-332J  /  optocoupler driver  /  drive and protect circuit  /  flexible and reliable
韩松, 于志强, 王明玥, 于洪泽, 贾鹏飞. 一种灵活可靠的IGBT驱动电路设计. 电气传动, 2024 , 54 (1) : 48 -52 . DOI: 10.19457/j.1001-2095.dqcd25239
HAN Song, YU Zhiqiang, WANG Mingyue, YU Hongze, JIA Pengfei. A Design of Flexible and Reliable IGBT Driver Circuit[J]. Electric Drive, 2024 , 54 (1) : 48 -52 . DOI: 10.19457/j.1001-2095.dqcd25239
在节能减排的时代背景下,随着绝缘栅双极型晶体管(IGBT)的制造和应用技术日趋成熟,IGBT以易于驱动、耐受电应力、热应力高的特点,被广泛应用于中高功率、中低频率变流器中[1]。据不完全统计,中、高压变频器因 IGBT失效而导致的故障占总故障的90%以上,而驱动和隔离引起的IGBT损毁大约在30%以上[2],这是由IGBT在大功率应用中的电热应力高、磁场环境恶劣引起的,IGBT的损毁对现场生产有很大影响[3],有效可靠的驱动及保护电路设计对IGBT运行在安全工作区至关重要。
在IGBT大功率应用场合,为防止高压侧电能损害低压侧设备及操作人员,业界普遍采用隔离型式的驱动保护电路,内部集成多种保护功能且各类工作参数外部可调的智能光耦隔离驱动器因其应用灵活、可靠性高的特点[4]成为了主流方案。
市场上可用的智能集成光耦隔离驱动器的生产厂商及型号繁多,针对当下设计的一类低压大功率工业变流器设备中选用的IGBT驱动需求,以ACPL-332J为核心,设计了匹配的隔离驱动及保护电路。
ACPL-332J是安华高(AVAGO)针对IGBT门极驱动进行优化设计的一款光耦隔离型驱动器,兼具隔离、驱动、保护、反馈功能,非常适合用于工业电机控制和功率转换应用;具有滞环特性的欠压保护(UVLO)、紧凑经济且易于实现的退饱和故障检测、设计灵活的有源米勒钳位、开集特性且隔离的集电极开路故障反馈以及两级软关断能力。
ACPL-332J器件内部功能框图如图1所示,集成了输入驱动信号隔离光耦LED1、欠压检测模块UVLO、退饱和故障检测模块DESAT、有源钳位检测模块VCLAMP、驱动电流放大电路、两级软关断电路和输出故障信号隔离光耦LED2
ACPL-332J器件典型参数如下[5]
1)输出驱动电流2.0~2.5 A。
2)最大工作隔离电压VIORM=1 414 VPEAK
3)工作温度范围-40~105 ℃内传播延时最大250 ns。
4)脉宽失真(PWD)即|TPLH-TPHL|最大为100 ns。
5)在集电极电压VCM=1 500 V时,共模抑制(CMR)最小50 kV/μs。
6)供电电流小于5 mA,供电电压15~30 V。
7)米勒钳位电流值为1.7 A。
ACPL-332J设计要点如下:
1)VLED管脚仅用于光耦测试,在实际电路使用设计时一定要将此管脚空置。
2)工作温度超过90 ℃时,器件计算损耗需要以10 mW/℃降额使用。
3)集电极开路故障电压(VDESAT)检测门槛值有随着温度升高而降低的趋势。
4)故障反馈输出(FAULT)和驱动信号输出(VOUT)由光耦LED1的电流IF、欠压检测模块UVLO、退饱和功能状态(DESAT)决定,输出状态如表1所示。
5)自带有源钳位功能不用时,管脚VCLAMP与VEE短接。
6)驱动器内置退饱和充电电流源电流值范围130~330 μA,典型电流值240 μA。
7)使用PNP/NPN输出驱动缓冲器时,注意器件上压降对实际IGBT门级驱动电压的影响。
ACPL-332J为单路输出驱动器,在三相变流器的驱动电路设计中,3个桥臂上、下管的驱动电路相同,以1个桥臂的上管为例进行原理框图及详细电路设计。
设计的驱动电路原理框图如图2所示,以ACPL-332J为核心,由输入脉冲整形电路、输出故障反馈电路、退饱和保护外围电路、有源钳位外围电路和推挽放大电路组成。
工业应用现场电磁环境恶劣,在大功率时更加严重,受此影响,驱动输入信号上可能出现异常的窄脉冲尖峰,当IGBT被异常窄脉冲信号驱动开通时,轻则造成IGBT损耗增加,温升增高,降低IGBT使用寿命,重则造成桥臂短路甚至设备损毁。正常驱动信号在传输线上由于寄生电容效应跳边沿会变缓,这也将增加IGBT开关损耗。ACPL-332J故障输出脚为开漏输出,可以将变流器桥臂中各个驱动器的故障信号独立输出,也可将多个驱动器的故障信号线“与”后输出。
设计的输入信号调理/输出故障反馈电路如图3所示,输入脉冲信号经过RC滤波,避免IGBT被小于设定脉冲宽度的信号开通,使用“或非门”搭建同一桥臂上、下管IGBT脉冲封锁,选用的“或非门”具有施密特触发特性,对脉冲跳边沿进行整形;同一桥臂上、下管IGBT故障信号线“与”后输出,R3对故障输出信号进行上拉,C6对故障输出信号进行抖动滤波。
ACPL-332J的一个关键参数是提供足够的IGBT门极电荷充放电时的峰值电流,以减小IGBT开关损耗。IGBT门极驱动电流峰值计算如下式所示:
I O U T = V G E _ o n + V G E _ o f f R G e x t + R G i n t
式中: I O U T为输出驱动电流峰值; V G E _ o n为门极开通电压; V G E _ o f f为门极关断电压; R G e x t为门极外置电阻; R G i n t为门极内置电阻。
根据设计需求,驱动英飞凌IGBT型号是FF600R12ME4,需要门极驱动电流7.1 A,超过ACPL-332J输出驱动电流峰值2.5 A,V5和V6选用非反向PNP/NPN双极型电流缓冲器进行驱动电流放大,可选用MJD44H11/MJD45H11,电流放大能力为8 A,满足驱动电流要求,设计电路如图4所示。缓冲器输出电流峰值是由选用三极管的基极电流(IB)、电流放大倍数(β)、集电极电流(IC)上限值决定的。电容C7用于保持退饱和故障时的软关断特性;电阻R5用于减少驱动器输出电流;电阻R6用于为IGBT提供另一条驱动电流通路。
ACPL-332J输出开通信号驱动IGBT门级容性负载时,驱动电流降到零后,驱动电压会在几个ms内从VCC2-3VBE升高到VCC2 R p u l l   -   d o w n(R9)用于解决此问题,设计时此电阻吸收数倍于650 μA的电流,阻值计算如下式所示:
R p u l l   -   d o w n = V C C 2 - 3 · V B E 650   μ A
式中: R p u l l - d o w n为驱动电流吸收电阻; V C C 2为驱动输入正压,驱动IGBT建议17.5 V,驱动MOSFET建议12.5 V; V B E为驱动器内置二极管的管压降,可按典型值0.7 V计算。
在同一桥臂上、下管IGBT的驱动过程中,由米勒电容造成的寄生导通是一个普遍问题,这会造成桥臂直通短路,损坏IGBT及变流装置,特别是在成本控制严格的小功率装置中,使用单电源零压关断驱动,此问题更加严重,寄生导通通路如图5所示,米勒电流计算如下:
I c g = C c g · d V c e d t
式中: I c g为米勒电流; C c g为米勒电容; d V c e为IGBT集射级电压变化量; d t为时间变化量。
IGBT结温上升后,门极开通电压阈值会略微下降,这就更容易造成寄生导通。在大功率应用中,为保证装置可靠运行,选用双电源负压关断驱动的同时,也利用ACPL-332J驱动器内部自带的有源钳位功能进行保护设计,在IGBT关断期间,当VCLAMP管脚电压较VEE高出2 V时,有源钳位保护动作,内部MOS管导通,将管脚VCLAMP与VEE接通。由于VCLAMP管脚吸收电流上限为1.7 A,设计电路中使用三极管V7放大有源钳位时吸收的门极电流,适应大功率应用工况,设计电路见图4
当变流器由不同原因导致短路过流发生时,流过IGBT的电流会迅速上升至远大于正常工作的值,使IGBT集射级之间的电压由饱和导通电压迅速升高至母线电压,这时称IGBT发生退饱和故障,剧烈增加的电流会造成功率器件IGBT快速升温直至烧毁。为此,必须实施退饱和检测和保护功能,以达到发生此类故障时减小或关闭过电流的目的。
ACPL-332J驱动器内部集成退饱和检测及保护功能,当退饱和检测电压值大于其内部设定参考电压时,驱动器以软关断的特性降低门极驱动输出电压,软关断过程分2个阶段,当门极驱动输出电压较VEE处电压高出2 V及以上时,驱动器内部使用1个通流能力小的1xDMOS对IGBT门极电容放电,当门极驱动输出电压较VEE处电压高出2 V以下时,驱动器内部使用1个通流能力大的50xDMOS对IGBT门极电容放电,并将门极电压钳位至VEE,既关断IGBT,又降低由电流剧变与杂散电感引起的电压尖峰;同时将故障输出端置低电平,将退饱和故障状态传递给控制器。退饱和保护功能仅在IGBT开通脉冲到来时工作,为避免IGBT开通初期误报退饱和故障,需要设置一个消隐时间,在消隐时间内不检测退饱和故障,消隐时间也决定退饱和故障发生时故障报出的时间,消隐时间计算如下式所示:
t B L A N K = C B L A N K · ( V D E S A T - 2 V F ) I C H G
式中: t B L A N K为消隐时间; C B L A N K为消隐电容; V D E S A T为驱动内置电压阈值,典型值为6.5 V; V F为二极管的压降; I C H G为驱动器内置电流源的电流值,典型值为240 μA。
设计电路见图4,C4为消隐电容,V3和V4为退饱和钳位二极管,设计时需选用结电容小、反向恢复快的型号,建议反向恢复时间小于75 ns,电阻R4限制电流尖峰,设计时应注意有效限制电流尖峰的同时避免明显改变消隐时间。
以光耦隔离驱动器ACPL-332J为核心,以有效、可靠驱动英飞凌FF600R12ME4为目的,设计选取电路主要参数如下:R2=22 Ω;C5=1 nF;R3=2.1 kΩ;C6=1 nF;C4=100 pF;R4=100 Ω;V3和V4型号为UF4007;V1型号为1N5925A;V2型号为MBR0540;R9=47 kΩ;R5=10 Ω;C7=10 nF;V5型号为MJD44H11;V6型号为MJD45H11;R7=1.5 Ω。参考安华高对使用其品牌下光耦隔离驱动器设计IGBT门级驱动电路时给出的印制电路板(PCB)布局建议,绘制PCB并进行样板制作[6]
对样板进行低压驱动及保护功能测试通过后,搭建测试平台进行双脉冲测试及短路测试,验证设计电路对FF600R12ME4驱动及保护的有效性,测试平台系统原理如图6所示,使用变流器设备实际层叠母排安装母线电容C,降低线路杂散电感LS,使用空芯电感避免磁芯饱和,使用定制短路排精确模拟短路工况,使用电阻R为测试后母排电容放电,使用青铜剑自定义脉冲波形发生装置进行测试脉冲生成。
设定母线电压为DC 600 V,设定脉冲开通时间T1T3,在第2个开通脉冲T3结束后达到额定电流,双脉冲测试波形如图7所示,图中驱动脉冲Vge波形、电流Ic波形、IGBT管压降Vce波形没有异常震荡,符合设计要求。
设定母线电压为DC 600 V,设定脉冲开通时间T4,依次将T4设置为8 μs,10 μs,15 μs进行短路测试。测试中IGBT退饱和保护时间(即从检测到退饱和算起到电流Ic被关断的时间)不随T4增加而增加,在5~6 μs左右,测试波形如图8所示,同时T4开通脉冲到来后,流过IGBT的电流剧烈增加,使得刚下降的Vce被抬升,当Vce超过退饱和检测门槛6.5 V后,ACPL-332J驱动器将驱动脉冲以软关断的特性降低到关断电压,由杂散电感引起的Vce电压尖峰符合设计要求,设计的电路有效地对IGBT进行了退饱和保护。
以智能集成光耦驱动器ACPL-332J为核心,根据变流器装置应用需求,匹配外围驱动及保护电路的方式设计的IGBT驱动电路,经过双脉冲测试验证了正常驱动波形整体性能良好,经过短路测试验证了退饱和检测及保护的有效性,并成功应用在公司开发的产品中,既保证了设计电路的高可靠性,也能灵活驱动不同功率等级的IGBT,提供了一种灵活可靠的IGBT驱动电路设计方式。
  • 天津电气科学研究院有限公司科研基金(YF2023ZL009)
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doi: 10.19457/j.1001-2095.dqcd25239
  • 接收时间:2023-07-12
  • 首发时间:2025-11-13
  • 出版时间:2024-01-20
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  • 收稿日期:2023-07-12
  • 修回日期:2023-08-21
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天津电气科学研究院有限公司科研基金(YF2023ZL009)
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    1 天津电气科学研究院有限公司,天津 300180
    2 电气传动国家工程研究中心,天津 300180
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2种不同金属材料的力学参数

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鹅膏菌科Amanitaceae 2 11 5.26 鹅膏菌属 Amanita 10 4.78
小菇科 Mycenaceae 2 12 5.74 丝盖伞属 Inocybe 5 2.39
多孔菌科 Polyporaceae 8 14 6.70 蜡蘑属 Laccaria 5 2.39
红菇科 Russulaceae 3 23 11.00 小皮伞属 Marasmius 6 2.87
小菇属 Mycena 11 5.26
光柄菇属 Pluteus 5 2.39
红菇属 Russula 17 8.13
栓菌属 Trametes 5 2.39
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